JP5970472B2 - 発光性フィルムを検査するための方法及び装置 - Google Patents

発光性フィルムを検査するための方法及び装置 Download PDF

Info

Publication number
JP5970472B2
JP5970472B2 JP2013545605A JP2013545605A JP5970472B2 JP 5970472 B2 JP5970472 B2 JP 5970472B2 JP 2013545605 A JP2013545605 A JP 2013545605A JP 2013545605 A JP2013545605 A JP 2013545605A JP 5970472 B2 JP5970472 B2 JP 5970472B2
Authority
JP
Japan
Prior art keywords
luminescent film
light
integrating sphere
film
mixing chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2013545605A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014500514A (ja
JP2014500514A5 (enExample
Inventor
ドゥミトゥリ サイモニアン
ドゥミトゥリ サイモニアン
ミハイル フォークスマン
ミハイル フォークスマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2014500514A publication Critical patent/JP2014500514A/ja
Publication of JP2014500514A5 publication Critical patent/JP2014500514A5/ja
Application granted granted Critical
Publication of JP5970472B2 publication Critical patent/JP5970472B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2013545605A 2010-12-22 2011-12-19 発光性フィルムを検査するための方法及び装置 Active JP5970472B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201061425805P 2010-12-22 2010-12-22
US61/425,805 2010-12-22
PCT/IB2011/055788 WO2012085824A1 (en) 2010-12-22 2011-12-19 Method and apparatus for testing luminescent films

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016098467A Division JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Publications (3)

Publication Number Publication Date
JP2014500514A JP2014500514A (ja) 2014-01-09
JP2014500514A5 JP2014500514A5 (enExample) 2015-02-05
JP5970472B2 true JP5970472B2 (ja) 2016-08-17

Family

ID=45567053

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2013545605A Active JP5970472B2 (ja) 2010-12-22 2011-12-19 発光性フィルムを検査するための方法及び装置
JP2016098467A Active JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2016098467A Active JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Country Status (6)

Country Link
US (1) US9029806B2 (enExample)
EP (1) EP2656050B1 (enExample)
JP (2) JP5970472B2 (enExample)
CN (1) CN103403531A (enExample)
TW (1) TWI591321B (enExample)
WO (1) WO2012085824A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468650B (zh) * 2012-09-14 2015-01-11 Ind Tech Res Inst 光學檢測系統及其光學檢測裝置
CN105158214B (zh) * 2015-09-12 2017-11-24 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
JP6623711B2 (ja) * 2015-11-16 2019-12-25 ダイトロン株式会社 検査装置
CN116293491A (zh) * 2016-04-25 2023-06-23 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
CN105953915A (zh) * 2016-06-30 2016-09-21 维沃移动通信有限公司 一种光敏传感器的校准设备及光敏传感器的校准方法
JP6394825B1 (ja) 2018-02-08 2018-09-26 横河電機株式会社 測定装置および測定方法
KR102257204B1 (ko) * 2019-07-26 2021-05-27 한국광기술원 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법
JP6751214B1 (ja) * 2020-02-12 2020-09-02 デクセリアルズ株式会社 測定装置及び成膜装置
CN114376547B (zh) * 2020-10-22 2023-06-30 鸿富成精密电子(成都)有限公司 测试装置及测试方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2757196C3 (de) 1977-12-22 1981-11-26 Vladimir Dr.-Ing. 5100 Aachen Blazek Photometrische Anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JPH07225150A (ja) * 1994-02-14 1995-08-22 Mitsubishi Electric Corp レーザ光検出装置
DE19528855A1 (de) * 1995-08-05 1997-02-06 Leybold Ag Verfahren und Vorrichtung zur spektralen Remissions- und Transmissionsmessung
DE69729754T2 (de) * 1996-01-11 2005-07-07 The Trustees Of Princeton University Organische luminiszenzbeschichtung fur lichtdetektoren
JPH1073486A (ja) * 1996-09-02 1998-03-17 Matsushita Electric Ind Co Ltd 蛍光体光学特性測定装置と蛍光体光学特性測定方法
AU8472698A (en) * 1997-06-25 1999-01-04 Waters Instruments, Inc. Means and method for measuring absorption of radiation-scattering samples
US5929994A (en) 1998-05-20 1999-07-27 Ahead Optoelectronics, Inc. Intergrating sphere ellipsometer
JP3611015B2 (ja) * 1998-12-24 2005-01-19 松下電器産業株式会社 蛍光体試料の光学特性測定方法と装置
TW554379B (en) * 2001-06-01 2003-09-21 Sony Corp Forming method of fluorescent surface and its forming device, and cathode-ray tube
JP2003004631A (ja) * 2001-06-18 2003-01-08 Kawasaki Kiko Co Ltd 成分計測装置
JP2004361149A (ja) * 2003-06-02 2004-12-24 Tdk Corp 含水量測定装置
JP2006214935A (ja) 2005-02-04 2006-08-17 Omron Corp 薄膜検査装置および薄膜検査方法
GB2429865B (en) * 2005-09-06 2011-02-23 Cintel Internat Ltd Optical scatter correction for film scanners
JP4767706B2 (ja) * 2006-01-27 2011-09-07 浜松ホトニクス株式会社 積分球用アダプタ及びこれを備える光検出装置
JP5220392B2 (ja) * 2007-11-21 2013-06-26 川上産業株式会社 気泡シート体成形情報検出装置、及び気泡シート体成形情報検出方法
WO2010141291A1 (en) * 2009-06-01 2010-12-09 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

Also Published As

Publication number Publication date
WO2012085824A1 (en) 2012-06-28
JP6216831B2 (ja) 2017-10-18
EP2656050B1 (en) 2021-03-31
EP2656050A1 (en) 2013-10-30
CN103403531A (zh) 2013-11-20
JP2014500514A (ja) 2014-01-09
TWI591321B (zh) 2017-07-11
TW201237390A (en) 2012-09-16
US9029806B2 (en) 2015-05-12
JP2016183969A (ja) 2016-10-20
US20130313444A1 (en) 2013-11-28

Similar Documents

Publication Publication Date Title
JP5970472B2 (ja) 発光性フィルムを検査するための方法及び装置
Gorrotxategi et al. Optical efficiency characterization of LED phosphors using a double integrating sphere system
JP5876272B2 (ja) 高透過光学検査システム
CN103424389B (zh) 一种测量荧光粉的pl光谱及ple光谱的测试系统
KR101533588B1 (ko) 발광 소자 불량 검출 장치 및 방법
TW201219691A (en) Solar simulator and solar cell examination apparatus
JP6623711B2 (ja) 検査装置
US9389188B2 (en) Method and apparatus for testing optical films
CN111562008B (zh) 可变激发光源入射角度的pl波长的量测方法及装置
KR101801032B1 (ko) 중심파장 추적 광루미네선스 강도 매핑장치
US8748847B2 (en) Method of manufacturing white light emitting device (LED) and apparatus measuring phosphor film
CN111161998B (zh) 一种激光同轴离子激发装置
KR20180016415A (ko) 단위 면적당 질량 측정 방법, 적층 필름 제조 방법 및 단위 면적당 질량 측정 장치
CN216560304U (zh) 一种用于材料亚表面缺陷检测的宽谱连续波长光源
US7349103B1 (en) System and method for high intensity small spot optical metrology
KR100845778B1 (ko) 광투과 에지영역에서의 광투과율을 이용한 실리콘 웨이퍼두께 측정장치 및 그 방법
JP7085758B2 (ja) 光学測定装置、光源装置
TWM530477U (zh) 一種發光二極體的光學檢測裝置
TWI623730B (zh) 一種發光二極體的光學檢測裝置
CN111077122A (zh) 一种量子点温度检测装置
JP2013080799A (ja) 封止材料検査装置および封止材料検査方法
KR20090030674A (ko) 광 전환물질 측정 시스템 및 그 측정방법, 발광소자제조방법
CN107576615A (zh) 一种纳米线吸收谱的测量方法及系统
KR20070076276A (ko) 막의 두께 측정 장치
Mangum et al. Improved color metrics in solid-state lighting via utilization of on-chip quantum dots

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141208

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20141208

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20150602

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150609

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150610

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150908

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20160126

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160517

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20160524

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160614

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160711

R150 Certificate of patent or registration of utility model

Ref document number: 5970472

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250