JP6712804B2 - 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 - Google Patents
磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 Download PDFInfo
- Publication number
- JP6712804B2 JP6712804B2 JP2016225281A JP2016225281A JP6712804B2 JP 6712804 B2 JP6712804 B2 JP 6712804B2 JP 2016225281 A JP2016225281 A JP 2016225281A JP 2016225281 A JP2016225281 A JP 2016225281A JP 6712804 B2 JP6712804 B2 JP 6712804B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic
- thin film
- skyrmion
- electrode
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/20—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors
- H10B61/22—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having three or more electrodes, e.g. transistors of the field-effect transistor [FET] type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1675—Writing or programming circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/40—Devices controlled by magnetic fields
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016225281A JP6712804B2 (ja) | 2016-11-18 | 2016-11-18 | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 |
| PCT/JP2017/039829 WO2018092610A1 (ja) | 2016-11-18 | 2017-11-02 | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 |
| KR1020197014368A KR102255871B1 (ko) | 2016-11-18 | 2017-11-02 | 자기 소자, 스커미온 메모리, 스커미온 메모리가 장착된 중앙 처리 lsi, 데이터 기록 장치, 데이터 처리 장치, 및 데이터 통신 장치 |
| US16/416,317 US10658426B2 (en) | 2016-11-18 | 2019-05-20 | Magnetic element, skyrmion memory, skyrmion memory-mounted central processing LSI, data recording apparatus, data processing apparatus, and data communication apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016225281A JP6712804B2 (ja) | 2016-11-18 | 2016-11-18 | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018082124A JP2018082124A (ja) | 2018-05-24 |
| JP2018082124A5 JP2018082124A5 (enExample) | 2019-07-11 |
| JP6712804B2 true JP6712804B2 (ja) | 2020-06-24 |
Family
ID=62146595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016225281A Active JP6712804B2 (ja) | 2016-11-18 | 2016-11-18 | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10658426B2 (enExample) |
| JP (1) | JP6712804B2 (enExample) |
| KR (1) | KR102255871B1 (enExample) |
| WO (1) | WO2018092610A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7149191B2 (ja) * | 2019-01-16 | 2022-10-06 | 株式会社アルバック | CoZnMn膜の形成方法、および、CoZnMnターゲット |
| JP2021033579A (ja) * | 2019-08-22 | 2021-03-01 | 国立大学法人大阪大学 | 演算装置 |
| JP7586694B2 (ja) * | 2020-12-01 | 2024-11-19 | Tdk株式会社 | 磁気アレイ |
| US11793002B2 (en) * | 2021-05-05 | 2023-10-17 | International Business Machines Corporation | Resistive memory device with magnetic layer having topological spin textures for tuning |
| KR102517665B1 (ko) * | 2021-07-05 | 2023-04-05 | 한국표준과학연구원 | 스커미온 생성, 소거 및 이동 장치 |
| CN116820390A (zh) * | 2022-03-21 | 2023-09-29 | 中电海康集团有限公司 | 一种存算器件、计数器、移位累加器和存内乘加结构 |
| CN115527576A (zh) * | 2022-08-30 | 2022-12-27 | 香港中文大学(深圳) | 一种基于磁隧道结产生及擦除单个斯格明子的方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3980990B2 (ja) * | 2002-10-31 | 2007-09-26 | 株式会社東芝 | 磁気メモリ |
| FR2963152B1 (fr) * | 2010-07-26 | 2013-03-29 | Centre Nat Rech Scient | Element de memoire magnetique |
| US8897061B2 (en) | 2012-01-30 | 2014-11-25 | Quantumag Consultancy Corp. | MTJ cell for an MRAM device and a manufacturing method thereof |
| SE538342C2 (sv) * | 2014-04-09 | 2016-05-24 | Nanosc Ab | Spinnoscillator-anordning |
| JP6677944B2 (ja) * | 2014-07-04 | 2020-04-08 | 国立研究開発法人理化学研究所 | 磁気素子、スキルミオンメモリ、固体電子デバイス、データ記録装置、データ処理装置および通信装置 |
| JP6450389B2 (ja) * | 2014-08-07 | 2019-01-09 | 国立研究開発法人理化学研究所 | 磁気記憶媒体およびデータ記録装置 |
| JP6637427B2 (ja) * | 2014-09-02 | 2020-01-29 | 国立研究開発法人理化学研究所 | 磁気素子、スキルミオンメモリ、スキルミオンメモリデバイス、固体電子デバイス、データ記録装置、データ処理装置およびデータ通信装置 |
| JP2016052697A (ja) | 2014-09-03 | 2016-04-14 | インターマン株式会社 | 人型ロボット |
| EP3196944B1 (en) * | 2014-09-04 | 2021-05-05 | Riken | Magnetic element and skyrmion memory |
| FR3025655B1 (fr) * | 2014-09-09 | 2016-10-14 | Thales Sa | Systeme de generation de skyrmions |
| JP6674899B2 (ja) | 2014-10-28 | 2020-04-01 | 国立研究開発法人理化学研究所 | 磁気素子、スキルミオンメモリ、スキルミオンメモリデバイス、スキルミオンメモリ搭載固体電子デバイス、データ記録装置、データ処理装置および通信装置 |
| KR101878418B1 (ko) * | 2014-11-06 | 2018-07-13 | 고쿠리쓰 겐큐 가이하쓰 호징 리가가쿠 겐큐소 | 자기 소자, 스커미온 메모리, 스커미온 메모리 탑재 고체 전자 장치, 데이터 기록 장치, 데이터 처리 장치 및 통신 장치 |
| JP6721902B2 (ja) * | 2014-11-27 | 2020-07-15 | 国立研究開発法人理化学研究所 | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載固体電子デバイス、データ記録装置、データ処理装置及び通信装置 |
| WO2017024253A1 (en) * | 2015-08-05 | 2017-02-09 | The Regents Of The University Of California | Ground state artificial skyrmion lattices at room temperature |
| JP5985728B1 (ja) | 2015-09-15 | 2016-09-06 | 株式会社東芝 | 磁気メモリ |
| US10593389B2 (en) * | 2016-03-01 | 2020-03-17 | Virginia Commonwealth University | Switching skyrmions with VCMA/electric field for memory, computing and information processing |
| JP6206688B2 (ja) * | 2016-05-11 | 2017-10-04 | セイコーエプソン株式会社 | 熱サイクル装置 |
| KR101963482B1 (ko) * | 2016-10-20 | 2019-03-28 | 고려대학교 산학협력단 | 자기 터널 접합 소자 및 자기 메모리 소자 |
| WO2018204755A1 (en) * | 2017-05-04 | 2018-11-08 | Massachusetts Institute Of Technology | Methods and apparatus for making magnetic skyrmions |
-
2016
- 2016-11-18 JP JP2016225281A patent/JP6712804B2/ja active Active
-
2017
- 2017-11-02 KR KR1020197014368A patent/KR102255871B1/ko active Active
- 2017-11-02 WO PCT/JP2017/039829 patent/WO2018092610A1/ja not_active Ceased
-
2019
- 2019-05-20 US US16/416,317 patent/US10658426B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20190267427A1 (en) | 2019-08-29 |
| KR20190065441A (ko) | 2019-06-11 |
| US10658426B2 (en) | 2020-05-19 |
| KR102255871B1 (ko) | 2021-05-24 |
| JP2018082124A (ja) | 2018-05-24 |
| WO2018092610A1 (ja) | 2018-05-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6712804B2 (ja) | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 | |
| US6633498B1 (en) | Magnetoresistive random access memory with reduced switching field | |
| US10141068B2 (en) | Magnetic element, skyrmion memory, skyrmion memory-device, solid-state electronic device, data-storage device, data processing and communication device | |
| US8514615B2 (en) | Structures and methods for a field-reset spin-torque MRAM | |
| KR102099068B1 (ko) | 자기 소자, 스커미온 메모리, 스커미온 메모리 장치, 스커미온 메모리 탑재 고체 전자 장치, 데이터 기록 장치, 데이터 처리 장치 및 통신 장치 | |
| US9129692B1 (en) | High density magnetic random access memory | |
| JP6637429B2 (ja) | 磁気素子、スキルミオンメモリ、スキルミオンメモリデバイス、スキルミオンメモリ搭載固体電子デバイス、データ記録装置、データ処理装置および通信装置 | |
| JP2007503670A (ja) | 多状態磁気ランダムアクセスメモリセル | |
| US10170689B2 (en) | Semiconductor device | |
| WO2018092611A1 (ja) | 磁気素子、スキルミオンメモリ、スキルミオンメモリ搭載中央演算処理lsi、データ記録装置、データ処理装置およびデータ通信装置 | |
| US9620189B2 (en) | Magnetic memory | |
| JP6436348B2 (ja) | 磁気素子、スキルミオンメモリ、スキルミオンメモリデバイス、データ処理装置、スキルミオンメモリ搭載固体電子デバイス、データ記録装置、データ処理装置及びデータ通信装置 | |
| US10375698B2 (en) | Memory system | |
| US7206223B1 (en) | MRAM memory with residual write field reset | |
| CN120379516B (zh) | 磁性随机存储单元、存储器及数据写入方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190531 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190531 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20191029 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20191204 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20200421 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20200519 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 6712804 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |