JP6613988B2 - 放射線撮影システム - Google Patents

放射線撮影システム Download PDF

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Publication number
JP6613988B2
JP6613988B2 JP2016067145A JP2016067145A JP6613988B2 JP 6613988 B2 JP6613988 B2 JP 6613988B2 JP 2016067145 A JP2016067145 A JP 2016067145A JP 2016067145 A JP2016067145 A JP 2016067145A JP 6613988 B2 JP6613988 B2 JP 6613988B2
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Japan
Prior art keywords
image
grating
moire fringe
radiation
moire
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Japanese (ja)
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JP2017176399A5 (enExample
JP2017176399A (ja
Inventor
千穂 巻渕
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Konica Minolta Inc
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Konica Minolta Inc
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Priority to JP2016067145A priority Critical patent/JP6613988B2/ja
Priority to US15/467,467 priority patent/US11221303B2/en
Publication of JP2017176399A publication Critical patent/JP2017176399A/ja
Publication of JP2017176399A5 publication Critical patent/JP2017176399A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/064—Investigating materials by wave or particle radiation by diffraction, scatter or reflection interference of radiation, e.g. Borrmann effect
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2016067145A 2016-03-30 2016-03-30 放射線撮影システム Active JP6613988B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016067145A JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム
US15/467,467 US11221303B2 (en) 2016-03-30 2017-03-23 Radiation capturing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016067145A JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム

Publications (3)

Publication Number Publication Date
JP2017176399A JP2017176399A (ja) 2017-10-05
JP2017176399A5 JP2017176399A5 (enExample) 2018-09-06
JP6613988B2 true JP6613988B2 (ja) 2019-12-04

Family

ID=59960857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016067145A Active JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム

Country Status (2)

Country Link
US (1) US11221303B2 (enExample)
JP (1) JP6613988B2 (enExample)

Families Citing this family (7)

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CN108053469A (zh) * 2017-12-26 2018-05-18 清华大学 多视角相机下的复杂动态场景人体三维重建方法及装置
US11154270B2 (en) * 2018-01-19 2021-10-26 Shimadzu Corporation X-ray imaging apparatus
WO2020054158A1 (ja) * 2018-09-11 2020-03-19 株式会社島津製作所 Ｘ線位相撮像システム
EP3832690A1 (en) * 2019-12-05 2021-06-09 Koninklijke Philips N.V. Estimation of full-field scattering for dax imaging
JP7516901B2 (ja) * 2020-06-18 2024-07-17 コニカミノルタ株式会社 放射線撮影システム、放射線撮影制御装置及びプログラム
JP7578450B2 (ja) * 2020-10-07 2024-11-06 キヤノンメディカルシステムズ株式会社 核医学診断装置
WO2024203394A1 (ja) * 2023-03-28 2024-10-03 コニカミノルタ株式会社 画像撮影方法、ｘ線タルボ撮影装置、画像撮影システム及びプログラム

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EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
WO2008102685A1 (ja) * 2007-02-21 2008-08-28 Konica Minolta Medical & Graphic, Inc. 放射線画像撮影装置及び放射線画像撮影システム
WO2008102654A1 (ja) * 2007-02-21 2008-08-28 Konica Minolta Medical & Graphic, Inc. Ｘ線画像システム及びｘ線画像プログラム
US20100327175A1 (en) * 2007-12-14 2010-12-30 Yakov Nesterets Phase-contrast imaging method and apparatus
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CN101943668B (zh) * 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
EP2478842A4 (en) * 2009-09-16 2013-10-23 Konica Minolta Med & Graphic X-RAY IMAGING DEVICE, X-RAY IMAGING SYSTEM, AND RADIOGRAPHIC CLOG GENERATING METHOD
CN102656644B (zh) * 2009-12-10 2016-11-16 皇家飞利浦电子股份有限公司 具有即时相位步进的非平行光栅装置、x射线系统及使用
WO2011114845A1 (ja) * 2010-03-18 2011-09-22 コニカミノルタエムジー株式会社 Ｘ線撮影システム
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JP2012047687A (ja) * 2010-08-30 2012-03-08 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム
WO2012042924A1 (ja) * 2010-09-29 2012-04-05 コニカミノルタエムジー株式会社 医用画像表示方法及び医用画像表示システム
JP5915645B2 (ja) * 2011-03-23 2016-05-11 コニカミノルタ株式会社 医用画像表示システム
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JP6353361B2 (ja) * 2011-07-04 2018-07-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 位相コントラストイメージング装置
JP5475737B2 (ja) * 2011-10-04 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法
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JP5783987B2 (ja) * 2011-12-05 2015-09-24 富士フイルム株式会社 放射線撮影装置
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JP2014090967A (ja) * 2012-11-06 2014-05-19 Canon Inc Ｘ線撮像装置
JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム
JP2014135989A (ja) * 2013-01-16 2014-07-28 Konica Minolta Inc 医用画像システム
JP2014178130A (ja) * 2013-03-13 2014-09-25 Canon Inc Ｘ線撮像装置及びｘ線撮像システム
EP2827339A1 (en) * 2013-07-16 2015-01-21 Canon Kabushiki Kaisha Source grating, interferometer, and object information acquisition system
WO2015015851A1 (ja) * 2013-07-30 2015-02-05 コニカミノルタ株式会社 医用画像システム及び関節軟骨状態のスコア判定方法
US9726622B2 (en) * 2013-10-31 2017-08-08 Tohoku University Non-destructive inspection device
AU2013260650B2 (en) * 2013-11-20 2015-07-16 Canon Kabushiki Kaisha Rotational phase unwrapping
JP6396472B2 (ja) * 2013-12-17 2018-09-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 走査微分位相コントラストシステムのための位相回復
JP6058860B2 (ja) * 2014-02-26 2017-01-11 株式会社日立製作所 Ｘ線撮像装置及びｘ線撮像方法
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JP2018519866A (ja) * 2015-05-06 2018-07-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線撮像
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Publication number Publication date
US20170284948A1 (en) 2017-10-05
JP2017176399A (ja) 2017-10-05
US11221303B2 (en) 2022-01-11

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