JP5834537B2 - 眼軸長測定装置 - Google Patents

眼軸長測定装置 Download PDF

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Publication number
JP5834537B2
JP5834537B2 JP2011141958A JP2011141958A JP5834537B2 JP 5834537 B2 JP5834537 B2 JP 5834537B2 JP 2011141958 A JP2011141958 A JP 2011141958A JP 2011141958 A JP2011141958 A JP 2011141958A JP 5834537 B2 JP5834537 B2 JP 5834537B2
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JP
Japan
Prior art keywords
light
eye
measurement
optical system
axial length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2011141958A
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English (en)
Japanese (ja)
Other versions
JP2013005982A (ja
JP2013005982A5 (enExample
Inventor
遠藤 雅和
雅和 遠藤
邦生 鈴木
邦生 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2011141958A priority Critical patent/JP5834537B2/ja
Priority to EP11176582.2A priority patent/EP2415393B1/en
Publication of JP2013005982A publication Critical patent/JP2013005982A/ja
Publication of JP2013005982A5 publication Critical patent/JP2013005982A5/ja
Application granted granted Critical
Publication of JP5834537B2 publication Critical patent/JP5834537B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Eye Examination Apparatus (AREA)
JP2011141958A 2010-08-05 2011-06-27 眼軸長測定装置 Expired - Fee Related JP5834537B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011141958A JP5834537B2 (ja) 2011-06-27 2011-06-27 眼軸長測定装置
EP11176582.2A EP2415393B1 (en) 2010-08-05 2011-08-04 Ophthalmic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011141958A JP5834537B2 (ja) 2011-06-27 2011-06-27 眼軸長測定装置

Publications (3)

Publication Number Publication Date
JP2013005982A JP2013005982A (ja) 2013-01-10
JP2013005982A5 JP2013005982A5 (enExample) 2014-08-07
JP5834537B2 true JP5834537B2 (ja) 2015-12-24

Family

ID=47673884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011141958A Expired - Fee Related JP5834537B2 (ja) 2010-08-05 2011-06-27 眼軸長測定装置

Country Status (1)

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JP (1) JP5834537B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9526415B2 (en) 2013-04-03 2016-12-27 Kabushiki Kaisha Topcon Ophthalmologic apparatus
US9380937B2 (en) 2013-04-03 2016-07-05 Kabushiki Kaisha Topcon Ophthalmologic apparatus
US9295387B2 (en) 2013-04-03 2016-03-29 Kabushiki Kaisha Topcon Ophthalmologic apparatus
US9295386B2 (en) 2013-04-03 2016-03-29 Kabushiki Kaisha Topcon Ophthalmologic apparatus
US9370301B2 (en) 2013-04-03 2016-06-21 Kabushiki Kaisha Topcon Ophthalmologic apparatus
JP6357851B2 (ja) * 2013-05-01 2018-07-18 株式会社ニデック 眼科装置
EP3893715A1 (en) * 2018-12-12 2021-10-20 Ecole Polytechnique Federale De Lausanne (Epfl) Ophthalmic system and method for clinical device using transcleral illumination with multiple points source

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3504314B2 (ja) * 1994-02-09 2004-03-08 株式会社トプコン 眼科装置
JP4996918B2 (ja) * 2006-12-26 2012-08-08 株式会社トプコン 光画像計測装置及び光画像計測装置を制御するプログラム
JP5172141B2 (ja) * 2006-12-26 2013-03-27 株式会社ニデック 眼軸長測定装置
JP5179063B2 (ja) * 2007-01-06 2013-04-10 株式会社ニデック 眼科装置
JP4896794B2 (ja) * 2007-03-30 2012-03-14 株式会社トプコン 光画像計測装置、それを制御するプログラム及び光画像計測方法

Also Published As

Publication number Publication date
JP2013005982A (ja) 2013-01-10

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