JP6052931B2 - リソグラフィ装置及びデバイス製造方法 - Google Patents
リソグラフィ装置及びデバイス製造方法 Download PDFInfo
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- JP6052931B2 JP6052931B2 JP2015515443A JP2015515443A JP6052931B2 JP 6052931 B2 JP6052931 B2 JP 6052931B2 JP 2015515443 A JP2015515443 A JP 2015515443A JP 2015515443 A JP2015515443 A JP 2015515443A JP 6052931 B2 JP6052931 B2 JP 6052931B2
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- 238000004519 manufacturing process Methods 0.000 title description 10
- 239000000758 substrate Substances 0.000 claims description 72
- 230000005855 radiation Effects 0.000 claims description 28
- 239000000463 material Substances 0.000 claims description 22
- 210000001747 pupil Anatomy 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 description 36
- 238000001459 lithography Methods 0.000 description 11
- 238000000059 patterning Methods 0.000 description 10
- 238000012545 processing Methods 0.000 description 7
- 230000009467 reduction Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000013307 optical fiber Substances 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000003491 array Methods 0.000 description 3
- 238000004590 computer program Methods 0.000 description 3
- 239000000835 fiber Substances 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 230000015654 memory Effects 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 235000005811 Viola adunca Nutrition 0.000 description 1
- 240000009038 Viola odorata Species 0.000 description 1
- 235000013487 Viola odorata Nutrition 0.000 description 1
- 235000002254 Viola papilionacea Nutrition 0.000 description 1
- 244000172533 Viola sororia Species 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000005381 magnetic domain Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012768 molten material Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
- G03F7/70391—Addressable array sources specially adapted to produce patterns, e.g. addressable LED arrays
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
- G03F7/704—Scanned exposure beam, e.g. raster-, rotary- and vector scanning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Description
本出願は、2012年6月8日に出願された米国特許仮出願第61/657,267号の利益を主張し、その全体が本明細書に援用される。
Claims (11)
- 個別に制御可能な線量をターゲットに与えるために複数の放射ビームを生成するよう構成された複数の光源デバイスであって、前記放射ビームが互いに平行とならないように配置された複数の光源デバイスと、
前記放射ビームのそれぞれを前記ターゲットのそれぞれの位置上に投影するよう構成された投影系であって、コリメートビームを受けてそれらを実質的に平行な経路上に方向転換するよう配置された屈折レンズ群を備える投影系と、
を備え、
前記光源デバイスのそれぞれは、前記放射ビームを前記コリメートビームに変換するコリメートレンズを備え、
前記投影系は、前記光源デバイスに数が一致し、前記コリメートビームを共通点に向かうよう集束させる複数のレンズをさらに備える、
ことを特徴とする露光装置。 - 前記屈折レンズ群は、一つの屈折レンズ素子から成ることを特徴とする請求項1に記載の露光装置。
- 前記屈折レンズ群は、負のパワーを有することを特徴とする請求項1または2に記載の露光装置。
- 前記屈折レンズ群は、正のパワーを有することを特徴とする請求項1または2に記載の露光装置。
- 前記複数のレンズは、密に充填されたアレイ状であることを特徴とする請求項1から4のいずれかに記載の露光装置。
- 前記屈折レンズ群は、方向転換された放射ビームを平行にするよう配置されることを特徴とする請求項1から5のいずれかに記載の露光装置。
- 前記放射ビームの経路に設けられた不透明部材をさらに備え、前記不透明部材は、前記光源デバイスのそれぞれに対応するピンホールを規定することを特徴とする請求項1から6のいずれかに記載の露光装置。
- 前記不透明部材は、前記光源デバイスと前記屈折レンズ群との間に位置することを特徴とする請求項7に記載の露光装置。
- 前記不透明部材は、前記投影系の瞳面に設けられることを特徴とする請求項7または8に記載の露光装置。
- 前記ターゲットは、デバイスが形成されるべき基板から間隔をおいたドナー物質層であることを特徴とする請求項1から9のいずれかに記載の露光装置。
- 前記投影系は、固定部および可動部を備えることを特徴とする請求項1から10のいずれかに記載の露光装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261657267P | 2012-06-08 | 2012-06-08 | |
US61/657,267 | 2012-06-08 | ||
PCT/EP2013/059576 WO2013182367A1 (en) | 2012-06-08 | 2013-05-08 | Lithography apparatus and device manufacturing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015520418A JP2015520418A (ja) | 2015-07-16 |
JP6052931B2 true JP6052931B2 (ja) | 2016-12-27 |
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015515443A Expired - Fee Related JP6052931B2 (ja) | 2012-06-08 | 2013-05-08 | リソグラフィ装置及びデバイス製造方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6052931B2 (ja) |
KR (1) | KR101680130B1 (ja) |
NL (1) | NL2010771A (ja) |
WO (1) | WO2013182367A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016020817A1 (en) * | 2014-08-07 | 2016-02-11 | Orbotech Ltd. | Lift printing system |
US10451953B2 (en) | 2014-11-12 | 2019-10-22 | Orbotech Ltd. | Acousto-optic deflector with multiple output beams |
KR20180030609A (ko) | 2015-07-09 | 2018-03-23 | 오르보테크 엘티디. | Lift 토출 각도의 제어 |
WO2020009764A1 (en) * | 2018-07-03 | 2020-01-09 | Applied Materials, Inc. | Pupil viewing with image projection systems |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101446773A (zh) * | 2001-11-07 | 2009-06-03 | 应用材料有限公司 | 无掩膜光子电子点格栅阵列光刻机 |
US20030162108A1 (en) * | 2002-01-30 | 2003-08-28 | Eastman Kodak Company | Using spacer elements to make electroluminscent display devices |
JP4515853B2 (ja) * | 2004-08-04 | 2010-08-04 | ナブテスコ株式会社 | 光学的立体造形装置 |
US7198879B1 (en) * | 2005-09-30 | 2007-04-03 | Eastman Kodak Company | Laser resist transfer for microfabrication of electronic devices |
WO2010032224A2 (en) | 2008-09-22 | 2010-03-25 | Asml Netherlands B.V. | Lithographic apparatus, programmable patterning device and lithographic method |
NL2006262A (en) * | 2010-02-23 | 2011-08-24 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
KR101496878B1 (ko) * | 2010-02-23 | 2015-03-02 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
JP5799306B2 (ja) * | 2010-07-22 | 2015-10-21 | 株式会社ブイ・テクノロジー | 露光装置用光照射装置の制御方法、及び露光方法 |
JP2012032691A (ja) * | 2010-08-02 | 2012-02-16 | Seiko Epson Corp | 光源装置及びプロジェクター |
JP5753320B2 (ja) * | 2011-08-16 | 2015-07-22 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置 |
-
2013
- 2013-05-08 KR KR1020147028931A patent/KR101680130B1/ko active IP Right Grant
- 2013-05-08 JP JP2015515443A patent/JP6052931B2/ja not_active Expired - Fee Related
- 2013-05-08 NL NL2010771A patent/NL2010771A/en not_active Application Discontinuation
- 2013-05-08 WO PCT/EP2013/059576 patent/WO2013182367A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
JP2015520418A (ja) | 2015-07-16 |
WO2013182367A1 (en) | 2013-12-12 |
NL2010771A (en) | 2013-12-10 |
KR20140141660A (ko) | 2014-12-10 |
KR101680130B1 (ko) | 2016-12-12 |
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