JP6325650B2 - 光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム - Google Patents
光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム Download PDFInfo
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- JP6325650B2 JP6325650B2 JP2016509357A JP2016509357A JP6325650B2 JP 6325650 B2 JP6325650 B2 JP 6325650B2 JP 2016509357 A JP2016509357 A JP 2016509357A JP 2016509357 A JP2016509357 A JP 2016509357A JP 6325650 B2 JP6325650 B2 JP 6325650B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/248—Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
- H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]
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- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Nuclear Medicine (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13165097.0 | 2013-04-24 | ||
| EP13165097 | 2013-04-24 | ||
| PCT/EP2014/056633 WO2014173644A1 (en) | 2013-04-24 | 2014-04-03 | Detection of radiation quanta using an optical detector pixel array and pixel cell trigger state sensing circuits |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016522890A JP2016522890A (ja) | 2016-08-04 |
| JP2016522890A5 JP2016522890A5 (OSRAM) | 2017-06-08 |
| JP6325650B2 true JP6325650B2 (ja) | 2018-05-16 |
Family
ID=48193107
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016509357A Active JP6325650B2 (ja) | 2013-04-24 | 2014-04-03 | 光検出器画素アレイを有する放射線検出装置、pet撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9677931B2 (OSRAM) |
| EP (1) | EP2989487B1 (OSRAM) |
| JP (1) | JP6325650B2 (OSRAM) |
| CN (1) | CN105143921B (OSRAM) |
| WO (1) | WO2014173644A1 (OSRAM) |
Families Citing this family (50)
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| GB201322940D0 (en) * | 2013-12-23 | 2014-02-12 | Johnson Matthey Plc | Radiation detection apparatus and method |
| US10527740B2 (en) * | 2014-04-03 | 2020-01-07 | Siemens Medical Solutions Usa, Inc. | Silicon photomultiplier based TOF-PET detector |
| US9927537B2 (en) * | 2014-12-15 | 2018-03-27 | General Electric Company | Systems and methods for positron emission tomography signal isolation |
| JP6738823B2 (ja) * | 2015-03-04 | 2020-08-12 | ラピスカン システムズ、インコーポレイテッド | マルチエネルギ検出器 |
| US10697829B2 (en) | 2015-07-08 | 2020-06-30 | The Commonwealth Of Australia | SPAD array structures and methods of operation |
| US10986998B2 (en) | 2016-04-26 | 2021-04-27 | Illinois Institute Of Technology | Apparatus and method for enhanced early photon detection in optical projection tomography |
| US10594920B2 (en) * | 2016-06-15 | 2020-03-17 | Stmicroelectronics, Inc. | Glass detection with time of flight sensor |
| CN106125127B (zh) * | 2016-06-18 | 2018-12-04 | 武汉京邦科技有限公司 | 一种硅光电倍增器的时间标记方法及其微元阵列编码系统 |
| CN106338757A (zh) * | 2016-09-07 | 2017-01-18 | 武汉京邦科技有限公司 | 一种基于数字化时间标记的太空望远镜 |
| WO2018123112A1 (ja) * | 2016-12-27 | 2018-07-05 | 株式会社島津製作所 | 光検出器 |
| US10613172B2 (en) * | 2017-06-22 | 2020-04-07 | General Electric Company | Readout electronics architecture with improved timing resolution |
| EP3419168B1 (en) * | 2017-06-23 | 2020-12-02 | ams AG | Avalanche diode arrangement and method for controlling an avalanche diode arrangement |
| WO2019000389A1 (en) * | 2017-06-30 | 2019-01-03 | Shanghai United Imaging Healthcare Co., Ltd. | SYSTEM AND METHOD FOR POSITRON EMISSION TOMOGRAPHY |
| WO2019019197A1 (en) * | 2017-07-28 | 2019-01-31 | Shenzhen United Imaging Healthcare Co., Ltd. | DETECTION DEVICE FOR POSITRON EMISSION TOMOGRAPHY |
| EP3451655B1 (en) * | 2017-08-31 | 2020-10-21 | Canon Kabushiki Kaisha | Solid-state image sensor and image capture apparatus |
| US10794758B2 (en) * | 2017-09-29 | 2020-10-06 | General Electric Company | System and method for verifying the integrity of a radiation detector |
| EP3701287A4 (en) * | 2017-10-26 | 2021-04-21 | Shenzhen Xpectvision Technology Co., Ltd. | RADIATION DETECTOR WITH NOISE HANDLING CAPABILITY |
| US10545224B2 (en) | 2017-12-06 | 2020-01-28 | Samsung Electronics Co., Ltd. | Time-resolving sensor using SPAD + PPD or capacitors in pixel for range measurement |
| EP3743738A4 (en) * | 2018-01-24 | 2021-07-28 | Shenzhen Xpectvision Technology Co., Ltd. | BAND PIXEL DETECTOR |
| US10254163B1 (en) * | 2018-03-15 | 2019-04-09 | Kromek Group, PLC | Interaction characteristics from a plurality of pixels |
| JP2019158806A (ja) * | 2018-03-16 | 2019-09-19 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置及び測距装置 |
| FR3079310B1 (fr) * | 2018-03-23 | 2020-04-17 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif de mesure de rayonnements alpha et/ou beta provenant d'une surface solide |
| JP7171213B2 (ja) * | 2018-04-02 | 2022-11-15 | キヤノン株式会社 | 光電変換装置及び撮像システム |
| EP3591440A1 (en) | 2018-07-04 | 2020-01-08 | ETH Zurich | Detection device and method for detecting sensor signals in a grid of sensor elements |
| EP3847481B1 (en) * | 2018-09-07 | 2023-11-29 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector |
| CN112601985A (zh) * | 2018-09-07 | 2021-04-02 | 深圳帧观德芯科技有限公司 | 一种具有在不同模式下操作的子像素的辐射检测器 |
| CN112673286B (zh) * | 2018-09-10 | 2024-11-01 | 皇家飞利浦有限公司 | 双传感器子像素辐射探测器 |
| JP2022510817A (ja) * | 2018-11-20 | 2022-01-28 | センス・フォトニクス,インコーポレイテッド | 空間的に分配されるストロービングのための方法及びシステム |
| WO2020150574A1 (en) * | 2019-01-18 | 2020-07-23 | Sense Photonics, Inc. | Digital pixels and operating methods thereof |
| WO2020178455A1 (en) * | 2019-03-07 | 2020-09-10 | ams Sensors Germany GmbH | Low current detection |
| CN110044479B (zh) * | 2019-03-11 | 2020-07-31 | 西安电子科技大学 | 一种基于无时钟电流舵dac结构的硅光电倍增管 |
| CN110226943B (zh) * | 2019-07-05 | 2023-08-15 | 上海联影医疗科技股份有限公司 | 光子到达探测器的参数计算方法、装置和计算机设备 |
| JP2021050949A (ja) * | 2019-09-24 | 2021-04-01 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子、および、電子機器 |
| CN110632641B (zh) * | 2019-09-26 | 2024-07-09 | 南昌华亮光电有限责任公司 | 一种双读出pet探测器正电子成像方法与系统 |
| CN111103614B (zh) * | 2020-01-02 | 2024-12-24 | 苏州瑞派宁科技有限公司 | 信号采样电路、探测装置及成像系统 |
| EP4097509A4 (en) | 2020-01-29 | 2024-05-29 | The Trustees Of Dartmouth College | Imaging system and methods of high resolution cherenkov dose images |
| US12004887B2 (en) * | 2020-01-31 | 2024-06-11 | Canon Medical Systems Corporation | Radiation diagnosis device with a first detector detecting Cherenkov light and a second detector detecting energy information of radiation |
| CN110926623B (zh) * | 2020-02-10 | 2020-05-19 | 南京邮电大学 | 一种高动态范围的时间-幅度转换电路及其测量方法 |
| KR20210150765A (ko) | 2020-06-04 | 2021-12-13 | 에스케이하이닉스 주식회사 | 이미지 센싱 장치 및 이를 포함하는 촬영 장치 |
| US12255217B2 (en) * | 2020-07-17 | 2025-03-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device, semiconductor image sensor, and method of manufacturing the same |
| IT202100006728A1 (it) * | 2021-03-19 | 2022-09-19 | Milano Politecnico | Sistema e metodo per la rivelazione, localizzazione e segnalazione di eventi di singolo fotone e di coincidenza temporale di almeno due fotoni |
| CN113109856A (zh) * | 2021-04-06 | 2021-07-13 | 明峰医疗系统股份有限公司 | 基于时分复用技术的ct探测器动态采样方法、系统及计算机可读存储介质 |
| CN113340441A (zh) * | 2021-07-09 | 2021-09-03 | 中国科学技术大学 | 发光检测系统 |
| CN114114210B (zh) * | 2021-11-25 | 2022-08-26 | 武汉市聚芯微电子有限责任公司 | 时间戳数据读写电路以及测距系统 |
| CN116088025B (zh) * | 2023-02-27 | 2025-08-08 | 西南科技大学 | 一种海洋放射性自适应探测系统与方法 |
| CN118282506B (zh) * | 2024-04-08 | 2024-11-08 | 中国科学院空间应用工程与技术中心 | 一种用于光电探测阵列的时间延迟校准方法和通信装置 |
| CN119363117B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119363116B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119382705B (zh) * | 2024-12-24 | 2025-05-09 | 合肥锐世数字科技有限公司 | 信号数字化方法、装置、计算机存储介质以及数字pet系统 |
| CN119644394A (zh) * | 2024-12-31 | 2025-03-18 | 清华大学 | 辐射敏感探测器及辐射检查设备 |
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| EP0531566B1 (de) | 1991-09-11 | 1994-07-06 | Siemens Aktiengesellschaft | Verfahren zur schnellen Ortung mit dem Maximum Likelihood-Estimator bei einer Gamma-Kamera |
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| GB0201260D0 (en) | 2002-01-21 | 2002-03-06 | Europ Org For Nuclear Research | A sensing and imaging device |
| DE10206173B4 (de) | 2002-02-14 | 2006-08-31 | Bruker Daltonik Gmbh | Hochauflösende Detektion für Flugzeitmassenspektrometer |
| JP2006284346A (ja) * | 2005-03-31 | 2006-10-19 | Shimadzu Corp | 放射線断層撮影装置 |
| BRPI0610720B1 (pt) * | 2005-04-22 | 2018-01-16 | Koninklijke Philips N. V. | pixel detector para uso em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, detector de radiação, sistema de geração de imagem de tomografia por emissão de pósitron de duração de trajetória (tof-pet), 5 método executado em conjunto com um cintilador que converte uma partícula de radiação para uma rajada de luz, e detector de radiação que inclui um cintilador e circuitos |
| US7187316B1 (en) | 2006-02-06 | 2007-03-06 | Brookhaven Science Associates, Llc | Method and apparatus for clockless analog-to-digital conversion and peak detection |
| US8598536B2 (en) * | 2006-10-04 | 2013-12-03 | CERN—European Organization for Nuclear Research | Apparatus and method for medical imaging |
| US7829860B2 (en) * | 2006-10-31 | 2010-11-09 | Dxray, Inc. | Photon counting imaging detector system |
| JP4825116B2 (ja) * | 2006-11-22 | 2011-11-30 | 浜松ホトニクス株式会社 | 固体撮像装置及び撮像方法 |
| FR2912588B1 (fr) * | 2007-02-13 | 2009-04-10 | Commissariat Energie Atomique | Detecteur de rayonnement x ou gamma |
| WO2009115956A2 (en) * | 2008-03-19 | 2009-09-24 | Koninklijke Philips Electronics N.V. | Single photon radiation detector |
| US8716643B2 (en) | 2010-09-06 | 2014-05-06 | King Abdulaziz City Science And Technology | Single photon counting image sensor and method |
| US8859944B2 (en) * | 2010-09-07 | 2014-10-14 | King Abdulaziz City Science And Technology | Coordinated in-pixel light detection method and apparatus |
| IT1402264B1 (it) * | 2010-09-16 | 2013-08-28 | St Microelectronics Srl | Array fotorilevatore multi-pixel di fotodiodi a valanga geiger-mode |
| EP2469294A1 (en) | 2010-12-23 | 2012-06-27 | André Borowski | 2D/3D real-time imager and corresponding imaging methods |
| US8294110B2 (en) * | 2011-03-11 | 2012-10-23 | Kabushiki Kaisha Toshiba | Method for improved correction of SiPM non-linearity in multiplexed radiation detectors |
| IL212289A (en) | 2011-04-13 | 2016-08-31 | Semi-Conductor Devices - An Elbit Systems - Rafael Partnership | Detector pixel signal readout circuit and an imaging method thereof |
| US8581188B2 (en) * | 2011-08-05 | 2013-11-12 | Pulsetor, Llc | Electron detector including one or more intimately-coupled scintillator-photomultiplier combinations, and electron microscope employing same |
| CN102538988B (zh) | 2012-02-08 | 2014-05-07 | 南京邮电大学 | 一种单光子雪崩二极管成像器件的淬灭与读出电路 |
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2014
- 2014-04-03 CN CN201480023147.0A patent/CN105143921B/zh active Active
- 2014-04-03 EP EP14717431.2A patent/EP2989487B1/en active Active
- 2014-04-03 US US14/784,993 patent/US9677931B2/en active Active
- 2014-04-03 JP JP2016509357A patent/JP6325650B2/ja active Active
- 2014-04-03 WO PCT/EP2014/056633 patent/WO2014173644A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP2016522890A (ja) | 2016-08-04 |
| WO2014173644A1 (en) | 2014-10-30 |
| US20160084703A1 (en) | 2016-03-24 |
| EP2989487B1 (en) | 2019-04-03 |
| US9677931B2 (en) | 2017-06-13 |
| CN105143921A (zh) | 2015-12-09 |
| EP2989487A1 (en) | 2016-03-02 |
| CN105143921B (zh) | 2018-10-23 |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |