JP5952336B2 - 太陽電池及びその製造方法 - Google Patents
太陽電池及びその製造方法 Download PDFInfo
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- JP5952336B2 JP5952336B2 JP2014103448A JP2014103448A JP5952336B2 JP 5952336 B2 JP5952336 B2 JP 5952336B2 JP 2014103448 A JP2014103448 A JP 2014103448A JP 2014103448 A JP2014103448 A JP 2014103448A JP 5952336 B2 JP5952336 B2 JP 5952336B2
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- 238000004519 manufacturing process Methods 0.000 title claims description 14
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 129
- 239000002245 particle Substances 0.000 claims description 80
- 239000000758 substrate Substances 0.000 claims description 80
- 229910052759 nickel Inorganic materials 0.000 claims description 48
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 36
- 229910052709 silver Inorganic materials 0.000 claims description 31
- 239000004332 silver Substances 0.000 claims description 31
- 229920005989 resin Polymers 0.000 claims description 29
- 239000011347 resin Substances 0.000 claims description 29
- RUFLMLWJRZAWLJ-UHFFFAOYSA-N nickel silicide Chemical compound [Ni]=[Si]=[Ni] RUFLMLWJRZAWLJ-UHFFFAOYSA-N 0.000 claims description 27
- 229910021334 nickel silicide Inorganic materials 0.000 claims description 27
- 239000002003 electrode paste Substances 0.000 claims description 23
- 239000012535 impurity Substances 0.000 claims description 23
- 229920001187 thermosetting polymer Polymers 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 16
- 229910021332 silicide Inorganic materials 0.000 claims description 15
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims description 15
- 230000004888 barrier function Effects 0.000 claims description 13
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000004925 Acrylic resin Substances 0.000 claims description 4
- 229920000178 Acrylic resin Polymers 0.000 claims description 4
- 230000005684 electric field Effects 0.000 claims description 4
- 239000003822 epoxy resin Substances 0.000 claims description 4
- 229920000647 polyepoxide Polymers 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 34
- 230000008569 process Effects 0.000 description 8
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 229910052814 silicon oxide Inorganic materials 0.000 description 4
- 239000005341 toughened glass Substances 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000005038 ethylene vinyl acetate Substances 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000178 monomer Substances 0.000 description 3
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 229910004205 SiNX Inorganic materials 0.000 description 2
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- -1 polyethylene terephthalate Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 239000002952 polymeric resin Substances 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005036 potential barrier Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000003685 thermal hair damage Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
- H01L31/0684—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells double emitter cells, e.g. bifacial solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
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- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Sustainable Development (AREA)
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- Manufacturing & Machinery (AREA)
- Photovoltaic Devices (AREA)
Description
Claims (18)
- 第1導電型の基板と、
前記基板の第1面に位置し、第1導電型とは異なる第2導電型の不純物を含有する第1ドーピング部と、
前記第1ドーピング部と電気的に接続された第1電極部と
を含み、
前記第1電極部は、熱硬化性樹脂と、前記熱硬化性樹脂内に分散された第1導電性粒子と、第2導電性粒子と、前記第2導電性粒子と前記第1ドーピング部の接触界面に位置するシリサイドを含み、
前記第1導電性粒子は銀(Ag)から構成され、前記第2導電性粒子は前記第1導電性粒子と比べて高い仕事関数を有するニッケル(Ni)から構成され、
前記ニッケルは、銀とニッケルを合せた全重量に対して15重量%〜25重量%の割合で含有される、太陽電池。 - 前記第1ドーピング部と接触する界面に形成されたシリサイドがニッケルシリサイドから構成される、請求項1記載の太陽電池。
- 前記ニッケルシリサイド(NS)は前記ニッケル(Ni)に比べて仕事関数が低くショットキー障壁が高いが、前記ニッケル(Ni)に比べて低い比抵抗を有する、請求項2記載の太陽電池。
- 前記ニッケルは、
2μm〜10μmの大きさを有する、請求項1記載の太陽電池。 - 前記熱硬化性樹脂は、
モノマー系のエポキシ樹脂またはアクリル樹脂を含む、請求項1記載の太陽電池。 - 前記第1ドーピング部は、
エミッタ部から形成される、請求項1記載の太陽電池。 - 前記エミッタ部には誘電層が形成される、請求項6記載の太陽電池。
- 前記第1電極部は、第1方向に延長された複数の第1フィンガー電極と、前記第1フィンガー電極と交差する第2方向に延長された複数の第1バスバー電極を含む、請求項7記載の太陽電池。
- 前記基板の第1面の反対側に位置する第2面に位置し、前記第1導電型の不純物を前記基板に比べて高濃度で含有する第2ドーピング部と、
前記第2ドーピング部と電気的に接続された第2電極部と
をさらに含み、
前記第2電極部は、前記第1導電性粒子、前記第2導電性粒子、前記シリサイド及び前記熱硬化性樹脂を含む、請求項1記載の太陽電池。 - 前記第2ドーピング部は後面電界部で形成される、請求項9記載の太陽電池。
- 前記後面電界部には、誘電層が形成される、請求項10記載の太陽電池。
- 前記第2電極部は、第1方向に延長された複数の第2フィンガー電極と前記第2フィンガー電極と交差する第2方向に延長された複数の第2バスバー電極を含む、請求項11記載の太陽電池。
- 第1導電型を有する基板の第1面に前記第1導電型とは異なる第2導電型の不純物を含有する第1ドーピング部を形成する段階と、
前記第1ドーピング部の一部を露出する開口部を備える誘電層を前記第1ドーピング部上に形成する段階と、
前記第1ドーピング部と電気的に接続された第1電極部を形成する段階と、を含み、
前記第1電極部を形成する段階は、
熱硬化性樹脂、前記熱硬化性樹脂内に分散された第1導電性粒子と、前記熱硬化性樹脂内に分散され、前記第1導電性粒子に比べて高い仕事関数を有する第2導電性粒子を含む電極ペーストを前記開口部を介して露出された前記第1ドーピング部に印刷する段階と、
前記電極ペーストを熱処理して硬化する段階と、
前記第2導電性粒子と、前記第1ドーピング部が接触する界面にシリサイドを形成する段階と
を含み、
前記第1電極部は、熱硬化性樹脂と、前記熱硬化性樹脂内に分散された第1導電性粒子と、第2導電性粒子と、前記第2導電性粒子と第1ドーピング部の接触界面に位置するシリサイドを含み、
前記第1導電性粒子は銀(Ag)から構成され、前記第2導電性粒子は前記第1導電性粒子と比べて高い仕事関数を有するニッケル(Ni)から構成され、
前記ニッケルは、銀とニッケルを合せた全重量に対して15重量%〜25重量%の割合で含有される、太陽電池の製造方法。 - 前記シリサイドを形成する段階は、前記ニッケルから構成された第2導電性粒子を利用して、前記第2導電性粒子が、前記第1ドーピング部と接触する界面にニッケルシリサイドを形成する段階を含む、請求項13記載の太陽電池の製造方法。
- 前記シリサイド(NS)は、前記ニッケル(Ni)に比べて仕事関数が低くショットキー障壁が高いが、前記ニッケル(Ni)に比べて低い比抵抗を有する、請求項14記載の太陽電池の製造方法。
- 230℃〜260℃の温度で前記電極ペーストを熱処理して硬化する、請求項15記載の太陽電池の製造方法。
- 前記ニッケルシリサイドを形成する段階は、前記基板を350℃〜400℃の温度に加熱することを含む、請求項16記載の太陽電池の製造方法。
- 前記第1ドーピング部をエミッタ部で形成する、請求項13記載の太陽電池の製造方法。
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KR1020130056314A KR101614186B1 (ko) | 2013-05-20 | 2013-05-20 | 태양전지 및 이의 제조 방법 |
KR10-2013-0056314 | 2013-05-20 |
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US (1) | US11004988B2 (ja) |
EP (1) | EP2806465B1 (ja) |
JP (1) | JP5952336B2 (ja) |
KR (1) | KR101614186B1 (ja) |
CN (1) | CN104183656B (ja) |
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DE202015102238U1 (de) * | 2015-05-04 | 2015-06-01 | Solarworld Innovations Gmbh | Photovoltaik-Zelle und Photovoltaik-Modul |
WO2018080122A1 (ko) | 2016-10-28 | 2018-05-03 | 한국전자통신연구원 | 영상 부호화/복호화 방법, 장치 및 비트스트림을 저장한 기록 매체 |
KR101980946B1 (ko) * | 2016-11-11 | 2019-05-21 | 삼성에스디아이 주식회사 | 태양전지용 전면 전극 및 이를 포함하는 태양전지 |
KR20210103850A (ko) * | 2020-02-14 | 2021-08-24 | 엘지전자 주식회사 | 태양 전지, 그리고 태양 전지 패널 및 이의 제조 방법 |
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TW201251084A (en) * | 2010-12-02 | 2012-12-16 | Applied Nanotech Holdings Inc | Nanoparticle inks for solar cells |
KR20120079591A (ko) | 2011-01-05 | 2012-07-13 | 엘지전자 주식회사 | 태양전지 및 그 제조 방법 |
KR20120091629A (ko) * | 2011-02-09 | 2012-08-20 | 엘지전자 주식회사 | 태양전지 |
DE102011016335B4 (de) * | 2011-04-07 | 2013-10-02 | Universität Konstanz | Nickelhaltige und ätzende druckbare Paste sowie Verfahren zur Bildung von elektrischen Kontakten beim Herstellen einer Solarzelle |
US8901414B2 (en) * | 2011-09-14 | 2014-12-02 | International Business Machines Corporation | Photovoltaic cells with copper grid |
CN104011882A (zh) * | 2012-01-12 | 2014-08-27 | 应用材料公司 | 制造太阳能电池装置的方法 |
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EP2806465A3 (en) | 2015-04-01 |
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