JP6148256B2 - 高分解能3d蛍光顕微鏡法のための顕微鏡および方法 - Google Patents

高分解能3d蛍光顕微鏡法のための顕微鏡および方法 Download PDF

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JP6148256B2
JP6148256B2 JP2014552544A JP2014552544A JP6148256B2 JP 6148256 B2 JP6148256 B2 JP 6148256B2 JP 2014552544 A JP2014552544 A JP 2014552544A JP 2014552544 A JP2014552544 A JP 2014552544A JP 6148256 B2 JP6148256 B2 JP 6148256B2
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JP2015505620A (ja
JP2015505620A5 (enExample
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カルクブレナー、トーマス
ヴォレシェンスキー、ラルフ
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Carl Zeiss Microscopy GmbH
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361Optical details, e.g. image relay to the camera or image sensor
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58Optics for apodization or superresolution; Optical synthetic aperture systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing

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  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2014552544A 2012-01-24 2012-12-13 高分解能3d蛍光顕微鏡法のための顕微鏡および方法 Active JP6148256B2 (ja)

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Application Number Priority Date Filing Date Title
DE102012201003.3A DE102012201003B4 (de) 2012-01-24 2012-01-24 Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie
DE102012201003.3 2012-01-24
PCT/EP2012/075465 WO2013110408A1 (de) 2012-01-24 2012-12-13 Mikroskop und verfahren für die hochauflösende 3-d fluoreszenzmikroskopie

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JP2015505620A JP2015505620A (ja) 2015-02-23
JP2015505620A5 JP2015505620A5 (enExample) 2017-04-27
JP6148256B2 true JP6148256B2 (ja) 2017-06-14

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US (1) US9885860B2 (enExample)
EP (1) EP2807515B1 (enExample)
JP (1) JP6148256B2 (enExample)
DE (1) DE102012201003B4 (enExample)
WO (1) WO2013110408A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102719078B1 (ko) 2021-10-26 2024-10-24 포항공과대학교 산학협력단 목시플록사신을 이용한 생체조직표면 세포 영상검사장치 및 목시플록사신을 이용한 생체조직표면 세포 영상검사방법

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012201003B4 (de) 2012-01-24 2024-07-25 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie
DE102013106895B4 (de) * 2013-07-01 2015-09-17 Leica Microsystems Cms Gmbh Lichtmikroskopisches Verfahren zur Lokalisierung von Punktobjekten
JP2016206652A (ja) * 2015-04-21 2016-12-08 オリンパス株式会社 試料の3次元構造の撮像方法及び顕微鏡装置
WO2017090210A1 (ja) * 2015-11-27 2017-06-01 株式会社ニコン 顕微鏡、観察方法、及び画像処理プログラム
CN109154569A (zh) 2016-02-12 2019-01-04 麻省理工学院 用于对未切片组织样本成像的方法和装置
DE102017129519B4 (de) * 2017-12-12 2020-08-06 Technische Universität Ilmenau Anordnung und Verfahren zur simultanen Messung der Fluoreszenz einzelner Schichten in einem Schichtsystem, beispielsweise dem Augenhintergrund
GB2578769B (en) 2018-11-07 2022-07-20 Advanced Risc Mach Ltd Data processing systems
DE102018220779A1 (de) * 2018-12-03 2020-06-04 Carl Zeiss Microscopy Gmbh Nachweisverfahren von induzierten Lichtsignalen in einer dreidimensionalen Region einer Probe
GB2583061B (en) * 2019-02-12 2023-03-15 Advanced Risc Mach Ltd Data processing systems
JP7329951B2 (ja) * 2019-04-01 2023-08-21 キヤノン株式会社 画像処理装置およびその制御方法

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3230890B2 (ja) * 1993-04-07 2001-11-19 株式会社日立製作所 電気泳動分離分析装置
US6771417B1 (en) 1997-08-01 2004-08-03 Carl Zeiss Jena Gmbh Applications of adaptive optics in microscopy
JP2001307366A (ja) * 1999-08-02 2001-11-02 Matsushita Electric Ind Co Ltd 光ピックアップ装置
US6852986B1 (en) * 1999-11-12 2005-02-08 E. I. Du Pont De Nemours And Company Fluorometer with low heat-generating light source
US20040242405A1 (en) * 2001-09-20 2004-12-02 Orme Gregory Michael Construction methods in space
US6947127B2 (en) * 2001-12-10 2005-09-20 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and/or back scattered light beam in a sample
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
DE10227119A1 (de) * 2002-06-15 2004-01-15 Carl Zeiss Jena Gmbh Optische Anordnung zur Gewinnung von Informationen von einer Probe oder einem Beobachtungsobjekt
DE10227120A1 (de) * 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
FR2865370B1 (fr) * 2004-01-22 2006-04-28 Centre Nat Rech Scient Systeme et procede de tomographie in vivo a haute resolution laterale et axiale de la retine humaine
JP4615886B2 (ja) * 2004-04-01 2011-01-19 オリンパス株式会社 走査型光学顕微鏡
EP1626257B1 (en) * 2004-08-11 2009-11-18 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Method and device for wave-front sensing
WO2006058187A2 (en) * 2004-11-23 2006-06-01 Robert Eric Betzig Optical lattice microscopy
US7345816B2 (en) * 2005-01-11 2008-03-18 Olympus Corporation Optical microscope
EP3203235A1 (en) 2005-05-23 2017-08-09 Harald F. Hess Optical microscopy with phototransformable optical labels
US20070057211A1 (en) * 2005-05-25 2007-03-15 Karsten Bahlman Multifocal imaging systems and method
US7728860B2 (en) * 2005-08-12 2010-06-01 Ricoh Company, Ltd. Method for image processing and image processing apparatus
DE102006021317B3 (de) 2006-05-06 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
US7764433B2 (en) * 2006-05-18 2010-07-27 The Regents Of The University Of California Method and system for correcting optical aberrations, including widefield imaging applications
US8217992B2 (en) 2007-01-11 2012-07-10 The Jackson Laboratory Microscopic imaging techniques
JP5536650B2 (ja) 2007-08-31 2014-07-02 ザ ジェネラル ホスピタル コーポレイション 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体
DE102008009216A1 (de) 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
US8143600B2 (en) * 2008-02-18 2012-03-27 Visiongate, Inc. 3D imaging of live cells with ultraviolet radiation
WO2009115108A1 (en) 2008-03-19 2009-09-24 Ruprecht-Karls-Universität Heidelberg A method and an apparatus for localization of single dye molecules in the fluorescent microscopy
EP2107363B1 (en) 2008-03-31 2012-07-11 Deutsches Krebsforschungszentrum Method of fluorescence-microscopically imaging a structure in a sample with high three-dimensional spatial resolution
US7772569B2 (en) 2008-04-01 2010-08-10 The Jackson Laboratory 3D biplane microscopy
US8155409B2 (en) 2008-04-17 2012-04-10 Ruprecht-Karls-Universitat Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions
US8174692B2 (en) * 2008-05-21 2012-05-08 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. High spatial resolution imaging of a structure of interest in a specimen
DE102008024568A1 (de) 2008-05-21 2009-12-03 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zum räumlich hochauflösenden Abbilden einer interessierenden Struktur einer Probe
US8531782B2 (en) * 2008-05-30 2013-09-10 The Invention Science Fund I Llc Emitting and focusing apparatus, methods, and systems
DE102008049886B4 (de) 2008-09-30 2021-11-04 Carl Zeiss Microscopy Gmbh Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben
US7675045B1 (en) 2008-10-09 2010-03-09 Los Alamos National Security, Llc 3-dimensional imaging at nanometer resolutions
WO2010062364A1 (en) 2008-10-31 2010-06-03 University Of Maine System Board Of Trustees Nanoscale imaging of molecular positions and anisotropies
DE102008059328A1 (de) 2008-11-27 2010-06-02 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte Mikroskopie
US8693742B2 (en) * 2008-12-17 2014-04-08 The Regents Of The University Of Colorado Three-dimensional single-molecule fluorescence imaging beyond the diffraction limit using a double-helix point spread function
DE102008064164A1 (de) 2008-12-22 2010-07-01 Leica Microsystems Cms Gmbh Verfahren zur räumlich hochauflösenden stochastischen Untersuchung einer mit einer Substanz markierten Struktur einer Probe
JP2012515930A (ja) 2009-01-26 2012-07-12 ザ ジェネラル ホスピタル コーポレーション 広視野の超解像顕微鏡を提供するためのシステム、方法及びコンピューターがアクセス可能な媒体
GB0907557D0 (en) * 2009-05-01 2009-06-10 Optos Plc Improvements in or relating to scanning ophthalmoscopes
EP3657228A1 (en) * 2009-07-09 2020-05-27 Howard Hughes Medical Institute Microscopy with adaptive optics
DE102009043744A1 (de) * 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren und Mikroskop zur dreidimensional auflösungsgesteigerten Mikroskopie
DE102009060490A1 (de) 2009-12-22 2011-06-30 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Bildteileranordnung
DE102009060793A1 (de) 2009-12-22 2011-07-28 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Verfahren zur zwei- oder dreidimensionalen Positionsbestimmung von Objekten
WO2011106323A2 (en) * 2010-02-23 2011-09-01 The Board Of Trustees Of The University Of Illinois Photobleaching and intermittency localization microscopy
JP5384453B2 (ja) * 2010-09-09 2014-01-08 シャープ株式会社 測定装置、測定システム、測定方法、制御プログラム、および、記録媒体
JP2013539074A (ja) * 2010-09-24 2013-10-17 カール・ツァイス・マイクロスコピー・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム
US8748801B2 (en) * 2010-09-26 2014-06-10 Raytheon Company Discrete wavefront sampling using a variable transmission filter
DE102010041794A1 (de) 2010-09-30 2012-04-05 Carl Zeiss Microlmaging Gmbh Mikroskopsystem, Mikroskopieverfahren und Computerprogrammprodukt
DE102010044013A1 (de) 2010-11-16 2012-05-16 Carl Zeiss Microimaging Gmbh Tiefenauflösungsgesteigerte Mikroskopie
DE102012201003B4 (de) 2012-01-24 2024-07-25 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102719078B1 (ko) 2021-10-26 2024-10-24 포항공과대학교 산학협력단 목시플록사신을 이용한 생체조직표면 세포 영상검사장치 및 목시플록사신을 이용한 생체조직표면 세포 영상검사방법

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EP2807515B1 (de) 2016-03-09
EP2807515A1 (de) 2014-12-03
JP2015505620A (ja) 2015-02-23
DE102012201003A1 (de) 2013-07-25
US20150160446A1 (en) 2015-06-11
DE102012201003B4 (de) 2024-07-25
WO2013110408A1 (de) 2013-08-01
US9885860B2 (en) 2018-02-06

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