JP6498513B2 - ３次元測量装置及び３次元測量方法 - Google Patents

３次元測量装置及び３次元測量方法 Download PDF

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Publication number
JP6498513B2
JP6498513B2 JP2015092816A JP2015092816A JP6498513B2 JP 6498513 B2 JP6498513 B2 JP 6498513B2 JP 2015092816 A JP2015092816 A JP 2015092816A JP 2015092816 A JP2015092816 A JP 2015092816A JP 6498513 B2 JP6498513 B2 JP 6498513B2
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Japan
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unit
measurement
threshold value
vibration
vibration amount
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JP2015092816A
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English (en)
Japanese (ja)
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JP2016211873A (ja
JP2016211873A5 (OSRAM
Inventor
秀之 松本
秀之 松本
田中　康司
康司 田中
彰二 林
彰二 林
貴昭 齋藤
貴昭 齋藤
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Topcon Corp
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Topcon Corp
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Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP2015092816A priority Critical patent/JP6498513B2/ja
Priority to US15/097,745 priority patent/US10534075B2/en
Priority to EP16166551.8A priority patent/EP3096110B1/en
Publication of JP2016211873A publication Critical patent/JP2016211873A/ja
Publication of JP2016211873A5 publication Critical patent/JP2016211873A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2015092816A 2015-04-30 2015-04-30 ３次元測量装置及び３次元測量方法 Active JP6498513B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2015092816A JP6498513B2 (ja) 2015-04-30 2015-04-30 ３次元測量装置及び３次元測量方法
US15/097,745 US10534075B2 (en) 2015-04-30 2016-04-13 Three-dimensional surveying instrument and three-dimensional surveying method
EP16166551.8A EP3096110B1 (en) 2015-04-30 2016-04-22 Three-dimensional surveying instrument and three-dimensional surveying method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015092816A JP6498513B2 (ja) 2015-04-30 2015-04-30 ３次元測量装置及び３次元測量方法

Publications (3)

Publication Number Publication Date
JP2016211873A JP2016211873A (ja) 2016-12-15
JP2016211873A5 JP2016211873A5 (OSRAM) 2018-06-14
JP6498513B2 true JP6498513B2 (ja) 2019-04-10

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ID=55806233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015092816A Active JP6498513B2 (ja) 2015-04-30 2015-04-30 ３次元測量装置及び３次元測量方法

Country Status (3)

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US (1) US10534075B2 (OSRAM)
EP (1) EP3096110B1 (OSRAM)
JP (1) JP6498513B2 (OSRAM)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6423032B2 (ja) * 2017-03-29 2018-11-14 株式会社トプコン ３次元測量装置
JP6953233B2 (ja) * 2017-08-24 2021-10-27 株式会社トプコン ３次元測量装置
JP7084705B2 (ja) 2017-09-13 2022-06-15 株式会社トプコン 測量装置
JP7117092B2 (ja) * 2017-09-25 2022-08-12 株式会社トプコン レーザ測定方法及びレーザ測定装置
JP6943742B2 (ja) * 2017-12-05 2021-10-06 株式会社トプコン 測量装置及びトータルステーションと２次元レーザスキャナとの組立て方法
US11320263B2 (en) 2019-01-25 2022-05-03 Stanley Black & Decker Inc. Laser level system
CN114791607B (zh) * 2021-01-25 2025-11-25 信泰光学(深圳)有限公司 测距装置及其侦测方法
JP7740826B2 (ja) * 2021-03-19 2025-09-17 株式会社トプコン 測量システム、測量方法、及び測量プログラム
US12498221B2 (en) 2021-08-10 2025-12-16 Topcon Corporation System, device, and control method
JP2023025465A (ja) * 2021-08-10 2023-02-22 株式会社トプコン 回転レーザシステム、回転レーザ装置及び制御方法
JP2023025466A (ja) * 2021-08-10 2023-02-22 株式会社トプコン 測量システム、測量装置及び制御方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10170269A (ja) * 1996-12-10 1998-06-26 Taisei Corp レーザレベル計
JP2001221635A (ja) * 2000-02-07 2001-08-17 East Japan Railway Co トータルステーション測量機による測量方法
DE10361870B4 (de) 2003-12-29 2006-05-04 Faro Technologies Inc., Lake Mary Laserscanner und Verfahren zum optischen Abtasten und Vermessen einer Umgebung des Laserscanners
JP4987730B2 (ja) 2005-01-12 2012-07-25 トリムブレ、アクチボラグ 角度変位の補償測定
JP5145013B2 (ja) * 2007-11-01 2013-02-13 株式会社トプコン 測量機
DE102010061382B4 (de) * 2010-12-21 2019-02-14 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung und Abstandsbestimmung von Objekten
JP5802062B2 (ja) * 2011-06-20 2015-10-28 大阪機工株式会社 工作機械の制御装置及び制御方法
EP2600173A1 (de) * 2011-11-29 2013-06-05 Hexagon Technology Center GmbH Verfahren zum Betreiben eines Laserscanners
JP6120521B2 (ja) * 2012-10-19 2017-04-26 株式会社トプコン ３次元測量装置及び３次元測量システム
EP2860546B1 (de) * 2013-10-09 2019-08-07 Hexagon Technology Center GmbH Vermessungsgerät mit einem Rotationsspiegel zum optischen Abtasten einer Umgebung

Also Published As

Publication number Publication date
EP3096110A2 (en) 2016-11-23
EP3096110B1 (en) 2018-09-12
EP3096110A3 (en) 2016-12-28
JP2016211873A (ja) 2016-12-15
US10534075B2 (en) 2020-01-14
US20160320473A1 (en) 2016-11-03

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