JP6625995B2 - 改善した半導体放射線検出器 - Google Patents
改善した半導体放射線検出器 Download PDFInfo
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- JP6625995B2 JP6625995B2 JP2016551053A JP2016551053A JP6625995B2 JP 6625995 B2 JP6625995 B2 JP 6625995B2 JP 2016551053 A JP2016551053 A JP 2016551053A JP 2016551053 A JP2016551053 A JP 2016551053A JP 6625995 B2 JP6625995 B2 JP 6625995B2
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- gate
- pixel
- doping
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8033—Photosensitive area
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
- H10F39/80377—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor characterised by the channel of the transistor, e.g. channel having a doping gradient
Landscapes
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Light Receiving Elements (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20130320 | 2013-11-04 | ||
| FI20130320 | 2013-11-04 | ||
| FI20136170 | 2013-11-22 | ||
| FI20136170 | 2013-11-22 | ||
| PCT/FI2014/050826 WO2015063375A2 (en) | 2013-11-04 | 2014-11-04 | Improved semiconductor radiation detector |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019214430A Division JP6849777B2 (ja) | 2013-11-04 | 2019-11-27 | 改善した半導体放射線検出器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016536809A JP2016536809A (ja) | 2016-11-24 |
| JP2016536809A5 JP2016536809A5 (enExample) | 2017-01-05 |
| JP6625995B2 true JP6625995B2 (ja) | 2019-12-25 |
Family
ID=52014132
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016551053A Active JP6625995B2 (ja) | 2013-11-04 | 2014-11-04 | 改善した半導体放射線検出器 |
| JP2019214430A Active JP6849777B2 (ja) | 2013-11-04 | 2019-11-27 | 改善した半導体放射線検出器 |
| JP2021033437A Active JP7078769B2 (ja) | 2013-11-04 | 2021-03-03 | 改善した半導体放射線検出器 |
| JP2022080294A Active JP7441267B2 (ja) | 2013-11-04 | 2022-05-16 | 改善した半導体放射線検出器 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019214430A Active JP6849777B2 (ja) | 2013-11-04 | 2019-11-27 | 改善した半導体放射線検出器 |
| JP2021033437A Active JP7078769B2 (ja) | 2013-11-04 | 2021-03-03 | 改善した半導体放射線検出器 |
| JP2022080294A Active JP7441267B2 (ja) | 2013-11-04 | 2022-05-16 | 改善した半導体放射線検出器 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | USRE49704E1 (enExample) |
| EP (2) | EP3066689B1 (enExample) |
| JP (4) | JP6625995B2 (enExample) |
| CN (1) | CN105849908B (enExample) |
| WO (1) | WO2015063375A2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11251217B2 (en) * | 2019-04-17 | 2022-02-15 | ActLight SA | Photodetector sensor arrays |
| DE102019206494A1 (de) | 2019-05-06 | 2020-11-12 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | DEPFET-Transistor und Verfahren zur Herstellung eines DEPFET- Transistors |
| EP3998641A4 (en) | 2019-07-12 | 2022-09-07 | Sony Semiconductor Solutions Corporation | LIGHT DETECTION DEVICE |
| FR3105409B1 (fr) * | 2019-12-19 | 2021-12-17 | Commissariat Energie Atomique | Composant de détection de rayonnement électromagnétique à haute sensibilité et procédé de fabrication d’un tel composant |
| CN111403428B (zh) * | 2020-03-23 | 2025-03-28 | 佛山眼图科技有限公司 | 光电传感器、可随机读取有源像素电路、图像传感器和相机装置 |
| US11735677B2 (en) | 2020-07-20 | 2023-08-22 | ActLight SA | Photodetectors and photodetector arrays |
| US12474453B2 (en) | 2022-01-20 | 2025-11-18 | ActLight SA | Control techniques for photodetector systems |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20010054723A1 (en) * | 2000-03-17 | 2001-12-27 | Tadashi Narui | Image sensor, method of fabricating the same, and exposure apparatus, measuring device, alignment device, and aberration measuring device using the image sensor |
| US6906793B2 (en) | 2000-12-11 | 2005-06-14 | Canesta, Inc. | Methods and devices for charge management for three-dimensional sensing |
| JP2004274009A (ja) | 2003-03-06 | 2004-09-30 | Takeshi Aoki | パンチスルー現象の発生を抑制する、二段式ゲート電極を有するmosfet |
| AU2005273818B2 (en) | 2004-08-20 | 2010-09-23 | Artto Aurola | Semiconductor radiation detector with a modified internal gate structure |
| WO2006018470A1 (en) | 2004-08-20 | 2006-02-23 | Artto Aurola | Semiconductor radiation detector with a modified internal gate structure |
| US7781811B2 (en) | 2005-08-30 | 2010-08-24 | National University Corporation Shizuoka University | Semiconductor range-finding element and solid-state imaging device |
| JP2007103578A (ja) * | 2005-10-03 | 2007-04-19 | Canon Inc | 光電変換装置及び放射線検出装置 |
| US8148760B2 (en) | 2006-01-05 | 2012-04-03 | Artto Aurola | Visible light detecting semiconductor radiation detector |
| WO2007077286A1 (en) | 2006-01-05 | 2007-07-12 | Artto Aurola | Semiconductor radiation detector detecting visible light |
| JP4212623B2 (ja) | 2006-01-31 | 2009-01-21 | 三洋電機株式会社 | 撮像装置 |
| JP5167799B2 (ja) | 2007-12-18 | 2013-03-21 | ソニー株式会社 | 固体撮像装置およびカメラ |
| US8035806B2 (en) | 2008-05-13 | 2011-10-11 | Samsung Electronics Co., Ltd. | Distance measuring sensor including double transfer gate and three dimensional color image sensor including the distance measuring sensor |
| JP5458690B2 (ja) | 2009-06-22 | 2014-04-02 | ソニー株式会社 | 固体撮像装置およびカメラ |
| JP2012190951A (ja) | 2011-03-10 | 2012-10-04 | Sony Corp | 固体撮像装置およびカメラ |
| JP5780025B2 (ja) | 2011-07-11 | 2015-09-16 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法、及び電子機器 |
-
2014
- 2014-11-04 EP EP14809062.4A patent/EP3066689B1/en active Active
- 2014-11-04 JP JP2016551053A patent/JP6625995B2/ja active Active
- 2014-11-04 US US17/022,935 patent/USRE49704E1/en active Active
- 2014-11-04 CN CN201480068356.7A patent/CN105849908B/zh active Active
- 2014-11-04 WO PCT/FI2014/050826 patent/WO2015063375A2/en not_active Ceased
- 2014-11-04 US US15/033,743 patent/US10079325B2/en not_active Ceased
- 2014-11-04 EP EP20181857.2A patent/EP3761363A1/en active Pending
-
2019
- 2019-11-27 JP JP2019214430A patent/JP6849777B2/ja active Active
-
2021
- 2021-03-03 JP JP2021033437A patent/JP7078769B2/ja active Active
-
2022
- 2022-05-16 JP JP2022080294A patent/JP7441267B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2020043360A (ja) | 2020-03-19 |
| EP3761363A1 (en) | 2021-01-06 |
| JP7441267B2 (ja) | 2024-02-29 |
| JP2021103779A (ja) | 2021-07-15 |
| WO2015063375A3 (en) | 2015-06-25 |
| JP6849777B2 (ja) | 2021-03-31 |
| EP3066689B1 (en) | 2020-07-08 |
| EP3066689A2 (en) | 2016-09-14 |
| CN105849908B (zh) | 2019-05-07 |
| US10079325B2 (en) | 2018-09-18 |
| USRE49704E1 (en) | 2023-10-17 |
| JP7078769B2 (ja) | 2022-05-31 |
| JP2022105602A (ja) | 2022-07-14 |
| WO2015063375A9 (en) | 2015-09-24 |
| WO2015063375A2 (en) | 2015-05-07 |
| CN105849908A (zh) | 2016-08-10 |
| US20160240720A1 (en) | 2016-08-18 |
| JP2016536809A (ja) | 2016-11-24 |
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