JP5809410B2 - マイクロ秒ｘ線強度切換えのためのｘ線管 - Google Patents

マイクロ秒ｘ線強度切換えのためのｘ線管 Download PDF

Info

Publication number
JP5809410B2
JP5809410B2 JP2010275191A JP2010275191A JP5809410B2 JP 5809410 B2 JP5809410 B2 JP 5809410B2 JP 2010275191 A JP2010275191 A JP 2010275191A JP 2010275191 A JP2010275191 A JP 2010275191A JP 5809410 B2 JP5809410 B2 JP 5809410B2
Authority
JP
Japan
Prior art keywords
emitter
electron beam
target
injector
extraction electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2010275191A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011129518A5 (enExample
JP2011129518A (ja
Inventor
マーク・アラン・フロンテラ
ユン・ゾウ
ピーター・アンドラス・ザヴォドスキー
セルジオ・ルメイトル
ケアリー・ショーン・ロジャース
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2011129518A publication Critical patent/JP2011129518A/ja
Publication of JP2011129518A5 publication Critical patent/JP2011129518A5/ja
Application granted granted Critical
Publication of JP5809410B2 publication Critical patent/JP5809410B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/045—Electrodes for controlling the current of the cathode ray, e.g. control grids
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/153—Spot position control

Landscapes

  • X-Ray Techniques (AREA)
JP2010275191A 2009-12-16 2010-12-10 マイクロ秒ｘ線強度切換えのためのｘ線管 Active JP5809410B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/639,206 2009-12-16
US12/639,206 US8401151B2 (en) 2009-12-16 2009-12-16 X-ray tube for microsecond X-ray intensity switching

Publications (3)

Publication Number Publication Date
JP2011129518A JP2011129518A (ja) 2011-06-30
JP2011129518A5 JP2011129518A5 (enExample) 2014-01-30
JP5809410B2 true JP5809410B2 (ja) 2015-11-10

Family

ID=44142902

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010275191A Active JP5809410B2 (ja) 2009-12-16 2010-12-10 マイクロ秒ｘ線強度切換えのためのｘ線管

Country Status (3)

Country Link
US (1) US8401151B2 (enExample)
JP (1) JP5809410B2 (enExample)
DE (1) DE102010060869A1 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009004334A1 (de) * 2009-01-12 2010-07-15 Siemens Aktiengesellschaft Verfahren zur Röntgenbildgebung unter Ausnutzung von Streustrahlung
DE102009008046A1 (de) * 2009-02-09 2010-08-19 Siemens Aktiengesellschaft Röntgenröhre mit einer Einfangvorrichtung für rückgestreute Elektronen und Verfahren zum Betreiben einer derartigen Röntgenröhre
US8401151B2 (en) * 2009-12-16 2013-03-19 General Electric Company X-ray tube for microsecond X-ray intensity switching
US9271689B2 (en) * 2010-01-20 2016-03-01 General Electric Company Apparatus for wide coverage computed tomography and method of constructing same
DE102011075453A1 (de) * 2011-05-06 2012-11-08 Siemens Aktiengesellschaft Röntgenröhre und Verfahren zum Betrieb einer Röntgenröhre
WO2013017988A1 (en) * 2011-08-01 2013-02-07 Koninklijke Philips Electronics N.V. Generation of multiple x-ray energies
RU2014151775A (ru) 2012-05-22 2016-07-20 Конинклейке Филипс Н.В. Гашение электронного пучка во время динамического перескока фокального пятна по кругу вращающегося диска анода рентгеновской трубки
DE102012211285B3 (de) * 2012-06-29 2013-10-10 Siemens Aktiengesellschaft Röntgenröhre und Verfahren zum Betrieb einer Röntgenröhre
US9484179B2 (en) * 2012-12-18 2016-11-01 General Electric Company X-ray tube with adjustable intensity profile
US9224572B2 (en) * 2012-12-18 2015-12-29 General Electric Company X-ray tube with adjustable electron beam
US9160325B2 (en) 2013-01-22 2015-10-13 General Electric Company Systems and methods for fast kilovolt switching in an X-ray system
US9048064B2 (en) * 2013-03-05 2015-06-02 Varian Medical Systems, Inc. Cathode assembly for a long throw length X-ray tube
DE102013208103A1 (de) * 2013-05-03 2014-11-06 Siemens Aktiengesellschaft Röntgenquelle und bildgebendes System
US9901311B2 (en) 2013-06-26 2018-02-27 Koninklijke Philips N.V. Imaging apparatus
US9603230B2 (en) 2013-11-18 2017-03-21 General Electric Systems and methods for measuring current with shielded conductors
US9443691B2 (en) 2013-12-30 2016-09-13 General Electric Company Electron emission surface for X-ray generation
US9711320B2 (en) * 2014-04-29 2017-07-18 General Electric Company Emitter devices for use in X-ray tubes
US10068741B2 (en) * 2014-12-25 2018-09-04 Meidensha Corporation Field emission device and reforming treatment method
US9711321B2 (en) * 2014-12-30 2017-07-18 General Electric Company Low aberration, high intensity electron beam for X-ray tubes
US10136868B2 (en) 2015-09-03 2018-11-27 General Electric Company Fast dual energy for general radiography
US9928985B2 (en) 2016-02-29 2018-03-27 General Electric Company Robust emitter for minimizing damage from ion bombardment
EP3226277A1 (en) 2016-03-31 2017-10-04 General Electric Company Angled flat emitter for high power cathode with electrostatic emission control
US10468222B2 (en) 2016-03-31 2019-11-05 General Electric Company Angled flat emitter for high power cathode with electrostatic emission control
JP6206541B1 (ja) 2016-06-13 2017-10-04 株式会社明電舎 電界放射装置および改質処理方法
JP6226033B1 (ja) 2016-06-24 2017-11-08 株式会社明電舎 電界放射装置および電界放射方法
DE102016222365B3 (de) * 2016-11-15 2018-04-05 Siemens Healthcare Gmbh Verfahren, Computerprogrammprodukt, computerlesbares Medium und Vorrichtung zur Erzeugung von Röntgenpulsen bei einer Röntgenbildgebung
WO2019019042A1 (en) 2017-07-26 2019-01-31 Shenzhen Xpectvision Technology Co., Ltd. INTEGRATED X-RAY SOURCE
GB2565138A (en) * 2017-08-04 2019-02-06 Adaptix Ltd X-ray generator
US11039809B2 (en) 2018-04-20 2021-06-22 GE Precision Healthcare LLC System and method for calibration of an X-ray tube
US10893839B2 (en) 2018-06-06 2021-01-19 General Electric Company Computed tomography system and method configured to image at different energy levels and focal spot positions
US10825634B2 (en) * 2019-02-21 2020-11-03 Varex Imaging Corporation X-ray tube emitter
US12274577B2 (en) 2022-04-11 2025-04-15 GE Precision Healthcare LLC Systems and methods for computed tomography
US12213238B2 (en) * 2022-10-18 2025-01-28 Carl Zeiss X-ray Microscopy, Inc. Reflection target X-ray source with steered beam on target

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2559526A (en) * 1945-09-18 1951-07-03 Research Corp Anode target for high-voltage highvacuum uniform-field acceleration tube
US3710176A (en) 1970-05-11 1973-01-09 Gen Electric Electron-optical recording device
FR2406890A1 (fr) 1977-10-21 1979-05-18 Radiologie Cie Gle Procede et dispositif pour ameliorer la definition radiologique des foyers des tubes a rayons x
US4458180A (en) 1982-02-18 1984-07-03 Elscint Ltd. Plasma electron source for cold-cathode discharge device or the like
DE3401749A1 (de) * 1984-01-19 1985-08-01 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung mit einer roentgenroehre
US4631742A (en) 1985-02-25 1986-12-23 General Electric Company Electronic control of rotating anode microfocus x-ray tubes for anode life extension
US4912367A (en) 1988-04-14 1990-03-27 Hughes Aircraft Company Plasma-assisted high-power microwave generator
US5199054A (en) * 1990-08-30 1993-03-30 Four Pi Systems Corporation Method and apparatus for high resolution inspection of electronic items
US5438605A (en) * 1992-01-06 1995-08-01 Picker International, Inc. Ring tube x-ray source with active vacuum pumping
US5332945A (en) 1992-05-11 1994-07-26 Litton Systems, Inc. Pierce gun with grading electrode
DE4430622C2 (de) * 1994-08-29 1998-07-02 Siemens Ag Kathodensystem für eine Röntgenröhre
DE19639920C2 (de) * 1996-09-27 1999-08-26 Siemens Ag Röntgenröhre mit variablem Fokus
US6094009A (en) 1997-06-05 2000-07-25 Hughes Electronics Corporation High efficiency collector for traveling wave tubes with high perveance beams using focusing lens effects
DE19731982C1 (de) * 1997-07-24 1998-12-10 Siemens Ag Röntgenröhre mit Mitteln zur magnetischen Ablenkung
US6376985B2 (en) * 1998-03-31 2002-04-23 Applied Materials, Inc. Gated photocathode for controlled single and multiple electron beam emission
JP4052731B2 (ja) * 1998-06-18 2008-02-27 株式会社アドバンテスト 電子銃
WO2000003412A1 (en) * 1998-07-09 2000-01-20 Hamamatsu Photonics K.K. X-ray tube
JP4026976B2 (ja) * 1999-03-02 2007-12-26 浜松ホトニクス株式会社 Ｘ線発生装置、ｘ線撮像装置及びｘ線検査システム
US6570165B1 (en) * 1999-12-30 2003-05-27 John C. Engdahl Radiation assisted electron emission device
WO2002015218A1 (de) 2000-08-17 2002-02-21 Gesellschaft für Schwerionenforschung mbH Vorrichtung und verfahren zur ionenstrahlbeschleunigung und zur elektronenstrahlimpulsformung und -verstärkung
US20040240616A1 (en) * 2003-05-30 2004-12-02 Applied Nanotechnologies, Inc. Devices and methods for producing multiple X-ray beams from multiple locations
US7826595B2 (en) * 2000-10-06 2010-11-02 The University Of North Carolina Micro-focus field emission x-ray sources and related methods
US6652143B2 (en) 2001-04-12 2003-11-25 Siemens Aktiengesellschaft Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube
JP3810656B2 (ja) * 2001-07-23 2006-08-16 株式会社神戸製鋼所 微小ｘ線源
CN1279795C (zh) * 2001-08-29 2006-10-11 株式会社东芝 X射线产生装置
US6760407B2 (en) * 2002-04-17 2004-07-06 Ge Medical Global Technology Company, Llc X-ray source and method having cathode with curved emission surface
US6785359B2 (en) 2002-07-30 2004-08-31 Ge Medical Systems Global Technology Company, Llc Cathode for high emission x-ray tube
GB0309383D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-ray tube electron sources
US7110500B2 (en) * 2003-09-12 2006-09-19 Leek Paul H Multiple energy x-ray source and inspection apparatus employing same
EP1784837A4 (en) * 2004-09-03 2011-04-20 Varian Med Sys Inc SHIELD STRUCTURE AND FOCAL POINT CONTROL ASSEMBLY FOR X-RAY DEVICE
WO2006064403A2 (en) 2004-12-17 2006-06-22 Koninklijke Philips Electronics, N.V. Pulsed x-ray for continuous detector correction
JP4972299B2 (ja) 2005-08-17 2012-07-11 株式会社アルバック 電子ビーム蒸着装置、および、当該装置を用いて行う基板の表面への蒸着被膜の形成方法
CN101449352A (zh) 2006-05-22 2009-06-03 皇家飞利浦电子股份有限公司 与旋转阳极移动同步地操纵电子束的x射线管
JP2007335125A (ja) 2006-06-13 2007-12-27 Ebara Corp 電子線装置
KR101112692B1 (ko) 2006-10-23 2012-02-29 가부시키가이샤 알박 피어스식 전자총의 전자빔 집속 제어방법 및 제어장치
US20080187093A1 (en) * 2007-02-06 2008-08-07 John Scott Price X-ray generation using secondary emission electron source
US7627087B2 (en) * 2007-06-28 2009-12-01 General Electric Company One-dimensional grid mesh for a high-compression electron gun
WO2009127995A1 (en) 2008-04-17 2009-10-22 Philips Intellectual Property & Standards Gmbh X-ray tube with passive ion collecting electrode
US7953205B2 (en) * 2008-05-22 2011-05-31 Vladimir Balakin Synchronized X-ray / breathing method and apparatus used in conjunction with a charged particle cancer therapy system
US8401151B2 (en) * 2009-12-16 2013-03-19 General Electric Company X-ray tube for microsecond X-ray intensity switching

Also Published As

Publication number Publication date
JP2011129518A (ja) 2011-06-30
DE102010060869A1 (de) 2011-06-22
US20110142193A1 (en) 2011-06-16
US8401151B2 (en) 2013-03-19

Similar Documents

Publication Publication Date Title
JP5809410B2 (ja) マイクロ秒ｘ線強度切換えのためのｘ線管
US8477908B2 (en) System and method for beam focusing and control in an indirectly heated cathode
US10741353B2 (en) Electron emitting construct configured with ion bombardment resistant
EP2750159B1 (en) Apparatus and method for generating distributed X-rays
US8520803B2 (en) Multi-segment anode target for an X-ray tube of the rotary anode type with each anode disk segment having its own anode inclination angle with respect to a plane normal to the rotational axis of the rotary anode and X-ray tube comprising a rotary anode with such a multi-segment anode target
US8385506B2 (en) X-ray cathode and method of manufacture thereof
JP5236393B2 (ja) 三点偏向を用いた焦点スポット温度の低減
US8488737B2 (en) Medical X-ray imaging system
JP4441656B2 (ja) Ｘ線管のための電子源及びケーブル
US10121629B2 (en) Angled flat emitter for high power cathode with electrostatic emission control
US6907110B2 (en) X-ray tube with ring anode, and system employing same
JP2011519125A (ja) パッシブイオン集電極を持つｘ線管
JP2012530340A (ja) ２つの焦点スポットを生成するｘ線管及びこれを有する医療デバイス
JP2008103326A (ja) Ｘ線装置の電子ビームを集束し偏向するための方法及び装置
US9224572B2 (en) X-ray tube with adjustable electron beam
EP3226277A1 (en) Angled flat emitter for high power cathode with electrostatic emission control
US7027559B2 (en) Method and apparatus for generating x-ray beams
CN104616952B (zh) 阴控多阴极分布式x射线装置
US10468222B2 (en) Angled flat emitter for high power cathode with electrostatic emission control
US7317785B1 (en) System and method for X-ray spot control
US9601300B2 (en) Cathode element for a microfocus x-ray tube
US20030048874A1 (en) Methods and apparatus for generating x-ray beams
WO2007102947A1 (en) System and method for x-ray spot control

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131205

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20131205

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20140806

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140812

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141028

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150217

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150424

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150818

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150911

R150 Certificate of patent or registration of utility model

Ref document number: 5809410

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350