JP6547967B2 - 赤外線検出装置 - Google Patents
赤外線検出装置 Download PDFInfo
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- JP6547967B2 JP6547967B2 JP2016198152A JP2016198152A JP6547967B2 JP 6547967 B2 JP6547967 B2 JP 6547967B2 JP 2016198152 A JP2016198152 A JP 2016198152A JP 2016198152 A JP2016198152 A JP 2016198152A JP 6547967 B2 JP6547967 B2 JP 6547967B2
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- 238000001514 detection method Methods 0.000 claims description 54
- 239000000758 substrate Substances 0.000 claims description 41
- 239000002184 metal Substances 0.000 claims description 34
- 230000003321 amplification Effects 0.000 claims description 20
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 20
- 238000001816 cooling Methods 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 6
- 230000017525 heat dissipation Effects 0.000 description 6
- 230000007423 decrease Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004868 gas analysis Methods 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0271—Housings; Attachments or accessories for photometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0205—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
赤外線を受光する赤外線検出器と、
赤外線検出器用増幅基板と、
前記赤外線検出器を保持する第1プレートと第2プレートと、アナロググランド電位でかつ前記赤外線検出器用増幅基板を支持する第3プレートとを有する導電性の固定具とを備え、
前記赤外線検出器は、外面に鍔を有する金属ケースと、金属ケースの内部にそれぞれ配置された、赤外線検出素子と電子冷却素子とサーミスタとを備えており、
前記赤外線検出器の前記金属ケースが貫通する前記第1プレートの貫通穴に前記金属ケースを貫通させた状態で、前記金属ケースの前記鍔が、前記第1プレートと前記第2プレートとによって挟まれて保持され、
前記第2プレートと前記第3プレートとは交差するように連結されて電気的に接続され、
前記赤外線検出器用増幅基板のアナロググランド部は、基板取付穴の周囲のランドであり、
前記第3プレートに立設された導電性の支柱が前記基板取付穴に挿入されて固定され、前記支柱を介して、前記ランドと前記第3プレートとが電気的に接続されて、前記金属ケースの電位と前記赤外線検出器用増幅基板の前記アナロググランド部のアナロググランド電位とが同電位となるように前記固定具によって電気的に接続されている。
図1は、実施の形態1に係る赤外線検出装置100の模式図である。
2 固定具
3 赤外線検出器用増幅基板
4 第1プレート
4a 貫通穴
5 第2プレート
5a 貫通穴
6 第3プレート
7 ねじ
8 基板取付穴
9 基板取付穴周囲のランド
10 支柱
11 リード
12 小基板
13 端面
14 第1コネクタ
15 第2コネクタ
16 赤外線検出素子
17 金属ケース
18 電子冷却素子
19 サーミスタ
20 鍔
21 第1対象物
22 第1入射光
23 第1反射光
24 第2対象物
25 第2入射光
26 反射点
27 第2拡散反射光
30 直接反射光
31 マルチセルパス
32 直接反射光
37 ねじ
41 赤外線検出器
100 赤外線検出装置
170 ポリゴン回転ミラー
500 赤外線検出装置
800 赤外線検出器
801 赤外光源
802 試料セル
Claims (3)
- 赤外線を受光する赤外線検出器と、
赤外線検出器用増幅基板と、
前記赤外線検出器を保持する第1プレートと第2プレートと、アナロググランド電位でかつ前記赤外線検出器用増幅基板を支持する第3プレートとを有する導電性の固定具とを備え、
前記赤外線検出器は、外面に鍔を有する金属ケースと、金属ケースの内部にそれぞれ配置された、赤外線検出素子と電子冷却素子とサーミスタとを備えており、
前記赤外線検出器の前記金属ケースが貫通する前記第1プレートの貫通穴に前記金属ケースを貫通させた状態で、前記金属ケースの前記鍔が、前記第1プレートと前記第2プレートとによって挟まれて保持され、
前記第2プレートと前記第3プレートとは交差するように連結されて電気的に接続され、
前記赤外線検出器用増幅基板のアナロググランド部は、基板取付穴の周囲のランドであり、
前記第3プレートに立設された導電性の支柱が前記基板取付穴に挿入されて固定され、前記支柱を介して、前記ランドと前記第3プレートとが電気的に接続されて、前記金属ケースの電位と前記赤外線検出器用増幅基板の前記アナロググランド部のアナロググランド電位とが同電位となるように前記固定具によって電気的に接続されている、
赤外線検出装置。 - 前記第2プレートの厚みが3mm以上でかつ4mm以下である、請求項1に記載の赤外線検出装置。
- 前記赤外線検出器のリードの長さが、前記第2プレートの厚みの2倍以上でかつ2.7倍以下である、請求項1又は2に記載の赤外線検出装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016198152A JP6547967B2 (ja) | 2016-10-06 | 2016-10-06 | 赤外線検出装置 |
EP17185864.0A EP3306288A1 (en) | 2016-10-06 | 2017-08-11 | Infrared detection device |
US15/694,910 US20180100769A1 (en) | 2016-10-06 | 2017-09-04 | Infrared detection device |
CN201710863016.9A CN107917900A (zh) | 2016-10-06 | 2017-09-21 | 红外线检测装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2016198152A JP6547967B2 (ja) | 2016-10-06 | 2016-10-06 | 赤外線検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018059842A JP2018059842A (ja) | 2018-04-12 |
JP6547967B2 true JP6547967B2 (ja) | 2019-07-24 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016198152A Expired - Fee Related JP6547967B2 (ja) | 2016-10-06 | 2016-10-06 | 赤外線検出装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20180100769A1 (ja) |
EP (1) | EP3306288A1 (ja) |
JP (1) | JP6547967B2 (ja) |
CN (1) | CN107917900A (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102448971B1 (ko) * | 2021-07-29 | 2022-09-29 | 한화시스템 주식회사 | 적외선 광학장치 및 이를 구비하는 초소형 인공위성 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1160585C (zh) * | 1996-04-24 | 2004-08-04 | 富士通株式会社 | 光纤可分离式光学模块 |
JP3624360B2 (ja) * | 1996-04-24 | 2005-03-02 | 富士通株式会社 | 光モジュール |
US6028309A (en) * | 1997-02-11 | 2000-02-22 | Indigo Systems Corporation | Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array |
US6876004B2 (en) * | 2001-12-04 | 2005-04-05 | Finisar Corporation | Circuit interconnect for optoelectronic device for controlled impedance at high frequencies |
JP4384006B2 (ja) * | 2004-10-28 | 2009-12-16 | 株式会社リガク | X線検出装置 |
JP2009068863A (ja) * | 2007-09-10 | 2009-04-02 | Toshiba Corp | 赤外線検出素子及びそれを用いた赤外線イメージセンサ |
JP5175562B2 (ja) * | 2008-01-28 | 2013-04-03 | シャープ株式会社 | 人物位置検出装置および空気調和機 |
EP2447705A1 (en) * | 2009-06-25 | 2012-05-02 | Panasonic Corporation | Infrared gas detector and infrared gas measuring device |
US9759613B2 (en) * | 2010-04-26 | 2017-09-12 | Hme Co., Ltd. | Temperature sensor device and radiation thermometer using this device, production method of temperature sensor device, multi-layered thin film thermopile using photo-resist film and radiation thermometer using this thermopile, and production method of multi-layered thin film thermopile |
US9024224B2 (en) | 2010-09-17 | 2015-05-05 | Panasonic Intellectual Property Management Co., Ltd. | Brominated flame retardant determining method, brominated flame retardant determining apparatus, recycling method, and recycling apparatus |
JP6179858B2 (ja) | 2013-10-08 | 2017-08-16 | パナソニックIpマネジメント株式会社 | 赤外線検出素子、赤外線検出器及び赤外線式ガスセンサ |
US9861297B2 (en) | 2013-09-09 | 2018-01-09 | Riken | Gas analysis device and gas analysis method |
-
2016
- 2016-10-06 JP JP2016198152A patent/JP6547967B2/ja not_active Expired - Fee Related
-
2017
- 2017-08-11 EP EP17185864.0A patent/EP3306288A1/en not_active Withdrawn
- 2017-09-04 US US15/694,910 patent/US20180100769A1/en not_active Abandoned
- 2017-09-21 CN CN201710863016.9A patent/CN107917900A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
US20180100769A1 (en) | 2018-04-12 |
CN107917900A (zh) | 2018-04-17 |
JP2018059842A (ja) | 2018-04-12 |
EP3306288A1 (en) | 2018-04-11 |
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