CN103403531A - 用于测试发光薄膜的方法和装置 - Google Patents

用于测试发光薄膜的方法和装置 Download PDF

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Publication number
CN103403531A
CN103403531A CN2011800619209A CN201180061920A CN103403531A CN 103403531 A CN103403531 A CN 103403531A CN 2011800619209 A CN2011800619209 A CN 2011800619209A CN 201180061920 A CN201180061920 A CN 201180061920A CN 103403531 A CN103403531 A CN 103403531A
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CN
China
Prior art keywords
light
emitting film
integrating sphere
emitting
film
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Pending
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CN2011800619209A
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English (en)
Chinese (zh)
Inventor
D·斯莫尼安
M·福克斯曼
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN103403531A publication Critical patent/CN103403531A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN2011800619209A 2010-12-22 2011-12-19 用于测试发光薄膜的方法和装置 Pending CN103403531A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201061425805P 2010-12-22 2010-12-22
US61/425805 2010-12-22
PCT/IB2011/055788 WO2012085824A1 (en) 2010-12-22 2011-12-19 Method and apparatus for testing luminescent films

Publications (1)

Publication Number Publication Date
CN103403531A true CN103403531A (zh) 2013-11-20

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800619209A Pending CN103403531A (zh) 2010-12-22 2011-12-19 用于测试发光薄膜的方法和装置

Country Status (6)

Country Link
US (1) US9029806B2 (enExample)
EP (1) EP2656050B1 (enExample)
JP (2) JP5970472B2 (enExample)
CN (1) CN103403531A (enExample)
TW (1) TWI591321B (enExample)
WO (1) WO2012085824A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105158214A (zh) * 2015-09-12 2015-12-16 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
CN109073801A (zh) * 2016-04-25 2018-12-21 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN113252304A (zh) * 2020-02-12 2021-08-13 迪睿合株式会社 测定装置及成膜装置
CN114376547A (zh) * 2020-10-22 2022-04-22 鸿富成精密电子(成都)有限公司 测试装置及测试方法
US11867636B2 (en) 2018-02-08 2024-01-09 Yokogawa Electric Corporation Measurement device and measurement method for measuring a physical quantity of a sheet

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468650B (zh) * 2012-09-14 2015-01-11 Ind Tech Res Inst 光學檢測系統及其光學檢測裝置
JP6623711B2 (ja) * 2015-11-16 2019-12-25 ダイトロン株式会社 検査装置
CN105953915A (zh) * 2016-06-30 2016-09-21 维沃移动通信有限公司 一种光敏传感器的校准设备及光敏传感器的校准方法
KR102257204B1 (ko) * 2019-07-26 2021-05-27 한국광기술원 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법

Citations (8)

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DE2757196A1 (de) * 1977-12-22 1979-06-28 Vladimir Dipl Ing Blazek Photometrische anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) * 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5764352A (en) * 1995-08-05 1998-06-09 Balzers Und Leybold Deutschland Holding Ag Process and apparatus for spectral reflectance and transmission measurements
CN1207205A (zh) * 1996-01-11 1999-02-03 普林斯顿大学理事会 光检测器用的有机发光涂层
CN1547753A (zh) * 2001-06-01 2004-11-17 索尼公司 荧光面的形成方法和其形成装置以及阴极射线管
GB2429865A (en) * 2005-09-06 2007-03-07 Cintel Internat Ltd Optical scatter correction for film scanners
US20100301739A1 (en) * 2009-06-01 2010-12-02 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

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US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JPH07225150A (ja) * 1994-02-14 1995-08-22 Mitsubishi Electric Corp レーザ光検出装置
JPH1073486A (ja) * 1996-09-02 1998-03-17 Matsushita Electric Ind Co Ltd 蛍光体光学特性測定装置と蛍光体光学特性測定方法
AU8472698A (en) * 1997-06-25 1999-01-04 Waters Instruments, Inc. Means and method for measuring absorption of radiation-scattering samples
US5929994A (en) 1998-05-20 1999-07-27 Ahead Optoelectronics, Inc. Intergrating sphere ellipsometer
JP3611015B2 (ja) * 1998-12-24 2005-01-19 松下電器産業株式会社 蛍光体試料の光学特性測定方法と装置
JP2003004631A (ja) * 2001-06-18 2003-01-08 Kawasaki Kiko Co Ltd 成分計測装置
JP2004361149A (ja) * 2003-06-02 2004-12-24 Tdk Corp 含水量測定装置
JP2006214935A (ja) 2005-02-04 2006-08-17 Omron Corp 薄膜検査装置および薄膜検査方法
JP4767706B2 (ja) * 2006-01-27 2011-09-07 浜松ホトニクス株式会社 積分球用アダプタ及びこれを備える光検出装置
JP5220392B2 (ja) * 2007-11-21 2013-06-26 川上産業株式会社 気泡シート体成形情報検出装置、及び気泡シート体成形情報検出方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2757196A1 (de) * 1977-12-22 1979-06-28 Vladimir Dipl Ing Blazek Photometrische anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) * 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5764352A (en) * 1995-08-05 1998-06-09 Balzers Und Leybold Deutschland Holding Ag Process and apparatus for spectral reflectance and transmission measurements
CN1207205A (zh) * 1996-01-11 1999-02-03 普林斯顿大学理事会 光检测器用的有机发光涂层
CN1547753A (zh) * 2001-06-01 2004-11-17 索尼公司 荧光面的形成方法和其形成装置以及阴极射线管
GB2429865A (en) * 2005-09-06 2007-03-07 Cintel Internat Ltd Optical scatter correction for film scanners
US20100301739A1 (en) * 2009-06-01 2010-12-02 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105158214A (zh) * 2015-09-12 2015-12-16 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN105158214B (zh) * 2015-09-12 2017-11-24 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
CN109073801A (zh) * 2016-04-25 2018-12-21 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
US11867636B2 (en) 2018-02-08 2024-01-09 Yokogawa Electric Corporation Measurement device and measurement method for measuring a physical quantity of a sheet
CN113252304A (zh) * 2020-02-12 2021-08-13 迪睿合株式会社 测定装置及成膜装置
CN113252304B (zh) * 2020-02-12 2024-06-25 迪睿合株式会社 测定装置及成膜装置
CN114376547A (zh) * 2020-10-22 2022-04-22 鸿富成精密电子(成都)有限公司 测试装置及测试方法
CN114376547B (zh) * 2020-10-22 2023-06-30 鸿富成精密电子(成都)有限公司 测试装置及测试方法

Also Published As

Publication number Publication date
WO2012085824A1 (en) 2012-06-28
JP6216831B2 (ja) 2017-10-18
EP2656050B1 (en) 2021-03-31
EP2656050A1 (en) 2013-10-30
JP5970472B2 (ja) 2016-08-17
JP2014500514A (ja) 2014-01-09
TWI591321B (zh) 2017-07-11
TW201237390A (en) 2012-09-16
US9029806B2 (en) 2015-05-12
JP2016183969A (ja) 2016-10-20
US20130313444A1 (en) 2013-11-28

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Application publication date: 20131120