JP2016065767A5 - - Google Patents

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Publication number
JP2016065767A5
JP2016065767A5 JP2014194032A JP2014194032A JP2016065767A5 JP 2016065767 A5 JP2016065767 A5 JP 2016065767A5 JP 2014194032 A JP2014194032 A JP 2014194032A JP 2014194032 A JP2014194032 A JP 2014194032A JP 2016065767 A5 JP2016065767 A5 JP 2016065767A5
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Japan
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JP2014194032A
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JP2016065767A (ja
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Priority to JP2014194032A priority Critical patent/JP2016065767A/ja
Priority claimed from JP2014194032A external-priority patent/JP2016065767A/ja
Priority to CN201510601469.5A priority patent/CN105445186A/zh
Priority to US14/863,371 priority patent/US9638578B2/en
Publication of JP2016065767A publication Critical patent/JP2016065767A/ja
Publication of JP2016065767A5 publication Critical patent/JP2016065767A5/ja
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また、画像形成部３３０では、図１４に示すように、対象物Ｏの物質Ａ、Ｂ、およびＣの分布を示す画像の画像データを作成する。この画像データは、画像形成部３３０から図示しないモニターに送出され、そのモニターにおいて、対象物Ｏの物質Ａ、Ｂ、およびＣの分布を示す画像が表示される。この場合、例えば、対象物Ｏの物質Ａの分布する領域は黒色、物質Ｂの分布する領域は灰色、物質Ｃの分布する領域は白色に色分けして表示される。このイメージング装置３００では、以上のように、対象物Ｏを構成する各物質の同定と、その各物質の分布測定とを同時に行うことができる。イメージング装置３００は、例えば、薬剤検査に用いられる。
JP2014194032A 2014-09-24 2014-09-24 テラヘルツ波検出装置、カメラ、イメージング装置、および計測装置 Withdrawn JP2016065767A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014194032A JP2016065767A (ja) 2014-09-24 2014-09-24 テラヘルツ波検出装置、カメラ、イメージング装置、および計測装置
CN201510601469.5A CN105445186A (zh) 2014-09-24 2015-09-18 太赫兹波检测装置、照相机、成像装置以及计测装置
US14/863,371 US9638578B2 (en) 2014-09-24 2015-09-23 Terahertz wave detecting device, camera, imaging apparatus, and measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014194032A JP2016065767A (ja) 2014-09-24 2014-09-24 テラヘルツ波検出装置、カメラ、イメージング装置、および計測装置

Publications (2)

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JP2016065767A JP2016065767A (ja) 2016-04-28
JP2016065767A5 true JP2016065767A5 (ja) 2017-09-28

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JP2014194032A Withdrawn JP2016065767A (ja) 2014-09-24 2014-09-24 テラヘルツ波検出装置、カメラ、イメージング装置、および計測装置

Country Status (3)

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US (1) US9638578B2 (ja)
JP (1) JP2016065767A (ja)
CN (1) CN105445186A (ja)

Families Citing this family (9)

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Publication number Priority date Publication date Assignee Title
JP7288296B2 (ja) * 2017-12-13 2023-06-07 キヤノン株式会社 テラヘルツ波カメラおよび検出モジュール
US10288563B1 (en) * 2018-01-22 2019-05-14 The Florida International University Board Of Trustees Sensor platform based on toroidal resonances for rapid detection of biomolecules
US11237103B2 (en) * 2018-05-31 2022-02-01 Socovar Sec Electronic device testing system, electronic device production system including same and method of testing an electronic device
CN108831988A (zh) * 2018-06-12 2018-11-16 中国科学院上海技术物理研究所 一种工作频率可调的非制冷型太赫兹探测器
CN109451252B (zh) * 2018-10-31 2020-12-25 中国科学院半导体研究所 紧凑型太赫兹波阵列图像传感器芯片
US11749015B2 (en) 2020-03-13 2023-09-05 Fingerprint Cards Anacatum Ip Ab Under display terahertz biometric imaging arrangement
US11922716B2 (en) 2020-03-13 2024-03-05 Fingerprint Cards Anacatum Ip Ab Under display passive terahertz biometric imaging device
CN114008690A (zh) * 2020-03-13 2022-02-01 指纹卡安娜卡敦知识产权有限公司 太赫兹生物特征成像封装
US11888233B2 (en) * 2020-04-07 2024-01-30 Ramot At Tel-Aviv University Ltd Tailored terahertz radiation

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1692504A (zh) * 2002-12-05 2005-11-02 松下电器产业株式会社 热电器件及其制造方法与红外线传感器
US20050087689A1 (en) * 2002-12-05 2005-04-28 Atsushi Tomozawa Pyroelectric device, method for manufacturing same and infrared sensor
US7837833B2 (en) * 2007-10-23 2010-11-23 Honeywell Asca Inc. Method for characterizing fibrous materials using stokes parameters
JP2009141661A (ja) 2007-12-06 2009-06-25 Optical Comb Inc 電磁波検出素子及び電磁波検出装置
CN102564601A (zh) * 2010-12-22 2012-07-11 精工爱普生株式会社 热式光检测装置、电子设备、热式光检测器及其制造方法
JP2013044703A (ja) * 2011-08-26 2013-03-04 Konica Minolta Holdings Inc 光センサー
JP2013171020A (ja) * 2012-02-23 2013-09-02 Seiko Epson Corp 熱型電磁波検出素子、熱型電磁波検出素子の製造方法、熱型電磁波検出装置および電子機器
US20130314765A1 (en) * 2012-05-25 2013-11-28 The Trustees Of Boston College Metamaterial Devices with Environmentally Responsive Materials
JP2014163674A (ja) * 2013-02-21 2014-09-08 Seiko Epson Corp テラヘルツ波検出装置、カメラ、イメージング装置、および計測装置
JP2014235145A (ja) 2013-06-05 2014-12-15 セイコーエプソン株式会社 テラヘルツ波検出装置、カメラ、イメージング装置および計測装置
JP2014235144A (ja) 2013-06-05 2014-12-15 セイコーエプソン株式会社 テラヘルツ波検出装置、カメラ、イメージング装置および計測装置
JP2014235146A (ja) 2013-06-05 2014-12-15 セイコーエプソン株式会社 テラヘルツ波検出装置、カメラ、イメージング装置および計測装置
US9335217B2 (en) * 2013-08-01 2016-05-10 The Regents Of The University Of California Pyroelectric aluminum nitride MEMS infrared sensor with selective wavelength infrared absorber

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