JP2015166735A5 - - Google Patents

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JP2015166735A5
JP2015166735A5 JP2015026752A JP2015026752A JP2015166735A5 JP 2015166735 A5 JP2015166735 A5 JP 2015166735A5 JP 2015026752 A JP2015026752 A JP 2015026752A JP 2015026752 A JP2015026752 A JP 2015026752A JP 2015166735 A5 JP2015166735 A5 JP 2015166735A5
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JP2015026752A
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JP2015166735A (ja
JP6537293B2 (ja
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JP2015026752A 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム Active JP6537293B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014026677 2014-02-14
JP2014026677 2014-02-14
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Publications (3)

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JP2015166735A JP2015166735A (ja) 2015-09-24
JP2015166735A5 true JP2015166735A5 (enExample) 2018-03-01
JP6537293B2 JP6537293B2 (ja) 2019-07-03

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JP2015026752A Active JP6537293B2 (ja) 2014-02-14 2015-02-13 Ｘ線トールボット干渉計及びｘ線トールボット干渉計システム

Country Status (5)

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US (1) US10393681B2 (enExample)
EP (1) EP3105763B1 (enExample)
JP (1) JP6537293B2 (enExample)
CN (2) CN105992557B (enExample)
WO (1) WO2015122542A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018020999A1 (ja) * 2016-07-28 2018-02-01 株式会社島津製作所 Ｘ線位相差撮像装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
EP3391821B1 (en) * 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
US11013482B2 (en) * 2017-10-31 2021-05-25 Shimadzu Corporation Phase contrast X-ray imaging system
JP6987345B2 (ja) * 2018-01-18 2021-12-22 富士フイルムヘルスケア株式会社 放射線撮像装置
CN112189134B (zh) * 2018-06-15 2023-09-19 株式会社岛津制作所 X射线成像装置
EP3922180A1 (en) 2020-06-09 2021-12-15 Koninklijke Philips N.V. Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system

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US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
WO2004058070A1 (ja) * 2002-12-26 2004-07-15 Atsushi Momose X線撮像装置および撮像方法
EP1731099A1 (en) 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
CN101576515B (zh) * 2007-11-23 2012-07-04 同方威视技术股份有限公司 X射线光栅相衬成像系统及方法
WO2009069040A1 (en) * 2007-11-26 2009-06-04 Koninklijke Philips Electronics N.V. Detection setup for x-ray phase contrast imaging
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KR101258927B1 (ko) * 2008-10-29 2013-04-29 캐논 가부시끼가이샤 Ｘ선 촬상장치 및 ｘ선 촬상방법
CN102325498B (zh) * 2009-02-05 2013-07-10 中国科学院高能物理研究所 基于低剂量单步光栅的x射线相位衬度成像
US7949095B2 (en) 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP2010249533A (ja) * 2009-04-10 2010-11-04 Canon Inc タルボ・ロー干渉計用の線源格子
CN101599800A (zh) * 2009-04-27 2009-12-09 北京邮电大学 利用铌酸锂调制器产生8倍频光载毫米波的装置与方法
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JP5578868B2 (ja) 2010-01-26 2014-08-27 キヤノン株式会社 光源格子、該光源格子を備えたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
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