JP6491507B2 - 半導体装置、電子装置および半導体装置の自己診断方法 - Google Patents

半導体装置、電子装置および半導体装置の自己診断方法 Download PDF

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Publication number
JP6491507B2
JP6491507B2 JP2015058012A JP2015058012A JP6491507B2 JP 6491507 B2 JP6491507 B2 JP 6491507B2 JP 2015058012 A JP2015058012 A JP 2015058012A JP 2015058012 A JP2015058012 A JP 2015058012A JP 6491507 B2 JP6491507 B2 JP 6491507B2
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scan
semiconductor device
circuit
self
flip
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JP2016176843A (ja
JP2016176843A5 (cg-RX-API-DMAC7.html
Inventor
卓郎 西川
卓郎 西川
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Renesas Electronics Corp
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Renesas Electronics Corp
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Priority to JP2015058012A priority Critical patent/JP6491507B2/ja
Priority to US15/007,246 priority patent/US9797950B2/en
Priority to CN201610128485.1A priority patent/CN105988464A/zh
Publication of JP2016176843A publication Critical patent/JP2016176843A/ja
Priority to US15/707,532 priority patent/US10317466B2/en
Publication of JP2016176843A5 publication Critical patent/JP2016176843A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G01R31/318563—Multiple simultaneous testing of subparts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318566—Comparators; Diagnosing the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318569—Error indication, logging circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318575—Power distribution; Power saving

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2015058012A 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法 Expired - Fee Related JP6491507B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015058012A JP6491507B2 (ja) 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法
US15/007,246 US9797950B2 (en) 2015-03-20 2016-01-27 Semiconductor device, electronic device, and self-diagnosis method for semiconductor device
CN201610128485.1A CN105988464A (zh) 2015-03-20 2016-03-08 半导体装置、电子装置以及用于半导体装置的自诊断方法
US15/707,532 US10317466B2 (en) 2015-03-20 2017-09-18 Semiconductor device, electronic device, and self-diagnosis method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015058012A JP6491507B2 (ja) 2015-03-20 2015-03-20 半導体装置、電子装置および半導体装置の自己診断方法

Publications (3)

Publication Number Publication Date
JP2016176843A JP2016176843A (ja) 2016-10-06
JP2016176843A5 JP2016176843A5 (cg-RX-API-DMAC7.html) 2017-12-28
JP6491507B2 true JP6491507B2 (ja) 2019-03-27

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US (2) US9797950B2 (cg-RX-API-DMAC7.html)
JP (1) JP6491507B2 (cg-RX-API-DMAC7.html)
CN (1) CN105988464A (cg-RX-API-DMAC7.html)

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JP6419140B2 (ja) 2016-12-08 2018-11-07 ウィンボンド エレクトロニクス コーポレーション 半導体装置およびその調整方法
JP6832787B2 (ja) * 2017-04-28 2021-02-24 ルネサスエレクトロニクス株式会社 半導体装置および半導体装置のテスト方法
JP2018195243A (ja) * 2017-05-22 2018-12-06 ルネサスエレクトロニクス株式会社 半導体装置、及び半導体装置の制御方法
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Publication number Publication date
CN105988464A (zh) 2016-10-05
JP2016176843A (ja) 2016-10-06
US20180003771A1 (en) 2018-01-04
US20160274185A1 (en) 2016-09-22
US9797950B2 (en) 2017-10-24
US10317466B2 (en) 2019-06-11

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