JP6812224B2 - 基板処理装置及び載置台 - Google Patents
基板処理装置及び載置台 Download PDFInfo
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- 238000012545 processing Methods 0.000 title claims description 75
- 238000003780 insertion Methods 0.000 claims description 52
- 230000037431 insertion Effects 0.000 claims description 52
- 238000012546 transfer Methods 0.000 claims description 38
- 230000002093 peripheral effect Effects 0.000 claims description 34
- 239000003507 refrigerant Substances 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 8
- 239000007789 gas Substances 0.000 description 36
- 238000005530 etching Methods 0.000 description 16
- 239000012212 insulator Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
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- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/002—Cooling arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
- H01J2237/3343—Problems associated with etching
- H01J2237/3344—Problems associated with etching isotropy
Description
図1は、第1の実施形態にかかるプラズマ処理装置100の概略構成を示す縦断面図である。ここでは、基板処理装置を1つの平行平板型のプラズマ処理装置100で構成した場合を例に挙げる。
第2の実施形態の特徴は、基台とフォーカスリングとの間に発熱部材を配置することで、フォーカスリングの温度の均一性を向上する点である。
第3の実施形態の特徴は、フォーカスリングの下部にリフタピンが嵌合される孔を形成することで、フォーカスリングを位置決めする点である。
102 処理容器
110 載置台
112 絶縁体
112a ネジ孔
114 基台
115 載置領域
116 外周領域
116a 挿入孔
117 冷媒流路
120 静電チャック
124 フォーカスリング
124a 穴
126 伝熱シート
126a 貫通孔
127 ネジ部材
127a 貫通孔
128 発熱部材
130 上部電極
131 絶縁性遮蔽部材
132 電極板
134 電極支持体
135 ガス拡散室
136 ガス吐出孔
137 電極支持体温調部
138 温度調節媒体室
140 処理ガス供給部
142 処理ガス供給源
150 第1高周波電源
160 第2高周波電源
172、182 リフタピン
400 制御部
410 操作部
420 記憶部
Claims (11)
- 処理容器と、
前記処理容器内に設けられた、被処理体が載置される載置領域と、前記載置領域の周囲に形成されてフォーカスリングが載置される外周領域とを有する基台と、
前記処理容器の底部に配置され、第1の貫通孔が形成され、前記基台を支持する支持部材と、
前記基台の外周領域に形成された挿入孔に挿入されて前記第1の貫通孔と螺合することにより前記基台と前記支持部材とを連結する、前記第1の貫通孔と連通する第2の貫通孔が形成された連結部材と、
前記第1の貫通孔及び前記第2の貫通孔に挿入されて前記挿入孔から突出自在に設けられ、前記挿入孔から突出して前記フォーカスリングを上昇させるリフタピンと
を有することを特徴とする基板処理装置。 - 前記フォーカスリングは、貫通孔が形成された伸縮性の伝熱部材を介して、前記基台の外周領域に載置され、
前記リフタピンは、前記挿入孔から突出して前記フォーカスリングを上昇させる場合に、前記伝熱部材の前記貫通孔を通過して前記フォーカスリングの下部に当接し、
前記伝熱部材は、前記フォーカスリングの上昇に伴って、前記基台と前記フォーカスリングとの間の隙間を埋めるように伸長することを特徴とする請求項1に記載の基板処理装置。 - 前記基台と前記フォーカスリングとの間に配置され、前記基台の外周領域のうち、前記挿入孔を除く領域を覆う発熱部材をさらに有することを特徴とする請求項1又は2に記載の基板処理装置。
- 前記フォーカスリングの下部には、有底状の穴が形成され、
前記リフタピンは、前記有底状の穴に嵌合されることを特徴とする請求項1〜3のいずれか一つに記載の基板処理装置。 - 前記基台の内部に形成され、冷媒を通流させる冷媒流路をさらに有することを特徴とする請求項1〜4のいずれか一つに記載の基板処理装置。
- 前記処理容器の底部に、前記第1の貫通孔及び前記第2の貫通孔と連通する第3の貫通孔が形成され、
前記リフタピンは、前記第1の貫通孔、前記第2の貫通孔及び前記第3の貫通孔に挿入されることを特徴とする請求項1〜5のいずれか一つに記載の基板処理装置。 - 被処理体が載置される載置領域と、前記載置領域の周囲に形成されてフォーカスリングが載置される外周領域とを有する基台と、
前記基台の外周領域に形成された挿入孔に挿入されて前記基台を前記基台の下方の部材に連結する、貫通孔が形成された連結部材と、
前記連結部材の前記貫通孔に挿入されて前記挿入孔から突出自在に前記基台に設けられ、前記挿入孔から突出して前記フォーカスリングを上昇させるリフタピンと
を有し、
前記フォーカスリングは、貫通孔が形成された伸縮性の伝熱部材を介して、前記基台の外周領域に載置され、
前記リフタピンは、前記挿入孔から突出して前記フォーカスリングを上昇させる場合に、前記伝熱部材の前記貫通孔を通過して前記フォーカスリングの下部に当接し、
前記伝熱部材は、前記フォーカスリングの上昇に伴って、前記基台と前記フォーカスリングとの間の隙間を埋めるように伸長することを特徴とする載置台。 - 前記基台と前記フォーカスリングとの間に配置され、前記基台の外周領域のうち、前記挿入孔を除く領域を覆う発熱部材をさらに有することを特徴とする請求項7に記載の載置台。
- 前記フォーカスリングの下部には、有底状の穴が形成され、
前記リフタピンは、前記有底状の穴に嵌合されることを特徴とする請求項7又は8に記載の載置台。 - 前記基台の内部に形成され、冷媒を通流させる冷媒流路をさらに有することを特徴とする請求項7〜9のいずれか一つに記載の載置台。
- 請求項7〜10のいずれか一つに記載の載置台を有する基板処理装置。
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JP2016238399A JP6812224B2 (ja) | 2016-12-08 | 2016-12-08 | 基板処理装置及び載置台 |
TW106142478A TWI766908B (zh) | 2016-12-08 | 2017-12-05 | 載置台及電漿處理裝置 |
US15/833,060 US20180166259A1 (en) | 2016-12-08 | 2017-12-06 | Mounting table and plasma processing apparatus |
KR1020170166630A KR102432446B1 (ko) | 2016-12-08 | 2017-12-06 | 배치대 및 플라즈마 처리 장치 |
CN201711284031.4A CN108183058B (zh) | 2016-12-08 | 2017-12-07 | 载置台和等离子体处理装置 |
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US9947517B1 (en) | 2016-12-16 | 2018-04-17 | Applied Materials, Inc. | Adjustable extended electrode for edge uniformity control |
US10553404B2 (en) | 2017-02-01 | 2020-02-04 | Applied Materials, Inc. | Adjustable extended electrode for edge uniformity control |
US11004722B2 (en) | 2017-07-20 | 2021-05-11 | Applied Materials, Inc. | Lift pin assembly |
US11075105B2 (en) | 2017-09-21 | 2021-07-27 | Applied Materials, Inc. | In-situ apparatus for semiconductor process module |
US10535549B2 (en) | 2017-10-27 | 2020-01-14 | Applied Materials, Inc. | Lift pin holder |
US11043400B2 (en) | 2017-12-21 | 2021-06-22 | Applied Materials, Inc. | Movable and removable process kit |
US11201037B2 (en) | 2018-05-28 | 2021-12-14 | Applied Materials, Inc. | Process kit with adjustable tuning ring for edge uniformity control |
US11935773B2 (en) | 2018-06-14 | 2024-03-19 | Applied Materials, Inc. | Calibration jig and calibration method |
CN111312633A (zh) * | 2018-07-27 | 2020-06-19 | 上海华力集成电路制造有限公司 | 硅刻蚀机及其操作方法 |
CN109192696B (zh) * | 2018-08-10 | 2021-06-08 | 北京北方华创微电子装备有限公司 | 升降针系统、真空反应腔室以及半导体加工设备 |
KR20200066537A (ko) * | 2018-08-13 | 2020-06-10 | 램 리써치 코포레이션 | 에지 링 포지셔닝 및 센터링 피처들을 포함하는 플라즈마 시스 튜닝을 위한 교체가능한 에지 링 어셈블리 및/또는 접을 수 있는 에지 링 어셈블리 |
JP7076351B2 (ja) * | 2018-10-03 | 2022-05-27 | 東京エレクトロン株式会社 | プラズマ処理装置、及びリング部材の厚さ測定方法 |
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KR20180065932A (ko) | 2018-06-18 |
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US20180166259A1 (en) | 2018-06-14 |
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