JP6124564B2 - 焦点検出装置及び方法、及び撮像装置 - Google Patents
焦点検出装置及び方法、及び撮像装置 Download PDFInfo
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- JP6124564B2 JP6124564B2 JP2012255509A JP2012255509A JP6124564B2 JP 6124564 B2 JP6124564 B2 JP 6124564B2 JP 2012255509 A JP2012255509 A JP 2012255509A JP 2012255509 A JP2012255509 A JP 2012255509A JP 6124564 B2 JP6124564 B2 JP 6124564B2
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- 238000001514 detection method Methods 0.000 title claims description 106
- 238000003384 imaging method Methods 0.000 title claims description 27
- 238000000034 method Methods 0.000 title claims description 27
- 210000001747 pupil Anatomy 0.000 claims description 29
- 230000003287 optical effect Effects 0.000 claims description 25
- 238000004364 calculation method Methods 0.000 claims description 16
- 230000004907 flux Effects 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000003702 image correction Methods 0.000 description 8
- 238000003672 processing method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 238000005315 distribution function Methods 0.000 description 4
- 230000011514 reflex Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000003705 background correction Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/285—Systems for automatic generation of focusing signals including two or more different focus detection devices, e.g. both an active and a passive focus detecting device
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
- G02B7/10—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification by relative axial movement of several lenses, e.g. of varifocal objective lens
- G02B7/102—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification by relative axial movement of several lenses, e.g. of varifocal objective lens controlled by a microcomputer
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/287—Systems for automatic generation of focusing signals including a sight line detecting device
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
- G02B7/365—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals by analysis of the spatial frequency components of the image
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B13/00—Viewfinders; Focusing aids for cameras; Means for focusing for cameras; Autofocus systems for cameras
- G03B13/32—Means for focusing
- G03B13/34—Power focusing
- G03B13/36—Autofocus systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/67—Focus control based on electronic image sensor signals
- H04N23/672—Focus control based on electronic image sensor signals based on the phase difference signals
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
- H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
- H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
- H04N25/134—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
- H04N25/704—Pixels specially adapted for focusing, e.g. phase difference pixel sets
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- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Studio Devices (AREA)
- Focusing (AREA)
- Automatic Focus Adjustment (AREA)
Description
Claims (7)
- 撮影光学系の異なる射出瞳領域を透過した複数の光束を受光して、前記異なる射出瞳領域に対応した一対の画像信号を出力する複数の画素を有する撮像手段と、
フーリエ変換した前記一対の画像信号の位相を角度に変換して求めた前記一対の画像の位相差が最も小さくなる空間周波数を求め、該空間周波数から前記一対の画像信号の像ずれ量を求める演算手段と、
前記演算手段により求めた前記像ずれ量に基づいて、位相差検出方式による焦点調節を行う焦点調節手段と
を有することを特徴とする焦点検出装置。 - 前記撮影光学系の光学情報を取得する取得手段を更に有し、
前記演算手段は、前記光学情報に基づいて前記射出瞳領域の口径蝕を計算し、該口径蝕に基づいて前記一対の画像信号の非対称性を修正し、該修正した一対の画像信号を用いて前記空間周波数を求めることを特徴とする請求項1に記載の焦点検出装置。 - 前記演算手段は、前記焦点調節の際に制御される前記撮影光学系を構成する撮影レンズの制御量が予め決められた範囲外である場合に、前記口径蝕に基づく非対称性を修正した前記一対の画像信号を用いて、前記空間周波数を求めることを特徴とする請求項2に記載の焦点検出装置。
- 請求項1乃至3のいずれか1項に記載の焦点検出装置を有することを特徴とする撮像装置。
- 撮影光学系の異なる射出瞳領域を透過した複数の光束を受光して、前記異なる射出瞳領域に対応した一対の画像信号を出力する撮像工程と、
フーリエ変換した前記一対の画像信号の位相を角度に変換して求めた前記一対の画像の位相差が最も小さくなる空間周波数を求め、該空間周波数から前記一対の画像信号の像ずれ量を求める演算工程と、
前記演算工程で求めた前記像ずれ量に基づいて、位相差検出方式による焦点調節を行う焦点調節工程と
を有することを特徴とする焦点検出方法。 - 前記撮影光学系の光学情報を取得する取得工程と、
前記光学情報に基づいて前記射出瞳領域の口径蝕を計算し、該口径蝕に基づいて前記一対の画像信号の非対称性を修正する修正工程と、
前記修正した一対の画像信号を用いて前記空間周波数を求め、該空間周波数から前記一対の画像信号の像ずれ量を求める再演算工程と
を有することを特徴とする請求項5に記載の焦点検出方法。 - 前記焦点調節の際に制御される前記撮影光学系を構成する撮影レンズの制御量が予め決められた範囲外である場合に、前記修正工程及び前記再演算工程を実行することを特徴とする請求項6に記載の焦点検出方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012255509A JP6124564B2 (ja) | 2012-11-21 | 2012-11-21 | 焦点検出装置及び方法、及び撮像装置 |
US14/054,261 US9160918B2 (en) | 2012-11-21 | 2013-10-15 | Focus control apparatus and method for performing focus control by phase difference detection, and image capturing apparatus |
KR1020130138130A KR101711804B1 (ko) | 2012-11-21 | 2013-11-14 | 초점검출장치, 초점검출방법 및 촬상장치 |
CN201310594719.8A CN103837959B (zh) | 2012-11-21 | 2013-11-21 | 焦点检测设备、焦点检测方法及摄像设备 |
Applications Claiming Priority (1)
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JP2012255509A JP6124564B2 (ja) | 2012-11-21 | 2012-11-21 | 焦点検出装置及び方法、及び撮像装置 |
Publications (3)
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JP2014102436A JP2014102436A (ja) | 2014-06-05 |
JP2014102436A5 JP2014102436A5 (ja) | 2016-01-07 |
JP6124564B2 true JP6124564B2 (ja) | 2017-05-10 |
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JP2012255509A Expired - Fee Related JP6124564B2 (ja) | 2012-11-21 | 2012-11-21 | 焦点検出装置及び方法、及び撮像装置 |
Country Status (4)
Country | Link |
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US (1) | US9160918B2 (ja) |
JP (1) | JP6124564B2 (ja) |
KR (1) | KR101711804B1 (ja) |
CN (1) | CN103837959B (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6000520B2 (ja) * | 2011-07-25 | 2016-09-28 | キヤノン株式会社 | 撮像装置およびその制御方法およびプログラム |
WO2014038258A1 (ja) * | 2012-09-06 | 2014-03-13 | 富士フイルム株式会社 | 撮像装置及び合焦制御方法 |
JP6186900B2 (ja) * | 2013-06-04 | 2017-08-30 | ソニー株式会社 | 固体撮像装置、電子機器、レンズ制御方法、および撮像モジュール |
JP2015129846A (ja) * | 2014-01-07 | 2015-07-16 | キヤノン株式会社 | 撮像装置およびその制御方法 |
JP6381266B2 (ja) * | 2014-04-15 | 2018-08-29 | キヤノン株式会社 | 撮像装置、制御装置、制御方法、プログラム、および、記憶媒体 |
JP6320195B2 (ja) * | 2014-06-24 | 2018-05-09 | キヤノン株式会社 | 撮像装置、制御装置、制御方法、プログラム、および、記憶媒体 |
JP2017049351A (ja) * | 2015-08-31 | 2017-03-09 | 富士通株式会社 | 合焦位置検出装置、合焦位置検出方法及び合焦位置検出用コンピュータプログラム |
JP6590639B2 (ja) * | 2015-10-30 | 2019-10-16 | キヤノン株式会社 | 距離検出装置、撮像装置、および距離検出方法 |
JP6942480B2 (ja) * | 2017-02-14 | 2021-09-29 | キヤノン株式会社 | 焦点検出装置、焦点検出方法、および焦点検出プログラム |
JP6873729B2 (ja) * | 2017-02-14 | 2021-05-19 | キヤノン株式会社 | 焦点検出装置、および撮像装置 |
JP7246961B2 (ja) * | 2019-02-15 | 2023-03-28 | キヤノン株式会社 | 撮像装置、撮像装置の制御方法、およびプログラム |
Family Cites Families (18)
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---|---|---|---|---|
JPS5598710A (en) * | 1979-01-20 | 1980-07-28 | Nippon Kogaku Kk <Nikon> | Focus detector |
US4336450A (en) * | 1979-01-20 | 1982-06-22 | Nippon Kogaku K.K. | Focus detecting apparatus |
JPS5863904A (ja) * | 1981-10-13 | 1983-04-16 | Nippon Kogaku Kk <Nikon> | オ−トフオ−カス制御装置 |
JPS5930510A (ja) * | 1982-08-13 | 1984-02-18 | Nippon Kogaku Kk <Nikon> | 自動合焦装置 |
JPS6237364A (ja) | 1985-08-09 | 1987-02-18 | Sumitomo Metal Ind Ltd | 合金化亜鉛めつき鋼板の製造方法および装置 |
JPS61209413A (ja) * | 1986-01-20 | 1986-09-17 | Nippon Kogaku Kk <Nikon> | 焦点検出装置 |
JP2692049B2 (ja) | 1986-07-10 | 1997-12-17 | キヤノン株式会社 | 焦点検出装置 |
JPH04211213A (ja) | 1990-03-01 | 1992-08-03 | Nikon Corp | 焦点検出装置 |
JP3958474B2 (ja) * | 1999-09-29 | 2007-08-15 | ペンタックス株式会社 | 自動焦点調節装置 |
JP5002086B2 (ja) | 1999-10-28 | 2012-08-15 | キヤノン株式会社 | 焦点検出装置と撮像装置 |
JP2005004718A (ja) * | 2003-05-16 | 2005-01-06 | Canon Inc | 信号処理装置及び制御方法 |
JP4594402B2 (ja) * | 2008-02-08 | 2010-12-08 | キヤノン株式会社 | 自動焦点カメラ |
JP2010020015A (ja) * | 2008-07-09 | 2010-01-28 | Canon Inc | 撮像装置 |
JP5276371B2 (ja) * | 2008-07-09 | 2013-08-28 | キヤノン株式会社 | 撮像装置 |
JP5300414B2 (ja) | 2008-10-30 | 2013-09-25 | キヤノン株式会社 | カメラ及びカメラシステム |
JP5237059B2 (ja) * | 2008-11-14 | 2013-07-17 | キヤノン株式会社 | 焦点検出装置及び方法、及び撮像装置 |
JP5901246B2 (ja) * | 2010-12-13 | 2016-04-06 | キヤノン株式会社 | 撮像装置 |
JP5615756B2 (ja) * | 2011-03-31 | 2014-10-29 | 富士フイルム株式会社 | 撮像装置及び撮像プログラム |
-
2012
- 2012-11-21 JP JP2012255509A patent/JP6124564B2/ja not_active Expired - Fee Related
-
2013
- 2013-10-15 US US14/054,261 patent/US9160918B2/en not_active Expired - Fee Related
- 2013-11-14 KR KR1020130138130A patent/KR101711804B1/ko active IP Right Grant
- 2013-11-21 CN CN201310594719.8A patent/CN103837959B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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CN103837959A (zh) | 2014-06-04 |
US9160918B2 (en) | 2015-10-13 |
US20140139725A1 (en) | 2014-05-22 |
JP2014102436A (ja) | 2014-06-05 |
KR20140065335A (ko) | 2014-05-29 |
CN103837959B (zh) | 2016-08-17 |
KR101711804B1 (ko) | 2017-03-03 |
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