JP6471466B2 - 眼科装置、及びそれに用いる処理プログラム - Google Patents

眼科装置、及びそれに用いる処理プログラム Download PDF

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Publication number
JP6471466B2
JP6471466B2 JP2014230052A JP2014230052A JP6471466B2 JP 6471466 B2 JP6471466 B2 JP 6471466B2 JP 2014230052 A JP2014230052 A JP 2014230052A JP 2014230052 A JP2014230052 A JP 2014230052A JP 6471466 B2 JP6471466 B2 JP 6471466B2
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image
diffusion
optical system
curvature radius
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JP2016093249A (ja
JP2016093249A5 (zh
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通浩 滝井
通浩 滝井
晃一 星野
晃一 星野
中村　健二
健二 中村
邦生 鈴木
邦生 鈴木
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to CN201510763062.2A priority patent/CN105581770B/zh
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JP2014230052A 2014-11-12 2014-11-12 眼科装置、及びそれに用いる処理プログラム Active JP6471466B2 (ja)

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JP2014230052A JP6471466B2 (ja) 2014-11-12 2014-11-12 眼科装置、及びそれに用いる処理プログラム
CN201510763062.2A CN105581770B (zh) 2014-11-12 2015-11-10 眼科装置和眼科处理方法

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JP2014230052A JP6471466B2 (ja) 2014-11-12 2014-11-12 眼科装置、及びそれに用いる処理プログラム

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JP2016093249A JP2016093249A (ja) 2016-05-26
JP2016093249A5 JP2016093249A5 (zh) 2017-12-21
JP6471466B2 true JP6471466B2 (ja) 2019-02-20

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE541262C2 (en) * 2016-11-15 2019-05-21 Heads Stockholm Ab Method and device for eye metric acquisition
JP6928453B2 (ja) * 2017-01-24 2021-09-01 株式会社トプコン 眼科装置
JP6869074B2 (ja) * 2017-03-29 2021-05-12 株式会社トプコン 眼科装置
EP3721788A4 (en) * 2017-12-04 2021-08-18 Nidek Co., Ltd. DEVICE FOR MEASURING EYEPIECE BREAKING FORCE
JP7297292B2 (ja) * 2019-06-03 2023-06-26 株式会社トーメーコーポレーション 眼科装置
JP7308721B2 (ja) * 2019-10-30 2023-07-14 株式会社トプコン 眼科情報処理装置、眼科装置、眼科情報処理方法、及びプログラム

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5475452A (en) * 1994-02-24 1995-12-12 Keravision, Inc. Device and method for mapping objects
JP2004223200A (ja) * 2003-01-20 2004-08-12 Tomey Corporation 角膜形状測定装置
JP4126249B2 (ja) * 2003-05-30 2008-07-30 株式会社ニデック 眼科装置
JP3892434B2 (ja) * 2003-11-28 2007-03-14 株式会社トプコン 眼科装置
JP4528049B2 (ja) * 2004-07-29 2010-08-18 株式会社トプコン 眼科装置
JP4859479B2 (ja) * 2006-02-20 2012-01-25 株式会社トーメーコーポレーション ケラトメータ
US7988290B2 (en) * 2007-06-27 2011-08-02 AMO Wavefront Sciences LLC. Systems and methods for measuring the shape and location of an object
US7837329B2 (en) * 2008-03-31 2010-11-23 Nidek Co., Ltd. Fundus camera
EP2268192B8 (en) * 2008-04-17 2022-01-19 Stichting VUmc Apparatus for corneal shape analysis and method for determining a corneal thickness
KR101056960B1 (ko) * 2008-11-25 2011-08-16 주식회사 휴비츠 측정 위치 오차를 보상하는 각막 곡률 측정방법 및 이를 이용한 검안기
JP6007466B2 (ja) * 2010-12-27 2016-10-12 株式会社ニデック 角膜形状測定装置
JP6003234B2 (ja) * 2012-05-29 2016-10-05 株式会社ニデック 眼底撮影装置
CN102715886B (zh) * 2012-06-21 2014-08-06 宁波明星科技发展有限公司 一种电脑验光仪的角膜曲率计算方法
JP2014079494A (ja) * 2012-10-18 2014-05-08 Canon Inc 眼科装置および眼科制御方法並びにプログラム
JP6349701B2 (ja) * 2013-11-29 2018-07-04 株式会社ニデック 眼科測定装置

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CN105581770A (zh) 2016-05-18
JP2016093249A (ja) 2016-05-26
CN105581770B (zh) 2019-10-11

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