JP6253270B2 - 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法 - Google Patents

電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法 Download PDF

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JP6253270B2
JP6253270B2 JP2013126002A JP2013126002A JP6253270B2 JP 6253270 B2 JP6253270 B2 JP 6253270B2 JP 2013126002 A JP2013126002 A JP 2013126002A JP 2013126002 A JP2013126002 A JP 2013126002A JP 6253270 B2 JP6253270 B2 JP 6253270B2
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Japan
Prior art keywords
potential
signal line
capacitor
switching element
discharge
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JP2013126002A
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English (en)
Japanese (ja)
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JP2015001446A5 (cg-RX-API-DMAC7.html
JP2015001446A (ja
Inventor
直昭 杉村
直昭 杉村
崇明 伊澤
崇明 伊澤
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Lapis Semiconductor Co Ltd
Yazaki Corp
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Lapis Semiconductor Co Ltd
Yazaki Corp
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Application filed by Lapis Semiconductor Co Ltd, Yazaki Corp filed Critical Lapis Semiconductor Co Ltd
Priority to JP2013126002A priority Critical patent/JP6253270B2/ja
Priority to PCT/JP2014/065505 priority patent/WO2014200033A1/ja
Priority to DE112014002795.2T priority patent/DE112014002795T5/de
Priority to US14/897,157 priority patent/US9857432B2/en
Publication of JP2015001446A publication Critical patent/JP2015001446A/ja
Publication of JP2015001446A5 publication Critical patent/JP2015001446A5/ja
Application granted granted Critical
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/396Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52Testing for short-circuits, leakage current or ground faults
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54Testing for continuity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16542Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies for batteries

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Secondary Cells (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
JP2013126002A 2013-06-14 2013-06-14 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法 Active JP6253270B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2013126002A JP6253270B2 (ja) 2013-06-14 2013-06-14 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法
PCT/JP2014/065505 WO2014200033A1 (ja) 2013-06-14 2014-06-11 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法
DE112014002795.2T DE112014002795T5 (de) 2013-06-14 2014-06-11 Batterieüberwachungssystem, Halbleiterschaltung, Leitungsbruch-Detektionsprogramm und Leitungsbruch-Detektionsverfahren
US14/897,157 US9857432B2 (en) 2013-06-14 2014-06-11 Battery monitoring system, semiconductor circuit, line-breakage detection program, and line-breakage detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013126002A JP6253270B2 (ja) 2013-06-14 2013-06-14 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法

Publications (3)

Publication Number Publication Date
JP2015001446A JP2015001446A (ja) 2015-01-05
JP2015001446A5 JP2015001446A5 (cg-RX-API-DMAC7.html) 2016-07-07
JP6253270B2 true JP6253270B2 (ja) 2017-12-27

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JP2013126002A Active JP6253270B2 (ja) 2013-06-14 2013-06-14 電池監視システム、半導体回路、断線検出プログラム、及び断線検出方法

Country Status (4)

Country Link
US (1) US9857432B2 (cg-RX-API-DMAC7.html)
JP (1) JP6253270B2 (cg-RX-API-DMAC7.html)
DE (1) DE112014002795T5 (cg-RX-API-DMAC7.html)
WO (1) WO2014200033A1 (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7049115B2 (ja) * 2015-09-17 2022-04-06 ヌヴォトンテクノロジージャパン株式会社 異常検出装置、及び電池システム
JP6539618B2 (ja) * 2016-07-21 2019-07-03 矢崎総業株式会社 電池監視システム
JP6753730B2 (ja) * 2016-08-26 2020-09-09 矢崎総業株式会社 電池監視システム、断線検出機能の自己診断方法
JP6603695B2 (ja) * 2017-09-15 2019-11-06 矢崎総業株式会社 異常検出装置
TWI737022B (zh) * 2019-10-23 2021-08-21 國立中山大學 電池組之斷線偵測器
CN111289939B (zh) * 2020-03-13 2021-08-03 深圳市创芯微微电子有限公司 电池断线检测电路
US20240175924A1 (en) * 2022-11-30 2024-05-30 O2Micro Inc. Battery monitoring circuits

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3300309B2 (ja) 1999-10-19 2002-07-08 本田技研工業株式会社 電池電圧測定装置
JP3709785B2 (ja) * 2000-12-01 2005-10-26 日産自動車株式会社 組電池の診断装置
JP3696124B2 (ja) 2001-05-17 2005-09-14 三洋電機株式会社 組電池の電圧検出回路
JP4569756B2 (ja) 2002-04-19 2010-10-27 新日本理化株式会社 液状植物性不飽和アルコール及びその製造方法
JP4254209B2 (ja) 2002-11-22 2009-04-15 新神戸電機株式会社 電池電圧検出線の検査方法、検査回路及び電池モジュール
JP4075785B2 (ja) 2003-12-01 2008-04-16 日産自動車株式会社 組電池の異常検出装置
JP4247681B2 (ja) 2004-07-14 2009-04-02 株式会社デンソー 組電池充電状態検出装置
JP4069455B2 (ja) 2004-08-04 2008-04-02 株式会社デンソー 組電池充電状態制御装置
JP4605047B2 (ja) 2006-02-24 2011-01-05 パナソニック株式会社 積層電圧計測装置
JP5076812B2 (ja) 2006-12-18 2012-11-21 日産自動車株式会社 異常診断装置
JP2012021867A (ja) * 2010-07-14 2012-02-02 Ricoh Co Ltd 二次電池を複数個直列に接続した組電池の保護用半導体装置、該保護用半導体装置を内蔵した電池パックおよび電子機器
JP5705556B2 (ja) * 2011-01-11 2015-04-22 ラピスセミコンダクタ株式会社 半導体回路、半導体装置、断線検出方法、及び断線検出プログラム
JP5698004B2 (ja) * 2011-01-12 2015-04-08 ラピスセミコンダクタ株式会社 半導体回路、電池監視システム、診断プログラム、及び診断方法
JP5839908B2 (ja) * 2011-09-21 2016-01-06 ラピスセミコンダクタ株式会社 半導体回路、電池監視システム、制御プログラム、及び制御方法

Also Published As

Publication number Publication date
DE112014002795T5 (de) 2016-03-24
US20160131718A1 (en) 2016-05-12
WO2014200033A1 (ja) 2014-12-18
JP2015001446A (ja) 2015-01-05
US9857432B2 (en) 2018-01-02

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