TWI591321B - 用於測試發光膜之方法及裝置 - Google Patents
用於測試發光膜之方法及裝置 Download PDFInfo
- Publication number
- TWI591321B TWI591321B TW100147825A TW100147825A TWI591321B TW I591321 B TWI591321 B TW I591321B TW 100147825 A TW100147825 A TW 100147825A TW 100147825 A TW100147825 A TW 100147825A TW I591321 B TWI591321 B TW I591321B
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- luminescent film
- film
- luminescent
- integrating sphere
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 24
- 238000000034 method Methods 0.000 title claims description 13
- 239000000463 material Substances 0.000 claims description 18
- 238000002156 mixing Methods 0.000 claims description 17
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 7
- 238000005286 illumination Methods 0.000 claims description 3
- 230000004044 response Effects 0.000 claims description 2
- 238000004020 luminiscence type Methods 0.000 claims 1
- 239000012528 membrane Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 229910002056 binary alloy Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910002059 quaternary alloy Inorganic materials 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910003468 tantalcarbide Inorganic materials 0.000 description 1
- 229910002058 ternary alloy Inorganic materials 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 229910052902 vermiculite Inorganic materials 0.000 description 1
- 235000019354 vermiculite Nutrition 0.000 description 1
- 239000010455 vermiculite Substances 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
- G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201061425805P | 2010-12-22 | 2010-12-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201237390A TW201237390A (en) | 2012-09-16 |
| TWI591321B true TWI591321B (zh) | 2017-07-11 |
Family
ID=45567053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100147825A TWI591321B (zh) | 2010-12-22 | 2011-12-21 | 用於測試發光膜之方法及裝置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9029806B2 (enExample) |
| EP (1) | EP2656050B1 (enExample) |
| JP (2) | JP5970472B2 (enExample) |
| CN (1) | CN103403531A (enExample) |
| TW (1) | TWI591321B (enExample) |
| WO (1) | WO2012085824A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI468650B (zh) * | 2012-09-14 | 2015-01-11 | Ind Tech Res Inst | 光學檢測系統及其光學檢測裝置 |
| CN105158214B (zh) * | 2015-09-12 | 2017-11-24 | 宁波申山新材料科技有限公司 | 一种功能贴膜通透性测试仪及其测试方法 |
| JP6623711B2 (ja) * | 2015-11-16 | 2019-12-25 | ダイトロン株式会社 | 検査装置 |
| CN116293491A (zh) * | 2016-04-25 | 2023-06-23 | 日本特殊陶业株式会社 | 波长转换构件、其制造方法及发光装置 |
| CN105910800A (zh) * | 2016-06-17 | 2016-08-31 | 宜昌劲森光电科技股份有限公司 | 量子管用集测试、印码、分选一体的设备 |
| CN105953915A (zh) * | 2016-06-30 | 2016-09-21 | 维沃移动通信有限公司 | 一种光敏传感器的校准设备及光敏传感器的校准方法 |
| JP6394825B1 (ja) | 2018-02-08 | 2018-09-26 | 横河電機株式会社 | 測定装置および測定方法 |
| KR102257204B1 (ko) * | 2019-07-26 | 2021-05-27 | 한국광기술원 | 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법 |
| JP6751214B1 (ja) * | 2020-02-12 | 2020-09-02 | デクセリアルズ株式会社 | 測定装置及び成膜装置 |
| CN114376547B (zh) * | 2020-10-22 | 2023-06-30 | 鸿富成精密电子(成都)有限公司 | 测试装置及测试方法 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2757196C3 (de) | 1977-12-22 | 1981-11-26 | Vladimir Dr.-Ing. 5100 Aachen Blazek | Photometrische Anordnung |
| US5044754A (en) * | 1989-12-20 | 1991-09-03 | Eastman Kodak Company | Apparatus and method for use in determining the optical transmission factor or density of a translucent element |
| US5079678A (en) | 1990-12-24 | 1992-01-07 | Eastman Kodak Company | Integrating light source utilizing a fluorescing reflector for improved light emission and color balance |
| US5406070A (en) | 1993-12-16 | 1995-04-11 | International Business Machines Corporation | Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data |
| JPH07225150A (ja) * | 1994-02-14 | 1995-08-22 | Mitsubishi Electric Corp | レーザ光検出装置 |
| DE19528855A1 (de) * | 1995-08-05 | 1997-02-06 | Leybold Ag | Verfahren und Vorrichtung zur spektralen Remissions- und Transmissionsmessung |
| DE69729754T2 (de) * | 1996-01-11 | 2005-07-07 | The Trustees Of Princeton University | Organische luminiszenzbeschichtung fur lichtdetektoren |
| JPH1073486A (ja) * | 1996-09-02 | 1998-03-17 | Matsushita Electric Ind Co Ltd | 蛍光体光学特性測定装置と蛍光体光学特性測定方法 |
| AU8472698A (en) * | 1997-06-25 | 1999-01-04 | Waters Instruments, Inc. | Means and method for measuring absorption of radiation-scattering samples |
| US5929994A (en) | 1998-05-20 | 1999-07-27 | Ahead Optoelectronics, Inc. | Intergrating sphere ellipsometer |
| JP3611015B2 (ja) * | 1998-12-24 | 2005-01-19 | 松下電器産業株式会社 | 蛍光体試料の光学特性測定方法と装置 |
| TW554379B (en) * | 2001-06-01 | 2003-09-21 | Sony Corp | Forming method of fluorescent surface and its forming device, and cathode-ray tube |
| JP2003004631A (ja) * | 2001-06-18 | 2003-01-08 | Kawasaki Kiko Co Ltd | 成分計測装置 |
| JP2004361149A (ja) * | 2003-06-02 | 2004-12-24 | Tdk Corp | 含水量測定装置 |
| JP2006214935A (ja) | 2005-02-04 | 2006-08-17 | Omron Corp | 薄膜検査装置および薄膜検査方法 |
| GB2429865B (en) * | 2005-09-06 | 2011-02-23 | Cintel Internat Ltd | Optical scatter correction for film scanners |
| JP4767706B2 (ja) * | 2006-01-27 | 2011-09-07 | 浜松ホトニクス株式会社 | 積分球用アダプタ及びこれを備える光検出装置 |
| JP5220392B2 (ja) * | 2007-11-21 | 2013-06-26 | 川上産業株式会社 | 気泡シート体成形情報検出装置、及び気泡シート体成形情報検出方法 |
| WO2010141291A1 (en) * | 2009-06-01 | 2010-12-09 | Nitto Denko Corporation | Luminescent ceramic and light-emitting device using the same |
-
2011
- 2011-12-19 US US13/885,774 patent/US9029806B2/en active Active
- 2011-12-19 WO PCT/IB2011/055788 patent/WO2012085824A1/en not_active Ceased
- 2011-12-19 EP EP11815865.8A patent/EP2656050B1/en active Active
- 2011-12-19 JP JP2013545605A patent/JP5970472B2/ja active Active
- 2011-12-19 CN CN2011800619209A patent/CN103403531A/zh active Pending
- 2011-12-21 TW TW100147825A patent/TWI591321B/zh active
-
2016
- 2016-05-17 JP JP2016098467A patent/JP6216831B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012085824A1 (en) | 2012-06-28 |
| JP6216831B2 (ja) | 2017-10-18 |
| EP2656050B1 (en) | 2021-03-31 |
| EP2656050A1 (en) | 2013-10-30 |
| CN103403531A (zh) | 2013-11-20 |
| JP5970472B2 (ja) | 2016-08-17 |
| JP2014500514A (ja) | 2014-01-09 |
| TW201237390A (en) | 2012-09-16 |
| US9029806B2 (en) | 2015-05-12 |
| JP2016183969A (ja) | 2016-10-20 |
| US20130313444A1 (en) | 2013-11-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI591321B (zh) | 用於測試發光膜之方法及裝置 | |
| Gorrotxategi et al. | Optical efficiency characterization of LED phosphors using a double integrating sphere system | |
| CN104220857B (zh) | 用于高亮度发光二极管的高吞吐量热测试方法及系统 | |
| US9404962B2 (en) | Apparatus for measuring the optoelectronic characteristics of light-emitting diode with a light gathering unit completely covers a sample holder during the measurement | |
| CN103424389B (zh) | 一种测量荧光粉的pl光谱及ple光谱的测试系统 | |
| JP5876272B2 (ja) | 高透過光学検査システム | |
| JP2012516534A (ja) | 遠隔蛍光体層及び／又は散乱層を備える照明システム | |
| US9389188B2 (en) | Method and apparatus for testing optical films | |
| KR101801032B1 (ko) | 중심파장 추적 광루미네선스 강도 매핑장치 | |
| US20110062468A1 (en) | Phosphor-converted light emitting diode device | |
| KR101693397B1 (ko) | Led 광원장치, 막두께 측정장치 및 박막 형성장치 | |
| JP5461595B2 (ja) | 発光特性測定装置及び方法 | |
| Li et al. | Efficient single-pixel batch measurement method for optical properties of micro-sized LED array | |
| JP5760589B2 (ja) | 白色ｌｅｄ装置用蛍光体の蛍光スペクトルの測定方法及び測定装置 | |
| Keppens et al. | Modelling the spatial colour distribution of phosphor-white high power light-emitting diodes | |
| Raymond et al. | Photoluminescence metrology for LED characterization in high volume manufacturing | |
| CN114354557A (zh) | 基于光电子集成芯片的荧光成像装置及其制备方法 | |
| KR20090030674A (ko) | 광 전환물질 측정 시스템 및 그 측정방법, 발광소자제조방법 | |
| TWI409476B (zh) | 測試發光二極體晶粒之方法 | |
| JP4009168B2 (ja) | 発光素子の測定方法 | |
| Ledentsov Jr et al. | Progress in hybrid integration of light sources and detectors in ceramic packages for ultra-compact sensors | |
| Kumar et al. | Characterization of White Light Emitting Materials | |
| Boher et al. | Rapid photo-goniometric technique for LED emission characterization | |
| JP6634766B2 (ja) | 分光放射束測定装置 | |
| KR101419522B1 (ko) | 반도체 발광 소자의 광특성 측정 장치 |