JP6825241B2 - 磁場計測装置、磁場計測装置の製造方法 - Google Patents

磁場計測装置、磁場計測装置の製造方法 Download PDF

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JP6825241B2
JP6825241B2 JP2016122368A JP2016122368A JP6825241B2 JP 6825241 B2 JP6825241 B2 JP 6825241B2 JP 2016122368 A JP2016122368 A JP 2016122368A JP 2016122368 A JP2016122368 A JP 2016122368A JP 6825241 B2 JP6825241 B2 JP 6825241B2
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polarized light
cell
magnetic field
light
linearly polarized
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JP2017227482A (ja
JP2017227482A5 (cg-RX-API-DMAC7.html
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上野　仁
仁 上野
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to US15/616,095 priority patent/US10444300B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/243—Spatial mapping of the polarizing magnetic field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Magnetic Variables (AREA)
JP2016122368A 2016-06-21 2016-06-21 磁場計測装置、磁場計測装置の製造方法 Active JP6825241B2 (ja)

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JP2016122368A JP6825241B2 (ja) 2016-06-21 2016-06-21 磁場計測装置、磁場計測装置の製造方法
US15/616,095 US10444300B2 (en) 2016-06-21 2017-06-07 Magnetic field measuring device and method for manufacturing magnetic field measuring device

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JP2016122368A JP6825241B2 (ja) 2016-06-21 2016-06-21 磁場計測装置、磁場計測装置の製造方法

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JP2017227482A JP2017227482A (ja) 2017-12-28
JP2017227482A5 JP2017227482A5 (cg-RX-API-DMAC7.html) 2019-06-20
JP6825241B2 true JP6825241B2 (ja) 2021-02-03

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JP6825237B2 (ja) * 2016-06-14 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法
US11262420B2 (en) 2018-08-17 2022-03-01 Hi Llc Integrated gas cell and optical components for atomic magnetometry and methods for making and using
US10627460B2 (en) 2018-08-28 2020-04-21 Hi Llc Systems and methods including multi-mode operation of optically pumped magnetometer(s)
US11237225B2 (en) 2018-09-18 2022-02-01 Hi Llc Dynamic magnetic shielding and beamforming using ferrofluid for compact Magnetoencephalography (MEG)
CN111289924B (zh) * 2018-12-10 2025-06-17 中科知影(北京)科技有限公司 多通道原子磁探测器
US11294008B2 (en) 2019-01-25 2022-04-05 Hi Llc Magnetic field measurement system with amplitude-selective magnetic shield
WO2020167450A1 (en) 2019-02-12 2020-08-20 Hi Llc Neural feedback loop filters for enhanced dynamic range magnetoencephalography (meg) systems and methods
WO2020205219A1 (en) 2019-03-29 2020-10-08 Hi Llc Integrated magnetometer arrays for magnetoencephalography (meg) detection systems and methods
US11269027B2 (en) 2019-04-23 2022-03-08 Hi Llc Compact optically pumped magnetometers with pump and probe configuration and systems and methods
US11839474B2 (en) 2019-05-31 2023-12-12 Hi Llc Magnetoencephalography (MEG) phantoms for simulating neural activity
US11131729B2 (en) 2019-06-21 2021-09-28 Hi Llc Systems and methods with angled input beams for an optically pumped magnetometer
US11415641B2 (en) 2019-07-12 2022-08-16 Hi Llc Detachable arrangement for on-scalp magnetoencephalography (MEG) calibration
US10996293B2 (en) 2019-08-06 2021-05-04 Hi Llc Systems and methods having an optical magnetometer array with beam splitters
WO2021045953A1 (en) 2019-09-03 2021-03-11 Hi Llc Methods and systems for fast field zeroing for magnetoencephalography (meg)
WO2021091867A1 (en) 2019-11-08 2021-05-14 Hi Llc Methods and systems for homogenous optically-pumped vapor cell array assembly from discrete vapor cells
US11835597B2 (en) * 2019-12-25 2023-12-05 Shimadzu Corporation Magnetic detection system, magnetic signal waveform pattern classification method, and waveform pattern distribution generation method for magnetic detection system
US11766217B2 (en) 2020-05-28 2023-09-26 Hi Llc Systems and methods for multimodal pose and motion tracking for magnetic field measurement or recording systems
WO2021242680A1 (en) 2020-05-28 2021-12-02 Hi Llc Systems and methods for recording neural activity
US11428756B2 (en) 2020-05-28 2022-08-30 Hi Llc Magnetic field measurement or recording systems with validation using optical tracking data
US11779250B2 (en) 2020-05-28 2023-10-10 Hi Llc Systems and methods for recording biomagnetic fields of the human heart
US11604237B2 (en) 2021-01-08 2023-03-14 Hi Llc Devices, systems, and methods with optical pumping magnetometers for three-axis magnetic field sensing
US11803018B2 (en) 2021-01-12 2023-10-31 Hi Llc Devices, systems, and methods with a piezoelectric-driven light intensity modulator
US12007454B2 (en) 2021-03-11 2024-06-11 Hi Llc Devices, systems, and methods for suppressing optical noise in optically pumped magnetometers
CN114601465B (zh) * 2022-03-09 2025-01-24 北京航空航天大学 一种小型双光束双通道的原子磁强计系统
JP2024106689A (ja) * 2023-01-27 2024-08-08 スミダコーポレーション株式会社 測定装置および測定方法
WO2024159233A1 (en) * 2023-01-27 2024-08-02 Government Of The United States Of America, As Represented By The Secretary Of Commerce Chronography system and method for performing redundant measurement of projectile velocity
KR102895993B1 (ko) * 2024-04-01 2025-12-04 주식회사 지성컴퍼니 전열교환기용 챔버에 연결되는 덕트 청소방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4327327A (en) * 1980-06-05 1982-04-27 The Singer Company All-angle gradient magnetometer
JP5178187B2 (ja) 2007-12-28 2013-04-10 キヤノン株式会社 原子磁気センサ、及び磁気センシング方法
JP5640335B2 (ja) * 2009-06-26 2014-12-17 セイコーエプソン株式会社 磁気センサー
JP2011137687A (ja) * 2009-12-28 2011-07-14 Seiko Epson Corp 磁気計測装置
JP5434735B2 (ja) * 2010-03-25 2014-03-05 セイコーエプソン株式会社 セルユニット、セルユニット群および磁場測定装置
JP2012154875A (ja) * 2011-01-28 2012-08-16 Seiko Epson Corp 磁場測定装置および容器
JP5799553B2 (ja) * 2011-04-01 2015-10-28 セイコーエプソン株式会社 磁場測定装置、磁場測定システムおよび磁場測定方法
JP5849640B2 (ja) 2011-11-21 2016-01-27 セイコーエプソン株式会社 磁場測定装置
JP6459167B2 (ja) * 2013-11-27 2019-01-30 セイコーエプソン株式会社 磁場測定装置および磁場測定方法
US10254356B2 (en) * 2014-12-02 2019-04-09 Seiko Epson Corporation Magnetic field measurement method and magnetic field measurement apparatus
JP6825237B2 (ja) * 2016-06-14 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法

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US20170363695A1 (en) 2017-12-21
US10444300B2 (en) 2019-10-15

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