JP5816144B2 - テストプログラムおよび試験システム - Google Patents

テストプログラムおよび試験システム Download PDF

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Publication number
JP5816144B2
JP5816144B2 JP2012190589A JP2012190589A JP5816144B2 JP 5816144 B2 JP5816144 B2 JP 5816144B2 JP 2012190589 A JP2012190589 A JP 2012190589A JP 2012190589 A JP2012190589 A JP 2012190589A JP 5816144 B2 JP5816144 B2 JP 5816144B2
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Japan
Prior art keywords
test
configuration data
program
information processing
processing apparatus
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JP2012190589A
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English (en)
Japanese (ja)
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JP2014048125A (ja
Inventor
善文 田原
善文 田原
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Advantest Corp
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Advantest Corp
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Priority to JP2012190589A priority Critical patent/JP5816144B2/ja
Priority to PCT/JP2013/004383 priority patent/WO2014034011A1/ja
Priority to TW102127014A priority patent/TWI480564B/zh
Publication of JP2014048125A publication Critical patent/JP2014048125A/ja
Priority to US14/597,217 priority patent/US20150127986A1/en
Application granted granted Critical
Publication of JP5816144B2 publication Critical patent/JP5816144B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2012190589A 2012-08-30 2012-08-30 テストプログラムおよび試験システム Active JP5816144B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012190589A JP5816144B2 (ja) 2012-08-30 2012-08-30 テストプログラムおよび試験システム
PCT/JP2013/004383 WO2014034011A1 (ja) 2012-08-30 2013-07-18 テストプログラムおよび試験システム
TW102127014A TWI480564B (zh) 2012-08-30 2013-07-29 電腦測試程式產品以及用於半導體元件的測試系統
US14/597,217 US20150127986A1 (en) 2012-08-30 2015-01-15 Test program and test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012190589A JP5816144B2 (ja) 2012-08-30 2012-08-30 テストプログラムおよび試験システム

Publications (2)

Publication Number Publication Date
JP2014048125A JP2014048125A (ja) 2014-03-17
JP5816144B2 true JP5816144B2 (ja) 2015-11-18

Family

ID=50182854

Family Applications (1)

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JP2012190589A Active JP5816144B2 (ja) 2012-08-30 2012-08-30 テストプログラムおよび試験システム

Country Status (4)

Country Link
US (1) US20150127986A1 (zh)
JP (1) JP5816144B2 (zh)
TW (1) TWI480564B (zh)
WO (1) WO2014034011A1 (zh)

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JP5833502B2 (ja) * 2012-06-04 2015-12-16 株式会社アドバンテスト テストプログラム
JP2014235127A (ja) * 2013-06-04 2014-12-15 株式会社アドバンテスト 試験システム、制御プログラム、コンフィギュレーションデータの書込方法
JP6368530B2 (ja) * 2014-04-28 2018-08-01 日鉄住金テックスエンジ株式会社 暗号化技術を用いた試験システム及び試験方法
US9756515B1 (en) * 2015-03-16 2017-09-05 Amazon Technologies, Inc. Mobile device test infrastructure
US9921264B2 (en) 2016-04-20 2018-03-20 International Business Machines Corporation Method and apparatus for offline supported adaptive testing
JP6781089B2 (ja) 2017-03-28 2020-11-04 日立オートモティブシステムズ株式会社 電子制御装置、電子制御システム、電子制御装置の制御方法
US10592370B2 (en) * 2017-04-28 2020-03-17 Advantest Corporation User control of automated test features with software application programming interface (API)
US10241146B2 (en) * 2017-05-01 2019-03-26 Advantest Corporation Test system and method
CN107272647A (zh) * 2017-06-30 2017-10-20 思澜科技（成都）有限公司 一种测试装置及其使用方法
US10845410B2 (en) 2017-08-28 2020-11-24 Teradyne, Inc. Automated test system having orthogonal robots
CN109975624B (zh) * 2017-12-27 2022-01-25 无锡华润华晶微电子有限公司 测试系统及测试方法
TWI664828B (zh) * 2018-02-14 2019-07-01 和碩聯合科技股份有限公司 測試方法和測試系統
US10775408B2 (en) * 2018-08-20 2020-09-15 Teradyne, Inc. System for testing devices inside of carriers
TWI664431B (zh) * 2018-11-02 2019-07-01 技嘉科技股份有限公司 測試系統
CN109634792B (zh) * 2018-12-06 2023-10-03 中电太极(集团)有限公司 一种基于云计算的服务器硬件测试平台系统
JP7316818B2 (ja) * 2019-03-28 2023-07-28 株式会社アドバンテスト 波形データ取得モジュールおよび試験装置
TWI790440B (zh) * 2020-05-11 2023-01-21 致茂電子股份有限公司 電子元件測試系統與期限稽核方法
KR20230002716A (ko) * 2020-07-21 2023-01-05 주식회사 아도반테스토 디바이스 특정 데이터를 사용하는 자동화된 테스트 장비 및 방법
US11867749B2 (en) 2020-10-22 2024-01-09 Teradyne, Inc. Vision system for an automated test system
US11953519B2 (en) 2020-10-22 2024-04-09 Teradyne, Inc. Modular automated test system
US11754596B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Test site configuration in an automated test system
US11754622B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Thermal control system for an automated test system
US11899042B2 (en) 2020-10-22 2024-02-13 Teradyne, Inc. Automated test system
US11867720B2 (en) 2020-11-16 2024-01-09 Advantest Corporation Test system configuration adapter systems and methods
CN112783770A (zh) * 2021-01-21 2021-05-11 深圳市杉川机器人有限公司 软件测试方法、装置、设备及计算机可读存储介质
CN115391166A (zh) * 2021-05-25 2022-11-25 爱德万测试股份有限公司 自动化测试系统及方法
US12007411B2 (en) 2021-06-22 2024-06-11 Teradyne, Inc. Test socket having an automated lid
TWI800946B (zh) * 2021-10-13 2023-05-01 大陸商常州欣盛半導體技術股份有限公司 任意波形產生器驗證平台
CN114443378B (zh) * 2021-12-17 2024-02-23 苏州浪潮智能科技有限公司 服务器信号测试系统及方法

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KR100245799B1 (ko) * 1997-06-30 2000-03-02 윤종용 검사조건 자동 작성 및 전송시 스템 및 방법
US7016811B2 (en) * 2001-08-15 2006-03-21 National Instruments Corporation Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification
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JP3776843B2 (ja) * 2002-06-28 2006-05-17 アジレント・テクノロジーズ・インク データ解析方法及び装置
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JP3845645B2 (ja) * 2004-05-28 2006-11-15 アンリツ株式会社 通信試験装置及び通信試験方法
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Also Published As

Publication number Publication date
US20150127986A1 (en) 2015-05-07
WO2014034011A1 (ja) 2014-03-06
TWI480564B (zh) 2015-04-11
JP2014048125A (ja) 2014-03-17
TW201413267A (zh) 2014-04-01

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