JP6071077B2 - スペクトルイメージング検出器の製造方法 - Google Patents

スペクトルイメージング検出器の製造方法 Download PDF

Info

Publication number
JP6071077B2
JP6071077B2 JP2014500514A JP2014500514A JP6071077B2 JP 6071077 B2 JP6071077 B2 JP 6071077B2 JP 2014500514 A JP2014500514 A JP 2014500514A JP 2014500514 A JP2014500514 A JP 2014500514A JP 6071077 B2 JP6071077 B2 JP 6071077B2
Authority
JP
Japan
Prior art keywords
photosensor
substrate
scintillator
row
scintillator array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2014500514A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014513279A5 (enExample
JP2014513279A (ja
Inventor
ランダル ペーター ルータ
ランダル ペーター ルータ
ロドニー アーノルド マットソン
ロドニー アーノルド マットソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2014513279A publication Critical patent/JP2014513279A/ja
Publication of JP2014513279A5 publication Critical patent/JP2014513279A5/ja
Application granted granted Critical
Publication of JP6071077B2 publication Critical patent/JP6071077B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2006Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/496Luminescent members, e.g. fluorescent sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2014500514A 2011-03-24 2012-03-19 スペクトルイメージング検出器の製造方法 Expired - Fee Related JP6071077B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161467044P 2011-03-24 2011-03-24
US61/467,044 2011-03-24
PCT/IB2012/051300 WO2012127403A2 (en) 2011-03-24 2012-03-19 Spectral imaging detector

Publications (3)

Publication Number Publication Date
JP2014513279A JP2014513279A (ja) 2014-05-29
JP2014513279A5 JP2014513279A5 (enExample) 2015-04-16
JP6071077B2 true JP6071077B2 (ja) 2017-02-01

Family

ID=45937487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014500514A Expired - Fee Related JP6071077B2 (ja) 2011-03-24 2012-03-19 スペクトルイメージング検出器の製造方法

Country Status (6)

Country Link
US (2) US9281422B2 (enExample)
EP (1) EP2689269B1 (enExample)
JP (1) JP6071077B2 (enExample)
CN (1) CN103443652B (enExample)
RU (1) RU2595795C2 (enExample)
WO (1) WO2012127403A2 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014184714A1 (en) 2013-05-16 2014-11-20 Koninklijke Philips N.V. Imaging detector
JP6574419B2 (ja) 2013-11-15 2019-09-11 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. フレキシブル基板上の両面有機光検出器
US10217790B2 (en) * 2015-01-15 2019-02-26 Koninklijke Philips N.V. Imaging detector module assembly
US11041966B2 (en) * 2016-10-26 2021-06-22 Koninklijke Philips N.V. Radiation detector scintillator with an integral through-hole interconnect
US10352170B2 (en) 2017-05-02 2019-07-16 General Electric Company Airfoil shape for a turbine rotor blade
US10247007B2 (en) 2017-05-02 2019-04-02 General Electric Company Airfoil shape for a turbine rotor blade
US10422227B2 (en) 2017-05-02 2019-09-24 General Electric Company Airfoil shape for a turbine rotor blade
US10415406B2 (en) 2017-05-03 2019-09-17 General Electric Company Turbine nozzle airfoil profile
US10280774B2 (en) 2017-05-03 2019-05-07 General Electric Company Turbine nozzle airfoil profile
US10408072B2 (en) 2017-05-08 2019-09-10 General Electric Company Turbine nozzle airfoil profile
US10533440B2 (en) 2017-05-15 2020-01-14 General Electric Company Turbine nozzle airfoil profile
US10436034B2 (en) 2017-05-15 2019-10-08 General Electric Company Airfoil shape for a turbine rotor blade
WO2019041172A1 (en) * 2017-08-30 2019-03-07 Shenzhen United Imaging Healthcare Co., Ltd. SYSTEM, METHOD AND DETECTOR MODULE FOR PET IMAGING
WO2019042797A1 (en) * 2017-08-31 2019-03-07 Koninklijke Philips N.V. MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR
DE102018200845B4 (de) 2018-01-19 2021-05-06 Siemens Healthcare Gmbh Montageverfahren für die Herstellung eines Röntgendetektors, Röntgendetektor und Röntgengerät
WO2020118102A1 (en) * 2018-12-06 2020-06-11 Analog Devices, Inc. Shielded integrated device packages
IT201900010638A1 (it) * 2019-07-02 2021-01-02 St Microelectronics Srl Rilevatore di radiazione a scintillatore e dosimetro corrispondente

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57172272A (en) * 1981-04-17 1982-10-23 Toshiba Corp Multichannel type radiation detector
US5043582A (en) * 1985-12-11 1991-08-27 General Imagining Corporation X-ray imaging system and solid state detector therefor
JPS62231222A (ja) 1986-03-31 1987-10-09 Nitto Electric Ind Co Ltd 液晶配向膜形成用溶液
US5179284A (en) * 1991-08-21 1993-01-12 General Electric Company Solid state radiation imager having a reflective and protective coating
RU2123710C1 (ru) * 1996-01-31 1998-12-20 Товарищество с ограниченной ответственностью "Медтех" Матричный рентгеновский приемник
FR2758630B1 (fr) * 1997-01-21 1999-04-09 Thomson Tubes Electroniques Procede de scellement etanche d'un detecteur de rayonnement a l'etat solide et detecteur obtenu par ce procede
US6114703A (en) * 1997-10-21 2000-09-05 The Regents Of The University Of California High resolution scintillation detector with semiconductor readout
DE19841423C1 (de) * 1998-09-10 1999-12-30 Siemens Ag Strahlendetektor, insbesondere eines Computertomographen
US6522715B2 (en) * 2000-12-29 2003-02-18 Ge Medical Systems Global Technology Company Llc High density flex interconnect for CT detectors
JP5038209B2 (ja) * 2001-04-11 2012-10-03 日本結晶光学株式会社 放射線検出装置
JP2003084066A (ja) * 2001-04-11 2003-03-19 Nippon Kessho Kogaku Kk 放射線検出器用部品、放射線検出器および放射線検出装置
US6510195B1 (en) * 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
US6895077B2 (en) * 2001-11-21 2005-05-17 University Of Massachusetts Medical Center System and method for x-ray fluoroscopic imaging
WO2004027453A1 (en) * 2002-09-18 2004-04-01 Koninklijke Philips Electronics N.V. Radiation detector
US7019304B2 (en) * 2003-10-06 2006-03-28 General Electric Company Solid-state radiation imager with back-side irradiation
WO2005057235A1 (en) * 2003-12-09 2005-06-23 Philips Intellectual Property & Standards Gmbh Shielding for an x-ray detector
US7075091B2 (en) 2004-01-29 2006-07-11 Ge Medical Systems Global Technology Company, Llc Apparatus for detecting ionizing radiation
JP2006058168A (ja) * 2004-08-20 2006-03-02 Hamamatsu Photonics Kk 放射線撮像素子および放射線撮像方法
DE102004052452B4 (de) * 2004-10-28 2008-05-29 Siemens Ag Strahlungsdetektor zur Erfassung von Strahlung
JP2006145431A (ja) * 2004-11-22 2006-06-08 Ge Medical Systems Global Technology Co Llc 放射線検出器、放射線撮像装置、放射線ct装置及び放射線検出器の製造方法
JP5345383B2 (ja) * 2005-04-22 2013-11-20 コーニンクレッカ フィリップス エヌ ヴェ 検出器画素、放射線検出器および方法、陽電子放出断層撮影システム、撮像検出器およびその較正方法、検出器セルの無効化方法
CN101166469B (zh) 2005-04-26 2015-05-06 皇家飞利浦电子股份有限公司 用于光谱ct的双层探测器
JP5268633B2 (ja) 2005-04-26 2013-08-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルctのための検出器アレイ
US7399972B2 (en) * 2005-06-09 2008-07-15 Nihon Kessho Kogaku Co., Ltd. Component for radiation detector and radiation detector
CN101278208A (zh) * 2005-10-05 2008-10-01 皇家飞利浦电子股份有限公司 使用薄电路的计算机断层摄影探测器
CA2647407A1 (en) * 2006-03-30 2007-10-18 Koninklijke Philips Electronics N.V. Radiation detector array
US7692156B1 (en) * 2006-08-23 2010-04-06 Radiation Monitoring Devices, Inc. Beam-oriented pixellated scintillators for radiation imaging
US7608837B2 (en) * 2006-11-24 2009-10-27 Tower Semiconductor Ltd. High resolution integrated X-ray CMOS image sensor
US8586933B2 (en) * 2007-04-25 2013-11-19 Koninklijke Philips N.V. Radiation detector having a split laminate optical coupling
CN104330816A (zh) * 2007-11-09 2015-02-04 皇家飞利浦电子股份有限公司 吸湿性闪烁体的保护
JP2009147212A (ja) * 2007-12-17 2009-07-02 Nippon Kessho Kogaku Kk 光検出器および光検出器を用いた光検出装置
JP5587788B2 (ja) 2007-12-21 2014-09-10 コーニンクレッカ フィリップス エヌ ヴェ 複合樹脂におけるシンチレータを備えた放射線感受性検出器
US8294108B2 (en) * 2008-02-04 2012-10-23 Shimadzu Corporation Radiation detector and tomography equipment provided with the same
JP4877417B2 (ja) * 2008-06-05 2012-02-15 株式会社島津製作所 放射線検出器の製造方法
US7737409B2 (en) * 2008-06-12 2010-06-15 Analog Devices, Inc. Silicon detector and method for constructing silicon detectors
US8869388B2 (en) * 2008-07-22 2014-10-28 Shimadzu Corporation Method of manufacturing radiation tomography apparatus
JP2012509492A (ja) * 2008-11-18 2012-04-19 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スペクトルイメージング検出器
EP2359161B1 (en) * 2008-11-21 2017-05-31 Trixell Assembly method for a tiled radiation detector
KR101497498B1 (ko) * 2008-12-19 2015-03-03 삼성전자주식회사 방사선 신호의 투과 영상을 획득하는 방법 및 장치
JP5247486B2 (ja) * 2009-01-16 2013-07-24 浜松ホトニクス株式会社 裏面入射型フォトダイオードアレイ及び放射線検出器
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
US9164700B2 (en) 2009-03-05 2015-10-20 Sandisk Il Ltd System for optimizing the transfer of stored content in response to a triggering event
US8466421B2 (en) * 2010-07-30 2013-06-18 Varian Medical Systems Inc. Radiation detector with multiple operating schemes
JP5422581B2 (ja) * 2011-01-31 2014-02-19 富士フイルム株式会社 放射線画像検出装置及びその製造方法

Also Published As

Publication number Publication date
WO2012127403A2 (en) 2012-09-27
EP2689269A2 (en) 2014-01-29
RU2013147397A (ru) 2015-04-27
CN103443652A (zh) 2013-12-11
US20160154121A1 (en) 2016-06-02
US9599725B2 (en) 2017-03-21
CN103443652B (zh) 2017-02-15
EP2689269B1 (en) 2015-05-13
JP2014513279A (ja) 2014-05-29
US20140015081A1 (en) 2014-01-16
US9281422B2 (en) 2016-03-08
WO2012127403A3 (en) 2012-12-27
RU2595795C2 (ru) 2016-08-27

Similar Documents

Publication Publication Date Title
JP6071077B2 (ja) スペクトルイメージング検出器の製造方法
JP6247285B2 (ja) 少なくとも2つのシンチレータアレイ層間に配置される少なくとも1つの薄型フォトセンサを有する多層型水平コンピュータ断層撮影システム及び方法
JP5455620B2 (ja) 放射線検出器および当該検出器を含む装置
US9835733B2 (en) Apparatus for detecting X-rays
NL2008201C2 (en) Detector systems with anode incidence face and methods of fabricating the same.
JP6445978B2 (ja) イメージング検出器
EP2433156B1 (en) Detector array with pre-focused anti-scatter grid
RU2647206C1 (ru) Сенсорное устройство и система визуализации для обнаружения сигналов излучения
JP2019533812A (ja) 一体型スルーホール相互接続部を備える放射線検出器シンチレータ
US10283557B2 (en) Radiation detector assembly
CN111133338B (zh) 具有单片闪烁体的多层探测器
CN104285163A (zh) 平铺的x射线成像器面板及其形成方法
CN105051900B (zh) 集成的二极管das探测器
JP6194126B2 (ja) モジュライメージング検出器asic
US10181493B2 (en) Radiation detector system of radiation imaging modality
JP2019531464A (ja) 三次元固体イメージング光検出器
CN102193102A (zh) 放射线检测装置、放射线检测装置的制造方法及图像摄影装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150225

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150225

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160125

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160128

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20160427

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160728

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20161206

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20161222

R150 Certificate of patent or registration of utility model

Ref document number: 6071077

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees