JP2015166735A5 - - Google Patents

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JP2015166735A5
JP2015166735A5 JP2015026752A JP2015026752A JP2015166735A5 JP 2015166735 A5 JP2015166735 A5 JP 2015166735A5 JP 2015026752 A JP2015026752 A JP 2015026752A JP 2015026752 A JP2015026752 A JP 2015026752A JP 2015166735 A5 JP2015166735 A5 JP 2015166735A5
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JP2015026752A
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JP2015166735A (ja
JP6537293B2 (ja
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Claims (2)

  1. 前記被検体情報取得部は、前記X線検出器によるX線強度分布を取得する際のピクセルピッチよりも細かいデータ間隔により画像データを記録することを特徴とする請求項11または12記載のX線トールボット干渉計システム。
  2. 前記被検体情報取得部が取得した被検体の情報に基づいた画像を表示する表示手段を備え、前記表示手段は前記X線検出器によるX線強度分布取得時のピクセルピッチよりも細かいデータ間隔で画像を表示することを特徴とする請求項13乃至15のいずれか1項に記載のX線トールボット干渉計システム
JP2015026752A 2014-02-14 2015-02-13 X線トールボット干渉計及びx線トールボット干渉計システム Active JP6537293B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 X線トールボット干渉計及びx線トールボット干渉計システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014026677 2014-02-14
JP2014026677 2014-02-14
JP2015026752A JP6537293B2 (ja) 2014-02-14 2015-02-13 X線トールボット干渉計及びx線トールボット干渉計システム

Publications (3)

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JP2015166735A JP2015166735A (ja) 2015-09-24
JP2015166735A5 true JP2015166735A5 (ja) 2018-03-01
JP6537293B2 JP6537293B2 (ja) 2019-07-03

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JP2015026752A Active JP6537293B2 (ja) 2014-02-14 2015-02-13 X線トールボット干渉計及びx線トールボット干渉計システム

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US (1) US10393681B2 (ja)
EP (1) EP3105763B1 (ja)
JP (1) JP6537293B2 (ja)
CN (2) CN109115816A (ja)
WO (1) WO2015122542A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10772592B2 (en) * 2016-07-28 2020-09-15 Shimadzu Corporation X-ray phase contrast imaging apparatus
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびx線検査装置
EP3391821B1 (en) * 2017-04-20 2024-05-08 Shimadzu Corporation X-ray phase contrast imaging system
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 X線位相差撮像システム
JP6987345B2 (ja) * 2018-01-18 2021-12-22 富士フイルムヘルスケア株式会社 放射線撮像装置
JP7006784B2 (ja) * 2018-06-15 2022-02-10 株式会社島津製作所 X線イメージング装置
EP3922180A1 (en) 2020-06-09 2021-12-15 Koninklijke Philips N.V. Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
JP4445397B2 (ja) 2002-12-26 2010-04-07 敦 百生 X線撮像装置および撮像方法
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
CN101576515B (zh) * 2007-11-23 2012-07-04 同方威视技术股份有限公司 X射线光栅相衬成像系统及方法
JP5438022B2 (ja) * 2007-11-26 2014-03-12 コーニンクレッカ フィリップス エヌ ヴェ X線位相コントラストイメージングの検出セットアップ
CN101413905B (zh) * 2008-10-10 2011-03-16 深圳大学 X射线微分干涉相衬成像系统
EP2343537B1 (en) * 2008-10-29 2019-04-10 Canon Kabushiki Kaisha X-ray imaging device and x-ray imaging method
JP5606455B2 (ja) * 2009-02-05 2014-10-15 パウル・シェラー・インスティトゥート 逆投影のためのイメージング装置及びその作動方法
US7949095B2 (en) 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
JP2010249533A (ja) * 2009-04-10 2010-11-04 Canon Inc タルボ・ロー干渉計用の線源格子
CN101599800A (zh) * 2009-04-27 2009-12-09 北京邮电大学 利用铌酸锂调制器产生8倍频光载毫米波的装置与方法
EP2442722B1 (en) * 2009-06-16 2017-03-29 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
CN101943668B (zh) * 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
JP5578868B2 (ja) 2010-01-26 2014-08-27 キヤノン株式会社 光源格子、該光源格子を備えたx線位相コントラスト像の撮像装置、x線コンピューター断層撮影システム
CN102221565B (zh) * 2010-04-19 2013-06-12 清华大学 X射线源光栅步进成像系统与成像方法
JP2012030039A (ja) * 2010-07-09 2012-02-16 Fujifilm Corp 放射線撮影システム及びその画像処理方法
JP2014012029A (ja) * 2010-10-27 2014-01-23 Fujifilm Corp 放射線撮影システム及び画像処理方法
EP2652708B1 (en) * 2010-12-13 2015-01-28 Paul Scherrer Institut A method and a system for image integration using constrained optimization for phase contrast imaging with an arrangement of gratings
JP2012125343A (ja) * 2010-12-14 2012-07-05 Fujifilm Corp 放射線撮影システム及び画像処理方法
JP2012143490A (ja) * 2011-01-14 2012-08-02 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
US9066704B2 (en) * 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
US20130108015A1 (en) * 2011-10-28 2013-05-02 Csem Centre Suisse D'electronique Et De Microtechnique S.A - Recherche Et Developpement X-ray interferometer
US20130259194A1 (en) * 2012-03-30 2013-10-03 Kwok L. Yip Hybrid slot-scanning grating-based differential phase contrast imaging system for medical radiographic imaging
CN103356223B (zh) * 2012-04-01 2015-07-08 中国科学院高能物理研究所 用于人体医学检测的 ct 成像系统及方法
US9357975B2 (en) * 2013-12-30 2016-06-07 Carestream Health, Inc. Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques

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