JP6813162B2 - モアレ法による高速変位・ひずみ分布測定方法及び測定装置 - Google Patents

モアレ法による高速変位・ひずみ分布測定方法及び測定装置 Download PDF

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JP6813162B2
JP6813162B2 JP2016028169A JP2016028169A JP6813162B2 JP 6813162 B2 JP6813162 B2 JP 6813162B2 JP 2016028169 A JP2016028169 A JP 2016028169A JP 2016028169 A JP2016028169 A JP 2016028169A JP 6813162 B2 JP6813162 B2 JP 6813162B2
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scanning
sample
moire
pitch
displacement
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JP2017146202A (ja
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慶華 王
慶華 王
志遠 李
志遠 李
時崎　高志
高志 時崎
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National Institute of Advanced Industrial Science and Technology AIST
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JP2016028169A 2016-02-17 2016-02-17 モアレ法による高速変位・ひずみ分布測定方法及び測定装置 Active JP6813162B2 (ja)

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JP6583761B2 (ja) 2016-09-27 2019-10-02 国立研究開発法人産業技術総合研究所 周期模様を利用した三次元形状・変位・ひずみ測定装置、方法およびそのプログラム
CN108196091B (zh) * 2018-03-30 2024-01-26 南京邮电大学 基于cmos的光电加速度传感器
CN108469443A (zh) * 2018-04-18 2018-08-31 北京航空航天大学 基于二维错位吸收光栅的x射线光栅差分相位衬度成像方法及装置
CN110068284B (zh) * 2019-05-20 2020-10-30 北京建筑大学 利用高速摄影测量技术监测塔式起重机的方法
CN110398201B (zh) * 2019-08-06 2021-08-06 湖南大学 一种联合数字图像相关技术和莫尔抽样法的位移测量方法
CN111325718B (zh) * 2020-01-23 2023-07-25 深圳大学 应变模态分析方法及相关装置
CN113720268B (zh) * 2021-08-03 2022-10-25 西安交通大学 基于光强原理测量应变的数码云纹方法、系统、设备及存储介质
KR20230069545A (ko) 2021-11-12 2023-05-19 삼성전자주식회사 무아레 패턴을 이용한 반도체 장치의 제조 방법

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