JP5970472B2 - 発光性フィルムを検査するための方法及び装置 - Google Patents
発光性フィルムを検査するための方法及び装置 Download PDFInfo
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- JP5970472B2 JP5970472B2 JP2013545605A JP2013545605A JP5970472B2 JP 5970472 B2 JP5970472 B2 JP 5970472B2 JP 2013545605 A JP2013545605 A JP 2013545605A JP 2013545605 A JP2013545605 A JP 2013545605A JP 5970472 B2 JP5970472 B2 JP 5970472B2
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- 238000000034 method Methods 0.000 title claims description 12
- 238000007689 inspection Methods 0.000 claims description 32
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- 239000000463 material Substances 0.000 claims description 16
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 11
- 238000012360 testing method Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 description 13
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- 238000003384 imaging method Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
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- 239000000919 ceramic Substances 0.000 description 3
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical group N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000002313 adhesive film Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
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- 238000011835 investigation Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical group [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical group [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
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- 239000000975 dye Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical group [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052757 nitrogen Chemical group 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
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- 239000002096 quantum dot Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
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- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
Claims (12)
- 発光性フィルムを検査するための構成であって、前記構成が、
入力ポート及び出力ポートを持つ混合チャンバ、並びに前記入力ポートに結合される発光体を含むランバート光源と、
入力ポートを持つ積分球であり、当該積分球の前記入力ポート及び前記混合チャンバの前記出力ポートの一方又は双方が、前記発光性フィルムを平らにするフランジである、積分球と、
前記混合チャンバ及び前記積分球の一方に配置される少なくとも1つのバッフルと、
測定装置とを有し、
検査中、前記発光性フィルムが、前記混合チャンバの前記出力ポートと、前記積分球の前記入力ポートとの間に配置され、
前記測定装置が、前記積分球に光学的に結合され、
前記ランバート光源、前記積分球及び前記測定装置が、第1の検査装置を形成し、前記構成が、前記第1の検査装置の前記発光性フィルムに対して下流に配置される第2の検査装置を更に有し、前記第2の検査装置が、前記発光性フィルムの特性を測定する、
構成。 - 検査中、前記混合チャンバの前記出力ポートが、前記発光性フィルムから500μm未満の間隔をおいて配置される請求項1に記載の構成。
- 検査中、前記混合チャンバの前記出力ポートが、前記積分球の前記入力ポートから1mm未満の間隔をおいて配置される請求項1に記載の構成。
- 前記発光体が、青色光を発するよう構成されるLEDである請求項1に記載の構成。
- 検査中、前記発光性フィルムが、前記積分球の前記入力ポート及び前記混合チャンバの前記出力ポートの少なくとも一方と摺動係合する請求項1に記載の構成。
- 前記積分球の前記入力ポート及び前記混合チャンバの前記出力ポートの少なくとも一方が、ナイフのように鋭いポートである請求項1に記載の構成。
- 前記発光性フィルムを案内するよう配置されるローラーを更に有する請求項1に記載の構成。
- 前記発光性フィルムが、可撓性材料中に配置される蛍光体を有する請求項1に記載の構成。
- 前記測定装置が、分光計及び光色彩計のうちの1つである請求項1に記載の構成。
- 発光性フィルムの第1面のすぐ近くにランバート光源を配置するステップであり、前記ランバート光源は、入力ポート及び出力ポートを持つ混合チャンバ、並びに前記入力ポートに結合される発光体を含む、ステップと、
前記発光性フィルムの第2面のすぐ近くに積分球の開口部を配置するステップと、
前記ランバート光源で前記発光性フィルムの一部を照明するステップと、
前記積分球によって集光される前記発光性フィルムからの光の特性を測定するステップと、
前記発光性フィルムからの光の特性の測定後に、測定値に応じて前記発光性フィルムの一部の特性を変えるステップと、
を有し、
前記積分球の前記開口部及び前記混合チャンバの前記出力ポートの一方又は双方が、前記発光性フィルムを平らにするフランジである、
方法。 - 前記発光性フィルムからの光が、同じ波長で前記発光性フィルムを通して伝達される前記ランバート光源からの光と、前記発光性フィルムによって吸収され、前記発光性フィルムによって異なる波長で発せられる前記ランバート光源からの光とを含む請求項10に記載の方法。
- 前記発光性フィルムの一部の特性を変えるステップが、前記発光性フィルム中の発光性材料の量を変えるステップを有する請求項10に記載の方法。
Applications Claiming Priority (3)
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US201061425805P | 2010-12-22 | 2010-12-22 | |
US61/425,805 | 2010-12-22 | ||
PCT/IB2011/055788 WO2012085824A1 (en) | 2010-12-22 | 2011-12-19 | Method and apparatus for testing luminescent films |
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JP2016098467A Division JP6216831B2 (ja) | 2010-12-22 | 2016-05-17 | 発光性フィルムを検査するための方法及び装置 |
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JP2014500514A JP2014500514A (ja) | 2014-01-09 |
JP2014500514A5 JP2014500514A5 (ja) | 2015-02-05 |
JP5970472B2 true JP5970472B2 (ja) | 2016-08-17 |
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JP2016098467A Active JP6216831B2 (ja) | 2010-12-22 | 2016-05-17 | 発光性フィルムを検査するための方法及び装置 |
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US (1) | US9029806B2 (ja) |
EP (1) | EP2656050B1 (ja) |
JP (2) | JP5970472B2 (ja) |
CN (1) | CN103403531A (ja) |
TW (1) | TWI591321B (ja) |
WO (1) | WO2012085824A1 (ja) |
Families Citing this family (9)
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TWI468650B (zh) * | 2012-09-14 | 2015-01-11 | Ind Tech Res Inst | 光學檢測系統及其光學檢測裝置 |
CN105158214B (zh) * | 2015-09-12 | 2017-11-24 | 宁波申山新材料科技有限公司 | 一种功能贴膜通透性测试仪及其测试方法 |
CN109073801A (zh) * | 2016-04-25 | 2018-12-21 | 日本特殊陶业株式会社 | 波长转换构件、其制造方法及发光装置 |
CN105910800A (zh) * | 2016-06-17 | 2016-08-31 | 宜昌劲森光电科技股份有限公司 | 量子管用集测试、印码、分选一体的设备 |
CN105953915A (zh) * | 2016-06-30 | 2016-09-21 | 维沃移动通信有限公司 | 一种光敏传感器的校准设备及光敏传感器的校准方法 |
JP6394825B1 (ja) | 2018-02-08 | 2018-09-26 | 横河電機株式会社 | 測定装置および測定方法 |
KR102257204B1 (ko) * | 2019-07-26 | 2021-05-27 | 한국광기술원 | 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법 |
JP6751214B1 (ja) * | 2020-02-12 | 2020-09-02 | デクセリアルズ株式会社 | 測定装置及び成膜装置 |
CN114376547B (zh) * | 2020-10-22 | 2023-06-30 | 鸿富成精密电子(成都)有限公司 | 测试装置及测试方法 |
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EP2656050A1 (en) | 2013-10-30 |
TWI591321B (zh) | 2017-07-11 |
US20130313444A1 (en) | 2013-11-28 |
JP2014500514A (ja) | 2014-01-09 |
EP2656050B1 (en) | 2021-03-31 |
JP6216831B2 (ja) | 2017-10-18 |
JP2016183969A (ja) | 2016-10-20 |
TW201237390A (en) | 2012-09-16 |
US9029806B2 (en) | 2015-05-12 |
CN103403531A (zh) | 2013-11-20 |
WO2012085824A1 (en) | 2012-06-28 |
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