JP5821363B2 - 製品欠陥要因分析装置 - Google Patents

製品欠陥要因分析装置 Download PDF

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Publication number
JP5821363B2
JP5821363B2 JP2011164130A JP2011164130A JP5821363B2 JP 5821363 B2 JP5821363 B2 JP 5821363B2 JP 2011164130 A JP2011164130 A JP 2011164130A JP 2011164130 A JP2011164130 A JP 2011164130A JP 5821363 B2 JP5821363 B2 JP 5821363B2
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data
product
defect
plant data
plant
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Japanese (ja)
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JP2013029916A (ja
JP2013029916A5 (enExample
Inventor
秀穂 神戸
秀穂 神戸
智親 氏家
智親 氏家
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Toshiba Mitsubishi Electric Industrial Systems Corp
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Toshiba Mitsubishi Electric Industrial Systems Corp
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Priority to JP2011164130A priority Critical patent/JP5821363B2/ja
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Publication of JP2013029916A5 publication Critical patent/JP2013029916A5/ja
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    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • General Factory Administration (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2011164130A 2011-07-27 2011-07-27 製品欠陥要因分析装置 Active JP5821363B2 (ja)

Priority Applications (1)

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JP2011164130A JP5821363B2 (ja) 2011-07-27 2011-07-27 製品欠陥要因分析装置

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JP2011164130A JP5821363B2 (ja) 2011-07-27 2011-07-27 製品欠陥要因分析装置

Publications (3)

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JP2013029916A JP2013029916A (ja) 2013-02-07
JP2013029916A5 JP2013029916A5 (enExample) 2014-10-16
JP5821363B2 true JP5821363B2 (ja) 2015-11-24

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Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6229282B2 (ja) * 2013-03-25 2017-11-15 大日本印刷株式会社 加工システム、加工ログ記憶プログラム、加工装置
JPWO2015040678A1 (ja) * 2013-09-17 2017-03-02 富士通株式会社 コロニー検査プログラム、コロニー検査装置およびコロニー検査方法
JP5962623B2 (ja) * 2013-09-20 2016-08-03 東芝三菱電機産業システム株式会社 鉄鋼プラント用データサーバ装置
JP6016767B2 (ja) * 2013-12-18 2016-10-26 株式会社神戸製鋼所 操業データ検索支援装置が実行する方法及び操業データ検索支援装置
WO2017134772A1 (ja) * 2016-02-03 2017-08-10 東芝三菱電機産業システム株式会社 製造設備診断支援装置及び製造設備診断支援方法
DE102019201557A1 (de) * 2019-02-07 2020-08-13 Zf Friedrichshafen Ag Verfahren und Vorrichtung zum automatisierten Identifizieren eines Produktfehlers eines Produkts und/oder zum automatisierten Identifizieren einer Produktfehlerursache des Produktfehlers
CN119630497A (zh) * 2023-07-12 2025-03-14 株式会社Tmeic 品质异常要因分析支援系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4758619B2 (ja) * 2003-12-10 2011-08-31 株式会社日立ハイテクノロジーズ 問題工程特定方法および装置
JP4772613B2 (ja) * 2005-12-16 2011-09-14 新日本製鐵株式会社 品質解析方法、品質解析装置、コンピュータプログラム、及びコンピュータ読み取り可能な記憶媒体
JP4855353B2 (ja) * 2006-11-14 2012-01-18 新日本製鐵株式会社 製品の品質改善条件解析装置、解析方法、コンピュータプログラム、及びコンピュータ読み取り可能な記録媒体
JP2010283274A (ja) * 2009-06-08 2010-12-16 Sharp Corp 異常原因解析装置、異常原因解析方法、異常原因解析プログラム、及び、プログラム記録媒体

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