JP6729323B2 - 異常判定装置 - Google Patents
異常判定装置 Download PDFInfo
- Publication number
- JP6729323B2 JP6729323B2 JP2016227640A JP2016227640A JP6729323B2 JP 6729323 B2 JP6729323 B2 JP 6729323B2 JP 2016227640 A JP2016227640 A JP 2016227640A JP 2016227640 A JP2016227640 A JP 2016227640A JP 6729323 B2 JP6729323 B2 JP 6729323B2
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- JP
- Japan
- Prior art keywords
- abnormality
- detection circuit
- abnormality detection
- ecu
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005856 abnormality Effects 0.000 claims description 126
- 238000001514 detection method Methods 0.000 claims description 64
- 238000005476 soldering Methods 0.000 claims description 4
- 239000000758 substrate Substances 0.000 description 20
- 229910000679 solder Inorganic materials 0.000 description 17
- 238000003860 storage Methods 0.000 description 15
- 238000006243 chemical reaction Methods 0.000 description 10
- 239000003507 refrigerant Substances 0.000 description 7
- 239000002826 coolant Substances 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 5
- 238000009499 grossing Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 230000008646 thermal stress Effects 0.000 description 2
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Images
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Emergency Alarm Devices (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
Claims (1)
- はんだにより基板上に実装された電子部品を含むと共に対象となる電子回路の異常を検知して異常発生信号を出力する異常検出回路の異常の有無を判定する異常判定装置であって、
前記異常検出回路の温度が所定温度範囲内に含まれる状態で該異常検出回路から前記異常発生信号の出力継続時間よりも短いパルス幅のパルスを複数回入力した際に、故障に繋がるおそれのある一時的な異常が前記異常検出回路に発生したと判定して警告を発生することを特徴とする異常判定装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016227640A JP6729323B2 (ja) | 2016-11-24 | 2016-11-24 | 異常判定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016227640A JP6729323B2 (ja) | 2016-11-24 | 2016-11-24 | 異常判定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018084486A JP2018084486A (ja) | 2018-05-31 |
JP6729323B2 true JP6729323B2 (ja) | 2020-07-22 |
Family
ID=62237586
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016227640A Expired - Fee Related JP6729323B2 (ja) | 2016-11-24 | 2016-11-24 | 異常判定装置 |
Country Status (1)
Country | Link |
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JP (1) | JP6729323B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112858948A (zh) * | 2021-01-11 | 2021-05-28 | 湖北三鑫金铜股份有限公司 | 电气线路瞬时接触不良故障检测电路 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3721363B2 (ja) * | 2003-01-08 | 2005-11-30 | 株式会社日立製作所 | 負荷駆動用ic |
JP4581930B2 (ja) * | 2005-09-09 | 2010-11-17 | 富士電機システムズ株式会社 | 電力用半導体素子の異常検出装置 |
JP5830458B2 (ja) * | 2012-12-04 | 2015-12-09 | 日立オートモティブシステムズ株式会社 | 電子制御装置 |
JP2015076719A (ja) * | 2013-10-09 | 2015-04-20 | 住友電気工業株式会社 | 内部回路の断線の検出が可能な光送信装置 |
US9377504B2 (en) * | 2014-03-27 | 2016-06-28 | Freescale Semiconductor, Inc. | Integrated circuit interconnect crack monitor circuit |
-
2016
- 2016-11-24 JP JP2016227640A patent/JP6729323B2/ja not_active Expired - Fee Related
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JP2018084486A (ja) | 2018-05-31 |
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