JP6537293B2 - Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム - Google Patents

Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム Download PDF

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Publication number
JP6537293B2
JP6537293B2 JP2015026752A JP2015026752A JP6537293B2 JP 6537293 B2 JP6537293 B2 JP 6537293B2 JP 2015026752 A JP2015026752 A JP 2015026752A JP 2015026752 A JP2015026752 A JP 2015026752A JP 6537293 B2 JP6537293 B2 JP 6537293B2
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grating
ray
source
analyzer
talbot interferometer
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JP2015166735A (ja
JP2015166735A5 (enExample
Inventor
宗一郎 半田
宗一郎 半田
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Surgery (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2015026752A 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム Active JP6537293B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014026677 2014-02-14
JP2014026677 2014-02-14
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Publications (3)

Publication Number Publication Date
JP2015166735A JP2015166735A (ja) 2015-09-24
JP2015166735A5 JP2015166735A5 (enExample) 2018-03-01
JP6537293B2 true JP6537293B2 (ja) 2019-07-03

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JP2015026752A Active JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Country Status (5)

Country Link
US (1) US10393681B2 (enExample)
EP (1) EP3105763B1 (enExample)
JP (1) JP6537293B2 (enExample)
CN (2) CN105992557B (enExample)
WO (1) WO2015122542A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018020999A1 (ja) * 2016-07-28 2018-02-01 株式会社島津製作所 Ｘ線位相差撮像装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
EP3391821B1 (en) * 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
US11013482B2 (en) * 2017-10-31 2021-05-25 Shimadzu Corporation Phase contrast X-ray imaging system
JP6987345B2 (ja) * 2018-01-18 2021-12-22 富士フイルムヘルスケア株式会社 放射線撮像装置
CN112189134B (zh) * 2018-06-15 2023-09-19 株式会社岛津制作所 X射线成像装置
EP3922180A1 (en) 2020-06-09 2021-12-15 Koninklijke Philips N.V. Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system

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US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
WO2004058070A1 (ja) * 2002-12-26 2004-07-15 Atsushi Momose X線撮像装置および撮像方法
EP1731099A1 (en) 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
CN101576515B (zh) * 2007-11-23 2012-07-04 同方威视技术股份有限公司 X射线光栅相衬成像系统及方法
WO2009069040A1 (en) * 2007-11-26 2009-06-04 Koninklijke Philips Electronics N.V. Detection setup for x-ray phase contrast imaging
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
KR101258927B1 (ko) * 2008-10-29 2013-04-29 캐논 가부시끼가이샤 Ｘ선 촬상장치 및 ｘ선 촬상방법
CN102325498B (zh) * 2009-02-05 2013-07-10 中国科学院高能物理研究所 基于低剂量单步光栅的x射线相位衬度成像
US7949095B2 (en) 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP2010249533A (ja) * 2009-04-10 2010-11-04 Canon Inc タルボ・ロー干渉計用の線源格子
CN101599800A (zh) * 2009-04-27 2009-12-09 北京邮电大学 利用铌酸锂调制器产生8倍频光载毫米波的装置与方法
EP2442722B1 (en) * 2009-06-16 2017-03-29 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
CN101943668B (zh) * 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
JP5578868B2 (ja) 2010-01-26 2014-08-27 キヤノン株式会社 光源格子、該光源格子を備えたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
CN102221565B (zh) * 2010-04-19 2013-06-12 清华大学 X射线源光栅步进成像系统与成像方法
JP2012030039A (ja) * 2010-07-09 2012-02-16 Fujifilm Corp 放射線撮影システム及びその画像処理方法
JP2014012029A (ja) * 2010-10-27 2014-01-23 Fujifilm Corp 放射線撮影システム及び画像処理方法
JP5818909B2 (ja) * 2010-12-13 2015-11-18 パウル・シェラー・インスティトゥート 回折格子の装置による位相コントラストイメージング用に制約付き最適化を使用して画像積分する方法およびシステム
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US20130108015A1 (en) * 2011-10-28 2013-05-02 Csem Centre Suisse D'electronique Et De Microtechnique S.A - Recherche Et Developpement X-ray interferometer
US20130259194A1 (en) * 2012-03-30 2013-10-03 Kwok L. Yip Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging
CN103365068B (zh) * 2012-04-01 2016-03-09 中国科学院高能物理研究所 光栅剪切三维成像系统及光栅剪切三维成像方法
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques

Also Published As

Publication number Publication date
CN109115816A (zh) 2019-01-01
JP2015166735A (ja) 2015-09-24
US20160356730A1 (en) 2016-12-08
EP3105763A1 (en) 2016-12-21
CN105992557A (zh) 2016-10-05
CN105992557B (zh) 2020-01-14
EP3105763B1 (en) 2019-09-11
US10393681B2 (en) 2019-08-27
WO2015122542A1 (en) 2015-08-20

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