JP5944349B2 - 発光ダイオードの蛍光体位置把握装置、発光ダイオードの蛍光体位置把握装置を備える部品実装器、発光ダイオードの蛍光体位置把握方法及びレンズ取り付け方法 - Google Patents

発光ダイオードの蛍光体位置把握装置、発光ダイオードの蛍光体位置把握装置を備える部品実装器、発光ダイオードの蛍光体位置把握方法及びレンズ取り付け方法 Download PDF

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Publication number
JP5944349B2
JP5944349B2 JP2013126556A JP2013126556A JP5944349B2 JP 5944349 B2 JP5944349 B2 JP 5944349B2 JP 2013126556 A JP2013126556 A JP 2013126556A JP 2013126556 A JP2013126556 A JP 2013126556A JP 5944349 B2 JP5944349 B2 JP 5944349B2
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Japan
Prior art keywords
emitting diode
light
light emitting
phosphor
substrate
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JP2013126556A
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English (en)
Japanese (ja)
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JP2014002150A5 (OSRAM
JP2014002150A (ja
Inventor
ジェ−ヒュン・パク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hanwha Vision Co Ltd
Original Assignee
Hanwha Techwin Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of JP2014002150A publication Critical patent/JP2014002150A/ja
Publication of JP2014002150A5 publication Critical patent/JP2014002150A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V5/00—Refractors for light sources
    • F21V5/04—Refractors for light sources of lens shape
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V9/00—Elements for modifying spectral properties, polarisation or intensity of the light emitted, e.g. filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages
    • H10H20/851—Wavelength conversion means
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages
    • H10H20/851—Wavelength conversion means
    • H10H20/8514—Wavelength conversion means characterised by their shape, e.g. plate or foil
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/85—Packages
    • H10H20/851—Wavelength conversion means
    • H10H20/8515—Wavelength conversion means not being in contact with the bodies
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
    • F21Y2115/00—Light-generating elements of semiconductor light sources
    • F21Y2115/10—Light-emitting diodes [LED]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Led Device Packages (AREA)
  • Studio Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Supply And Installment Of Electrical Components (AREA)
JP2013126556A 2012-06-18 2013-06-17 発光ダイオードの蛍光体位置把握装置、発光ダイオードの蛍光体位置把握装置を備える部品実装器、発光ダイオードの蛍光体位置把握方法及びレンズ取り付け方法 Active JP5944349B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2012-0065245 2012-06-18
KR1020120065245A KR101472444B1 (ko) 2012-06-18 2012-06-18 발광 다이오드의 형광체 위치 파악 장치, 발광 다이오드의 형광체 위치 파악 장치를 포함한 부품 실장기, 발광 다이오드의 형광체 위치 파악 방법 및 렌즈 설치 방법

Publications (3)

Publication Number Publication Date
JP2014002150A JP2014002150A (ja) 2014-01-09
JP2014002150A5 JP2014002150A5 (OSRAM) 2015-08-06
JP5944349B2 true JP5944349B2 (ja) 2016-07-05

Family

ID=49895610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013126556A Active JP5944349B2 (ja) 2012-06-18 2013-06-17 発光ダイオードの蛍光体位置把握装置、発光ダイオードの蛍光体位置把握装置を備える部品実装器、発光ダイオードの蛍光体位置把握方法及びレンズ取り付け方法

Country Status (3)

Country Link
JP (1) JP5944349B2 (OSRAM)
KR (1) KR101472444B1 (OSRAM)
CN (2) CN103512491A (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102268172B1 (ko) * 2014-07-07 2021-06-23 엘지전자 주식회사 광원 모듈 어셈블리 조립 장치 및 조립 방법
KR20160056167A (ko) * 2014-11-11 2016-05-19 삼성전자주식회사 발광 장치의 제조 방법, 발광 모듈 검사 장비 및 발광 모듈의 양불 판단 방법
KR102746079B1 (ko) 2016-08-03 2024-12-24 삼성전자주식회사 발광소자 패키지의 검사 장치 및 제조 장치
JP6860440B2 (ja) * 2017-07-20 2021-04-14 日本メクトロン株式会社 基板位置認識装置、位置認識加工装置および基板製造方法
CN109216532B (zh) * 2018-11-01 2023-09-12 上海悦威电子设备有限公司 一种紫外led石英透镜装配结构及方法
KR102825008B1 (ko) * 2020-02-05 2025-06-27 삼성디스플레이 주식회사 광학 검사 장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3678007B2 (ja) * 1998-07-10 2005-08-03 松下電器産業株式会社 電子部品実装装置における電子部品認識装置および電子部品認識方法
JP3673657B2 (ja) * 1998-11-06 2005-07-20 松下電器産業株式会社 プラズマディスプレイ蛍光体の検査装置および検査方法
JP2003196949A (ja) * 2001-12-27 2003-07-11 Hitachi High-Tech Instruments Co Ltd 光学ディスク検査装置
JP3723845B2 (ja) * 2002-03-26 2005-12-07 国立大学法人富山大学 有機エレクトロルミネッセンス素子に使用される有機薄膜の膜厚測定法および測定装置
KR100925275B1 (ko) * 2002-11-04 2009-11-05 엘지전자 주식회사 플라즈마 디스플레이 패널의 형광체 검사 장치 및 방법
JP2006162427A (ja) * 2004-12-07 2006-06-22 Toshiba Corp Ｌｅｄチップの検査方法及びｌｅｄチップの検査装置
KR101168316B1 (ko) * 2009-12-01 2012-07-25 삼성전자주식회사 발광다이오드 검사 장치
CN102087226B (zh) * 2009-12-04 2015-03-25 三星电子株式会社 Led测试装置及其测试方法
KR101289826B1 (ko) * 2011-06-15 2013-07-26 삼성전자주식회사 Ｌｅｄ 검사 장치 및 그 방법

Also Published As

Publication number Publication date
KR20130142023A (ko) 2013-12-27
CN103512491A (zh) 2014-01-15
JP2014002150A (ja) 2014-01-09
CN107655407A (zh) 2018-02-02
KR101472444B1 (ko) 2014-12-24

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