JP6790008B2 - 検出素子および検出器 - Google Patents
検出素子および検出器 Download PDFInfo
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- 230000000052 comparative effect Effects 0.000 description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 7
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- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 6
- 230000005684 electric field Effects 0.000 description 5
- 229910003472 fullerene Inorganic materials 0.000 description 5
- 239000011368 organic material Substances 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
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- -1 polyphenylene vinylene Polymers 0.000 description 4
- 229920000301 poly(3-hexylthiophene-2,5-diyl) polymer Polymers 0.000 description 3
- 229920000553 poly(phenylenevinylene) Polymers 0.000 description 3
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000002041 carbon nanotube Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910021389 graphene Inorganic materials 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000002861 polymer material Substances 0.000 description 2
- 229920000123 polythiophene Polymers 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- MCEWYIDBDVPMES-UHFFFAOYSA-N [60]pcbm Chemical compound C123C(C4=C5C6=C7C8=C9C%10=C%11C%12=C%13C%14=C%15C%16=C%17C%18=C(C=%19C=%20C%18=C%18C%16=C%13C%13=C%11C9=C9C7=C(C=%20C9=C%13%18)C(C7=%19)=C96)C6=C%11C%17=C%15C%13=C%15C%14=C%12C%12=C%10C%10=C85)=C9C7=C6C2=C%11C%13=C2C%15=C%12C%10=C4C23C1(CCCC(=O)OC)C1=CC=CC=C1 MCEWYIDBDVPMES-UHFFFAOYSA-N 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 229920000109 alkoxy-substituted poly(p-phenylene vinylene) Polymers 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000005250 beta ray Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
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- 239000000539 dimer Substances 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
- H10K30/82—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes
- H10K30/821—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes comprising carbon nanotubes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/10—Organic photovoltaic [PV] modules; Arrays of single organic PV cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/30—Devices controlled by radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/242—Stacked detectors, e.g. for depth information
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/451—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising a metal-semiconductor-metal [m-s-m] structure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
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- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
- Electromagnetism (AREA)
- Light Receiving Elements (AREA)
- Measurement Of Radiation (AREA)
Description
図1は、本実施の形態の検出器30の一例を示す模式図である。
次に、検出器30の作製方法を説明する。検出器30の作製方法は限定されない。例えば、検出器30は、以下の手順で作製する。
なお、上記実施の形態では、第3電極20は、有機変換層16内における面方向Xの全領域に渡って配置された、シート状である形態を一例として説明した。
なお、本実施の形態では、第1電極12および第2電極14が、1層のシート状である場合を一例として説明した。しかし、第1電極12および第2電極14の少なくとも一方は、有機変換層16の厚み方向における位置が互いに異なる、複数の電極層から構成されていてもよい。
本実施の形態では、上記実施の形態の検出素子10が、更に第4電極を備えた構成を説明する。
12 第1電極
14 第2電極
16 有機変換層
20 第3電極
Q 貫通孔
15、15A、15B 第4電極
22 電圧印加部
24 検出部
30、31、50 検出器
Claims (10)
- 第1電極と、
第2電極と、
前記第1電極と前記第2電極との間に配置され、放射線のエネルギーを電荷に変換する有機変換層と、
前記有機変換層内に設けられ、バイアスが印加される第3電極と、を備え、
前記第1電極および前記第2電極は、接地されている、
検出素子。 - 前記第1電極および前記第2電極の電位は、前記第3電極との間に電位差を有する、
請求項1に記載の検出素子。 - 前記第1電極、前記第2電極、および前記第3電極の少なくとも一つは、前記有機変換層の厚み方向に貫通する貫通孔を有する、
請求項1または2に記載の検出素子。 - 第1電極と、
第2電極と、
前記第1電極と前記第2電極との間に配置され、放射線のエネルギーを電荷に変換する有機変換層と、
前記有機変換層内に設けられ、バイアスが印加される第3電極と、を備え、
前記第1電極、前記第2電極、および前記第3電極の少なくとも一つは、導電性炭素材料からなる、
検出素子。 - 第1電極と、
第2電極と、
前記第1電極と前記第2電極との間に配置され、放射線のエネルギーを電荷に変換する有機変換層と、
前記有機変換層内に設けられ、バイアスが印加される第3電極と、
前記有機変換層における、前記第1電極および前記第2電極の対向方向に対して交差する方向の少なくとも一端部側に配置され、前記第3電極より電位の低い第4電極と、
を備える検出素子。 - 前記第4電極は、前記対向方向に延伸され、前記対向方向の端部が、前記第1電極および前記第2電極の少なくとも一方に接続されてなる、
請求項5に記載の検出素子。 - 第1電極と、
第2電極と、
前記第1電極と前記第2電極との間に配置され、放射線のエネルギーを電荷に変換する有機変換層と、
前記有機変換層内に設けられ、バイアスが印加される第3電極と、を備え、
前記第1電極および前記第2電極は、前記有機変換層を該有機変換層の厚み方向に挟むように配置され、
前記第1電極および前記第2電極の少なくとも一方は、前記厚み方向の位置の異なる複数の電極層から構成され、
複数の前記電極層は、前記第3電極から離れるほど電位差が大きい、
検出素子。 - 前記放射線は、β線である、請求項1〜請求項7の何れか1項に記載の検出素子。
- 前記第3電極より電位の低い2つの第4電極をさらに備え、
前記2つの第4電極の一方は、前記有機変換層における、前記第1電極および前記第2電極の対向方向に対して交差する方向の一方の端部側に配置され、
前記2つの第4電極の他方は、前記有機変換層における、前記対向方向に対して交差する方向の他方の端部側に配置され、
前記2つの第4電極それぞれの前記対向方向の端部の一方は、前記第1電極に接続され、
前記2つの第4電極それぞれの前記対向方向の端部の他方は、前記第2電極に接続される、
請求項1に記載の検出素子。 - 請求項1〜請求項9の何れか1項に記載の検出素子と、
前記第3電極にバイアスを印加する電圧印加部と、
前記第3電極から出力される出力信号を検出する検出部と、
を備える、検出器。
Priority Applications (2)
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JP2018046594A JP6790008B2 (ja) | 2018-03-14 | 2018-03-14 | 検出素子および検出器 |
US16/123,332 US11125895B2 (en) | 2018-03-14 | 2018-09-06 | Detection element and detector |
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JP2018046594A JP6790008B2 (ja) | 2018-03-14 | 2018-03-14 | 検出素子および検出器 |
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JP2019161043A JP2019161043A (ja) | 2019-09-19 |
JP6790008B2 true JP6790008B2 (ja) | 2020-11-25 |
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JP (1) | JP6790008B2 (ja) |
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JP2022135295A (ja) | 2021-03-05 | 2022-09-15 | 株式会社東芝 | 放射線検出器 |
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