JP6192280B2 - レーザ光源装置およびレーザ顕微鏡 - Google Patents

レーザ光源装置およびレーザ顕微鏡 Download PDF

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Publication number
JP6192280B2
JP6192280B2 JP2012214454A JP2012214454A JP6192280B2 JP 6192280 B2 JP6192280 B2 JP 6192280B2 JP 2012214454 A JP2012214454 A JP 2012214454A JP 2012214454 A JP2012214454 A JP 2012214454A JP 6192280 B2 JP6192280 B2 JP 6192280B2
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dispersion
wavelength
optical system
laser light
light source
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Japanese (ja)
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JP2013083970A5 (enExample
JP2013083970A (ja
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博一 久保
博一 久保
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Olympus Corp
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Olympus Corp
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0057—Temporal shaping, e.g. pulse compression, frequency chirping
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/353—Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
    • G02F1/3532—Arrangements of plural nonlinear devices for generating multi-colour light beams, e.g. arrangements of SHG, SFG, OPO devices for generating RGB light beams
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/39—Non-linear optics for parametric generation or amplification of light, infrared or ultraviolet waves
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
    • G02B2207/114—Two photon or multiphoton effect
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0092—Nonlinear frequency conversion, e.g. second harmonic generation [SHG] or sum- or difference-frequency generation outside the laser cavity

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Lasers (AREA)
JP2012214454A 2011-09-30 2012-09-27 レーザ光源装置およびレーザ顕微鏡 Active JP6192280B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012214454A JP6192280B2 (ja) 2011-09-30 2012-09-27 レーザ光源装置およびレーザ顕微鏡

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011217160 2011-09-30
JP2011217160 2011-09-30
JP2012214454A JP6192280B2 (ja) 2011-09-30 2012-09-27 レーザ光源装置およびレーザ顕微鏡

Publications (3)

Publication Number Publication Date
JP2013083970A JP2013083970A (ja) 2013-05-09
JP2013083970A5 JP2013083970A5 (enExample) 2015-11-12
JP6192280B2 true JP6192280B2 (ja) 2017-09-06

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US (1) US9356413B2 (enExample)
JP (1) JP6192280B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013227103B4 (de) * 2013-09-03 2018-05-30 Leica Microsystems Cms Gmbh Mikroskop mit einer akustooptischen Vorrichtung
WO2015108991A2 (en) 2014-01-17 2015-07-23 Imra America, Inc. Laser-based modification of transparent materials
JP2017513211A (ja) * 2014-02-28 2017-05-25 イムラ アメリカ インコーポレイテッド 顕微鏡に適用される多波長超短パルスの生成及び放出
CN103823309B (zh) * 2014-03-12 2016-05-04 南开大学 一种时空分布可调的超短激光脉冲分束方法及装置
CN103885166A (zh) * 2014-03-28 2014-06-25 天津大学 基于布拉格衍射晶体的超高分辨非线性激发荧光显微系统
JP6501451B2 (ja) * 2014-03-31 2019-04-17 キヤノン株式会社 光源装置およびそれを用いた情報取得装置
CN103995362A (zh) * 2014-04-24 2014-08-20 南开大学 一种连续调节脉冲间隔的方法和装置
US10156771B2 (en) * 2015-12-01 2018-12-18 The United States Of America, As Represented By The Secretary Of Commerce Optical parametric oscillator
JP6746371B2 (ja) * 2016-05-13 2020-08-26 キヤノン株式会社 光源装置及び情報取得装置
CN105742953A (zh) * 2016-05-13 2016-07-06 上海朗研光电科技有限公司 一种用脉冲堆积放大实现高功率超短脉冲激光的装置与方法
FR3092442B1 (fr) * 2019-02-04 2022-12-30 Amplitude Systemes Système laser à superposition temporelle d’impulsions
US11808568B2 (en) * 2021-02-05 2023-11-07 Shangqing Liu Method of inner light layer illumination by multi-beam interference and apparatuses for imaging in turbid media
US20220258277A1 (en) * 2021-02-12 2022-08-18 Joyce Liu Laser Beam Processing Apparatuses and Correspondent Method Using Multi-beam Interference
CN119812918B (zh) * 2024-12-31 2025-11-04 中国科学院长春光学精密机械与物理研究所 大能量碟片激光器热镜效应控制系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10056382B4 (de) 2000-11-14 2004-07-01 Leica Microsystems Heidelberg Gmbh Scanmikroskop
DE10347712A1 (de) * 2003-10-14 2005-05-12 Leica Microsystems Rastermikroskop
JP2005172776A (ja) * 2003-12-07 2005-06-30 Kazuyoshi Ito 複数の波長依存性物質を含む試料の分析方法及び分析装置
FR2877103B1 (fr) * 2004-10-22 2012-02-10 Mauna Kea Technologies Systeme et procede d'imagerie microscopique multiphotonique fibre d'un echantillon
DE102005059338A1 (de) * 2005-12-08 2007-06-14 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur Untersuchung von Proben
JP5185695B2 (ja) * 2008-05-23 2013-04-17 オリンパス株式会社 レーザ顕微鏡装置及び標本画像取得方法
JP2011017965A (ja) * 2009-07-10 2011-01-27 Nikon Corp 顕微鏡装置、および顕微鏡装置の制御方法
JP2011128287A (ja) * 2009-12-16 2011-06-30 Nikon Corp 多光子顕微鏡
JP2011146463A (ja) * 2010-01-13 2011-07-28 Nikon Corp レーザ発振装置
WO2011091316A2 (en) * 2010-01-22 2011-07-28 Newport Corporation Broadly tunable optical parametric oscillator

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US9356413B2 (en) 2016-05-31
JP2013083970A (ja) 2013-05-09
US20130083816A1 (en) 2013-04-04

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