JP2017176399A5 - - Google Patents

Download PDF

Info

Publication number
JP2017176399A5
JP2017176399A5 JP2016067145A JP2016067145A JP2017176399A5 JP 2017176399 A5 JP2017176399 A5 JP 2017176399A5 JP 2016067145 A JP2016067145 A JP 2016067145A JP 2016067145 A JP2016067145 A JP 2016067145A JP 2017176399 A5 JP2017176399 A5 JP 2017176399A5
Authority
JP
Japan
Prior art keywords
shows
image
images
image obtained
subject
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016067145A
Other languages
English (en)
Japanese (ja)
Other versions
JP6613988B2 (ja
JP2017176399A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2016067145A priority Critical patent/JP6613988B2/ja
Priority claimed from JP2016067145A external-priority patent/JP6613988B2/ja
Priority to US15/467,467 priority patent/US11221303B2/en
Publication of JP2017176399A publication Critical patent/JP2017176399A/ja
Publication of JP2017176399A5 publication Critical patent/JP2017176399A5/ja
Application granted granted Critical
Publication of JP6613988B2 publication Critical patent/JP6613988B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016067145A 2016-03-30 2016-03-30 放射線撮影システム Active JP6613988B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016067145A JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム
US15/467,467 US11221303B2 (en) 2016-03-30 2017-03-23 Radiation capturing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016067145A JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム

Publications (3)

Publication Number Publication Date
JP2017176399A JP2017176399A (ja) 2017-10-05
JP2017176399A5 true JP2017176399A5 (enExample) 2018-09-06
JP6613988B2 JP6613988B2 (ja) 2019-12-04

Family

ID=59960857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016067145A Active JP6613988B2 (ja) 2016-03-30 2016-03-30 放射線撮影システム

Country Status (2)

Country Link
US (1) US11221303B2 (enExample)
JP (1) JP6613988B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108053469A (zh) * 2017-12-26 2018-05-18 清华大学 多视角相机下的复杂动态场景人体三维重建方法及装置
US11154270B2 (en) * 2018-01-19 2021-10-26 Shimadzu Corporation X-ray imaging apparatus
JP7040625B2 (ja) * 2018-09-11 2022-03-23 株式会社島津製作所 Ｘ線位相撮像システム
EP3832690A1 (en) * 2019-12-05 2021-06-09 Koninklijke Philips N.V. Estimation of full-field scattering for dax imaging
JP7516901B2 (ja) * 2020-06-18 2024-07-17 コニカミノルタ株式会社 放射線撮影システム、放射線撮影制御装置及びプログラム
JP7578450B2 (ja) * 2020-10-07 2024-11-06 キヤノンメディカルシステムズ株式会社 核医学診断装置
JPWO2024203394A1 (enExample) * 2023-03-28 2024-10-03

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1623671A4 (en) 2002-12-26 2008-11-05 Atsushi Momose X-RAY PRESENTATION SYSTEM AND PRESENTATION METHOD
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
JP5683808B2 (ja) * 2007-02-21 2015-03-11 コニカミノルタ株式会社 Ｘ線画像システム
WO2008102685A1 (ja) * 2007-02-21 2008-08-28 Konica Minolta Medical & Graphic, Inc. 放射線画像撮影装置及び放射線画像撮影システム
US20100327175A1 (en) * 2007-12-14 2010-12-30 Yakov Nesterets Phase-contrast imaging method and apparatus
JP4992739B2 (ja) * 2008-01-25 2012-08-08 株式会社島津製作所 放射線撮像装置
CN103876761B (zh) * 2008-10-29 2016-04-27 佳能株式会社 X射线成像装置和x射线成像方法
CN101943668B (zh) * 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
EP2478842A4 (en) * 2009-09-16 2013-10-23 Konica Minolta Med & Graphic X-RAY IMAGING DEVICE, X-RAY IMAGING SYSTEM, AND RADIOGRAPHIC CLOG GENERATING METHOD
EP2510522B1 (en) * 2009-12-10 2015-12-02 Koninklijke Philips N.V. Non-parallel grating arrangement with on-the-fly phase stepping and x-ray system
US8989474B2 (en) * 2010-03-18 2015-03-24 Konica Minolta Medical & Graphic, Inc. X-ray image capturing system
EP2585817B1 (en) * 2010-06-28 2020-01-22 Paul Scherrer Institut A method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry
JP2012047687A (ja) * 2010-08-30 2012-03-08 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム
WO2012042924A1 (ja) * 2010-09-29 2012-04-05 コニカミノルタエムジー株式会社 医用画像表示方法及び医用画像表示システム
WO2012128335A1 (ja) * 2011-03-23 2012-09-27 コニカミノルタエムジー株式会社 医用画像表示システム
JP2012200567A (ja) * 2011-03-28 2012-10-22 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
CN103648388B (zh) * 2011-07-04 2017-05-03 皇家飞利浦有限公司 相位对比度成像设备
JP5475737B2 (ja) * 2011-10-04 2014-04-16 富士フイルム株式会社 放射線撮影装置及び画像処理方法
JP5783987B2 (ja) * 2011-12-05 2015-09-24 富士フイルム株式会社 放射線撮影装置
JP2013116270A (ja) * 2011-12-05 2013-06-13 Canon Inc Ｘ線撮像装置
WO2013126296A1 (en) * 2012-02-24 2013-08-29 University Of Massachusetts Medical School Apparatus and method for x-ray phase contrast imaging
US20130259194A1 (en) * 2012-03-30 2013-10-03 Kwok L. Yip Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging
JP2014090967A (ja) * 2012-11-06 2014-05-19 Canon Inc Ｘ線撮像装置
JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム
JP2014135989A (ja) * 2013-01-16 2014-07-28 Konica Minolta Inc 医用画像システム
JP2014178130A (ja) * 2013-03-13 2014-09-25 Canon Inc Ｘ線撮像装置及びｘ線撮像システム
EP2827339A1 (en) * 2013-07-16 2015-01-21 Canon Kabushiki Kaisha Source grating, interferometer, and object information acquisition system
US10085701B2 (en) * 2013-07-30 2018-10-02 Konica Minolta, Inc. Medical image system and joint cartilage state score determination method
JP6004411B2 (ja) * 2013-10-31 2016-10-05 国立大学法人東北大学 非破壊検査装置
AU2013260650B2 (en) * 2013-11-20 2015-07-16 Canon Kabushiki Kaisha Rotational phase unwrapping
JP6396472B2 (ja) * 2013-12-17 2018-09-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 走査微分位相コントラストシステムのための位相回復
EP3112850B1 (en) * 2014-02-26 2020-04-22 Hitachi, Ltd. X-ray imaging apparatus and x-ray imaging method
US9330456B2 (en) * 2014-04-29 2016-05-03 General Electric Company Systems and methods for regularized Fourier analysis in x-ray phase contrast imaging
CN107580473A (zh) * 2015-05-06 2018-01-12 皇家飞利浦有限公司 X射线成像
WO2017055181A1 (en) * 2015-09-30 2017-04-06 Koninklijke Philips N.V. Focussing of gratings for differential phase contrast imaging by means of electro-mechanic transducer foils

Similar Documents

Publication Publication Date Title
JP2017176399A5 (enExample)
JP2017500160A5 (enExample)
JP2015519091A5 (enExample)
RU2016147939A (ru) Дифракционная решетка для использования с многослойной системой отображения
JP2014112236A5 (enExample)
JP2016027367A5 (ja) 投影システム
JP2018106496A5 (enExample)
EP2899583A3 (en) Periodic fringe imaging with structured pattern illumination and electronic rolling shutter detection
JP2018534758A5 (enExample)
JP2016510582A5 (enExample)
EP3458308A4 (en) IMAGES WITH ACTIVE EXPOSURE CORRECTION
JP2017135495A5 (enExample)
JP2016188903A5 (enExample)
JP2015105831A5 (enExample)
JP2015099293A5 (enExample)
JP2014027457A5 (enExample)
JP2015087135A (ja) 微小変位計測システム
JP2018068578A5 (enExample)
JP2013160530A5 (ja) 検査装置、ロボット装置及び検査プログラム
DK3443401T3 (da) Superopløsningsafbildning
JP2016133626A5 (enExample)
EP3899990A4 (en) ATOMIC INTERFEROMETER
JP2015523108A5 (enExample)
JP2015099522A5 (enExample)
JP2017042232A5 (enExample)