JP6182840B2 - 放射線検出器の製造方法 - Google Patents

放射線検出器の製造方法 Download PDF

Info

Publication number
JP6182840B2
JP6182840B2 JP2012201790A JP2012201790A JP6182840B2 JP 6182840 B2 JP6182840 B2 JP 6182840B2 JP 2012201790 A JP2012201790 A JP 2012201790A JP 2012201790 A JP2012201790 A JP 2012201790A JP 6182840 B2 JP6182840 B2 JP 6182840B2
Authority
JP
Japan
Prior art keywords
radiation detector
partition
substrate
manufacturing
scintillator layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2012201790A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014029314A5 (fr
JP2014029314A (ja
Inventor
川西　光宏
光宏 川西
五十嵐　崇裕
崇裕 五十嵐
真一 小口
真一 小口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2012201790A priority Critical patent/JP6182840B2/ja
Priority to PCT/JP2013/002976 priority patent/WO2014002363A1/fr
Publication of JP2014029314A publication Critical patent/JP2014029314A/ja
Publication of JP2014029314A5 publication Critical patent/JP2014029314A5/ja
Application granted granted Critical
Publication of JP6182840B2 publication Critical patent/JP6182840B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
JP2012201790A 2012-06-25 2012-09-13 放射線検出器の製造方法 Active JP6182840B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012201790A JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法
PCT/JP2013/002976 WO2014002363A1 (fr) 2012-06-25 2013-05-09 Détecteur de rayonnement et son procédé de fabrication

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012142132 2012-06-25
JP2012142132 2012-06-25
JP2012201790A JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017145110A Division JP6515958B2 (ja) 2012-06-25 2017-07-27 放射線検出器及びその製造方法

Publications (3)

Publication Number Publication Date
JP2014029314A JP2014029314A (ja) 2014-02-13
JP2014029314A5 JP2014029314A5 (fr) 2015-04-02
JP6182840B2 true JP6182840B2 (ja) 2017-08-23

Family

ID=49782565

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012201790A Active JP6182840B2 (ja) 2012-06-25 2012-09-13 放射線検出器の製造方法

Country Status (2)

Country Link
JP (1) JP6182840B2 (fr)
WO (1) WO2014002363A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017191113A (ja) * 2012-06-25 2017-10-19 ソニー株式会社 放射線検出器及びその製造方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10087367B2 (en) 2013-01-21 2018-10-02 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
US11597877B2 (en) 2013-01-21 2023-03-07 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
US11098248B2 (en) 2013-01-21 2021-08-24 Siemens Medical Solutions Usa, Inc. Passivation of metal halide scintillators
WO2015076150A1 (fr) * 2013-11-20 2015-05-28 東レ株式会社 Panneau scintillateur
US10393887B2 (en) * 2015-07-19 2019-08-27 Afo Research, Inc. Fluorine resistant, radiation resistant, and radiation detection glass systems
EP3193337A1 (fr) * 2016-01-13 2017-07-19 Siemens Medical Solutions USA, Inc. Passivation de scintillateurs à halogénure métallique
JP6781868B2 (ja) * 2016-03-24 2020-11-11 国立大学法人静岡大学 放射線検出素子の製造方法
EP3473183A4 (fr) 2016-06-15 2020-02-12 Shimadzu Corporation Dispositif d'imagerie par rayonnement
JPWO2018020555A1 (ja) * 2016-07-25 2018-12-06 野洲メディカルイメージングテクノロジー株式会社 シンチレータセンサ基板及びシンチレータセンサ基板の製造方法
EP3660542A1 (fr) * 2018-11-29 2020-06-03 Koninklijke Philips N.V. Détecteur optique et à rayons x hybride
US11465932B2 (en) 2019-03-25 2022-10-11 Afo Research, Inc. Alkali free fluorophosphate based glass systems
CN114316943B (zh) 2020-09-30 2023-08-11 株式会社博迈立铖 闪烁体结构体及其制造方法
JP6879426B1 (ja) * 2020-09-30 2021-06-02 日立金属株式会社 シンチレータ構造体およびその製造方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09145845A (ja) * 1995-11-22 1997-06-06 Canon Inc 放射線検出器及び放射線検出装置
JP4097455B2 (ja) * 2001-06-25 2008-06-11 化成オプトニクス株式会社 デジタルラジオグラフィー用酸硫化ガドリニウム蛍光体、放射線像変換スクリーン及び放射線像撮像装置
JP2003262672A (ja) * 2002-03-11 2003-09-19 Canon Inc 放射線検出装置及びその製造方法
WO2003083513A1 (fr) * 2002-03-28 2003-10-09 Kabushiki Kaisha Toshiba Detecteur de rayons x
JP2004239722A (ja) * 2003-02-05 2004-08-26 Toshiba Corp 放射線検出器
JP4307127B2 (ja) * 2003-04-02 2009-08-05 キヤノン株式会社 放射線撮影装置
JP2004317300A (ja) * 2003-04-16 2004-11-11 Toshiba Corp 放射線平面検出器及びその製造方法
JP2004340737A (ja) * 2003-05-15 2004-12-02 Toshiba Corp 放射線検出器及びその製造方法
DE102004056999A1 (de) * 2004-11-25 2006-06-01 Siemens Ag Verfahren zur Herstellung einer Szintillatorschicht für einen Röntgendetektor und Szintillatorschicht
JP5313632B2 (ja) * 2008-11-04 2013-10-09 富士フイルム株式会社 放射線画像検出器
JP2011007552A (ja) * 2009-06-24 2011-01-13 Konica Minolta Medical & Graphic Inc シンチレータパネル、放射線検出装置、及びシンチレータパネルの製造方法
JP5369979B2 (ja) * 2009-08-05 2013-12-18 コニカミノルタ株式会社 放射線画像検出装置
JP2011257339A (ja) * 2010-06-11 2011-12-22 Konica Minolta Medical & Graphic Inc 放射線画像検出装置
WO2012161304A1 (fr) * 2011-05-26 2012-11-29 東レ株式会社 Panneau scintillateur et procédé de fabrication de panneau scintillateur

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017191113A (ja) * 2012-06-25 2017-10-19 ソニー株式会社 放射線検出器及びその製造方法

Also Published As

Publication number Publication date
JP2014029314A (ja) 2014-02-13
WO2014002363A1 (fr) 2014-01-03

Similar Documents

Publication Publication Date Title
JP6182840B2 (ja) 放射線検出器の製造方法
US9632185B2 (en) Scintillator panel and method for manufacturing the same
TWI574670B (zh) Radiation detecting device and manufacturing method thereof
US9564253B2 (en) Scintillator panel
TWI589912B (zh) Scintillator panel and scintillator panel manufacturing method
JP6515958B2 (ja) 放射線検出器及びその製造方法
KR102533843B1 (ko) 신틸레이터 패널, 그것을 사용한 x선 검출기 및 x선 투시 장치
JP2012185123A (ja) 放射線撮像装置および放射線撮像装置の製造方法
KR102197808B1 (ko) 신틸레이터 패널 및 그 제조 방법, 및 방사선 검출 장치
CN107797135B (zh) 放射线检测器
CN102565839A (zh) 辐射检测元件、辐射检测模块及辐射图像诊断设备
US20160282483A1 (en) Scintillator panel, radiation detector, and method for manufacturing scintillator panel
JP2013015353A (ja) 放射線検出器およびその製造方法
JP2018165666A (ja) 放射線変換パネルおよびタルボ撮影装置
JP2705943B2 (ja) 放射線画像変換パネル
JP2829610B2 (ja) 放射線画像変換パネルの製造方法
JP2843998B2 (ja) 放射線画像変換パネル
JP2656797B2 (ja) 放射線画像変換パネル
JP2023134945A (ja) シンチレータパネルおよび放射線検出器
JP2677824B2 (ja) 放射線画像変換パネル
JPH10186098A (ja) 放射線像変換パネルとその製造方法
JP3162094B2 (ja) 放射線画像変換パネルおよびその使用方法
JP2656795B2 (ja) 放射線画像変換パネル
JPH01316698A (ja) 放射線画像変換パネル

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150217

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150217

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20151117

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160112

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160607

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160722

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20161213

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170127

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170627

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20170710

R151 Written notification of patent or utility model registration

Ref document number: 6182840

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250