JP6281958B2 - カスタマイズ可能な流れの注入を伴うエピタキシャルチャンバ - Google Patents

カスタマイズ可能な流れの注入を伴うエピタキシャルチャンバ Download PDF

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JP6281958B2
JP6281958B2 JP2015539628A JP2015539628A JP6281958B2 JP 6281958 B2 JP6281958 B2 JP 6281958B2 JP 2015539628 A JP2015539628 A JP 2015539628A JP 2015539628 A JP2015539628 A JP 2015539628A JP 6281958 B2 JP6281958 B2 JP 6281958B2
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Japan
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gas
process gas
substrate
injection device
adjustable
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Japanese (ja)
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JP2015534283A (ja
JP2015534283A5 (ko
Inventor
シュー−クワン ラウ,
シュー−クワン ラウ,
チョーポン ツォン,
チョーポン ツォン,
メフメト トゥールル サミール,
メフメト トゥールル サミール,
ジーユエン イェー,
ジーユエン イェー,
デーヴィッド ケー. カールソン,
デーヴィッド ケー. カールソン,
シュエピン リー,
シュエピン リー,
エロール アントニオ シー. サンチェス,
エロール アントニオ シー. サンチェス,
スワミナタン スリニバサン,
スワミナタン スリニバサン,
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Applied Materials Inc
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Applied Materials Inc
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Publication of JP2015534283A5 publication Critical patent/JP2015534283A5/ja
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45514Mixing in close vicinity to the substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/14Feed and outlet means for the gases; Modifying the flow of the reactive gases
JP2015539628A 2012-10-26 2013-10-08 カスタマイズ可能な流れの注入を伴うエピタキシャルチャンバ Active JP6281958B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261719009P 2012-10-26 2012-10-26
US61/719,009 2012-10-26
US14/047,047 US20140137801A1 (en) 2012-10-26 2013-10-07 Epitaxial chamber with customizable flow injection
US14/047,047 2013-10-07
PCT/US2013/063899 WO2014066033A1 (en) 2012-10-26 2013-10-08 Epitaxial chamber with customizable flow injection

Publications (3)

Publication Number Publication Date
JP2015534283A JP2015534283A (ja) 2015-11-26
JP2015534283A5 JP2015534283A5 (ko) 2016-12-01
JP6281958B2 true JP6281958B2 (ja) 2018-02-21

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JP2015539628A Active JP6281958B2 (ja) 2012-10-26 2013-10-08 カスタマイズ可能な流れの注入を伴うエピタキシャルチャンバ

Country Status (7)

Country Link
US (2) US20140137801A1 (ko)
JP (1) JP6281958B2 (ko)
KR (1) KR102135229B1 (ko)
CN (1) CN104756231B (ko)
SG (2) SG11201502761RA (ko)
TW (1) TWI628729B (ko)
WO (1) WO2014066033A1 (ko)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9512520B2 (en) * 2011-04-25 2016-12-06 Applied Materials, Inc. Semiconductor substrate processing system
US9499905B2 (en) * 2011-07-22 2016-11-22 Applied Materials, Inc. Methods and apparatus for the deposition of materials on a substrate
US9840778B2 (en) * 2012-06-01 2017-12-12 Taiwan Semiconductor Manufacturing Company, Ltd. Plasma chamber having an upper electrode having controllable valves and a method of using the same
US10344380B2 (en) 2013-02-11 2019-07-09 Globalwafers Co., Ltd. Liner assemblies for substrate processing systems
US11414759B2 (en) * 2013-11-29 2022-08-16 Taiwan Semiconductor Manufacturing Co., Ltd Mechanisms for supplying process gas into wafer process apparatus
JP6542245B2 (ja) * 2014-02-14 2019-07-10 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 射出アセンブリ付きの上方ドーム
WO2015195256A1 (en) * 2014-06-18 2015-12-23 Applied Materials, Inc. One-piece injector assembly
JP6629248B2 (ja) * 2014-06-20 2020-01-15 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated エピタキシャルチャンバへのガス注入装置
US11060203B2 (en) * 2014-09-05 2021-07-13 Applied Materials, Inc. Liner for epi chamber
US10760161B2 (en) * 2014-09-05 2020-09-01 Applied Materials, Inc. Inject insert for EPI chamber
JP6402058B2 (ja) * 2015-03-23 2018-10-10 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法及びプログラム
KR20180008907A (ko) * 2015-06-12 2018-01-24 어플라이드 머티어리얼스, 인코포레이티드 반도체 에피택시 성장을 위한 주입기
KR102350588B1 (ko) 2015-07-07 2022-01-14 삼성전자 주식회사 인젝터를 갖는 박막 형성 장치
US10260149B2 (en) * 2016-04-28 2019-04-16 Applied Materials, Inc. Side inject nozzle design for processing chamber
CN107403717B (zh) * 2016-04-28 2023-07-18 应用材料公司 一种用于处理腔室的改进侧注入喷嘴设计
DE102016211614A1 (de) * 2016-06-28 2017-12-28 Siltronic Ag Verfahren und Vorrichtung zur Herstellung von beschichteten Halbleiterscheiben
US20180033659A1 (en) * 2016-07-28 2018-02-01 Applied Materials, Inc. Gas purge system and method for outgassing control
US10752991B2 (en) * 2017-02-06 2020-08-25 Applied Materials, Inc. Half-angle nozzle
WO2018154823A1 (ja) 2017-02-23 2018-08-30 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法およびプログラム
US11469079B2 (en) * 2017-03-14 2022-10-11 Lam Research Corporation Ultrahigh selective nitride etch to form FinFET devices
US11077410B2 (en) * 2017-10-09 2021-08-03 Applied Materials, Inc. Gas injector with baffle
DE102018120580A1 (de) * 2018-08-23 2020-02-27 Infineon Technologies Ag Vorrichtung und verfahren zum abscheiden einer schicht bei atmosphärendruck
WO2020046567A1 (en) * 2018-08-29 2020-03-05 Applied Materials, Inc. Chamber injector
JP6902060B2 (ja) 2019-02-13 2021-07-14 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法、およびプログラム
US11032945B2 (en) * 2019-07-12 2021-06-08 Applied Materials, Inc. Heat shield assembly for an epitaxy chamber
CN111455458B (zh) * 2019-09-18 2021-11-16 北京北方华创微电子装备有限公司 外延装置及应用于外延装置的进气结构
DE102020103946A1 (de) 2020-02-14 2021-08-19 AIXTRON Ltd. Gaseinlasseinrichtung für einen CVD-Reaktor
TWI775073B (zh) * 2020-05-07 2022-08-21 台灣積體電路製造股份有限公司 光固化的方法及其設備
EP4074861A1 (de) 2021-04-13 2022-10-19 Siltronic AG Verfahren zum herstellen von halbleiterscheiben mit aus der gasphase abgeschiedener epitaktischer schicht in einer abscheidekammer
US20220364261A1 (en) * 2021-05-11 2022-11-17 Applied Materials, Inc. Chamber architecture for epitaxial deposition and advanced epitaxial film applications

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2653633B1 (fr) * 1989-10-19 1991-12-20 Commissariat Energie Atomique Dispositif de traitement chimique assiste par un plasma de diffusion.
US5551985A (en) * 1995-08-18 1996-09-03 Torrex Equipment Corporation Method and apparatus for cold wall chemical vapor deposition
TW356554B (en) * 1995-10-23 1999-04-21 Watkins Johnson Co Gas injection system for semiconductor processing
JP3517808B2 (ja) * 1996-07-17 2004-04-12 日本酸素株式会社 気相成長方法及び装置
JP4381489B2 (ja) * 1997-06-24 2009-12-09 ソニー株式会社 化学気相成長装置
US6291800B1 (en) * 1998-02-20 2001-09-18 Tokyo Electron Limited Heat treatment apparatus and substrate processing system
JP3203225B2 (ja) * 1998-02-23 2001-08-27 東京エレクトロン株式会社 熱処理装置
JP2000331939A (ja) * 1999-05-17 2000-11-30 Applied Materials Inc 成膜装置
US6656831B1 (en) * 2000-01-26 2003-12-02 Applied Materials, Inc. Plasma-enhanced chemical vapor deposition of a metal nitride layer
KR100571731B1 (ko) * 2000-11-11 2006-04-17 할도르 토프쉐 에이/에스 개선된 수소화공정 방법 및 기존의 수소화공정 반응기를개장하는 방법
US7098131B2 (en) * 2001-07-19 2006-08-29 Samsung Electronics Co., Ltd. Methods for forming atomic layers and thin films including tantalum nitride and devices including the same
US20070137794A1 (en) * 2003-09-24 2007-06-21 Aviza Technology, Inc. Thermal processing system with across-flow liner
KR100578136B1 (ko) * 2004-01-27 2006-05-10 삼성전자주식회사 플라즈마로 강화된 반도체 증착 장비
TW200729300A (en) * 2005-11-30 2007-08-01 Nuflare Technology Inc Film-forming method and film-forming equipment
CA2677857A1 (en) * 2007-04-24 2008-11-06 Linde North America, Inc. Flash processing of asphaltic residual oil
JP2010040541A (ja) * 2008-07-31 2010-02-18 Sumco Corp エピタキシャル装置
US20100108263A1 (en) * 2008-10-30 2010-05-06 Applied Materials, Inc. Extended chamber liner for improved mean time between cleanings of process chambers
JP5268766B2 (ja) * 2009-04-23 2013-08-21 Sumco Techxiv株式会社 成膜反応装置及び成膜基板製造方法
JP2010263112A (ja) * 2009-05-08 2010-11-18 Sumco Corp エピタキシャル成長装置及びシリコンエピタキシャルウェーハの製造方法
US9127360B2 (en) * 2009-10-05 2015-09-08 Applied Materials, Inc. Epitaxial chamber with cross flow

Also Published As

Publication number Publication date
CN104756231B (zh) 2020-08-28
US20140137801A1 (en) 2014-05-22
KR102135229B1 (ko) 2020-07-17
CN104756231A (zh) 2015-07-01
JP2015534283A (ja) 2015-11-26
WO2014066033A1 (en) 2014-05-01
SG10201703437WA (en) 2017-05-30
TWI628729B (zh) 2018-07-01
TW201419438A (zh) 2014-05-16
US20180209043A1 (en) 2018-07-26
SG11201502761RA (en) 2015-06-29
KR20150074165A (ko) 2015-07-01

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