JP5728026B2 - 研磨パッド及びこれの製造方法 - Google Patents

研磨パッド及びこれの製造方法 Download PDF

Info

Publication number
JP5728026B2
JP5728026B2 JP2012546101A JP2012546101A JP5728026B2 JP 5728026 B2 JP5728026 B2 JP 5728026B2 JP 2012546101 A JP2012546101 A JP 2012546101A JP 2012546101 A JP2012546101 A JP 2012546101A JP 5728026 B2 JP5728026 B2 JP 5728026B2
Authority
JP
Japan
Prior art keywords
polishing
layer
composition
present disclosure
polishing pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2012546101A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013515379A5 (https=
JP2013515379A (ja
Inventor
ナイチャオ リー,
ナイチャオ リー,
ウィリアム ディー. ジョセフ,
ウィリアム ディー. ジョセフ,
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of JP2013515379A publication Critical patent/JP2013515379A/ja
Publication of JP2013515379A5 publication Critical patent/JP2013515379A5/ja
Application granted granted Critical
Publication of JP5728026B2 publication Critical patent/JP5728026B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/34Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties
    • B24D3/342Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties incorporated in the bonding agent
    • B24D3/344Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties incorporated in the bonding agent the bonding agent being organic
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Polyurethanes Or Polyureas (AREA)
JP2012546101A 2009-12-22 2010-12-20 研磨パッド及びこれの製造方法 Active JP5728026B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US28898209P 2009-12-22 2009-12-22
US61/288,982 2009-12-22
US42244210P 2010-12-13 2010-12-13
US61/422,442 2010-12-13
PCT/US2010/061199 WO2011087737A2 (en) 2009-12-22 2010-12-20 Polishing pad and method of making the same

Publications (3)

Publication Number Publication Date
JP2013515379A JP2013515379A (ja) 2013-05-02
JP2013515379A5 JP2013515379A5 (https=) 2014-02-13
JP5728026B2 true JP5728026B2 (ja) 2015-06-03

Family

ID=44247814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012546101A Active JP5728026B2 (ja) 2009-12-22 2010-12-20 研磨パッド及びこれの製造方法

Country Status (6)

Country Link
US (1) US20130012108A1 (https=)
JP (1) JP5728026B2 (https=)
KR (1) KR101855073B1 (https=)
SG (1) SG181890A1 (https=)
TW (1) TWI517975B (https=)
WO (1) WO2011087737A2 (https=)

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2323808B1 (en) * 2008-07-18 2015-09-30 3M Innovative Properties Company Polishing pad with floating elements and method of making and using the same
MX2013007753A (es) * 2011-01-04 2013-08-15 Evonik Degussa Gmbh Productos semiterminados compuestos, partes moldeadas producidas por los mismos y partes moldeadas producidas directamente en base a (met) acrilatos hidroxifuncionalizados, los cuales son reticulados por medio de uretdionas en forma termoestable.
US20120302148A1 (en) * 2011-05-23 2012-11-29 Rajeev Bajaj Polishing pad with homogeneous body having discrete protrusions thereon
SG10201508090WA (en) * 2011-11-29 2015-10-29 Nexplanar Corp Polishing pad with foundation layer and polishing surface layer
US9067297B2 (en) 2011-11-29 2015-06-30 Nexplanar Corporation Polishing pad with foundation layer and polishing surface layer
KR101847619B1 (ko) * 2012-01-12 2018-04-11 엠.씨.케이(주) 고함량의 연마제 성분을 포함한 연마패드 및 그 연마패드 제조방법
JP6078631B2 (ja) * 2012-03-20 2017-02-08 ジェイエイチ ローデス カンパニー, インコーポレイテッド セルフコンディショニング研磨パッドおよびその作製方法
TWI590918B (zh) * 2013-08-16 2017-07-11 三芳化學工業股份有限公司 硏磨墊、硏磨裝置及製造硏磨墊之方法
US9421666B2 (en) * 2013-11-04 2016-08-23 Applied Materials, Inc. Printed chemical mechanical polishing pad having abrasives therein
TWI580524B (zh) * 2014-02-18 2017-05-01 中國砂輪企業股份有限公司 高性能化學機械研磨修整器及其製作方法
JP6365869B2 (ja) * 2014-03-19 2018-08-01 Dic株式会社 ウレタン組成物及び研磨材
JP6315246B2 (ja) * 2014-03-31 2018-04-25 富士紡ホールディングス株式会社 研磨パッド及びその製造方法
WO2015167910A1 (en) * 2014-05-01 2015-11-05 3M Innovative Properties Company Flexible abrasive article and method of using the same
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US9776361B2 (en) 2014-10-17 2017-10-03 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
US10399201B2 (en) 2014-10-17 2019-09-03 Applied Materials, Inc. Advanced polishing pads having compositional gradients by use of an additive manufacturing process
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US10875145B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
US10821573B2 (en) 2014-10-17 2020-11-03 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
KR20240015167A (ko) * 2014-10-17 2024-02-02 어플라이드 머티어리얼스, 인코포레이티드 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성
TWI548481B (zh) * 2014-11-17 2016-09-11 三芳化學工業股份有限公司 拋光墊及其製造方法
US10086500B2 (en) * 2014-12-18 2018-10-02 Applied Materials, Inc. Method of manufacturing a UV curable CMP polishing pad
US10010106B2 (en) * 2015-04-30 2018-07-03 Frito-Lay North America, Inc. Method and apparatus for removing a portion of a food product with an abrasive stream
KR101600393B1 (ko) * 2015-05-20 2016-03-07 에프엔에스테크 주식회사 연마 패드 및 이의 제조 방법
US10005172B2 (en) * 2015-06-26 2018-06-26 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Controlled-porosity method for forming polishing pad
CN105150120B (zh) * 2015-09-01 2018-03-30 河南科技学院 一种Roll‑to‑Roll化学机械抛光机用固结磨料抛光辊的刚性层及其制备方法
TWI769988B (zh) * 2015-10-07 2022-07-11 美商3M新設資產公司 拋光墊與系統及其製造與使用方法
TWI754275B (zh) * 2015-10-16 2022-02-01 美商應用材料股份有限公司 拋光墊及形成其之方法
JP6940495B2 (ja) 2015-10-30 2021-09-29 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
KR102629800B1 (ko) * 2016-01-19 2024-01-29 어플라이드 머티어리얼스, 인코포레이티드 다공성 화학적 기계적 연마 패드들
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
TWI689573B (zh) * 2016-05-23 2020-04-01 日商拓自達電線股份有限公司 導電性接著劑組成物
KR101894071B1 (ko) * 2016-11-03 2018-08-31 에스케이씨 주식회사 연마패드 제조용 자외선 경화형 수지 조성물, 연마패드 및 이의 제조방법
US11814795B2 (en) * 2017-04-03 2023-11-14 Jl Darling Llc Coating for recyclable paper
US11524390B2 (en) * 2017-05-01 2022-12-13 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Methods of making chemical mechanical polishing layers having improved uniformity
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
WO2019032286A1 (en) 2017-08-07 2019-02-14 Applied Materials, Inc. ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME
JP7089905B2 (ja) * 2018-03-02 2022-06-23 富士紡ホールディングス株式会社 研磨パッド
EP3790706A4 (en) 2018-05-07 2022-02-16 Applied Materials, Inc. CHEMICAL MECHANICAL POLISHING PADS WITH ADJUSTABLE HYDROPHIL AND ZETA POTENTIAL
WO2020050932A1 (en) 2018-09-04 2020-03-12 Applied Materials, Inc. Formulations for advanced polishing pads
US20200171623A1 (en) * 2018-11-30 2020-06-04 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer backside cleaning apparatus and method of cleaning wafer backside
KR102871742B1 (ko) * 2019-04-05 2025-10-16 디디피 스페셜티 일렉트로닉 머티리얼즈 유에스, 엘엘씨 폴리우레탄계 열 계면 재료
US11851570B2 (en) 2019-04-12 2023-12-26 Applied Materials, Inc. Anionic polishing pads formed by printing processes
KR102718259B1 (ko) * 2019-07-23 2024-10-16 케이피엑스케미칼 주식회사 탄성 패드 및 그 제조 방법
KR102270392B1 (ko) * 2019-10-01 2021-06-30 에스케이실트론 주식회사 웨이퍼 연마 헤드, 웨이퍼 연마 헤드의 제조방법 및 그를 구비한 웨이퍼 연마 장치
TWI741753B (zh) * 2019-10-29 2021-10-01 南韓商Skc索密思股份有限公司 研磨墊、製造該研磨墊之方法及使用該研磨墊以製造半導體裝置之方法
KR102293765B1 (ko) * 2019-11-21 2021-08-26 에스케이씨솔믹스 주식회사 연마패드, 이의 제조방법, 및 이를 이용한 반도체 소자의 제조방법
KR102293801B1 (ko) * 2019-11-28 2021-08-25 에스케이씨솔믹스 주식회사 연마패드, 이의 제조방법 및 이를 이용한 반도체 소자의 제조방법
US11813712B2 (en) 2019-12-20 2023-11-14 Applied Materials, Inc. Polishing pads having selectively arranged porosity
US11638979B2 (en) 2020-06-09 2023-05-02 Applied Materials, Inc. Additive manufacturing of polishing pads
US11612978B2 (en) 2020-06-09 2023-03-28 Applied Materials, Inc. Additive manufacturing of polishing pads
US11806829B2 (en) 2020-06-19 2023-11-07 Applied Materials, Inc. Advanced polishing pads and related polishing pad manufacturing methods
WO2021260629A1 (en) 2020-06-25 2021-12-30 3M Innovative Properties Company Polishing pads and systems for and methods of using same
CN116368161A (zh) * 2020-10-19 2023-06-30 Cmc材料股份有限公司 用于化学机械抛光垫的能够uv固化的树脂
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ
KR102538440B1 (ko) * 2021-05-26 2023-05-30 에스케이엔펄스 주식회사 연마 시스템, 연마 패드 및 반도체 소자의 제조방법
JP7844617B2 (ja) * 2021-07-06 2026-04-13 アプライド マテリアルズ インコーポレイテッド 化学機械研磨のための音響窓を含む研磨パッド
TWI788017B (zh) * 2021-09-16 2022-12-21 美商帕拉萊斯集團國際有限責任公司 墊體及其製法
JP7441916B2 (ja) * 2021-10-12 2024-03-01 エスケー エンパルス カンパニー リミテッド 研磨パッドおよびこれを用いた半導体素子の製造方法
US20230405765A1 (en) * 2022-06-15 2023-12-21 Cmc Materials Llc Dual-cure resin for preparing chemical mechanical polishing pads
US20230406984A1 (en) * 2022-06-15 2023-12-21 Cmc Materials Llc Uv-curable resins for chemical mechanical polishing pads
US20240227120A1 (en) * 2022-12-22 2024-07-11 Applied Materials, Inc. Uv curable printable formulations for high performance 3d printed cmp pads
US20250312886A1 (en) * 2024-04-05 2025-10-09 Taiwan Semiconductor Manufacturing Co., Ltd. Device and method for improved cmp process with cmp head

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6077601A (en) * 1998-05-01 2000-06-20 3M Innovative Properties Company Coated abrasive article
US6477926B1 (en) * 2000-09-15 2002-11-12 Ppg Industries Ohio, Inc. Polishing pad
CN100379522C (zh) * 2000-12-01 2008-04-09 东洋橡膠工业株式会社 研磨垫及其制造方法和研磨垫用缓冲层
US7097549B2 (en) * 2001-12-20 2006-08-29 Ppg Industries Ohio, Inc. Polishing pad
US20050276967A1 (en) * 2002-05-23 2005-12-15 Cabot Microelectronics Corporation Surface textured microporous polishing pads
KR20050052513A (ko) * 2002-09-25 2005-06-02 피피지 인더스트리즈 오하이오 인코포레이티드 평탄화를 위한 윈도를 가진 연마 패드
US20070010169A1 (en) * 2002-09-25 2007-01-11 Ppg Industries Ohio, Inc. Polishing pad with window for planarization
US20040209066A1 (en) * 2003-04-17 2004-10-21 Swisher Robert G. Polishing pad with window for planarization
KR20040093402A (ko) * 2003-04-22 2004-11-05 제이에스알 가부시끼가이샤 연마 패드 및 반도체 웨이퍼의 연마 방법
JP2006114666A (ja) * 2004-10-14 2006-04-27 Asahi Kasei Electronics Co Ltd 研磨パッド、その製造方法、およびそれを用いた研磨方法
DE102006035726A1 (de) * 2006-07-28 2008-01-31 Evonik Röhm Gmbh Verfahren zur Herstellung von ABA-Triblockcopolymeren auf (Meth)acrylatbasis

Also Published As

Publication number Publication date
KR101855073B1 (ko) 2018-05-09
CN102762340A (zh) 2012-10-31
TW201130656A (en) 2011-09-16
TWI517975B (zh) 2016-01-21
WO2011087737A2 (en) 2011-07-21
WO2011087737A3 (en) 2011-09-15
US20130012108A1 (en) 2013-01-10
JP2013515379A (ja) 2013-05-02
SG181890A1 (en) 2012-07-30
KR20120120247A (ko) 2012-11-01

Similar Documents

Publication Publication Date Title
JP5728026B2 (ja) 研磨パッド及びこれの製造方法
US7097549B2 (en) Polishing pad
US6477926B1 (en) Polishing pad
CN100379522C (zh) 研磨垫及其制造方法和研磨垫用缓冲层
KR100877388B1 (ko) 연마 패드 및 그 제조 방법
US7291063B2 (en) Polyurethane urea polishing pad
JP5739891B2 (ja) 構造化研磨物品並びにその使用方法
EP1034065B1 (en) Durable abrasive articles with thick abrasive coatings
JP5074224B2 (ja) 研磨パッド、研磨パッドの製造方法、及び半導体デバイスの製造方法
CN100537147C (zh) 研磨垫及其制造方法和研磨垫用缓冲层
US20070021045A1 (en) Polyurethane Urea Polishing Pad with Window
CN102762340B (zh) 抛光垫及其制造方法
JP2005324302A (ja) 研磨パッドおよびその製造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131219

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20131219

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140902

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150310

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150403

R150 Certificate of patent or registration of utility model

Ref document number: 5728026

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250