JP6348578B2 - 撮像素子のための画素アーキテクチャ - Google Patents

撮像素子のための画素アーキテクチャ Download PDF

Info

Publication number
JP6348578B2
JP6348578B2 JP2016517310A JP2016517310A JP6348578B2 JP 6348578 B2 JP6348578 B2 JP 6348578B2 JP 2016517310 A JP2016517310 A JP 2016517310A JP 2016517310 A JP2016517310 A JP 2016517310A JP 6348578 B2 JP6348578 B2 JP 6348578B2
Authority
JP
Japan
Prior art keywords
current
detection pixel
detection
current mirror
charge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2016517310A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016535470A (ja
JP2016535470A5 (https=
Inventor
イヴァン モロフ
イヴァン モロフ
Original Assignee
ヴァレックス イメージング コーポレイション
ヴァレックス イメージング コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ヴァレックス イメージング コーポレイション, ヴァレックス イメージング コーポレイション filed Critical ヴァレックス イメージング コーポレイション
Publication of JP2016535470A publication Critical patent/JP2016535470A/ja
Publication of JP2016535470A5 publication Critical patent/JP2016535470A5/ja
Application granted granted Critical
Publication of JP6348578B2 publication Critical patent/JP6348578B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2016517310A 2013-09-26 2014-09-24 撮像素子のための画素アーキテクチャ Expired - Fee Related JP6348578B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361882840P 2013-09-26 2013-09-26
US61/882,840 2013-09-26
US14/474,660 US9500752B2 (en) 2013-09-26 2014-09-02 Pixel architecture for imaging devices
US14/474,660 2014-09-02
PCT/US2014/057107 WO2015048059A1 (en) 2013-09-26 2014-09-24 Pixel architecture for imaging devices

Publications (3)

Publication Number Publication Date
JP2016535470A JP2016535470A (ja) 2016-11-10
JP2016535470A5 JP2016535470A5 (https=) 2017-11-02
JP6348578B2 true JP6348578B2 (ja) 2018-06-27

Family

ID=52690939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016517310A Expired - Fee Related JP6348578B2 (ja) 2013-09-26 2014-09-24 撮像素子のための画素アーキテクチャ

Country Status (5)

Country Link
US (1) US9500752B2 (https=)
JP (1) JP6348578B2 (https=)
CN (1) CN105594199B (https=)
DE (1) DE112014004420T5 (https=)
WO (1) WO2015048059A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9686490B2 (en) * 2014-04-01 2017-06-20 Sensors Unlimited, Inc. Integrating pixels and methods of operation
DE102016212765A1 (de) * 2016-07-13 2018-01-18 Robert Bosch Gmbh Pixeleinheit für einen Bildsensor, Bildsensor, Verfahren zum Sensieren eines Lichtsignals, Verfahren zum Ansteuern einer Pixeleinheit und Verfahren zum Generieren eines Bildes unter Verwendung einer Pixeleinheit
US10032264B2 (en) * 2016-07-15 2018-07-24 H3D, Inc. Reduction of background interference in a radiation image
CN109474795A (zh) * 2018-10-31 2019-03-15 天津大学 一种基于跨导单元的低噪声像素电路结构
CN109655877B (zh) 2019-01-04 2020-12-01 京东方科技集团股份有限公司 平板探测器的像素结构、平板探测器及摄像系统
CN110518816B (zh) * 2019-08-14 2021-05-07 三峡大学 一种输入端口数可调的模块化高增益整流电路
CN115053113B (zh) 2020-02-10 2025-09-09 三菱电机株式会社 红外线检测元件
CN114864609B (zh) * 2021-01-20 2026-01-23 京东方科技集团股份有限公司 有源像素传感器及平板探测器

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6751289B2 (en) * 2000-10-10 2004-06-15 Kabushiki Kaisha Toshiba X-ray diagnostic apparatus
JP3734717B2 (ja) * 2001-04-26 2006-01-11 富士通株式会社 イメージセンサ
JP3846572B2 (ja) 2001-09-20 2006-11-15 ソニー株式会社 固体撮像装置
AUPR900501A0 (en) 2001-11-22 2001-12-13 Silverbrook Research Pty. Ltd. Methods and systems (nps030)
GB0201260D0 (en) * 2002-01-21 2002-03-06 Europ Org For Nuclear Research A sensing and imaging device
JP4252247B2 (ja) * 2002-02-28 2009-04-08 富士通マイクロエレクトロニクス株式会社 感度を上げることができるｃｍｏｓイメージセンサ
US7936388B2 (en) * 2003-12-11 2011-05-03 Advasense Technologies (2004) Ltd. Apparatus and a method for low noise sensing
FR2866180B1 (fr) * 2004-02-06 2006-06-23 St Microelectronics Sa Procede de traitement des informations delivrees par une matrice de pixels actifs d'un capteur offrant une dynamique et un gain etendus, et capteur correspondant.
ATE458995T1 (de) 2005-01-06 2010-03-15 Koninkl Philips Electronics Nv Pixel-realisierter stromverstärker
PT103370B (pt) * 2005-10-20 2009-01-19 Univ Do Minho Matriz de imagem de raios-x com guias de luz e sensores de pixel inteligentes, dispositivos detectores de radiação ou de partículas de alta energia que a contém, seu processo de fabrico e sua utilização
GB2481970A (en) 2010-07-06 2012-01-18 St Microelectronics Res & Dev Ltd Image sensor with sample and hold circuitry for noise reduction
FR2965440B1 (fr) * 2010-09-29 2013-08-23 Commissariat Energie Atomique Dispositif d'imagerie a chute ohmique nulle dans un bus de donnee
JP5764468B2 (ja) * 2010-11-26 2015-08-19 富士フイルム株式会社 放射線画像検出装置、及び放射線画像撮影システム
US20130070134A1 (en) * 2011-09-16 2013-03-21 Boyd Fowler Low Noise CMOS Pixel Array
US20130082936A1 (en) * 2011-09-29 2013-04-04 Sharp Kabushiki Kaisha Sensor array with high linearity
CN102956197B (zh) * 2012-10-26 2015-07-01 上海大学 硅基有机发光二极管微显示器电流脉宽调制驱动电路

Also Published As

Publication number Publication date
JP2016535470A (ja) 2016-11-10
WO2015048059A1 (en) 2015-04-02
DE112014004420T5 (de) 2016-06-16
CN105594199B (zh) 2019-06-14
CN105594199A (zh) 2016-05-18
US20150085988A1 (en) 2015-03-26
US9500752B2 (en) 2016-11-22

Similar Documents

Publication Publication Date Title
JP6348578B2 (ja) 撮像素子のための画素アーキテクチャ
JP6706963B2 (ja) 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法
US8847136B2 (en) Conversion gain modulation using charge sharing pixel
EP2070313B1 (en) Compensation of leakage current and residual signals for integrating detector based on direct x-ray conversion
US8199236B2 (en) Device and pixel architecture for high resolution digital
US20070187609A1 (en) Multi-mode digital imaging apparatus and system
JP2008517541A (ja) 高利得デジタル画像システム
CN102066975A (zh) 信噪比改进的高动态范围x射线探测器
JP6353300B2 (ja) 画素回路、半導体光検出装置および放射線計数装置
Matsuura et al. Digital radiology using active matrix readout: amplified pixel detector array for fluoroscopy
US8130294B2 (en) Imaging array with non-linear light response
WO2016084454A1 (ja) 放射線検出器
JP6354221B2 (ja) 撮像装置及び電子機器
EP2673951B1 (en) Radiation detector and method
US20170048471A1 (en) Device and method
JP2004356866A (ja) 撮像装置
CN109031393B (zh) 光电探测电路以及光电探测器
US7268607B2 (en) Integrating capacitance circuitry for an integrating amplifier and related method
JP2019141345A (ja) 放射線撮像装置の制御装置、放射線撮像システム、および、放射線撮像システムの制御方法
GB2508493A (en) Image detector array having respective bias and output line select transistors

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170925

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170925

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20170925

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20171002

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20171218

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20171219

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180313

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180501

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180531

R150 Certificate of patent or registration of utility model

Ref document number: 6348578

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees