JP6017429B2 - 磁場センサにおいて過渡信号を低減させるための装置および方法 - Google Patents

磁場センサにおいて過渡信号を低減させるための装置および方法 Download PDF

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JP6017429B2
JP6017429B2 JP2013532815A JP2013532815A JP6017429B2 JP 6017429 B2 JP6017429 B2 JP 6017429B2 JP 2013532815 A JP2013532815 A JP 2013532815A JP 2013532815 A JP2013532815 A JP 2013532815A JP 6017429 B2 JP6017429 B2 JP 6017429B2
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circuit
loop
magnetic field
coupled
ground
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JP2013539051A (ja
JP2013539051A5 (enExample
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チェン，ウェイフア
ワード，マイケル・ジー
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アレグロ・マイクロシステムズ・エルエルシー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
    • H10D48/40—Devices controlled by magnetic fields

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Magnetic Variables (AREA)
JP2013532815A 2010-10-08 2011-09-14 磁場センサにおいて過渡信号を低減させるための装置および方法 Active JP6017429B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/900,969 2010-10-08
US12/900,969 US8339134B2 (en) 2010-10-08 2010-10-08 Apparatus and method for reducing a transient signal in a magnetic field sensor
PCT/US2011/051492 WO2012047463A1 (en) 2010-10-08 2011-09-14 Apparatus and method for reducing a transient signal in a magnetic field sensor

Related Child Applications (1)

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JP2016186651A Division JP6220433B2 (ja) 2010-10-08 2016-09-26 磁場センサにおいて過渡信号を低減させるための装置および方法

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JP2013539051A JP2013539051A (ja) 2013-10-17
JP2013539051A5 JP2013539051A5 (enExample) 2014-07-24
JP6017429B2 true JP6017429B2 (ja) 2016-11-02

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JP2013532815A Active JP6017429B2 (ja) 2010-10-08 2011-09-14 磁場センサにおいて過渡信号を低減させるための装置および方法
JP2016186651A Active JP6220433B2 (ja) 2010-10-08 2016-09-26 磁場センサにおいて過渡信号を低減させるための装置および方法

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US (3) US8339134B2 (enExample)
EP (1) EP2609442B1 (enExample)
JP (2) JP6017429B2 (enExample)
KR (1) KR101885205B1 (enExample)
WO (1) WO2012047463A1 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8339134B2 (en) 2010-10-08 2012-12-25 Allegro Microsystems, Inc. Apparatus and method for reducing a transient signal in a magnetic field sensor
US9121880B2 (en) * 2011-11-04 2015-09-01 Infineon Technologies Ag Magnetic sensor device
US9201123B2 (en) 2011-11-04 2015-12-01 Infineon Technologies Ag Magnetic sensor device and a method for fabricating the same
US8994397B2 (en) * 2011-11-15 2015-03-31 Texas Instruments Incorporated Thermal pad shorts test for wire bonded strip testing
US10234513B2 (en) * 2012-03-20 2019-03-19 Allegro Microsystems, Llc Magnetic field sensor integrated circuit with integral ferromagnetic material
US9176203B2 (en) * 2013-02-05 2015-11-03 Texas Instruments Incorporated Apparatus and method for in situ current measurement in a conductor
US20140333300A1 (en) * 2013-05-09 2014-11-13 Hamilton Sundstrand Corporation Regulated magnetic flux density for extended current measurement
US9291648B2 (en) * 2013-08-07 2016-03-22 Texas Instruments Incorporated Hybrid closed-loop/open-loop magnetic current sensor
US9846180B2 (en) * 2013-12-11 2017-12-19 Eaton Corporation Current sensing assembly employing magnetic sensors
US9762139B2 (en) * 2014-08-12 2017-09-12 Yiqiang Jake Zhang Active switching rectifier employing MOSFET and current-based control using a hall-effect switch
US9966873B2 (en) * 2014-08-12 2018-05-08 Yiqiang Jake Zhang Active switching rectifier employing MOSFET and current-based control using a hall-effect switch
JP6390709B2 (ja) * 2014-10-10 2018-09-19 日立金属株式会社 電流検出装置、及び電流検出方法
EP3058988B1 (en) * 2015-02-17 2020-11-25 Noxell Corporation Composition for providing a film on keratin fibres
KR102426433B1 (ko) 2015-11-09 2022-07-29 삼성디스플레이 주식회사 플렉서블 표시 장치 및 이의 제조 방법
WO2017099156A1 (ja) 2015-12-11 2017-06-15 旭化成エレクトロニクス株式会社 磁気センサ
US9810721B2 (en) 2015-12-23 2017-11-07 Melexis Technologies Sa Method of making a current sensor and current sensor
US10505102B2 (en) 2016-04-04 2019-12-10 Infineon Technologies Ag Semiconductor device for sensing a magnetic field including an encapsulation material defining a through-hole
JP2018004269A (ja) * 2016-06-27 2018-01-11 アイシン精機株式会社 電流センサ
US10353019B2 (en) * 2016-07-18 2019-07-16 Apple Inc. High dynamic range magnetometer architecture
JP2021028571A (ja) * 2017-09-27 2021-02-25 株式会社村田製作所 電流センサ
EP3508863B1 (en) * 2018-01-05 2023-06-07 Melexis Technologies SA Offset current sensor structure
US10983179B2 (en) 2018-07-02 2021-04-20 Asahi Kasei Microdevices Corporation Magnetic field measuring device, magnetic field measurement method, and recording medium having recorded thereon magnetic field measurement program
US20200003846A1 (en) * 2018-07-02 2020-01-02 Asahi Kasei Microdevices Corporation Magnetic field measuring device, magnetic field measurement method, and recording medium having recorded thereon magnetic field measurement program
US10763219B2 (en) 2018-08-14 2020-09-01 Allegro Microsystems, Llc Signal conductor routing configurations and techniques
JP2020101464A (ja) * 2018-12-21 2020-07-02 アイシン精機株式会社 磁束検出ユニット
CN111586960B (zh) * 2019-02-15 2021-09-14 华为技术有限公司 一种抗干扰电路板及终端
DE102020211526A1 (de) * 2019-09-20 2021-03-25 Robert Bosch Gesellschaft mit beschränkter Haftung Sensorvorrichtung mit Sensor und Stromrichter
EP3796007B1 (en) * 2019-09-21 2022-03-02 LEM International SA Current transducer
JP7369020B2 (ja) * 2019-11-27 2023-10-25 新電元工業株式会社 電流検出器及びパワーモジュール
TW202201038A (zh) * 2020-03-13 2022-01-01 日商艾普凌科有限公司 半導體裝置
US12367135B1 (en) 2024-03-25 2025-07-22 Allegro Microsystems, Llc Circuit having start up trimming

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0018750B1 (en) * 1979-05-04 1982-12-29 THE GENERAL ELECTRIC COMPANY, p.l.c. Carrier-domain magnetometers
US4268785A (en) 1979-09-13 1981-05-19 Ampex Corporation Transient overshoot, undershoot and delay compensation circuit in systems comprising reactive filter networks
JPS5762510A (en) * 1980-10-03 1982-04-15 Toshiba Corp Current transformer
JPH0645901Y2 (ja) * 1986-06-09 1994-11-24 株式会社ト−キン 電流検出器
JPS648668U (enExample) * 1987-07-03 1989-01-18
JP2545926B2 (ja) * 1987-07-07 1996-10-23 日本電装株式会社 電流検出器
JPH0622221Y2 (ja) * 1987-07-10 1994-06-08 株式会社トーキン 電流検出器
JP2897996B2 (ja) * 1988-10-05 1999-05-31 旭化成電子株式会社 磁界検出装置
JPH03102277A (ja) * 1989-12-13 1991-04-26 Hinode Pawatoronikusu Kk ホール素子利用の信号取出回路の構成用プリント基板
US5912556A (en) 1996-11-06 1999-06-15 Honeywell Inc. Magnetic sensor with a chip attached to a lead assembly within a cavity at the sensor's sensing face
JPH10253652A (ja) 1997-03-14 1998-09-25 Denso Corp センサ装置及びその製造方法並びにその製造に用いられるリードフレーム
JPH11287668A (ja) * 1998-02-04 1999-10-19 Denso Corp 増幅回路及びそれを用いた位置検出装置
JP3491584B2 (ja) * 1999-12-08 2004-01-26 株式会社デンソー 回転角度出力調整方法
JP2001326546A (ja) * 2000-05-17 2001-11-22 Mitsubishi Electric Corp 差動増幅器の入力回路
US6781359B2 (en) 2002-09-20 2004-08-24 Allegro Microsystems, Inc. Integrated current sensor
JP4260544B2 (ja) * 2003-05-19 2009-04-30 株式会社日立製作所 回転角度検出装置及び回転制御装置
US7709754B2 (en) * 2003-08-26 2010-05-04 Allegro Microsystems, Inc. Current sensor
JP4523838B2 (ja) * 2004-12-27 2010-08-11 株式会社リコー 磁気センサ回路および半導体装置
JP2007103556A (ja) * 2005-10-03 2007-04-19 Tamura Seisakusho Co Ltd ホール素子デバイスとそれを用いたホール素子回路
US7365535B2 (en) * 2005-11-23 2008-04-29 Honeywell International Inc. Closed-loop magnetic sensor system
US7768083B2 (en) * 2006-01-20 2010-08-03 Allegro Microsystems, Inc. Arrangements for an integrated sensor
US8300372B2 (en) * 2006-04-04 2012-10-30 Cerus Industrial Corporation Apparatus, system, and/or method for protection and control of an electrical device
US8269491B2 (en) 2008-02-27 2012-09-18 Allegro Microsystems, Inc. DC offset removal for a magnetic field sensor
JP2010197155A (ja) * 2009-02-24 2010-09-09 Aisin Seiki Co Ltd 磁束検出装置
US8339134B2 (en) 2010-10-08 2012-12-25 Allegro Microsystems, Inc. Apparatus and method for reducing a transient signal in a magnetic field sensor

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Publication number Publication date
JP2013539051A (ja) 2013-10-17
US8339134B2 (en) 2012-12-25
EP2609442A1 (en) 2013-07-03
US20120086444A1 (en) 2012-04-12
EP2609442B1 (en) 2014-04-16
JP2017021043A (ja) 2017-01-26
KR20130100316A (ko) 2013-09-10
WO2012047463A1 (en) 2012-04-12
US8451002B2 (en) 2013-05-28
KR101885205B1 (ko) 2018-08-03
US20130009638A1 (en) 2013-01-10
JP6220433B2 (ja) 2017-10-25
US8542011B2 (en) 2013-09-24
US20130214778A1 (en) 2013-08-22

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