JP5721203B2 - アンダーフィル封止剤として有用でありかつリワーク可能な低発熱性の熱硬化性樹脂組成物 - Google Patents
アンダーフィル封止剤として有用でありかつリワーク可能な低発熱性の熱硬化性樹脂組成物 Download PDFInfo
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- JP5721203B2 JP5721203B2 JP2008537880A JP2008537880A JP5721203B2 JP 5721203 B2 JP5721203 B2 JP 5721203B2 JP 2008537880 A JP2008537880 A JP 2008537880A JP 2008537880 A JP2008537880 A JP 2008537880A JP 5721203 B2 JP5721203 B2 JP 5721203B2
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- circuit board
- thermosetting resin
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- semiconductor chip
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Description
・非沈殿性
・破壊靭性、耐衝撃性、および係数の向上
・耐擦傷性および耐磨耗性の改善
・収縮および熱膨張の軽減
・熱安定性、耐薬品性、ガラス転移温度、耐候性、誘電特性など、多数の所望の特性の改善、または少なくとも悪影響を与えないこと
熱硬化性樹脂組成物
本発明による熱硬化性樹脂組成物は、下の表1に示す成分から調製することができる。
硬化していない状態で、組成物を、約75℃の分注温度で、シリンジから8×8mmのCSP上へ分注した。組成物は、毛管作用によって、30秒未満で、パッケージとパッケージが取り付けられた回路基板との間のアンダーフィル空間内へ流れ込んだ。
組成物を熱衝撃試験にさらし、その間、試験サンプルを、約−55℃の温度で約10分の期間維持し、その後約+125℃の温度まで上げて約10分の期間維持した。所定の回数の熱サイクルに達した後、試験サンプルを導通試験にかけて、CSPと回路基板の間の電気接続を確認した。少なくとも1000サイクルで導通が確認されたとき、試験サンプルは許容可能であると評価した。
熱風発生器を使用して、前述の熱硬化性樹脂組成物で回路基板に固定させたCSPの周囲の領域を、30秒間285℃の熱風を当てることによって加熱した。次いで、CSPとガラス強化エポキシ基板の間に金属片を挿入し、CSPを持ち上げることによって、CSPは容易に取り外すことができた。
Claims (6)
- 熱硬化性樹脂組成物であって、300J/g未満の発熱量を示し、半導体チップと前記半導体チップが電気的に接続された回路基板との間、またはキャリア基板上に取り付けられた半導体チップを含む半導体デバイスと前記半導体デバイスが電気的に接続された回路基板との間のアンダーフィルをそれぞれ封止することが可能であり、その反応生成物が制御可能に分解可能であり、前記組成物が、
(a)第1粘度を有する第1のビスフェノールエポキシ樹脂、第1粘度より低い第2粘度を有する第2のビスフェノールエポキシ樹脂、および脂環式エポキシ樹脂の組合せを含むエポキシ樹脂成分と、
(b)それぞれの無機充填剤の粒子寸法が1〜1000nmの範囲内である粒子寸法分布を有する無機充填剤成分と、
(c)カチオン触媒を遊離できる熱開始剤とを含み、
前記熱硬化性樹脂組成物は、80℃〜150℃の温度で5〜60分の期間加熱することによって硬化し、前記アンダーフィルを封止でき、
熱硬化された前記熱硬化性樹脂組成物は、190℃〜290℃の温度で10秒〜60秒の期間加熱することによって軟化し、前記半導体チップを前記回路基板より引き離すことができるか、または、前記半導体デバイスを前記回路基板より引き離すことができる
組成物。 - 前記第1粘度は25℃において3000cps以上であり、前記第2粘度は25℃において250cps以下である請求項1に記載の熱硬化性樹脂組成物。
- 前記第1粘度は25℃において3000〜4500cpsであり、前記第2粘度は25℃において30〜250cpsである請求項2に記載の熱硬化性樹脂組成物。
- 前記熱開始剤はアンモニウムアンチモネイトである、請求項1〜3のいずれか1項に記載の熱硬化性樹脂組成物。
- 半導体デバイスおよび前記半導体デバイスが電気的に接続された回路基板、または半導体チップおよび前記半導体チップが電気的に接続された回路基板を有する電子デバイスであって、それぞれ前記半導体デバイスと前記回路基板の間、または前記半導体チップと前記回路基板の間に、請求項1に記載の熱硬化性樹脂組成物をアンダーフィル封止剤として使用して組み立てられ、前記熱硬化性樹脂組成物は、80℃〜150℃の温度で5〜60分の期間加熱することによって硬化して、前記アンダーフィルを封止でき、熱硬化された前記熱硬化性樹脂組成物は、190℃〜290℃の温度で10秒〜60秒の期間加熱することによって軟化しかつそれらの接着性を損失することができる、電子デバイス。
- キャリア基板上に取り付けられた半導体チップを含む半導体デバイスと前記半導体デバイスが電気的に接続された回路基板との間、または半導体チップと前記半導体チップが電気的に接続された回路基板との間のアンダーフィルを、
(a)前記半導体デバイスと前記回路基板の間、または前記半導体チップと前記回路基板の間のアンダーフィル内に、請求項1に記載の組成物を分注するステップと、
(b)そのように分注した前記組成物を、60℃〜150℃の範囲の温度に5〜60分の期間さらして、前記組成物に反応生成物を形成させるステップとを含む方法で封止し、
(c)前記反応生成物を、190℃〜290℃の温度で10秒〜60秒の期間加熱することによって軟化し、前記半導体チップを前記回路基板より引き離すか、または、前記半導体デバイスを前記回路基板より引き離すことを可能とするステップを含む方法。
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US6548575B2 (en) * | 2000-12-13 | 2003-04-15 | National Starch And Chemical Investment Holding Corporation | High temperature underfilling material with low exotherm during use |
JP2002284849A (ja) * | 2001-03-26 | 2002-10-03 | Sumitomo Bakelite Co Ltd | 液状樹脂組成物および半導体装置 |
JP2004027185A (ja) * | 2002-05-01 | 2004-01-29 | Ngk Spark Plug Co Ltd | 埋込樹脂組成物及びそれを用いた配線基板 |
US7022410B2 (en) * | 2003-12-16 | 2006-04-04 | General Electric Company | Combinations of resin compositions and methods of use thereof |
US20070261883A1 (en) * | 2004-04-22 | 2007-11-15 | Chan Bruce C | Methods For Improving The Flux Compatibility Of Underfill Formulations |
US7247683B2 (en) * | 2004-08-05 | 2007-07-24 | Fry's Metals, Inc. | Low voiding no flow fluxing underfill for electronic devices |
JP4810911B2 (ja) * | 2005-07-26 | 2011-11-09 | パナソニック電工株式会社 | エポキシ樹脂組成物、エポキシ樹脂フィルム、光導波路、光・電気混載配線基板並びに電子デバイス |
US7701641B2 (en) * | 2006-03-20 | 2010-04-20 | Ophthonix, Inc. | Materials and methods for producing lenses |
-
2006
- 2006-10-24 US US12/091,094 patent/US8075721B2/en not_active Expired - Fee Related
- 2006-10-24 JP JP2008537880A patent/JP5721203B2/ja active Active
- 2006-10-24 WO PCT/US2006/041484 patent/WO2007050611A1/en active Application Filing
- 2006-10-24 KR KR1020087012406A patent/KR101308307B1/ko active IP Right Grant
- 2006-10-24 EP EP06826563A patent/EP1966306A4/en not_active Withdrawn
- 2006-10-24 CN CN2006800478197A patent/CN101341212B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN101341212A (zh) | 2009-01-07 |
EP1966306A4 (en) | 2011-12-14 |
CN101341212B (zh) | 2012-07-04 |
JP2009513785A (ja) | 2009-04-02 |
WO2007050611A1 (en) | 2007-05-03 |
US20080285247A1 (en) | 2008-11-20 |
KR101308307B1 (ko) | 2013-09-17 |
KR20080070832A (ko) | 2008-07-31 |
EP1966306A1 (en) | 2008-09-10 |
US8075721B2 (en) | 2011-12-13 |
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