JP2014500514A5 - - Google Patents

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Publication number
JP2014500514A5
JP2014500514A5 JP2013545605A JP2013545605A JP2014500514A5 JP 2014500514 A5 JP2014500514 A5 JP 2014500514A5 JP 2013545605 A JP2013545605 A JP 2013545605A JP 2013545605 A JP2013545605 A JP 2013545605A JP 2014500514 A5 JP2014500514 A5 JP 2014500514A5
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JP
Japan
Prior art keywords
light
configuration
film
luminescent film
integrating sphere
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JP2013545605A
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English (en)
Japanese (ja)
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JP5970472B2 (ja
JP2014500514A (ja
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Priority claimed from PCT/IB2011/055788 external-priority patent/WO2012085824A1/en
Publication of JP2014500514A publication Critical patent/JP2014500514A/ja
Publication of JP2014500514A5 publication Critical patent/JP2014500514A5/ja
Application granted granted Critical
Publication of JP5970472B2 publication Critical patent/JP5970472B2/ja
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JP2013545605A 2010-12-22 2011-12-19 発光性フィルムを検査するための方法及び装置 Active JP5970472B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201061425805P 2010-12-22 2010-12-22
US61/425,805 2010-12-22
PCT/IB2011/055788 WO2012085824A1 (en) 2010-12-22 2011-12-19 Method and apparatus for testing luminescent films

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016098467A Division JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Publications (3)

Publication Number Publication Date
JP2014500514A JP2014500514A (ja) 2014-01-09
JP2014500514A5 true JP2014500514A5 (enExample) 2015-02-05
JP5970472B2 JP5970472B2 (ja) 2016-08-17

Family

ID=45567053

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2013545605A Active JP5970472B2 (ja) 2010-12-22 2011-12-19 発光性フィルムを検査するための方法及び装置
JP2016098467A Active JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2016098467A Active JP6216831B2 (ja) 2010-12-22 2016-05-17 発光性フィルムを検査するための方法及び装置

Country Status (6)

Country Link
US (1) US9029806B2 (enExample)
EP (1) EP2656050B1 (enExample)
JP (2) JP5970472B2 (enExample)
CN (1) CN103403531A (enExample)
TW (1) TWI591321B (enExample)
WO (1) WO2012085824A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI468650B (zh) * 2012-09-14 2015-01-11 Ind Tech Res Inst 光學檢測系統及其光學檢測裝置
CN105158214B (zh) * 2015-09-12 2017-11-24 宁波申山新材料科技有限公司 一种功能贴膜通透性测试仪及其测试方法
JP6623711B2 (ja) * 2015-11-16 2019-12-25 ダイトロン株式会社 検査装置
CN116293491A (zh) * 2016-04-25 2023-06-23 日本特殊陶业株式会社 波长转换构件、其制造方法及发光装置
CN105910800A (zh) * 2016-06-17 2016-08-31 宜昌劲森光电科技股份有限公司 量子管用集测试、印码、分选一体的设备
CN105953915A (zh) * 2016-06-30 2016-09-21 维沃移动通信有限公司 一种光敏传感器的校准设备及光敏传感器的校准方法
JP6394825B1 (ja) 2018-02-08 2018-09-26 横河電機株式会社 測定装置および測定方法
KR102257204B1 (ko) * 2019-07-26 2021-05-27 한국광기술원 형광체 필름 및 그의 제조방법과 이를 이용한 광 특성 측정 장치 및 측정 방법
JP6751214B1 (ja) * 2020-02-12 2020-09-02 デクセリアルズ株式会社 測定装置及び成膜装置
CN114376547B (zh) * 2020-10-22 2023-06-30 鸿富成精密电子(成都)有限公司 测试装置及测试方法

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DE2757196C3 (de) 1977-12-22 1981-11-26 Vladimir Dr.-Ing. 5100 Aachen Blazek Photometrische Anordnung
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5079678A (en) 1990-12-24 1992-01-07 Eastman Kodak Company Integrating light source utilizing a fluorescing reflector for improved light emission and color balance
US5406070A (en) 1993-12-16 1995-04-11 International Business Machines Corporation Method and apparatus for scanning an object and correcting image data using concurrently generated illumination data
JPH07225150A (ja) * 1994-02-14 1995-08-22 Mitsubishi Electric Corp レーザ光検出装置
DE19528855A1 (de) * 1995-08-05 1997-02-06 Leybold Ag Verfahren und Vorrichtung zur spektralen Remissions- und Transmissionsmessung
DE69729754T2 (de) * 1996-01-11 2005-07-07 The Trustees Of Princeton University Organische luminiszenzbeschichtung fur lichtdetektoren
JPH1073486A (ja) * 1996-09-02 1998-03-17 Matsushita Electric Ind Co Ltd 蛍光体光学特性測定装置と蛍光体光学特性測定方法
AU8472698A (en) * 1997-06-25 1999-01-04 Waters Instruments, Inc. Means and method for measuring absorption of radiation-scattering samples
US5929994A (en) 1998-05-20 1999-07-27 Ahead Optoelectronics, Inc. Intergrating sphere ellipsometer
JP3611015B2 (ja) * 1998-12-24 2005-01-19 松下電器産業株式会社 蛍光体試料の光学特性測定方法と装置
TW554379B (en) * 2001-06-01 2003-09-21 Sony Corp Forming method of fluorescent surface and its forming device, and cathode-ray tube
JP2003004631A (ja) * 2001-06-18 2003-01-08 Kawasaki Kiko Co Ltd 成分計測装置
JP2004361149A (ja) * 2003-06-02 2004-12-24 Tdk Corp 含水量測定装置
JP2006214935A (ja) 2005-02-04 2006-08-17 Omron Corp 薄膜検査装置および薄膜検査方法
GB2429865B (en) * 2005-09-06 2011-02-23 Cintel Internat Ltd Optical scatter correction for film scanners
JP4767706B2 (ja) * 2006-01-27 2011-09-07 浜松ホトニクス株式会社 積分球用アダプタ及びこれを備える光検出装置
JP5220392B2 (ja) * 2007-11-21 2013-06-26 川上産業株式会社 気泡シート体成形情報検出装置、及び気泡シート体成形情報検出方法
WO2010141291A1 (en) * 2009-06-01 2010-12-09 Nitto Denko Corporation Luminescent ceramic and light-emitting device using the same

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