JP5705937B2 - Bonding device manufacturing apparatus and manufacturing method - Google Patents

Bonding device manufacturing apparatus and manufacturing method Download PDF

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JP5705937B2
JP5705937B2 JP2013190882A JP2013190882A JP5705937B2 JP 5705937 B2 JP5705937 B2 JP 5705937B2 JP 2013190882 A JP2013190882 A JP 2013190882A JP 2013190882 A JP2013190882 A JP 2013190882A JP 5705937 B2 JP5705937 B2 JP 5705937B2
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JP2015055853A (en
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道也 横田
道也 横田
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Shin Etsu Engineering Co Ltd
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本発明は、例えば液晶ディスプレイ(LCD)、有機ELディスプレイ(OLED)、プラズマディスプレイ(PDP)、フレキシブルディスプレイなどのフラットパネルディスプレイ(FPD)やセンサーデバイスか、又は例えばタッチパネル式FPDや3D(3次元)ディスプレイや電子書籍などのような、液晶モジュール(LCM)やフレキシブルプリント配線板(FPC)などの基板に対して、タッチパネルやカバーガラスやカバーフィルムやFPDなどのもう一枚の基板を貼り合わせる貼合デバイスの製造装置、及び貼合デバイスの製造方法に関する。   The present invention may be a flat panel display (FPD) or a sensor device such as a liquid crystal display (LCD), an organic EL display (OLED), a plasma display (PDP), or a flexible display, or a touch panel type FPD or 3D (three-dimensional). Bonding another substrate such as a touch panel, cover glass, cover film, or FPD to a substrate such as a liquid crystal module (LCM) or flexible printed wiring board (FPC) such as a display or electronic book It is related with the manufacturing apparatus of a device, and the manufacturing method of a bonding device.

従来、この種の貼合デバイスの製造装置及び製造方法として、ウエハとそれを覆うカバープレートの対向面のどちらか一方又は両方に接着剤を一定高さで塗布し、これらウエハ及びカバープレートを、減圧された閉鎖空間で重ね合わせて、それらの間に前記接着剤で囲まれる封止空間を形成し、その後、前記閉鎖空間を大気開放して前記封止空間の内圧との間に圧力差を発生させ、この気圧差で前記ウエハ及び前記カバープレートを全体的に均等に加圧するものがある(例えば、特許文献1参照)。それにより、接着剤が押し潰されて前記ウエハ及び前記カバープレートの間に所定のギャップが形成され、スペーサー無しでウエハとカバープレートを所定間隔で平行に貼り合わせることができるようにしている。
さらに、前記接着剤の塗布高さと該接着剤で囲まれた前記封止空間内の面積から重ね合わせ時の前記封止空間内に封止される気体の容積を計算するとともに、前記ウエハと前記カバープレートを貼り合わせて両者の間隔を所望のギャップに押し潰した時における前記封止空間内の封止気体の容積を計算することで、前記重ね合わせ時の封止気体容積を前記貼り合わせ後の封止気体の容積に圧縮するために必要な圧力差が前記閉鎖空間の大気開放時に発生するように前記封止空間の内圧を設定している。それにより、事前の計算値に基づいてウエハとカバープレートとの間のギャップを調整することができるようにしている。
Conventionally, as a manufacturing apparatus and a manufacturing method of this type of bonding device, an adhesive is applied at a certain height to one or both of the wafer and the facing surface of the cover plate covering the wafer, and the wafer and the cover plate are Overlap in the reduced closed space to form a sealed space surrounded by the adhesive between them, and then open the closed space to the atmosphere to create a pressure difference with the internal pressure of the sealed space There is one that generates and pressurizes the wafer and the cover plate evenly by this pressure difference (see, for example, Patent Document 1). Thereby, the adhesive is crushed to form a predetermined gap between the wafer and the cover plate, and the wafer and the cover plate can be bonded in parallel at a predetermined interval without a spacer.
Further, the volume of gas sealed in the sealing space at the time of superposition is calculated from the application height of the adhesive and the area in the sealing space surrounded by the adhesive, and the wafer and the After the pasting, the sealing gas volume at the time of the superposition is calculated by calculating the volume of the sealing gas in the sealing space when the cover plate is pasted and the distance between the two is crushed to a desired gap. The internal pressure of the sealed space is set so that a pressure difference necessary for compressing to the volume of the sealed gas is generated when the closed space is opened to the atmosphere. Thereby, the gap between the wafer and the cover plate can be adjusted based on the previously calculated value.

特許第4373491号公報Japanese Patent No. 4373491

ところで、接着剤として用いられる紫外線硬化型や熱硬化型のシール材は、封止空間を囲むように全周に亘ってほぼ同じ高さで塗布される。シール材の塗布例としては、図12(a)〜(c)に示されるように、ウエハやカバープレートとなる上基板1′及び下基板2′に対して、複数の封止空間3s′を所定間隔毎に配置し、その貼り合わせ後に各封止空間3s′が気密封止されたデバイスに分割して使用する場合がある。このような場合でも、それぞれのデバイスに封止空間3s′を確実に形成する必要があるため、シール材3′の塗布高さをほぼ同じにしなければならい。
したがって、図12(a)に示されるように、シール材3′の塗布高さに差が生じた時は、上基板1′及び下基板2′の重ね合わせ高さが、図12(b)に示されるように、上基板1′に対して一つでもシール材3′が接触していないと不十分である。つまり、図12(c)に示されるように、上吸引チャック11′で上基板1′を真空吸着したまま、全てのシール材3′とそれぞれ接触する位置まで下基板2′に対し接近移動させる必要がある。
しかし乍ら、図12(c)に示されるように、上吸引チャック11′が真空吸着した上基板1′で、大半のシール材3′が押し潰される位置まで押圧すると、上吸引チャック11′のチャック面と上基板1′の表面が密着したままなので、上基板1′の表面を上吸引チャック11′のチャック面から離すことができない。この状態においてシール材3′で囲まれる封止空間3s′と、閉鎖空間となる変圧室10′との間に圧力差が生じても、上基板1′及び下基板2′を全体的に均等に加圧して所定のギャップで貼り合わせることはできない。
すなわち、重ね合わせ状態の上基板1′の表面から上吸引チャック11′のチャック面を分離して両者間に隙間が形成されないと、圧力差による所定ギャップでの上基板1′及び下基板2′の貼り合わせを実現できないという問題があった。
そこで、このような問題点を解決するために、上吸引チャック11′のチャック面から圧縮空気などの流体を上基板1′の表面へ向けて吹き付けることで、重ね合わせ状態の上基板1′の表面から上吸引チャック11′のチャック面を強制的に分離させることが考えられる。
しかし、このような強制的な分離は、流体の吹き付けで未硬化のシール材3′が過剰に押し潰されて塗布パターン形状の乱れを起こしたり、過剰な押し潰しによってシール材3′に含まれるフィラーなどの固形成分と液状成分が分離したり、別な問題が発生するおそれもある。さらに、減圧された変圧室10′内で上吸引チャック11′のチャック面から圧縮空気などの流体を吹き出すと、上吸引チャック11′の管路内や変圧室10′内で強い空気振動が発生し、吸着した上基板1′への機械的な振動を引き起こすおそれもある。
By the way, the ultraviolet curing type or thermosetting type sealing material used as the adhesive is applied at almost the same height over the entire circumference so as to surround the sealing space. As an example of the application of the sealing material, as shown in FIGS. 12A to 12C, a plurality of sealing spaces 3s ′ are formed on the upper substrate 1 ′ and the lower substrate 2 ′ serving as a wafer or a cover plate. In some cases, the devices are arranged at predetermined intervals and divided into devices in which each sealing space 3s ′ is hermetically sealed after bonding. Even in such a case, since it is necessary to reliably form the sealing space 3 s ′ in each device, the application height of the sealing material 3 ′ must be almost the same.
Accordingly, as shown in FIG. 12 (a), when a difference occurs in the coating height of the sealing material 3 ', the overlapping height of the upper substrate 1' and the lower substrate 2 'is as shown in FIG. As shown in FIG. 3, it is not sufficient if even one sealing material 3 'is not in contact with the upper substrate 1'. That is, as shown in FIG. 12C, the upper substrate 1 'is vacuum-adsorbed by the upper suction chuck 11' and moved closer to the lower substrate 2 'to a position where it comes into contact with all the sealing materials 3'. There is a need.
However, as shown in FIG. 12C, when the upper suction chuck 11 'is pressed to the position where most of the sealing material 3' is crushed by the upper substrate 1 'which is vacuum-adsorbed, the upper suction chuck 11' Since the chuck surface and the surface of the upper substrate 1 'remain in close contact with each other, the surface of the upper substrate 1' cannot be separated from the chuck surface of the upper suction chuck 11 '. In this state, even if a pressure difference is generated between the sealed space 3s ′ surrounded by the sealing material 3 ′ and the variable pressure chamber 10 ′ serving as a closed space, the upper substrate 1 ′ and the lower substrate 2 ′ are generally uniform. It is not possible to apply pressure and bond together with a predetermined gap.
That is, if the chuck surface of the upper suction chuck 11 ′ is separated from the surface of the upper substrate 1 ′ in the overlapped state and no gap is formed between them, the upper substrate 1 ′ and the lower substrate 2 ′ with a predetermined gap due to a pressure difference are formed. There was a problem that it was not possible to realize the pasting.
Therefore, in order to solve such problems, a fluid such as compressed air is blown from the chuck surface of the upper suction chuck 11 'toward the surface of the upper substrate 1', so that the upper substrate 1 'in an overlapped state is formed. It is conceivable to forcibly separate the chuck surface of the upper suction chuck 11 'from the surface.
However, such forced separation causes the uncured sealing material 3 ′ to be excessively crushed by spraying the fluid, resulting in disorder of the coating pattern shape, or included in the sealing material 3 ′ due to excessive crushing. There is also a possibility that a solid component such as a filler and a liquid component are separated or another problem occurs. Further, when a fluid such as compressed air is blown out from the chuck surface of the upper suction chuck 11 'in the decompressed variable pressure chamber 10', strong air vibration is generated in the pipe line of the upper suction chuck 11 'and in the variable pressure chamber 10'. In addition, there is a possibility of causing mechanical vibration to the adsorbed upper substrate 1 '.

本発明は、このような問題に対処することを課題とするものであり、重ね合わせ状態の一方の基板から一方の吸引チャックを未硬化のシール材に何らかの影響が与えられることなく分離させることで、シール材の形状を乱すことのない基板同士の貼り合わせを実現する、などを目的とするものである。   An object of the present invention is to cope with such a problem, by separating one suction chuck from one substrate in an overlapped state without affecting the uncured sealing material. The purpose is to realize bonding between substrates without disturbing the shape of the sealing material.

このような目的を達成するために本発明による貼合デバイスの製造装置は、減圧された変圧室内で一対の基板を重ね合わせて、それらの間に未硬化のシール材で囲まれる封止空間が形成され、前記変圧室の大気開放された内圧と前記封止空間の間で発生する圧力差により、前記基板を全体的に均等に加圧して所定のギャップで貼り合わせる貼合デバイスの製造装置であって、前記基板が出し入れ自在に収容される前記変圧室と、前記変圧室内において前記基板を前記シール材が挟み込まれるようにそれぞれ着脱自在に第一真空度で吸着保持する一対の吸引チャックと、前記第一真空度よりも高圧な第二真空度に減圧された前記変圧室内で、前記吸引チャックのいずれか一方又は両方をZ方向へ相対的に接近移動させて前記基板を重ね合わせる駆動手段と、前記吸引チャックのいずれか一方の吸引圧力を圧力調整する第一吸引圧調整手段と、前記吸引チャックの他方の吸引圧力を圧力調整する第二吸引圧調整手段と、前記変圧室の内圧を大気雰囲気から所定の真空圧まで圧力調整する室圧調整手段と、前記駆動手段,前記第一吸引圧調整手段,前記第二吸引圧調整手段及び前記室圧調整手段をそれぞれ作動制御する制御部と、を備え、前記制御部は、前記駆動手段により前記基板を前記第二真空度の前記変圧室内で重ね合わせて、前記基板の間に未硬化の前記シール材で囲まれる前記封止空間が形成された後に、前記第一吸引圧調整手段により前記吸引チャックのいずれか一方の吸引圧力を、前記基板重ね合わせ時の前記第一真空度からそれよりも高圧で且つ前記変圧室の内圧と均等な前記第二真空度へ上昇させ、その後、前記第一吸引圧調整手段及び前記室圧調整手段により、前記吸引チャックのいずれか一方の吸引圧力と前記変圧室の内圧を、前記第二真空度からそれよりも高圧で且つ大気圧よりも負圧の第三真空度までそれぞれ上昇させた後、前記第三真空度のまま所定時間に亘り維持して、前記基板間の前記封止空間との圧力差で前記吸引チャックのいずれか一方のチャック面から前記基板の一方が離れるように未硬化の前記シール材を圧縮変形させ、前記吸引チャックの一方のチャック面から前記基板の一方が離れた後に、前記吸引チャックのいずれか一方の吸引圧力と前記変圧室の内圧を、前記第三真空度から大気圧まで上昇させることを特徴とする。 In order to achieve such an object, a bonding device manufacturing apparatus according to the present invention has a sealed space surrounded by an uncured sealing material between a pair of substrates in a reduced pressure transformer chamber. A bonding device manufacturing apparatus that is formed and pressurizes the substrate evenly and bonds it with a predetermined gap by a pressure difference generated between the internal pressure of the variable pressure chamber opened to the atmosphere and the sealed space. And a pair of suction chucks that are detachably adsorbed and held at a first degree of vacuum so that the sealing material is sandwiched in the transformer chamber, and the transformer chamber in which the substrate is detachably accommodated. In the variable pressure chamber reduced to a second degree of vacuum higher than the first degree of vacuum, one or both of the suction chucks are moved relatively close to each other in the Z direction to overlap the substrates. Moving means, first suction pressure adjusting means for adjusting the suction pressure of one of the suction chucks, second suction pressure adjusting means for adjusting the other suction pressure of the suction chuck, and A chamber pressure adjusting means for adjusting the internal pressure from the atmospheric atmosphere to a predetermined vacuum pressure, and a control for controlling the operation of the driving means, the first suction pressure adjusting means, the second suction pressure adjusting means, and the chamber pressure adjusting means, respectively. And the controller is configured to superimpose the substrate in the variable pressure chamber of the second degree of vacuum by the driving means, and is surrounded by the uncured sealing material between the substrates. Is formed, the first suction pressure adjusting means causes the suction pressure of any one of the suction chucks to be higher than the first vacuum degree at the time of stacking the substrates and to the internal pressure of the variable pressure chamber. Equal The second vacuum degree is raised, and thereafter, the first suction pressure adjusting means and the chamber pressure adjusting means cause the suction pressure of one of the suction chucks and the internal pressure of the variable pressure chamber to be changed from the second vacuum degree. After increasing to a third vacuum degree higher than that and a negative pressure from atmospheric pressure, the third vacuum degree is maintained for a predetermined time, and the pressure between the sealing spaces between the substrates is increased. After compressing and deforming the uncured sealing material so that one of the substrates is separated from any one chuck surface of the suction chuck, and after one of the substrates is separated from one chuck surface of the suction chuck, The suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber are increased from the third degree of vacuum to the atmospheric pressure.

また本発明による貼合デバイスの製造方法は、変圧室内に一対の吸引チャックが相対的に互いに接近する方向へ移動自在に設けられ、前記吸引チャックに対して一対の基板を未硬化のシール材が挟み込まれるようにそれぞれ着脱自在に第一真空度で吸着保持し、前記第一真空度よりも高圧な第二真空度に減圧された前記変圧室内で前記吸引チャックの接近移動により前記基板を重ね合わせて、それらの間に前記シール材で囲まれる封止空間が形成され、前記変圧室の大気開放された内圧と前記封止空間の間で発生する圧力差により、前記基板を全体的に均等に加圧して所定のギャップで貼り合わせる貼合デバイスの製造方法であって、前記基板の重ね合わせ後に、前記基板のいずれか一方に対する前記吸引チャックのいずれか一方の吸引圧力を、前記基板重ね合わせ時の前記第一真空度からそれよりも高圧な前記第二真空度へ上昇させ、前記変圧室の前記内圧と均等にして圧力差による前記基板の一方の吸着保持を解消する均圧化工程と、前記均圧化工程の後に、前記吸引チャックのいずれか一方の吸引圧力及び前記変圧室の内圧を、前記第二真空度よりも高圧で且つ大気圧よりも負圧の第三真空度までそれぞれ上昇させる昇圧工程と、前記昇圧工程の後に、前記吸引チャックのいずれか一方の吸引圧力及び前記変圧室の内圧を前記第三真空度のまま所定時間に亘って維持し、前記基板間の前記第二真空度の前記封止空間との圧力差で未硬化の前記シール材が圧縮変形して前記吸引チャックの一方から前記基板の一方を離す待機工程と、前記待機工程で前記吸引チャックの一方から前記基板の一方が離れた後に、前記変圧室の内圧及び前記吸引チャックのいずれか一方の吸引圧力を、前記第三真空度から大気圧まで上昇させ、前記封止空間との圧力差で前記基板を所定のギャップに貼り合わせる大気開放工程と、を含むことを特徴とする。 In the bonding device manufacturing method according to the present invention, the pair of suction chucks are provided in the transformation chamber so as to be relatively movable in a direction in which the pair of suction chucks are relatively close to each other. The substrates are superposed by the close movement of the suction chuck in the variable pressure chamber that is detachably held in a first vacuum degree so as to be sandwiched and depressurized to a second vacuum degree higher than the first vacuum degree. A sealing space surrounded by the sealing material is formed between them, and the substrate is made uniform evenly by the pressure difference generated between the internal pressure of the variable pressure chamber opened to the atmosphere and the sealing space. A manufacturing method of a bonding device that pressurizes and bonds with a predetermined gap, and after the substrates are superposed, the suction pressure of any one of the suction chucks against any one of the substrates The first vacuum degree at the time of stacking the substrates is raised to the second vacuum degree higher than the first vacuum degree, and the suction holding of one of the substrates due to the pressure difference is made equal to the internal pressure of the variable pressure chamber. After the pressure equalizing step and the pressure equalizing step, the suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber are set to a pressure higher than the second vacuum degree and negative than atmospheric pressure. A pressure raising step for raising each to three vacuum degrees, and after the pressure raising process, maintaining the suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber for a predetermined time while maintaining the third vacuum degree, a waiting step of the of the second vacuum between the substrates the uncured sealant at a pressure differential between the sealed space is compressed and deformed release one of the substrate from one of the suction chuck, said at the stand-by step From one side of the suction chuck After one of the substrates is separated, the internal pressure of the variable pressure chamber and the suction pressure of one of the suction chucks are increased from the third vacuum level to the atmospheric pressure, and the substrate is subjected to a pressure difference from the sealing space. And an atmosphere release step of bonding the substrate to a predetermined gap.

前述した特徴を有する本発明による貼合デバイスの製造装置及び製造方法は、第二真空度に減圧された変圧室内で一対の基板が重ね合わされた後に、一方の基板に対する一方の吸引チャックの吸引圧力を、第一真空度からそれよりも高圧な変圧室の第二真空度へ上昇させることにより、一方の吸引チャックの吸引圧力と変圧室の内圧が、均等な第二真空度となるため、一方の吸引チャックのチャック面からの圧力差による一方の基板の真空吸着が解消される。その後に、変圧室の内圧と一方の吸引チャックの吸引圧力を、第二真空度からそれよりも高圧で且つ大気圧よりも負圧の第三真空度まで上昇させることにより、変圧室内の第三真空度と、基板間の第二真空度の封止空間との圧力差で未硬化のシール材が圧縮変形して、一方の吸引チャックのチャック面から一方の基板の表面が離れる。その後に、変圧室の内圧及び一方の吸引チャックの吸引圧力を、第三真空度から大気圧まで上昇させることにより、圧力差で基板が所望のギャップに貼り合わせされる。
したがって、重ね合わせ状態の一方の基板から一方の吸引チャックを未硬化のシール材に何らかの影響が与えられることなく分離させることで、シール材の形状を乱すことのない基板同士の貼り合わせを実現することができる。
その結果、シール材の高さにバラツキがあったとしても、圧力差により基板を所定のギャップに貼り合わせることができる。
さらに、チャック面から基板の表面へ向け圧縮空気などの流体を吹き付けて強制的に分離させるものに比べ、未硬化のシール材が過剰に押し潰されることがなく、シール材の塗布パターン形状の乱れ、シール材に含まれるフィラーなどの固形成分と液状成分の分離、一方の吸引チャックの管路内や変圧室内での空気振動の発生を防止することができて、基板の貼り合わせ精度の向上が図れる。
In the bonding device manufacturing apparatus and method according to the present invention having the above-described features, the suction pressure of one suction chuck with respect to one substrate after the pair of substrates are overlapped in the transformer chamber depressurized to the second vacuum degree. Is increased from the first degree of vacuum to the second degree of vacuum in the variable pressure chamber higher than that, so that the suction pressure of one suction chuck and the internal pressure of the variable pressure chamber become equal second degree of vacuum. The vacuum suction of one substrate due to the pressure difference from the chuck surface of the suction chuck is eliminated. Thereafter, the suction pressure of the internal pressure and one suction chuck of the transformer chamber, by increasing from the second vacuum to the third degree of vacuum negative pressure than and atmospheric pressure at a high pressure than a third transformer chamber The uncured sealing material is compressed and deformed by the pressure difference between the degree of vacuum and the sealing space of the second degree of vacuum between the substrates, and the surface of one substrate is separated from the chuck surface of one suction chuck. Thereafter, the internal pressure of the variable pressure chamber and the suction pressure of one of the suction chucks are increased from the third degree of vacuum to the atmospheric pressure, so that the substrate is bonded to the desired gap with a pressure difference.
Accordingly, by separating one suction chuck from one substrate in an overlapped state without affecting the uncured sealing material, bonding between the substrates without disturbing the shape of the sealing material is realized. be able to.
As a result, even if the height of the sealing material varies, the substrate can be bonded to the predetermined gap due to the pressure difference.
Furthermore, compared to the case where forced fluid such as compressed air is blown from the chuck surface to the surface of the substrate, uncured sealing material is not crushed excessively, and the coating pattern shape of the sealing material is disturbed. The separation of solid and liquid components such as filler contained in the sealing material, and the generation of air vibrations in the pipe line of one suction chuck or in the variable pressure chamber can be prevented, improving the bonding accuracy of the substrates. I can plan.

本発明の実施形態に係る貼合デバイスの製造装置の全体構成を示す説明図であり、搬入された基板の吸着状態を示す縦断正面図である。Is an explanatory diagram showing the overall configuration of an apparatus for manufacturing a laminated device according to the embodiment of the present invention, it is a longitudinal front view showing a suction state of the substrate that is transportable input. 同説明図であり、重ね合わせ工程の状態を示す縦断正面図である。It is the same explanatory drawing, and is a vertical front view which shows the state of a superimposition process. 同説明図であり、均圧化工程の状態を示す縦断正面図である。It is the same explanatory drawing, and is a vertical front view which shows the state of a pressure equalization process. 同説明図であり、均圧化工程の終了時の状態を示す縦断正面図である。It is the same explanatory drawing, and is a vertical front view which shows the state at the time of completion | finish of a pressure equalization process. 同説明図であり、昇圧工程の状態を示す縦断正面図である。It is the same explanatory drawing, and is a vertical front view which shows the state of a pressure | voltage rise process. 同説明図であり、大気開放工程の状態を示す縦断正面図である。It is the same explanatory drawing and is a vertical front view which shows the state of an air release process. 同説明図であり、基板の搬出時の状態を示す縦断正面図である。It is the same explanatory drawing, and is a vertical front view which shows the state at the time of carrying out a board | substrate. 本発明の実施形態に係る貼合デバイスの製造方法のタイムチャートである。It is a time chart of the manufacturing method of the bonding device which concerns on embodiment of this invention. 本発明の他の実施例に係る貼合デバイスの製造装置の全体構成を示す説明図であり、昇圧工程の状態を示す縦断正面図ある。It is explanatory drawing which shows the whole structure of the manufacturing apparatus of the bonding device which concerns on the other Example of this invention, and is a longitudinal cross-sectional front view which shows the state of a pressure | voltage rise process. 同説明図であり、大気開放工程の状態を示す縦断正面図である。It is the same explanatory drawing and is a vertical front view which shows the state of an air release process. 本発明の他の実施例に係る貼合デバイスの製造方法のタイムチャートである。It is a time chart of the manufacturing method of the bonding device which concerns on the other Example of this invention. シール材の塗布例を示す説明図であり、(a)が基板の重ね合わせ前の正面図、(b)が重ね合わせ途中を示す正面図、(c)が重ね合わせ後の正面図である。It is explanatory drawing which shows the example of application | coating of a sealing material, (a) is a front view before superimposition of a board | substrate, (b) is a front view in the middle of superimposition, (c) is a front view after superimposition.

以下、本発明の実施形態を図面に基づいて詳細に説明する。
本発明の実施形態に係る貼合デバイスAの製造装置B及び製造方法は、図1〜図11に示すように、変圧室10内に一対の吸引チャック11,12が相対的に互いに接近する方向へ移動自在に設けられ、吸引チャック11,12に対して一対の基板1,2を、それらのいずれか一方又は両方に設けた未硬化のシール材3が挟み込まれるようにそれぞれ着脱自在に第一真空度で吸着保持し、第一真空度よりも高圧な第二真空度に減圧された変圧室10内で吸引チャック11,12の接近移動により基板1,2を重ね合わせる。これら重ね合わされた基板1,2の間には、シール材3で囲まれる封止空間3sが形成され、変圧室10の大気開放された内圧P2と封止空間3sとの間で発生する圧力差により、基板1,2を全体的に均等に加圧して所定のギャップで貼り合わせている。
詳しく説明すると、本発明の実施形態に係る貼合デバイスAの製造装置Bは、図2〜図8及び図10,図11に示すように、一対の基板1,2が出し入れ自在に収容される変圧室10と、変圧室10内において一対の基板1,2を未硬化のシール材3が挟み込まれるように着脱自在に吸着保持するように設けられる一対の吸引チャック11,12と、吸引チャック11,12のいずれか一方又は両方をZ方向へ相対的に接近移動させるように設けられる駆動手段13と、吸引チャック11,12のいずれか一方の吸引圧力を圧力調整する第一吸引圧調整手段14と、吸引チャック11,12の他方の吸引圧力を圧力調整する第二吸引圧調整手段15と、変圧室10を大気雰囲気から所定の真空圧まで圧力調整するように設けられる室圧調整手段16と、これら吸引チャック11,12の駆動手段13,第一吸引圧調整手段14,第二吸引圧調整手段15及び室圧調整手段16などをそれぞれ作動制御する制御部17と、を主要な構成要素として備えている。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
In the manufacturing apparatus B and the manufacturing method of the bonding device A according to the embodiment of the present invention, as shown in FIGS. 1 to 11, the pair of suction chucks 11 and 12 are relatively close to each other in the variable pressure chamber 10. First, the pair of substrates 1 and 2 is detachably attached to the suction chucks 11 and 12 so that the uncured sealing material 3 provided on either or both of them is sandwiched therebetween. It is sucked and held at a vacuum degree, superimposing the substrates 1 and 2 by the approach movement of the suction chuck 11, 12 with pressure-reduced transformer chamber 10 to the high-pressure second vacuum than the first vacuum. A sealed space 3 s surrounded by the sealing material 3 is formed between the superposed substrates 1 and 2, and a pressure difference generated between the internal pressure P <b> 2 released from the atmosphere of the variable pressure chamber 10 and the sealed space 3 s. Thus, the substrates 1 and 2 are pressed together uniformly and bonded together with a predetermined gap.
If it demonstrates in detail, as shown in FIGS. 2-8, FIG. 10, and FIG. 11, the manufacturing apparatus B of the bonding device A which concerns on embodiment of this invention will accommodate a pair of board | substrates 1 and 2 so that attachment or detachment is possible. A variable pressure chamber 10, a pair of suction chucks 11 and 12 provided so as to be detachably sucked and held so that the uncured sealing material 3 is sandwiched between the pair of substrates 1 and 2 in the variable pressure chamber 10, and the suction chuck 11 , 12 and a drive means 13 provided so as to relatively move in the Z direction, and a first suction pressure adjusting means 14 for adjusting the suction pressure of any one of the suction chucks 11, 12. A second suction pressure adjusting means 15 for adjusting the other suction pressure of the suction chucks 11 and 12, and a chamber pressure adjusting hand provided to adjust the pressure of the variable pressure chamber 10 from the atmospheric atmosphere to a predetermined vacuum pressure. 16 and a controller 17 for controlling the operation of the driving means 13, the first suction pressure adjusting means 14, the second suction pressure adjusting means 15, the chamber pressure adjusting means 16 and the like of the suction chucks 11 and 12, respectively. As an element.

基板1,2は、例えばFPDやセンサーデバイスなどのような複数の構成部品が一体的に組み付けられた薄板状の構造体である。
一方の基板1は、例えばタッチパネルやカバーガラスやカバーフィルムなど、他方の基板2を覆うように接着されることで、FPDやセンサーデバイスなどを構成するものである。
さらに、基板1,2は、図1〜図7及び図9,図10に示されるように、通常、Z方向(上下方向)へ配置され、上方の基板1を以下「上基板1」といい、下方の基板2を以下「下基板2という。
The substrates 1 and 2 are thin plate-like structures in which a plurality of components such as an FPD and a sensor device are integrally assembled.
One substrate 1 constitutes an FPD, a sensor device, or the like by being bonded so as to cover the other substrate 2, such as a touch panel, a cover glass, or a cover film.
Further, as shown in FIGS. 1 to 7, 9, and 10, the substrates 1 and 2 are usually arranged in the Z direction (vertical direction), and the upper substrate 1 is hereinafter referred to as “upper substrate 1”. The lower substrate 2 is hereinafter referred to as “lower substrate 2”.

シール材3は、圧縮変形可能な未硬化又は半硬化の流動性を有し、紫外線などの光エネルギーを吸収して重合が進行することにより硬化して接着性を発現する光硬化型接着剤、熱エネルギーの吸収により重合が進行して硬化する熱硬化型接着剤、二液混合硬化型接着剤などが用いられる。
シール材3の配置方法としては、上基板1と下基板2を重ね合わせる前に、上基板1及び下基板2の対向面のいずれか一方又は両方に対し、例えばディスペンサなどの定量吐出ノズルを用いて、その内側に封止空間3sが区画形成されるように所定形状の枠状に塗布され、封止空間3sを囲む全周に亘りほぼ同じ高さで連続するように配置することが好ましい。上基板1及び下基板2の貼り合わせ後には、例えば紫外線の照射や加熱などによって硬化させることが好ましい。また、その他の例として、シール材3を印刷などで配置することも可能である。
シール材3の配置例としては、図1〜図7及び図9,図10に示されるように、上基板1及び下基板2に対して、複数の封止空間3sが所定間隔毎で配置され、その貼り合わせ後に各封止空間3sが気密封止されたデバイスに分割して使用することが好ましい。
The sealing material 3 has an uncured or semi-cured fluidity that can be compressed and deformed, absorbs light energy such as ultraviolet rays, and cures as a result of polymerization, and exhibits a bonding property. A thermosetting adhesive, a two-component mixed curable adhesive, or the like that is cured by polymerization by absorption of thermal energy is used.
As a method for arranging the sealing material 3, before superposing the upper substrate 1 and the lower substrate 2, for example, a quantitative discharge nozzle such as a dispenser is used for one or both of the opposing surfaces of the upper substrate 1 and the lower substrate 2. In addition, it is preferably applied in a frame shape having a predetermined shape so that the sealing space 3s is partitioned and formed so as to be continuous at substantially the same height over the entire circumference surrounding the sealing space 3s. After the upper substrate 1 and the lower substrate 2 are bonded together, it is preferable to cure them by, for example, ultraviolet irradiation or heating. As another example, the sealing material 3 can be arranged by printing or the like.
As an example of the arrangement of the sealing material 3, as shown in FIGS. 1 to 7, 9, and 10, a plurality of sealing spaces 3 s are arranged at predetermined intervals with respect to the upper substrate 1 and the lower substrate 2. It is preferable to divide and use each sealed space 3s in a hermetically sealed device after the bonding.

変圧室10は、チャンバー10aの内部に形成され、例えば搬送ロボットなどの搬送手段(図示しない)を用いて、上基板1と下基板2がチャンバー10a内の変圧室10とチャンバー10aの外部空間とに亘って出し入れ可能となるように、チャンバー10aの全体又は一部を開閉自在に構成している。詳しく説明すると、大気雰囲気において搬送手段により、チャンバー10a内の変圧室10へ上基板1と下基板2がそれぞれ搬入され、上基板1及び下基板2の貼り合わせが完了した貼合デバイスAを搬出している。
チャンバー10aの具体例としては、図1〜図7及び図9,図10に示されるように、チャンバー10aの一部に扉10bを開閉自在に設けることにより、変圧室10が開閉自在で且つ密封構造となるように構成している。
また、その他の例として図示しないが、開閉扉式に代えて、チャンバー10aがZ方向へ分割され、Z方向へ相対的に接近又は離隔するように往復動させることで、変圧室10が開閉自在で且つ密封構造となるように変更することも可能である。
The variable pressure chamber 10 is formed inside the chamber 10a. For example, the upper substrate 1 and the lower substrate 2 are connected to the outer space of the variable pressure chamber 10 and the chamber 10a in the chamber 10a by using transfer means (not shown) such as a transfer robot. The whole or part of the chamber 10a is configured to be openable and closable so that it can be taken in and out. More specifically, the upper substrate 1 and the lower substrate 2 are respectively carried into the variable pressure chamber 10 in the chamber 10a by the conveying means in the air atmosphere, and the bonding device A in which the bonding of the upper substrate 1 and the lower substrate 2 is completed is carried out. doing.
As a specific example of the chamber 10a, as shown in FIGS. 1 to 7, 9, and 10, a door 10b is provided in a part of the chamber 10a so that it can be opened and closed, so that the variable pressure chamber 10 can be opened and closed and sealed. It is configured to be a structure.
Although not shown as another example, the variable pressure chamber 10 can be freely opened and closed by dividing the chamber 10a in the Z direction and reciprocatingly moving closer to or away from the Z direction instead of the open / close door type. It is also possible to change the sealing structure.

チャンバー10aの内部には、上基板1が着脱自在に真空吸着される吸引チャック11を有する保持部材11aと、下基板2が着脱自在に真空吸着される吸引チャック12を有する保持部材12aが、それぞれZ方向へ往復動自在に設けられている。
上基板1の吸引チャック11を以下「上吸引チャック」といい、上吸引チャック11が具備される保持部材11aを以下「上保持部材」という。下基板2の吸引チャック12を以下「下吸引チャック」といい、下吸引チャック12が具備される保持部材12aを以下「下保持部材」という。
上保持部材11aと下保持部材12aは、例えば金属やセラミックスなどの剛体で歪み(撓み)変形しない厚さの平板状に形成された定盤などからなり、それらの対向面がそれぞれチャンバー10a内で互いにZ方向へ対向するように平行に配設されている。
上保持部材11aの対向面には、上吸引チャック11が設けられ、下保持部材12aの対向面には、下吸引チャック12が設けられる。さらに、上保持部材11a及び下保持部材12aの対向面は、上吸引チャック11や下吸引チャック12による真空吸引で上基板1や下基板2に歪みを起こさないような微細の穴や溝の吸着構造を有している。
また必要に応じて、上保持部材11a及び下保持部材12aの対向面には、上吸引チャック11や下吸引チャック12に加えて、粘着チャックや静電チャックなどを設けることも可能である。
Inside the chamber 10a, there are a holding member 11a having a suction chuck 11 on which the upper substrate 1 is detachably vacuum-sucked and a holding member 12a having a suction chuck 12 on which the lower substrate 2 is detachably vacuum-sucked, respectively. It is provided so as to be able to reciprocate in the Z direction.
The suction chuck 11 of the upper substrate 1 is hereinafter referred to as “upper suction chuck”, and the holding member 11a provided with the upper suction chuck 11 is hereinafter referred to as “upper holding member”. The suction chuck 12 of the lower substrate 2 is hereinafter referred to as a “lower suction chuck”, and the holding member 12a provided with the lower suction chuck 12 is hereinafter referred to as a “lower holding member”.
The upper holding member 11a and the lower holding member 12a are composed of a platen having a thickness that does not deform (bend) with a rigid body such as metal or ceramics, and the opposing surfaces thereof are respectively in the chamber 10a. They are arranged in parallel so as to face each other in the Z direction.
The upper suction chuck 11 is provided on the facing surface of the upper holding member 11a, and the lower suction chuck 12 is provided on the facing surface of the lower holding member 12a. Further, the opposing surfaces of the upper holding member 11a and the lower holding member 12a are attracted to fine holes and grooves that do not cause distortion in the upper substrate 1 and the lower substrate 2 by vacuum suction by the upper suction chuck 11 and the lower suction chuck 12. It has a structure.
In addition to the upper suction chuck 11 and the lower suction chuck 12, an adhesive chuck, an electrostatic chuck, or the like can be provided on the opposing surfaces of the upper holding member 11a and the lower holding member 12a as necessary.

上保持部材11a又は下保持部材12aのいずれか一方か、若しくは上保持部材11a及び下保持部材12aの両方は、チャンバー10aの壁面に対してZ方向へ移動自在に支持され、駆動手段13を連設している。
駆動手段13は、アクチュエーターなどから構成され、後述する制御部17により上基板1及び下基板2の重ね合わせ時において、上保持部材11a又は下保持部材12aのいずれか一方か若しくは両方をZ方向へ相対的に接近移動させるように作動制御している。
また、上保持部材11a又は下保持部材12aのいずれか一方か若しくは両方には、位置合わせ用駆動部(図示しない)が備えられ、上保持部材11aと下保持部材12aをXYθ方向へ相対的に移動させることで、上基板1と下基板2を位置合わせしている。
Either the upper holding member 11a or the lower holding member 12a, or both the upper holding member 11a and the lower holding member 12a are supported so as to be movable in the Z direction with respect to the wall surface of the chamber 10a, and the driving means 13 is connected. Has been established.
The driving means 13 is composed of an actuator or the like, and when the upper substrate 1 and the lower substrate 2 are overlapped by the control unit 17 to be described later, one or both of the upper holding member 11a and the lower holding member 12a are moved in the Z direction. The operation is controlled to move relatively close.
Further, either one or both of the upper holding member 11a and the lower holding member 12a is provided with an alignment driving unit (not shown), and the upper holding member 11a and the lower holding member 12a are relatively moved in the XYθ direction. By moving, the upper substrate 1 and the lower substrate 2 are aligned.

上吸引チャック11には、その吸引圧力P1を大気雰囲気から所定の真空度まで調整するための第一吸引圧調整手段14が設けられている。
第一吸引圧調整手段14は、電空制御式の真空レギュレータなどが用いられ、上基板1及び下基板2の重ね合わせ時における真空圧力から大気圧までを計画的に昇圧させる過程として、予め昇圧曲線を1点から多点の段階的な減圧目標値として設定することにより、真空圧力から大気圧までの昇圧過程の昇圧速度を制御することが好ましい。
詳しく説明すると、第一吸引圧調整手段14は、上吸引チャック11のチャック面から例えば真空ポンプなどの吸引源14aに向けてそれぞれ連通する第一吸引管路14bと、第一吸引管路14bの途中に設けられる第一流量調整部14cと、を有している。
第一流量調整部14cは、第一吸引管路14bを開閉させる開閉弁や通過流量を調整するための調圧器などから構成される。
下吸引チャック12には、その吸引圧力を大気雰囲気から所定の真空度まで調整するための第二吸引圧調整手段15が設けられている。
第二吸引圧調整手段15は、下吸引チャック12のチャック面から例えば真空ポンプなどの吸引源14aに向けてそれぞれ連通する第二吸引管路15bと、第二吸引管路15bの途中に設けられる第二流量調整部15cと、を有している。
第二流量調整部15cは、第二吸引管路15bを開閉させる開閉弁などから構成される。
The upper suction chuck 11 is provided with first suction pressure adjusting means 14 for adjusting the suction pressure P1 from the atmospheric atmosphere to a predetermined degree of vacuum.
As the first suction pressure adjusting means 14, an electropneumatic control type vacuum regulator or the like is used. As the process of systematically increasing the pressure from the vacuum pressure to the atmospheric pressure when the upper substrate 1 and the lower substrate 2 are overlaid, It is preferable to control the pressure increase rate during the pressure increase process from the vacuum pressure to the atmospheric pressure by setting the curve as a stepwise target pressure reduction value from one point to many points.
More specifically, the first suction pressure adjusting means 14 includes a first suction conduit 14b that communicates from the chuck surface of the upper suction chuck 11 to a suction source 14a such as a vacuum pump, and a first suction conduit 14b. And a first flow rate adjusting unit 14c provided in the middle.
The first flow rate adjusting unit 14c includes an on-off valve that opens and closes the first suction pipe 14b, a pressure regulator for adjusting the passing flow rate, and the like.
The lower suction chuck 12 is provided with second suction pressure adjusting means 15 for adjusting the suction pressure from the atmospheric atmosphere to a predetermined degree of vacuum.
The second suction pressure adjusting means 15 is provided in the middle of the second suction conduit 15b and the second suction conduit 15b communicating from the chuck surface of the lower suction chuck 12 toward the suction source 14a such as a vacuum pump, for example. And a second flow rate adjusting unit 15c.
The second flow rate adjusting unit 15c includes an opening / closing valve that opens and closes the second suction pipe line 15b.

上吸引チャック11及び下吸引チャック12の具体例として、図1〜図7及び図9,図10に示されるように、上基板1と下基板2の重ね合わせ後に、上吸引チャック11のチャック面から上基板1が重力で離れるように構成している。
また、その他の例として図示しないが、上基板1と下基板2の重ね合わせ後に、下吸引チャック12のチャック面から下基板2が離れるように構成することも可能である。
さらに、上吸引チャック11の第一吸引圧調整手段14には、連絡管路14dを介して後述する室圧調整手段16の排気管路16bと連通させることも可能である。連絡管路14dの途中には、均圧調整部14eが設けられ、均圧調整部14eは、連絡管路14dを開閉させる均圧用開閉弁などから構成される。
As specific examples of the upper suction chuck 11 and the lower suction chuck 12, as shown in FIGS. 1 to 7, 9 and 10, the chuck surface of the upper suction chuck 11 after the upper substrate 1 and the lower substrate 2 are overlapped. The upper substrate 1 is configured to be separated by gravity.
Although not shown as another example, the lower substrate 2 can be separated from the chuck surface of the lower suction chuck 12 after the upper substrate 1 and the lower substrate 2 are overlapped.
Furthermore, the first suction pressure adjusting means 14 of the upper suction chuck 11 can be communicated with an exhaust pipe 16b of a chamber pressure adjusting means 16 described later via a communication pipe 14d. A pressure equalization adjusting unit 14e is provided in the middle of the communication pipeline 14d, and the pressure equalization adjusting unit 14e includes a pressure equalizing on / off valve that opens and closes the communication pipeline 14d.

上吸引チャック11の第一吸引圧調整手段14と下吸引チャック12の第二吸引圧調整手段15は、後述する制御部17によりそれぞれ作動制御され、上吸引チャック11の吸引圧力P1と下吸引チャック12の吸引圧力をそれぞれ次のように設定している。
上基板1及び下基板2の重ね合わせ時において、上吸引チャック11の吸引圧力P1と下吸引チャック12の吸引圧力は、それぞれ第一真空度に設定されている。上基板1及び下基板2の重ね合わせ後は、上吸引チャック11の吸引圧力P1が、第一真空度からそれよりも高圧な第二真空度へ、第二真空度からそれよりも高圧で且つ大気圧よりも低圧な第三真空度へ、第三真空度から大気圧までそれぞれ段階的に昇圧するように設定されている。
下吸引チャック12の吸引圧力は、上基板1及び下基板2の貼り合わせが完了し貼合デバイスAとなって変圧室10から搬出される前まで第一真空度に維持し、搬出の直前に大気圧まで一気に昇圧するように設定されている。
これら第一真空度、第二真空度及び三真空度の具体例としては、図8及び図11に示されるように、第一真空度が例えば1万Pa又は1万Pa前後の高真空圧(以下「高真空圧」という)であり、第二真空度が例えば5万Pa又は5万Pa前後の中真空圧(以下「中真空圧」という)であり、第三真空度が例えば7万Pa又は7万Pa前後の低真空圧(以下「低真空圧」という)である。
なお、ここでは、大気圧を約10万Paとしている。
The first suction pressure adjusting means 14 of the upper suction chuck 11 and the second suction pressure adjusting means 15 of the lower suction chuck 12 are respectively controlled by a control unit 17 to be described later, and the suction pressure P1 of the upper suction chuck 11 and the lower suction chuck 11 are controlled. The 12 suction pressures are set as follows.
When the upper substrate 1 and the lower substrate 2 are overlaid, the suction pressure P1 of the upper suction chuck 11 and the suction pressure of the lower suction chuck 12 are set to the first degree of vacuum, respectively. After superposition of the upper substrate 1 and lower substrate 2, the suction pressure P1 of the upper suction chuck 11, the high-pressure second vacuum than the first vacuum, and at a pressure higher than the second vacuum The pressure is set so that the pressure is increased stepwise from the third vacuum level to the atmospheric pressure to the third vacuum level lower than the atmospheric pressure.
The suction pressure of the lower suction chuck 12 is maintained at the first degree of vacuum until the bonding of the upper substrate 1 and the lower substrate 2 is completed and the bonding device A is unloaded from the variable pressure chamber 10, and immediately before unloading. It is set to boost pressure to atmospheric pressure at once.
As specific examples of the first degree of vacuum, the second degree of vacuum, and the third degree of vacuum, as shown in FIGS. 8 and 11, the first degree of vacuum is, for example, a high vacuum pressure of about 10,000 Pa or 10,000 Pa ( Hereinafter referred to as “high vacuum pressure”), the second vacuum degree is, for example, 50,000 Pa or a medium vacuum pressure around 50,000 Pa (hereinafter referred to as “medium vacuum pressure”), and the third vacuum degree is, for example, 70,000 Pa. Or a low vacuum pressure of about 70,000 Pa (hereinafter referred to as “low vacuum pressure”).
Here, the atmospheric pressure is about 100,000 Pa.

一方、チャンバー10aには、変圧室10と連通してその内圧P2を大気雰囲気から所定の真空度まで調整するための室圧調整手段16が設けられている。
室圧調整手段16は、変圧室10から例えば真空ポンプなどの排気源16aに向けて連通する排気路16bと、排気路16bの途中に設けられる室圧調整部16cと、を有している。
室圧調整部16cは、排気路16bを開閉させる開閉弁や通過流量を調整するための調圧器などから構成され、後述する制御部17により作動制御され、変圧室10の内圧P2を次のように設定している。
上基板1及び下基板2の重ね合わせ時において、変圧室10の内圧P2は、第一真空度(高真空圧)よりも高圧な第二真空度(中真空圧)に設定されている。上基板1及び下基板2の重ね合わせ後は、変圧室10の内圧P2が、第二真空度(中真空圧)よりも高圧で且つ大気圧よりも負圧の第三真空度(低真空圧)を経て大気圧まで段階的に昇圧するように設定されている。
On the other hand, the chamber 10a is provided with a chamber pressure adjusting means 16 that communicates with the variable pressure chamber 10 and adjusts its internal pressure P2 from the atmospheric atmosphere to a predetermined degree of vacuum.
The chamber pressure adjusting means 16 has an exhaust passage 16b that communicates from the variable pressure chamber 10 to an exhaust source 16a such as a vacuum pump, and a chamber pressure adjusting portion 16c provided in the middle of the exhaust passage 16b.
The chamber pressure adjusting unit 16c includes an on-off valve that opens and closes the exhaust passage 16b, a pressure regulator for adjusting the passage flow rate, and the like. The chamber pressure adjusting unit 16c is controlled by a control unit 17 to be described later, and the internal pressure P2 of the variable pressure chamber 10 is set as follows. Is set.
In superposition when the upper substrate 1 and lower substrate 2, the internal pressure P2 of the transformer chamber 10 is set to a high-pressure second vacuum (medium vacuum pressure) than the first vacuum (high vacuum). After the upper substrate 1 and the lower substrate 2 are overlaid, the internal pressure P2 of the variable pressure chamber 10 is higher than the second vacuum level (medium vacuum pressure) and negative than the atmospheric pressure. ) To increase the pressure gradually to atmospheric pressure.

さらに、上吸引チャック11の吸引管路14bと、下吸引チャック12の吸引管路15bと、変圧室10と通じる室圧調整手段16の排気路16bには、それぞれの管路内の負圧を大気開放するためのブロー弁を設けることが好ましい。
図示例では、上吸引チャック11の吸引管路14bと連絡管路14dを介して連通する変圧室10の排気路16bにブロー弁16dを配置し、下吸引チャック12の吸引管路15bにブロー弁15dを配置している。
Further, the suction line 14 b of the upper suction chuck 11, the suction line 15 b of the lower suction chuck 12, and the exhaust path 16 b of the chamber pressure adjusting means 16 communicating with the variable pressure chamber 10 are supplied with negative pressure in the respective lines. It is preferable to provide a blow valve for opening to the atmosphere.
In the illustrated example, a blow valve 16d is disposed in the exhaust passage 16b of the variable pressure chamber 10 communicating with the suction conduit 14b of the upper suction chuck 11 via the communication conduit 14d, and the blow valve is provided in the suction conduit 15b of the lower suction chuck 12. 15d is arranged.

制御部17は、吸引チャック11,12の駆動手段13と、上吸引チャック11の第一吸引圧調整手段14の第一流量調整部14cや均圧調整部14eと、下吸引チャック12の第二吸引圧調整手段15の第二流量調整部15cと、変圧室10の室圧調整手段16の室圧調整部16cと、ブロー弁16d,15dにそれぞれ電気的に接続するだけでなく、前述した変圧室10に対して上基板1及び下基板2を出し入れするための搬送手段や、上基板1と下基板2をXYθ方向へ相対的に移動させるための位置合わせ用駆動部や、シール材3を硬化させる硬化手段などにも電気的に接続するコントローラーである。
制御部17による上吸引チャック11の第一吸引圧調整手段14の制御は、上基板1及び下基板2の重ね合わせ時における真空圧力から大気圧までの段階的な昇圧過程において、上吸引チャック11のチャック面を上基板1の表面から離脱させるために、離脱面内に負圧が生じないように、該チャック面の内部と変圧室10の内圧P2との均圧を考慮した微速での離脱を開始する制御を行うことが好ましい。
制御部17となるコントローラーは、その制御回路(図示しない)に予め設定されたプログラムに従って、予め設定されたタイミングで順次それぞれ作動制御している。
詳しく説明すると、制御部17は、駆動手段13により基板1,2がシール材3を挟んで重ね合わされた状態で、第一吸引圧調整手段14により吸引チャック11,12のいずれか一方(上吸引チャック11)の吸引圧力P1を、第一真空度からそれよりも高圧な変圧室10の第二真空度へ向けて上昇させ、その後、第一吸引圧調整手段14及び室圧調整手段16により、吸引チャック11,12のいずれか一方の吸引圧力P1と変圧室10の内圧P2を、変圧室10内の第二真空度よりも高圧で且つ大気圧よりも負圧の第三真空度までそれぞれ上昇させた後、第三真空度から大気圧まで上昇させるように制御している。
The control unit 17 includes a driving unit 13 for the suction chucks 11 and 12, a first flow rate adjusting unit 14 c and a pressure equalizing unit 14 e for the first suction pressure adjusting unit 14 for the upper suction chuck 11, and a second for the lower suction chuck 12. In addition to being electrically connected to the second flow rate adjusting unit 15c of the suction pressure adjusting unit 15, the chamber pressure adjusting unit 16c of the chamber pressure adjusting unit 16 of the variable pressure chamber 10, and the blow valves 16d and 15d, respectively, Conveying means for moving the upper substrate 1 and the lower substrate 2 in and out of the chamber 10, a positioning drive unit for moving the upper substrate 1 and the lower substrate 2 relative to each other in the XYθ direction, and a sealing material 3 are provided. It is a controller that is electrically connected to a curing means for curing.
The control of the first suction pressure adjusting means 14 of the upper suction chuck 11 by the control unit 17 is performed in the stepwise pressure increasing process from the vacuum pressure to the atmospheric pressure when the upper substrate 1 and the lower substrate 2 are overlapped. In order to detach the chuck surface from the surface of the upper substrate 1, detachment at a very low speed taking into account the equal pressure between the inside of the chuck surface and the internal pressure P2 of the variable pressure chamber 10 so that no negative pressure is generated in the detachment surface. It is preferable to perform control to start the process.
The controller serving as the controller 17 sequentially controls the operation at a preset timing in accordance with a preset program in its control circuit (not shown).
More specifically, the control unit 17 is configured so that the first suction pressure adjusting unit 14 selects one of the suction chucks 11 and 12 (upper suction) in a state where the substrates 1 and 2 are overlapped with the sealing member 3 by the driving unit 13. The suction pressure P1 of the chuck 11) is increased from the first degree of vacuum toward the second degree of vacuum of the variable pressure chamber 10 higher than that, and then the first suction pressure adjusting means 14 and the chamber pressure adjusting means 16 are used. The suction pressure P1 of one of the suction chucks 11 and 12 and the internal pressure P2 of the variable pressure chamber 10 are increased to a third vacuum level that is higher than the second vacuum level in the variable pressure chamber 10 and negative than the atmospheric pressure. Then, it is controlled to increase from the third degree of vacuum to the atmospheric pressure.

そして、制御部17の制御回路に設定されたプログラムを、貼合デバイスAを生産するための製造方法として説明する。
本発明の実施形態に係る貼合デバイスAの製造方法は、上基板1と下基板2の重ね合わせ工程S1と、上吸引チャック11又は下吸引チャック12のいずれか一方(上吸引チャック11)の吸引圧力P1を第一真空度(高真空圧)から第二真空度(中真空圧)へ向けて上昇させる均圧化工程S2と、変圧室10の内圧P2及び上吸引チャック11又は下吸引チャック12のいずれか一方(上吸引チャック11)の吸引圧力P1を第三真空度(低真空圧)まで上昇させる昇圧工程S4と、変圧室10の内圧P2及び上吸引チャック11又は下吸引チャック12のいずれか一方(上吸引チャック11)の吸引圧力P1を大気圧まで上昇させる大気開放工程S6と、を主要な工程として含んでいる。
特に、昇圧工程S4において、変圧室10の内圧P2及び上吸引チャック11又は下吸引チャック12のいずれか一方(上吸引チャック11)の吸引圧力P1を、第二真空度(中真空圧)から第三真空度(低真空圧)へ向けて徐々に上昇させることが好ましい。
また、上吸引チャック11又は下吸引チャック12の他方(下吸引チャック12)の吸引圧力は、重ね合わせ工程S1から均圧化工程S2、昇圧工程S4、大気開放工程S6までの全工程において、第一真空度(高真空圧)に維持している。
And the program set to the control circuit of the control part 17 is demonstrated as a manufacturing method for producing the bonding device A.
In the manufacturing method of the bonding device A according to the embodiment of the present invention, the upper substrate 1 and the lower substrate 2 are overlapped with each other, the upper suction chuck 11 or the lower suction chuck 12 (upper suction chuck 11). A pressure equalization step S2 in which the suction pressure P1 is increased from the first vacuum degree (high vacuum pressure) to the second vacuum degree (medium vacuum pressure), the internal pressure P2 of the variable pressure chamber 10 and the upper suction chuck 11 or the lower suction chuck. 12 (upper suction chuck 11) is increased to a third vacuum degree (low vacuum pressure), the pressure increasing step S4, the internal pressure P2 of the variable pressure chamber 10 and the upper suction chuck 11 or the lower suction chuck 12 An air release step S6 for raising the suction pressure P1 of either one (upper suction chuck 11) to atmospheric pressure is included as a main step.
In particular, in the boosting step S4, the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of either the upper suction chuck 11 or the lower suction chuck 12 (upper suction chuck 11) are changed from the second degree of vacuum (medium vacuum pressure) to the first. It is preferable to gradually increase it toward three vacuum degrees (low vacuum pressure).
The suction pressure of the other of the upper suction chuck 11 and the lower suction chuck 12 (the lower suction chuck 12) is the same in all steps from the superposition step S1 to the pressure equalization step S2, the pressure increase step S4, and the air release step S6. Maintains a degree of vacuum (high vacuum pressure).

さらに加えて、均圧化工程S2と昇圧工程S4の間には、上吸引チャック11又は下吸引チャック12のいずれか一方の吸引圧力P1を所定時間に亘って維持する第一の待機工程S3を含むことも可能である。
昇圧工程S4と大気開放工程S6の間には、変圧室10の内圧P2及び上吸引チャック11又は下吸引チャック12のいずれか一方の吸引圧力P1を所定時間に亘って維持する第二の待機工程S5を含むことが好ましい。
つまり、上吸引チャック11又は下吸引チャック12のいずれか一方の吸引圧力P1と、変圧室10の内圧P2を第三真空度(低真空圧)までそれぞれ上昇させた後、第三真空度(低真空圧)のまま所定時間に亘って維持し、その後、第三真空度(低真空圧)から大気圧まで上昇させるように制御することが好ましい。
In addition, a first standby step S3 for maintaining the suction pressure P1 of either the upper suction chuck 11 or the lower suction chuck 12 for a predetermined time between the pressure equalization step S2 and the pressure increase step S4. It can also be included.
Between the pressure increasing step S4 and the atmosphere releasing step S6, a second standby step for maintaining the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of either the upper suction chuck 11 or the lower suction chuck 12 for a predetermined time. Preferably, S5 is included.
That is, after raising the suction pressure P1 of either the upper suction chuck 11 or the lower suction chuck 12 and the internal pressure P2 of the variable pressure chamber 10 to the third vacuum level (low vacuum pressure), respectively, The vacuum pressure is preferably maintained for a predetermined time and then controlled to be increased from the third degree of vacuum (low vacuum pressure) to atmospheric pressure.

貼合デバイスAの製造方法の具体例としては、先ず、図1に示されるように、変圧室10内の上吸引チャック11と下吸引チャック12に向けて上基板1と下基板2がそれぞれ外部から搬入される。この時点で、上吸引チャック11と下吸引チャック12は、駆動手段13の作動によりZ方向へ離隔移動している。
上吸引チャック11の吸引圧力P1は、第一吸引圧調整手段14の第一流量調整部14cとなる開閉弁を開き、調圧器によって第一真空度(高真空圧)に圧力調整される。下吸引チャック12の吸引圧力は、第二吸引圧調整手段15の第二流量調整部15cとなる開閉弁を開いて、第一真空度(高真空圧)に圧力調整される。それにより、上基板1と下基板2は、上吸引チャック11及び下吸引チャック12に対して、第一真空度(高真空圧)でそれぞれ移動不能に吸着保持される。
さらに、変圧室10が密閉状態となった後は、室圧調整手段16の圧力調整部16cとなる排気弁を開いて、調圧器によって変圧室10の内圧P2が第一真空度(高真空圧)よりも高圧な第二真空度(中真空圧)まで減圧される。そのため、上吸引チャック11のチャック面から上基板1が落下せず且つXY方向へ位置ズレしないと同時に、下吸引チャック12のチャック面にお下基板2がXY方向へ位置ズレしない。
As a specific example of the manufacturing method of the bonding device A, first, as shown in FIG. 1, the upper substrate 1 and the lower substrate 2 are respectively externally directed toward the upper suction chuck 11 and the lower suction chuck 12 in the variable pressure chamber 10. It is carried in from. At this time, the upper suction chuck 11 and the lower suction chuck 12 are moved apart in the Z direction by the operation of the driving means 13.
The suction pressure P1 of the upper suction chuck 11 is adjusted to a first vacuum degree (high vacuum pressure) by a pressure regulator by opening an on-off valve serving as the first flow rate adjusting unit 14c of the first suction pressure adjusting means 14. The suction pressure of the lower suction chuck 12 is adjusted to the first degree of vacuum (high vacuum pressure) by opening an on-off valve serving as the second flow rate adjusting unit 15c of the second suction pressure adjusting means 15. As a result, the upper substrate 1 and the lower substrate 2 are sucked and held by the upper suction chuck 11 and the lower suction chuck 12 so as not to move at a first degree of vacuum (high vacuum pressure).
Further, after the variable pressure chamber 10 is hermetically sealed, the exhaust valve serving as the pressure adjusting portion 16c of the chamber pressure adjusting means 16 is opened, and the internal pressure P2 of the variable pressure chamber 10 is set to the first degree of vacuum (high vacuum pressure) by the pressure regulator. ) it is reduced to a pressure of the second vacuum (medium vacuum pressure) than. Therefore, the upper substrate 1 does not fall from the chuck surface of the upper suction chuck 11 and does not shift in the XY direction, and at the same time, the lower substrate 2 does not shift in the XY direction on the chuck surface of the lower suction chuck 12.

それに続く、図2に示される重ね合わせ工程S1では、第二真空度(中真空圧)に減圧された変圧室10内で、駆動手段13の作動により上吸引チャック11と下吸引チャック12をZ方向へ相対的に接近移動させて、上基板1と下基板2がシール3を挟んでZ方向へ重ね合わされる。
それにより、上基板1と下基板2の間には、シール材3で囲まれる封止空間3sが形成され、封止空間3s内の圧力は、第二真空度(中真空圧)となる。
In the subsequent superposition step S1 shown in FIG. 2, the upper suction chuck 11 and the lower suction chuck 12 are moved to Z by the operation of the driving means 13 in the variable pressure chamber 10 reduced to the second vacuum degree (medium vacuum pressure). The upper substrate 1 and the lower substrate 2 are overlapped in the Z direction with the seal 3 interposed therebetween by relatively moving in the direction.
Thereby, a sealing space 3s surrounded by the sealing material 3 is formed between the upper substrate 1 and the lower substrate 2, and the pressure in the sealing space 3s becomes the second degree of vacuum (medium vacuum pressure).

それに続く、図3に示される均圧化工程S2では、上吸引チャック11の第一流量調整部14cとなる開閉弁が開いたまま、上吸引チャック11の第一吸引圧調整手段14の第一流量調整部14cの作動によって、上基板1が吸着される上吸引チャック11の吸引圧力P1を、第一真空度(高真空圧)からそれよりも高圧な第二真空度(中真空圧)まで上昇させる。
均圧化工程S2の終了時には、図4に示されるように、上吸引チャック11の第一吸引圧調整手段14が、上吸引チャック11の吸引管路14bと変圧室10の排気管路16bを連絡管路14dで連通されるように制御することが好ましい。
それにより、上吸引チャック11の吸引圧力P1と変圧室10の内圧P2が、それぞれ均等な第二真空度(中真空圧)となる。そのため、この頃になると、上吸引チャック11のチャック面からの圧力差による上基板1の真空吸着が解消される。
さらに、上基板1の真空吸着を確実に解消させるため、第一の待機工程S3により所定時間に亘って、上吸引チャック11の吸引圧力P1と変圧室10の内圧P2を第二真空度(中真空圧)に維持することが好ましい。
In the subsequent pressure equalization step S2 shown in FIG. 3, the first suction pressure adjusting means 14 of the upper suction chuck 11 is kept open while the on-off valve serving as the first flow rate adjusting unit 14c of the upper suction chuck 11 is open. by the operation of the flow rate adjusting portion 14c, a suction pressure P1 on the suction chuck 11 on the substrate 1 is adsorbed, to the first vacuum pressure of the second vacuum than the (high vacuum pressure) (medium vacuum pressure) Raise.
At the end of the pressure equalization step S2, as shown in FIG. 4, the first suction pressure adjusting means 14 of the upper suction chuck 11 passes through the suction pipe 14b of the upper suction chuck 11 and the exhaust pipe 16b of the variable pressure chamber 10. It is preferable to control the communication line 14d to communicate with it.
As a result, the suction pressure P1 of the upper suction chuck 11 and the internal pressure P2 of the variable pressure chamber 10 are each equal to the second degree of vacuum (medium vacuum pressure). Therefore, at this time, the vacuum suction of the upper substrate 1 due to the pressure difference from the chuck surface of the upper suction chuck 11 is eliminated.
Further, in order to reliably eliminate the vacuum suction of the upper substrate 1, the suction pressure P1 of the upper suction chuck 11 and the internal pressure P2 of the variable pressure chamber 10 are set to a second degree of vacuum (medium) over a predetermined time by the first standby step S3. (Vacuum pressure) is preferably maintained.

その後に続く、図5に示される昇圧工程S4では、室圧調整手段16の圧力調整部16cとなる調圧器によって、変圧室10の内圧P2を第二真空度(中真空圧)からそれよりも高圧で且つ大気圧よりも負圧の第三真空度(低真空圧)まで上昇させる。
これと同時に、第一吸引圧調整手段14の第一流量調整部14cや均圧調整部14eの作動によって、上吸引チャック11の吸引圧力P1を、第二真空度(中真空圧)から第三真空度(低真空圧)まで上昇させている。
その具体例として図示例の場合には、上吸引チャック11の第一流量調整部14cが、連絡管路14dを介して上吸引チャック11の吸引管路14bと変圧室10の排気管路16bが連通されることにより、上吸引チャック11の吸引圧力P1が、変圧室10の内圧P2の上昇と連動して同圧で第三真空度(低真空圧)へ上昇するように制御している。
また、その他の例として図示しないが、上吸引チャック11の第一吸引圧調整手段14の第一流量調整部14cの作動によって、上吸引チャック11の吸引圧力P1を、変圧室10の内圧P2の上昇とほぼ同時に第三真空度(低真空圧)まで徐々に上昇させることも可能である。
In the subsequent boosting step S4 shown in FIG. 5, the internal pressure P2 of the variable pressure chamber 10 is changed from the second vacuum level (medium vacuum pressure) to a higher level by the pressure regulator serving as the pressure adjusting unit 16c of the chamber pressure adjusting means 16. The pressure is increased to a third degree of vacuum (low vacuum pressure) at a high pressure and a negative pressure from the atmospheric pressure.
At the same time, the suction pressure P1 of the upper suction chuck 11 is changed from the second vacuum degree (medium vacuum pressure) to the third by the operation of the first flow rate adjustment part 14c and the pressure equalization adjustment part 14e of the first suction pressure adjustment means 14. The vacuum level (low vacuum pressure) is increased.
As a specific example, in the case of the illustrated example, the first flow rate adjusting unit 14c of the upper suction chuck 11 is connected to the suction pipe 14b of the upper suction chuck 11 and the exhaust pipe 16b of the variable pressure chamber 10 through the communication pipe 14d. By communicating, the suction pressure P1 of the upper suction chuck 11 is controlled to increase to the third degree of vacuum (low vacuum pressure) at the same pressure in conjunction with the increase of the internal pressure P2 of the variable pressure chamber 10.
Although not shown as another example, the suction pressure P1 of the upper suction chuck 11 is changed to the internal pressure P2 of the variable pressure chamber 10 by the operation of the first flow rate adjusting unit 14c of the first suction pressure adjusting means 14 of the upper suction chuck 11. It is also possible to gradually increase to the third degree of vacuum (low vacuum pressure) almost simultaneously with the increase.

昇圧工程S4によって、変圧室10の内圧P2と上吸引チャック11の吸引圧力P1が、それぞれ第三真空度(低真空圧)となるため、変圧室10の内圧P2である第三真空度(低真空圧)と、基板1,2の間にシール材3で囲まれる封止空間3s内の圧力である第二真空度(中真空圧)とに圧力差が生じる。
そのため、昇圧工程S4が終了する頃になると、この圧力差で未硬化のシール材3が圧縮変形して、上吸引チャック11のチャック面から上基板1の表面が離脱し始める。
この際、変圧室10内の第三真空度(低真空圧)と、基板1,2間の第二真空度(中真空圧)の封止空間3sとの圧力差で、未硬化のシール材3を十分且つ確実に圧縮変形させるため、第二の待機工程S5により所定時間に亘って、変圧室10の内圧P2と上吸引チャック11の吸引圧力P1を第三真空度(低真空圧)に維持することが好ましい。
Since the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of the upper suction chuck 11 become the third degree of vacuum (low vacuum pressure) by the pressure increasing step S4, respectively, the third vacuum degree (low There is a pressure difference between the vacuum pressure) and the second degree of vacuum (medium vacuum pressure), which is the pressure in the sealing space 3 s surrounded by the sealing material 3 between the substrates 1 and 2.
Therefore, when the pressure increasing step S4 is finished, the uncured sealing material 3 is compressed and deformed by this pressure difference, and the surface of the upper substrate 1 starts to be detached from the chuck surface of the upper suction chuck 11.
At this time, the uncured sealing material is caused by the pressure difference between the third vacuum degree (low vacuum pressure) in the variable pressure chamber 10 and the sealing space 3 s of the second vacuum degree (medium vacuum pressure) between the substrates 1 and 2. 3 is sufficiently and reliably compressed and deformed, the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of the upper suction chuck 11 are set to the third degree of vacuum (low vacuum pressure) over a predetermined time in the second standby step S5. It is preferable to maintain.

その後に続く、図6に示される大気開放工程S6では、室圧調整手段16の圧力調整部16cとなる調圧器によって、変圧室10の内圧P2を第三真空度(低真空圧)からそれよりも高圧な大気圧まで上昇させる。これと同時に、第一吸引圧調整手段14の第一流量調整部14cや均圧調整部14eの作動によって、上吸引チャック11の吸引圧力P1を、第三真空度(低真空圧)から大気圧まで上昇させている。
その具体例として図示例の場合には、上吸引チャック11の吸引管路14bから吸引源14aへの経路を閉じ、均圧調整部14eにより連絡管路14dを介して上吸引チャック11の吸引管路14bと変圧室10の排気管路16bが連通されることで、上吸引チャック11の吸引圧力P1が、変圧室10の内圧P2の上昇と同時に大気圧まで徐々に上昇するように制御している。
また、その他の例として図示しないが、上吸引チャック11の第一吸引圧調整手段14の第一流量調整部14cの作動によって、上吸引チャック11の吸引圧力P1を、変圧室10の内圧P2の上昇とほぼ同時に大気圧まで徐々に上昇させることも可能である。
In the subsequent air release step S6 shown in FIG. 6, the internal pressure P2 of the variable pressure chamber 10 is changed from the third degree of vacuum (low vacuum pressure) by the pressure regulator serving as the pressure adjusting unit 16c of the chamber pressure adjusting means 16. Also raise the pressure to high atmospheric pressure. At the same time, the suction pressure P1 of the upper suction chuck 11 is changed from the third degree of vacuum (low vacuum pressure) to the atmospheric pressure by the operation of the first flow rate adjustment unit 14c and the pressure equalization adjustment unit 14e of the first suction pressure adjusting means 14. It is raised to.
As a specific example, in the case of the illustrated example, the path from the suction line 14b of the upper suction chuck 11 to the suction source 14a is closed, and the suction pipe of the upper suction chuck 11 is connected by the pressure equalizing adjustment unit 14e via the communication line 14d. By connecting the passage 14b and the exhaust pipe 16b of the variable pressure chamber 10, the suction pressure P1 of the upper suction chuck 11 is controlled so as to gradually increase to the atmospheric pressure simultaneously with the increase of the internal pressure P2 of the variable pressure chamber 10. Yes.
Although not shown as another example, the suction pressure P1 of the upper suction chuck 11 is changed to the internal pressure P2 of the variable pressure chamber 10 by the operation of the first flow rate adjusting unit 14c of the first suction pressure adjusting means 14 of the upper suction chuck 11. It is also possible to gradually increase to atmospheric pressure almost simultaneously with the increase.

大気開放工程S6によって、変圧室10の内圧P2と上吸引チャック11の吸引圧力P1が、それぞれ大気圧となるため、変圧室10の内圧P2である大気圧と、基板1,2間に封止空間3s内の圧力である第二真空度(中真空圧)との圧力差が拡大する。
この拡大した圧力差で未硬化のシール材3が更に圧縮変形して、上吸引チャック11のチャック面から上基板1の表面が完全に離れるとともに、上基板1及び下基板2が全体的に均等に押し潰されて所望のギャップで貼り合わされる。
そして、変圧室10の内圧P2が大気圧又は大気圧の近くまで上昇したところで、室圧調整手段16の圧力調整部16cとなる排気弁を閉じ、変圧室10の排気路16bに設けられたブロー弁16dを開いて、変圧室10の排気路16b及び上吸引チャック11の吸引管路14b内の圧力を開放している。
この頃には、図6に二点鎖線で示されるように、駆動手段13の作動により上吸引チャック11と下吸引チャック12をZ方向へ相対的に離隔移動させて、シール材3を挟んで貼り合わされた上基板1及び下基板2が下吸引チャック12のチャック面に移動不能に吸着保持される。
Since the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of the upper suction chuck 11 are each atmospheric pressure by the air release process S6, the atmospheric pressure which is the internal pressure P2 of the variable pressure chamber 10 and the substrates 1 and 2 are sealed. The pressure difference with the second degree of vacuum (medium vacuum pressure), which is the pressure in the space 3s, increases.
The uncured sealing material 3 is further compressed and deformed by the enlarged pressure difference, and the surface of the upper substrate 1 is completely separated from the chuck surface of the upper suction chuck 11, and the upper substrate 1 and the lower substrate 2 are generally uniform. To be bonded together with a desired gap.
When the internal pressure P2 of the variable pressure chamber 10 rises to atmospheric pressure or close to atmospheric pressure, the exhaust valve serving as the pressure adjusting portion 16c of the chamber pressure adjusting means 16 is closed, and the blower provided in the exhaust passage 16b of the variable pressure chamber 10 is closed. The valve 16 d is opened to release the pressure in the exhaust passage 16 b of the variable pressure chamber 10 and the suction conduit 14 b of the upper suction chuck 11.
At this time, as shown by a two-dot chain line in FIG. 6, the upper suction chuck 11 and the lower suction chuck 12 are moved relatively apart in the Z direction by the operation of the driving means 13, and the sealing material 3 is sandwiched therebetween. The combined upper substrate 1 and lower substrate 2 are sucked and held on the chuck surface of the lower suction chuck 12 so as not to move.

大気開放工程S6の後は、図7に示されるように、下吸引チャック12の流量調整部14eとなる開閉弁を閉じ、下吸引チャック12の吸引管路14cに設けられたブロー弁15dを開いて、下吸引チャック12の吸引管路14c内の圧力を開放する。
この状態で、変圧室10内から外部へ、上基板1及び下基板2を所望のギャップで貼り合わせた貼合デバイスAが搬出される。
それ以降は前述した作動が繰り返される。
After the air release step S6, as shown in FIG. 7, the open / close valve serving as the flow rate adjusting unit 14e of the lower suction chuck 12 is closed, and the blow valve 15d provided in the suction line 14c of the lower suction chuck 12 is opened. Thus, the pressure in the suction line 14c of the lower suction chuck 12 is released.
In this state, the bonding device A in which the upper substrate 1 and the lower substrate 2 are bonded together with a desired gap is carried out from the inside of the variable pressure chamber 10 to the outside.
Thereafter, the above-described operation is repeated.

このような本発明の実施形態に係る貼合デバイスAの製造装置B及び製造方法によると、図2に示されるように、第二真空度(中真空圧)に減圧された変圧室10内で一対の基板1,2が重ね合わされる重ね合わせ工程S1の後に、図3に示される均圧化工程S2で一方の基板(上基板)1に対する一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、第一真空度(高真空圧)からそれよりも高圧な変圧室10の第二真空度(中真空圧)へ向けて上昇させる。それにより、図4に示されるように、一方の吸引チャック(上吸引チャック)11の吸引圧力P1と変圧室10の内圧P2が、均等な第二真空度(中真空圧)となるため、一方の吸引チャック(上吸引チャック)11のチャック面からの圧力差による一方の基板(上基板)1の真空吸着が解消される。その後の図5に示される昇圧工程S4で、変圧室10の内圧P2と一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、変圧室10内の第二真空度(中真空圧)よりも高圧で且つ大気圧よりも負圧の第三真空度まで上昇させる。それにより、変圧室10内の第三真空度(低真空圧)と、基板1,2間の第二真空度(中真空圧)の封止空間3sとの圧力差で未硬化のシール材3が圧縮変形して、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面が離れる。その後の図6に示される大気開放工程S6で、変圧室10の内圧P2及び一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、第三真空度(低真空圧)から大気圧まで上昇させる。
According to the manufacturing apparatus B and manufacturing method of the bonding device A according to such an embodiment of the present invention, as shown in FIG. 2, in the variable pressure chamber 10 reduced to the second degree of vacuum (medium vacuum pressure). After the superposition step S1 in which the pair of substrates 1 and 2 are superposed, the suction pressure of one suction chuck (upper suction chuck) 11 with respect to one substrate (upper substrate) 1 in the pressure equalization step S2 shown in FIG. P1 is raised from the first vacuum degree (high vacuum pressure) toward the second vacuum degree (medium vacuum pressure) of the variable pressure chamber 10 having a higher pressure. As a result, as shown in FIG. 4, the suction pressure P1 of one suction chuck (upper suction chuck) 11 and the internal pressure P2 of the variable pressure chamber 10 have an equal second degree of vacuum (medium vacuum pressure). The vacuum suction of one substrate (upper substrate) 1 due to the pressure difference from the chuck surface of the suction chuck (upper suction chuck) 11 is eliminated. In the subsequent step S4 shown in FIG. 5, the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of the one suction chuck (upper suction chuck) 11 are determined from the second degree of vacuum (medium vacuum pressure) in the variable pressure chamber 10. Is increased to a third degree of vacuum that is higher than the atmospheric pressure and negative. Thereby, the uncured sealing material 3 is caused by the pressure difference between the third vacuum degree (low vacuum pressure) in the variable pressure chamber 10 and the sealing space 3 s of the second vacuum degree (medium vacuum pressure) between the substrates 1 and 2. Is compressed and deformed, and the surface of one substrate (upper substrate) 1 is separated from the chuck surface of one suction chuck (upper suction chuck) 11. In the subsequent air release step S6 shown in FIG. 6, the internal pressure P2 of the variable pressure chamber 10 and the suction pressure P1 of one suction chuck (upper suction chuck) 11 are increased from the third degree of vacuum (low vacuum pressure) to the atmospheric pressure. Let

具体例を挙げて説明すると、重ね合わせ工程S1で基板1,2の間に未硬化のシール材3で封止された封止空間3s内には、変圧室10の中真空圧(5万Pa)が閉じ込められている。
その後の昇圧工程S4で、低真空圧(7万Pa)まで変圧室10の内圧P2を上昇させると、基板1,2に対してシール材3の内外差圧分(2万Pa)が必然的に生じる。
その後の大気開放工程S6で、大気圧(10万Pa)では約1000g/cm2の真空差圧の密着力が得られるので、シール材3の内外差圧分(2万Pa)では、およそ200g/cm2の密着力が得られることになる。
それにより、未硬化のシール材3は厚み方向へ圧縮変形して、その分だけ基板1,2の厚みが全体的に薄くなるため、圧力差で基板1,2が所望のギャップに貼り合わせされる。
実験によれば、貼り合せ前の上基板1及び下基板2において、シール材3の塗布高さのバラツキが平均60μmあり、重ね合わせ工程S1の駆動手段13によるシール材3の押し潰し寸法を10μmとした場合は、昇圧工程S4の終了時に低真空圧(7万Pa)まで昇圧されると、シール材3が平均20μmの潰れて、上基板1及び下基板2のギャップが平均40μmまで圧縮変形した。さらに、大気開放工程S6の終了時に大気圧(10万Pa)まで昇圧されると、シール材3が平均35μmの潰れて、上基板1及び下基板2のギャップが目標となる25μmまで圧縮変形された。このように作製された貼合デバイスAは、封止セル内との間に差圧が生じても、シール材3と上基板1及び下基板2の接触界面に差圧による空気貫通が起きない安定封止状態であることが確認でき、目的を達成できた。
Explaining with a specific example, in the sealing space 3s sealed with the uncured sealing material 3 between the substrates 1 and 2 in the overlapping step S1, the medium vacuum pressure (50,000 Pa) in the variable pressure chamber 10 is obtained. ) Is trapped.
In the subsequent step S4, when the internal pressure P2 of the variable pressure chamber 10 is increased to a low vacuum pressure (70,000 Pa), an internal / external pressure difference (20,000 Pa) of the sealing material 3 with respect to the substrates 1 and 2 is inevitable. To occur.
In the subsequent air release step S6, an adhesive force of about 1000 g / cm 2 of vacuum differential pressure is obtained at atmospheric pressure (100,000 Pa), and therefore about 200 g for the internal / external differential pressure of the sealing material 3 (20,000 Pa). An adhesion force of / cm 2 is obtained.
Thereby, the uncured sealing material 3 is compressed and deformed in the thickness direction, and the thickness of the substrates 1 and 2 is reduced overall, so that the substrates 1 and 2 are bonded to a desired gap by a pressure difference. The
According to the experiment, on the upper substrate 1 and the lower substrate 2 before bonding, the variation in the coating height of the sealing material 3 is 60 μm on average, and the crushing dimension of the sealing material 3 by the driving means 13 in the overlapping step S1 is 10 μm. In this case, when the pressure is increased to a low vacuum pressure (70,000 Pa) at the end of the pressure increasing step S4, the seal material 3 is crushed by an average of 20 μm, and the gap between the upper substrate 1 and the lower substrate 2 is compressed and deformed to an average of 40 μm. did. Further, when the pressure is increased to atmospheric pressure (100,000 Pa) at the end of the air release step S6, the sealing material 3 is crushed by an average of 35 μm, and the gap between the upper substrate 1 and the lower substrate 2 is compressed and deformed to a target of 25 μm. It was. In the bonding device A thus produced, even if a differential pressure occurs between the sealing cell and the sealing cell 3, air penetration due to the differential pressure does not occur at the contact interface between the sealing material 3 and the upper substrate 1 and the lower substrate 2. It was confirmed that it was in a stable sealed state, and the object was achieved.

したがって、重ね合わせ状態の一方の基板(上基板)1から一方の吸引チャック(上吸引チャック)11を未硬化のシール材3に何らかの影響が与えられることなく分離させることで、シール材3の形状を乱すことのない基板1,2同士の貼り合わせを実現することができる。
その結果、シール材3の高さにバラツキがあったとしても、圧力差により基板1,2を所定のギャップに貼り合わせることができる。
さらに、チャック面から基板の表面へ向け圧縮空気などの流体を吹き付けて強制的に分離させるものに比べ、未硬化のシール材3が過剰に押し潰されることがなく、シール材3の塗布パターン形状の乱れ、シール材3に含まれるフィラーなどの固形成分と液状成分の分離、一方の吸引チャック(上吸引チャック)11の管路内や変圧室10内での空気振動の発生を防止することができて、基板1,2の貼り合わせ精度の向上が図れる。
Therefore, the shape of the sealing material 3 is obtained by separating the one suction chuck (upper suction chuck) 11 from the one substrate (upper substrate) 1 in an overlapped state without any influence on the uncured sealing material 3. The substrates 1 and 2 can be bonded together without disturbing.
As a result, even if the height of the sealing material 3 varies, the substrates 1 and 2 can be bonded to the predetermined gap due to the pressure difference.
Furthermore, the uncured sealing material 3 is not excessively crushed and the application pattern shape of the sealing material 3 is compared to that in which a fluid such as compressed air is sprayed from the chuck surface to the surface of the substrate and forcedly separated. Turbulence, separation of solid and liquid components such as filler contained in the sealing material 3, and generation of air vibrations in the pipe line of one suction chuck (upper suction chuck) 11 or in the variable pressure chamber 10 can be prevented. Thus, the accuracy of bonding the substrates 1 and 2 can be improved.

特に、一方の吸引チャック(上吸引チャック)11の吸引圧力P1及び変圧室10の内圧P2を第三真空度(低真空圧)までそれぞれ上昇させた後、第三真空度(低真空圧)のまま所定時間に亘って維持し、その後、第三真空度(低真空圧)から大気圧まで上昇させるように制御する場合には、昇圧工程S4で生ずる、変圧室10内の第三真空度(低真空圧)と、基板1,2間の第二真空度(中真空圧)の封止空間3sとの圧力差で、未硬化のシール材3が十分且つ確実に圧縮変形するまで待つ。それにより、未硬化のシール材3の圧縮変形速度が遅くても、待機工程S5中にはシール材3の圧縮変形が進行し完了して、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面が完全に離れる。
したがって、重ね合わせ状態の一方の基板(上基板)1から一方の吸引チャック(上吸引チャック)11をより確実に分離させることができる。
その結果、一方の基板(上基板)1からの一方の吸引チャック(上吸引チャック)11の分離性能が向上し、基板1,2の貼り合わせ精度の更なる向上が図れる。
In particular, after raising the suction pressure P1 of one suction chuck (upper suction chuck) 11 and the internal pressure P2 of the variable pressure chamber 10 to the third vacuum degree (low vacuum pressure), respectively, the third vacuum degree (low vacuum pressure) is increased. In the case where the pressure is maintained for a predetermined time and then controlled to be increased from the third degree of vacuum (low vacuum pressure) to the atmospheric pressure, the third degree of vacuum in the variable pressure chamber 10 ( The pressure difference between the low vacuum pressure) and the sealing space 3s of the second vacuum degree (medium vacuum pressure) between the substrates 1 and 2 is waited until the uncured sealing material 3 is sufficiently and reliably compressed and deformed. Thereby, even if the compression deformation speed of the uncured sealing material 3 is low, the compression deformation of the sealing material 3 proceeds and is completed during the standby step S5, and the chuck surface of one suction chuck (upper suction chuck) 11 is completed. The surface of one substrate (upper substrate) 1 is completely separated from
Accordingly, the one suction chuck (upper suction chuck) 11 can be more reliably separated from the one substrate (upper substrate) 1 in an overlapped state.
As a result, the separation performance of one suction chuck (upper suction chuck) 11 from one substrate (upper substrate) 1 is improved, and the bonding accuracy of the substrates 1 and 2 can be further improved.

さらに、第一吸引圧調整手段14及び室圧調整手段16により、吸引チャック11,12のいずれか一方の吸引圧力P1と変圧室10の内圧P2を、第二真空度から第三真空度へ向けて段階的に上昇させるように制御する場合には、昇圧工程S4において、変圧室10内の第三真空度(低真空圧)と、基板1,2間の第二真空度(中真空圧)の封止空間3sとの圧力差で、未硬化のシール材3が徐々に圧縮変形するため、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面が微速で離れる。
したがって、一方の基板(上基板)1を介して未硬化のシール材3に影響を全く与えることなく、一方の基板(上基板)1から一方の吸引チャック(上吸引チャック)11をより確実に分離させることができる。
その結果、一方の基板(上基板)1からの一方の吸引チャック(上吸引チャック)11の分離性能が向上し、基板1,2の貼り合わせ精度の更なる向上が図れる。
Further, by the first suction pressure adjusting means 14 and the chamber pressure adjusting means 16, the suction pressure P1 of one of the suction chucks 11 and 12 and the internal pressure P2 of the variable pressure chamber 10 are changed from the second vacuum degree to the third vacuum degree. In the step-up step S4, the third vacuum degree (low vacuum pressure) in the variable pressure chamber 10 and the second vacuum degree (medium vacuum pressure) between the substrates 1 and 2 are controlled. Since the uncured sealing material 3 gradually compresses and deforms due to the pressure difference with the sealing space 3s, the surface of one substrate (upper substrate) 1 is moved from the chuck surface of one suction chuck (upper suction chuck) 11. Leave at a slow speed.
Therefore, the one suction chuck (upper suction chuck) 11 can be more reliably connected from one substrate (upper substrate) 1 without affecting the uncured sealing material 3 via the one substrate (upper substrate) 1 at all. Can be separated.
As a result, the separation performance of one suction chuck (upper suction chuck) 11 from one substrate (upper substrate) 1 is improved, and the bonding accuracy of the substrates 1 and 2 can be further improved.

次に、本発明の各実施例を図面に基づいて説明する。
この実施例1は、図4及び図8に示すように、均圧化工程S2の終了時に、一方の吸引チャック(上吸引チャック)11の第一吸引圧調整手段14が、一方の吸引チャック(上吸引チャック)11の吸引管路14bと変圧室10の排気管路16bを連絡管路14dで連通されるように制御している。
図4に示される例では、上吸引チャック11の第一流量調整部14cとなる開閉弁を閉じて吸引源14aへの通路を遮断すると同時に、均圧調整部14eとなる均圧用開閉弁が開くことで、連絡管路14dを介して上吸引チャック11の吸引管路14bと変圧室10の排気管路16bが連通され、室圧調整手段16の圧力調整部16cとなる調圧器によって、第三真空度(低真空圧)まで徐々に上昇させている。
それにより、変圧室10の排気管路16bは、連絡管路14dを介して上吸引チャック11の吸引管路14bと連通しているため、上吸引チャック11の吸引圧力P1も、変圧室10の内圧P2の上昇と同時に第三真空度(低真空圧)まで徐々に上昇する。
Next, each embodiment of the present invention will be described with reference to the drawings.
In the first embodiment, as shown in FIGS. 4 and 8, at the end of the pressure equalization step S2, the first suction pressure adjusting means 14 of one suction chuck (upper suction chuck) 11 is replaced with one suction chuck ( The suction line 14b of the upper suction chuck) 11 and the exhaust line 16b of the variable pressure chamber 10 are controlled so as to communicate with each other through a communication line 14d.
In the example shown in FIG. 4, the on-off valve serving as the first flow rate adjusting unit 14c of the upper suction chuck 11 is closed to block the passage to the suction source 14a, and at the same time, the equalizing on-off valve serving as the pressure equalizing unit 14e is opened. As a result, the suction line 14b of the upper suction chuck 11 and the exhaust line 16b of the variable pressure chamber 10 are communicated with each other via the communication line 14d, and the pressure regulator serving as the pressure adjusting unit 16c of the chamber pressure adjusting means 16 is used to perform the third adjustment. The pressure is gradually increased to the degree of vacuum (low vacuum pressure).
As a result, the exhaust line 16b of the variable pressure chamber 10 communicates with the suction line 14b of the upper suction chuck 11 via the communication line 14d. Simultaneously with the rise of the internal pressure P2, it gradually rises to the third degree of vacuum (low vacuum pressure).

このような本発明の実施例1に係る貼合デバイスAの製造装置B及び製造方法によると、一方の吸引チャック(上吸引チャック)11の吸引管路14bと、変圧室10の排気管路16bにそれぞれ圧力センサーなどを設けて管理制御しなくても、連絡管路14dで吸引管路14bと排気管路16bを連通させることにより、連絡管路14dを通って一方の吸引チャック(上吸引チャック)11の吸引圧力P1と変圧室10の内圧P2が、それぞれ均等な第二真空度(中真空圧)となる。そのため、一方の吸引チャック(上吸引チャック)11のチャック面からの圧力差による一方の基板(上基板)1の真空吸着が解消される。
したがって、簡単な構造及び制御で一方の吸引チャック(上吸引チャック)11から一方の基板(上基板)1を確実に離脱させることができる。
その結果、低コストで一方の吸引チャック(上吸引チャック)11と一方の基板(上基板)1の分離性能が向上し、基板1,2の貼り合わせ精度の更なる向上が図れるという利点がある。
さらに、変圧室10の圧力調整用の室圧調整手段16を用いることで、変圧室10の内圧P2と共に一方の吸引チャック(上吸引チャック)11の吸引圧力P1を同時に且つ正確に調整することができる。
その結果、圧力センサーなどの測定誤差と関係なく、一方の吸引チャック(上吸引チャック)11の吸引圧力P1と変圧室10の内圧P2を精密に制御できて、操作性と経済性に優れるという利点がある。
According to the manufacturing apparatus B and the manufacturing method of the bonding device A according to the first embodiment of the present invention, the suction pipe 14b of one suction chuck (upper suction chuck) 11 and the exhaust pipe 16b of the variable pressure chamber 10 are used. Even if a pressure sensor or the like is not provided for management control, the suction pipe 14b and the exhaust pipe 16b are communicated with each other through the communication pipe 14d, so that one suction chuck (upper suction chuck) passes through the communication pipe 14d. ) The suction pressure P1 of 11 and the internal pressure P2 of the variable pressure chamber 10 become equal second vacuum degrees (medium vacuum pressures), respectively. Therefore, the vacuum suction of one substrate (upper substrate) 1 due to the pressure difference from the chuck surface of one suction chuck (upper suction chuck) 11 is eliminated.
Therefore, one substrate (upper substrate) 1 can be reliably detached from one suction chuck (upper suction chuck) 11 with a simple structure and control.
As a result, there is an advantage that the separation performance of one suction chuck (upper suction chuck) 11 and one substrate (upper substrate) 1 can be improved at a low cost, and the bonding accuracy of the substrates 1 and 2 can be further improved. .
Furthermore, by using the chamber pressure adjusting means 16 for adjusting the pressure of the variable pressure chamber 10, the suction pressure P1 of one suction chuck (upper suction chuck) 11 can be adjusted simultaneously and accurately together with the internal pressure P2 of the variable pressure chamber 10. it can.
As a result, it is possible to precisely control the suction pressure P1 of one suction chuck (upper suction chuck) 11 and the internal pressure P2 of the variable pressure chamber 10 regardless of measurement errors of the pressure sensor or the like, and it is excellent in operability and economy. There is.

この実施例2は、図9〜図11に示すように、少なくとも大気開放工程S6で実施例1の図6及び図8に代えて、図10及び図11に示されるように、一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、変圧室10の内圧P2よりも僅かに高く第三真空度(低真空圧)から大気圧まで上昇させるように制御する構成が、図1〜図8に示した実施例1とは異なり、それ以外の構成は図1〜図8に示した実施例1と同じものである。   In the second embodiment, as shown in FIGS. 9 to 11, at least in the atmosphere release step S <b> 6, instead of FIGS. 6 and 8 of the first embodiment, as shown in FIGS. 10 and 11, one suction chuck is used. A configuration in which the suction pressure P1 of the (upper suction chuck) 11 is controlled to be slightly higher than the internal pressure P2 of the variable pressure chamber 10 and increased from the third degree of vacuum (low vacuum pressure) to the atmospheric pressure is shown in FIGS. Unlike the first embodiment shown in FIG. 1, the other configuration is the same as that of the first embodiment shown in FIGS.

さらに、図9〜図11に示す実施例2は、昇圧工程S4で実施例1の図5及び図8に代えて、図9及び図11に示されるように、一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、変圧室10の内圧P2よりも僅かに高く第二真空度(中真空圧)から第三真空度(低真空圧)まで上昇させるように制御している。
また、その他の例として図示しないが、昇圧工程S4を実施例1の図5及び図8と同様に、一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、変圧室10の内圧P2の上昇と連動して同圧で第三真空度(低真空圧)へ上昇させるように制御することも可能である。
Further, in the second embodiment shown in FIG. 9 to FIG. 11, instead of FIG. 5 and FIG. 8 of the first embodiment in the boosting step S4, as shown in FIG. 9 and FIG. The suction pressure P1 of 11 is controlled to be slightly higher than the internal pressure P2 of the variable pressure chamber 10 from the second vacuum degree (medium vacuum pressure) to the third vacuum degree (low vacuum pressure).
Further, although not shown as another example, in the pressure increasing step S4, the suction pressure P1 of one suction chuck (upper suction chuck) 11 is set to the internal pressure P2 of the variable pressure chamber 10 in the same manner as in FIGS. It is also possible to control to increase to the third degree of vacuum (low vacuum pressure) with the same pressure in conjunction with the increase.

このような本発明の実施例2に係る貼合デバイスAの製造装置B及び製造方法によると、大気開放工程S6において、一方の吸引チャック(上吸引チャック)11の吸引圧力P1の上昇と、変圧室10の内圧P2の上昇との僅かな圧力差により、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面へ向け微量の空気が流れて、一方の吸引チャック(上吸引チャック)11のチャック面と一方の基板(上基板)1の表面の隙間が必然的に広がる。
したがって、簡単な制御で一方の基板(上基板)1を介して未硬化のシール材3に影響を全く与えることなく、一方の吸引チャック(上吸引チャック)11から一方の基板(上基板)1をより確実に分離させることができる。
その結果、低コストで一方の基板(上基板)1からの一方の吸引チャック(上吸引チャック)11の分離性能が向上し、基板1,2の貼り合わせ精度の更なる向上が図れるという利点がある。
さらに、図示例のように昇圧工程S4でも、一方の吸引チャック(上吸引チャック)11の吸引圧力P1を、変圧室10の内圧P2よりも僅かに高く第二真空度(中真空圧)から第三真空度(低真空圧)まで上昇させるように制御した場合には、昇圧工程S4において、一方の吸引チャック(上吸引チャック)11の吸引圧力P1の上昇と、変圧室10の内圧P2の上昇との僅かな圧力差により、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面へ向け微量の空気が流れて、一方の吸引チャック(上吸引チャック)11のチャック面と一方の基板(上基板)1の表面の隙間が必然的に広がる。
そのため、図示例の場合には、昇圧工程S4に進行すると、一方の吸引チャック(上吸引チャック)11のチャック面から一方の基板(上基板)1の表面が離脱し始める。
したがって、図1〜図8に示した実施例1よりも、一方の吸引チャック(上吸引チャック)11から一方の基板(上基板)1を更に容易且つ確実に分離させることができるという利点がある。
According to the manufacturing apparatus B and the manufacturing method of the bonding device A according to the second embodiment of the present invention, the increase in the suction pressure P1 of one suction chuck (upper suction chuck) 11 and the transformation in the atmosphere release step S6. Due to a slight pressure difference from the increase in the internal pressure P2 of the chamber 10, a small amount of air flows from the chuck surface of one suction chuck (upper suction chuck) 11 toward the surface of one substrate (upper substrate) 1, A gap between the chuck surface of the suction chuck (upper suction chuck) 11 and the surface of one substrate (upper substrate) 1 inevitably widens.
Therefore, from one suction chuck (upper suction chuck) 11 to one substrate (upper substrate) 1 without affecting the uncured sealing material 3 via one substrate (upper substrate) 1 by simple control. Can be more reliably separated.
As a result, the separation performance of one suction chuck (upper suction chuck) 11 from one substrate (upper substrate) 1 can be improved at a low cost, and the bonding accuracy of the substrates 1 and 2 can be further improved. is there.
Further, in the pressure increasing step S4 as in the illustrated example, the suction pressure P1 of one of the suction chucks (upper suction chuck) 11 is slightly higher than the internal pressure P2 of the variable pressure chamber 10 from the second vacuum degree (medium vacuum pressure). When control is performed so as to increase to three vacuum degrees (low vacuum pressure), in the pressure increasing step S4, the suction pressure P1 of one suction chuck (upper suction chuck) 11 is increased and the internal pressure P2 of the variable pressure chamber 10 is increased. Due to a slight pressure difference from the chuck surface, a small amount of air flows from the chuck surface of one suction chuck (upper suction chuck) 11 to the surface of one substrate (upper substrate) 1, and one suction chuck (upper suction chuck). The gap between the 11 chuck surfaces and the surface of one substrate (upper substrate) 1 inevitably widens.
Therefore, in the case of the illustrated example, when proceeding to the boosting step S4, the surface of one substrate (upper substrate) 1 starts to be detached from the chuck surface of one suction chuck (upper suction chuck) 11.
Therefore, there is an advantage that one substrate (upper substrate) 1 can be more easily and reliably separated from one suction chuck (upper suction chuck) 11 than the first embodiment shown in FIGS. .

なお、図示例では、駆動手段13で、吸引チャック11,12の両方をZ方向へ相対的に接近移動して基板1,2を重ね合わせているが、これに限定されず、吸引チャック11,12のいずれか一方を他方へ向け接近移動して基板1,2を重ね合わせてもよい。   In the illustrated example, both the suction chucks 11 and 12 are moved relatively close to each other in the Z direction by the driving unit 13 to superimpose the substrates 1 and 2. However, the present invention is not limited to this. The substrates 1 and 2 may be overlapped by moving one of 12 close to the other.

A 貼合デバイス 1 基板(上基板)
2 基板(下基板) 3 シール材
3s 封止空間 B 製造装置
10 変圧室 11 吸引チャック(上吸引チャック)
12 吸引チャック(下吸引チャック) 13 駆動手段
14 第一吸引圧調整手段 14b 吸引管路
14d 連絡管路 15 第二吸引圧調整手段
16 室圧調整手段 16b 排気管路
17 制御部 P1 一方の吸引チャックの吸引圧力
P2 変圧室の内圧 S2 均圧化工程
S4 昇圧工程 S6 大気開放工程
A bonding device 1 substrate (upper substrate)
2 Substrate (lower substrate) 3 Sealing material 3s Sealing space B Manufacturing equipment 10 Transformer chamber 11 Suction chuck (upper suction chuck)
12 suction chuck (lower suction chuck) 13 driving means 14 first suction pressure adjusting means 14b suction conduit 14d connecting conduit 15 second suction pressure adjusting means 16 chamber pressure adjusting means 16b exhaust conduit 17 controller P1 one suction chuck Suction pressure P2 Inner pressure in the transformer chamber S2 Pressure equalization process S4 Pressure increase process S6 Atmospheric release process

Claims (5)

減圧された変圧室内で一対の基板を重ね合わせて、それらの間に未硬化のシール材で囲まれる封止空間が形成され、前記変圧室の大気開放された内圧と前記封止空間の間で発生する圧力差により、前記基板を全体的に均等に加圧して所定のギャップで貼り合わせる貼合デバイスの製造装置であって、
前記基板が出し入れ自在に収容される前記変圧室と、
前記変圧室内において前記基板を前記シール材が挟み込まれるようにそれぞれ着脱自在に第一真空度で吸着保持する一対の吸引チャックと、
前記第一真空度よりも高圧な第二真空度に減圧された前記変圧室内で、前記吸引チャックのいずれか一方又は両方をZ方向へ相対的に接近移動させて前記基板を重ね合わせる駆動手段と、
前記吸引チャックのいずれか一方の吸引圧力を圧力調整する第一吸引圧調整手段と、
前記吸引チャックの他方の吸引圧力を圧力調整する第二吸引圧調整手段と、
前記変圧室の内圧を大気雰囲気から所定の真空圧まで圧力調整する室圧調整手段と、
前記駆動手段,前記第一吸引圧調整手段,前記第二吸引圧調整手段及び前記室圧調整手段をそれぞれ作動制御する制御部と、を備え、
前記制御部は、前記駆動手段により前記基板を前記第二真空度の前記変圧室内で重ね合わせて、前記基板の間に未硬化の前記シール材で囲まれる前記封止空間が形成された後に、前記第一吸引圧調整手段により前記吸引チャックのいずれか一方の吸引圧力を、前記基板重ね合わせ時の前記第一真空度からそれよりも高圧で且つ前記変圧室の内圧と均等な前記第二真空度へ上昇させ、その後、前記第一吸引圧調整手段及び前記室圧調整手段により、前記吸引チャックのいずれか一方の吸引圧力と前記変圧室の内圧を、前記第二真空度からそれよりも高圧で且つ大気圧よりも負圧の第三真空度までそれぞれ上昇させた後、前記第三真空度のまま所定時間に亘り維持して、前記基板間の前記封止空間との圧力差で前記吸引チャックのいずれか一方のチャック面から前記基板の一方が離れるように未硬化の前記シール材を圧縮変形させ、前記吸引チャックの一方のチャック面から前記基板の一方が離れた後に、前記吸引チャックのいずれか一方の吸引圧力と前記変圧室の内圧を、前記第三真空度から大気圧まで上昇させることを特徴とする貼合デバイスの製造装置。
A pair of substrates are overlapped in the reduced pressure chamber, and a sealed space surrounded by an uncured sealing material is formed between them. Between the internal pressure of the variable pressure chamber opened to the atmosphere and the sealed space. Due to the generated pressure difference, the substrate is a manufacturing apparatus of a bonding device that pressurizes the substrate uniformly and bonds it with a predetermined gap,
The variable pressure chamber in which the substrate is accommodated freely;
A pair of suction chucks that are detachably attached and held at a first degree of vacuum so that the sealing material is sandwiched in the transformer chamber;
Driving means for superimposing the substrates by relatively moving either one or both of the suction chucks in the Z direction in the variable pressure chamber reduced in pressure to a second degree of vacuum higher than the first degree of vacuum; ,
First suction pressure adjusting means for adjusting the suction pressure of any one of the suction chucks;
Second suction pressure adjusting means for adjusting the other suction pressure of the suction chuck;
Chamber pressure adjusting means for adjusting the internal pressure of the variable pressure chamber from an atmospheric atmosphere to a predetermined vacuum pressure;
A controller for controlling the operation of the driving means, the first suction pressure adjusting means, the second suction pressure adjusting means, and the chamber pressure adjusting means,
The controller is configured such that the substrate is overlapped in the transformation chamber having the second degree of vacuum by the driving unit, and the sealing space surrounded by the uncured sealing material is formed between the substrates. The first suction pressure adjusting means causes the suction pressure of any one of the suction chucks to be higher than the first vacuum degree when the substrates are superposed, and to be equal to the internal pressure of the variable pressure chamber. After that, the first suction pressure adjusting means and the chamber pressure adjusting means increase the suction pressure of one of the suction chucks and the internal pressure of the variable pressure chamber from the second vacuum degree to a higher pressure than that. In addition, the vacuum is raised to a third vacuum level that is a negative pressure from the atmospheric pressure, and then maintained at the third vacuum level for a predetermined time, and the suction is performed by the pressure difference between the substrates and the sealing space. One of the chucks The uncured sealing material is compressed and deformed so that one of the substrates is separated from the chuck surface, and after one of the substrates is separated from one chuck surface of the suction chuck, the suction pressure of one of the suction chucks And the internal pressure of the variable pressure chamber is increased from the third degree of vacuum to the atmospheric pressure.
前記第一吸引圧調整手段及び前記室圧調整手段により、前記吸引チャックのいずれか一方の吸引圧力と前記変圧室の内圧を、前記第二真空度から前記第三真空度へ向けて段階的に上昇させるように制御することを特徴とする請求項1記載の貼合デバイスの製造装置。   By the first suction pressure adjusting means and the chamber pressure adjusting means, the suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber are gradually increased from the second vacuum degree to the third vacuum degree. It controls so that it may raise, The manufacturing apparatus of the bonding device of Claim 1 characterized by the above-mentioned. 前記第一吸引圧調整手段が、前記吸引チャックのいずれか一方の吸引管路と前記変圧室の排気管路を連絡管路で連通させるように制御することを特徴とする請求項1又は2記載の貼合デバイスの製造装置。 The first suction pressure adjusting means, according to claim 1, wherein the controller controls the exhaust line of the variable pressure chamber either with one of the suction conduit of the suction chuck so as to communicate with the communication pipe line Manufacturing device for pasting devices. 前記吸引チャックのいずれか一方の吸引圧力を、前記変圧室の内圧よりも僅かに高く前記第三真空度から大気圧まで上昇させるように制御することを特徴とする請求項1又は2記載の貼合デバイスの製造装置。 The sticking pressure according to claim 1 or 2 , wherein the suction pressure of any one of the suction chucks is controlled to be slightly higher than the internal pressure of the variable pressure chamber and increased from the third degree of vacuum to the atmospheric pressure. Combined device manufacturing equipment. 変圧室内に一対の吸引チャックが相対的に互いに接近する方向へ移動自在に設けられ、前記吸引チャックに対して一対の基板を未硬化のシール材が挟み込まれるようにそれぞれ着脱自在に第一真空度で吸着保持し、前記第一真空度よりも高圧な第二真空度に減圧された前記変圧室内で前記吸引チャックの接近移動により前記基板を重ね合わせて、それらの間に前記シール材で囲まれる封止空間が形成され、前記変圧室の大気開放された内圧と前記封止空間の間で発生する圧力差により、前記基板を全体的に均等に加圧して所定のギャップで貼り合わせる貼合デバイスの製造方法であって、
前記基板の重ね合わせ後に、前記基板のいずれか一方に対する前記吸引チャックのいずれか一方の吸引圧力を、前記基板重ね合わせ時の前記第一真空度からそれよりも高圧な前記第二真空度へ上昇させ、前記変圧室の前記内圧と均等にして圧力差による前記基板の一方の吸着保持を解消する均圧化工程と、
前記均圧化工程の後に、前記吸引チャックのいずれか一方の吸引圧力及び前記変圧室の内圧を、前記第二真空度よりも高圧で且つ大気圧よりも負圧の第三真空度までそれぞれ上昇させる昇圧工程と、
前記昇圧工程の後に、前記吸引チャックのいずれか一方の吸引圧力及び前記変圧室の内圧を前記第三真空度のまま所定時間に亘って維持し、前記基板間の前記第二真空度の前記封止空間との圧力差で未硬化の前記シール材が圧縮変形して前記吸引チャックの一方から前記基板の一方を離す待機工程と、
前記待機工程で前記吸引チャックの一方から前記基板の一方が離れた後に、前記変圧室の内圧及び前記吸引チャックのいずれか一方の吸引圧力を、前記第三真空度から大気圧まで上昇させ、前記封止空間との圧力差で前記基板を所定のギャップに貼り合わせる大気開放工程と、を含むことを特徴とする貼合デバイスの製造方法。
A pair of suction chucks are movably provided in the transformer chamber so as to be relatively close to each other, and the pair of substrates are detachably attached to the suction chucks so that an uncured sealing material is sandwiched between them. The substrate is superposed by the close movement of the suction chuck in the variable pressure chamber that has been sucked and held and reduced to a second degree of vacuum higher than the first degree of vacuum, and is surrounded by the sealing material therebetween. A bonding device in which a sealed space is formed, and the substrate is uniformly pressed and bonded at a predetermined gap by a pressure difference generated between the internal pressure of the variable pressure chamber opened to the atmosphere and the sealed space. A manufacturing method of
After the superposition of the substrates, the suction pressure of any one of the suction chucks with respect to any one of the substrates is increased from the first vacuum degree during the superposition of the substrates to the second vacuum degree higher than that. And equalizing the internal pressure of the variable pressure chamber and canceling the adsorption holding of one of the substrates due to a pressure difference; and
After the pressure equalization step, the suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber are increased to a third vacuum level that is higher than the second vacuum level and negative than atmospheric pressure. Boosting step,
After the boosting step, the suction pressure of any one of the suction chucks and the internal pressure of the variable pressure chamber are maintained at the third vacuum degree for a predetermined time, and the sealing of the second vacuum degree between the substrates is performed. A standby step in which one of the substrates is separated from one of the suction chucks by compressing and deforming the uncured sealing material due to a pressure difference with a stop space;
After one of the substrates is separated from one of the suction chucks in the standby step , the internal pressure of the variable pressure chamber and the suction pressure of one of the suction chucks are increased from the third vacuum degree to the atmospheric pressure, And an atmosphere opening step of bonding the substrate to a predetermined gap with a pressure difference from the sealing space.
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Publication number Priority date Publication date Assignee Title
JP6737575B2 (en) * 2015-09-30 2020-08-12 Aiメカテック株式会社 Board assembly system, board assembly apparatus used in the system, and board assembly method using the system
CN106739424B (en) 2015-11-20 2020-02-14 财团法人工业技术研究院 Taking-down and bonding device, taking-down method and bonding method using same
CN106793488B (en) 2015-11-20 2019-04-30 财团法人工业技术研究院 Flexible electronic device and manufacturing process method thereof
JP6810584B2 (en) * 2016-11-30 2021-01-06 タツモ株式会社 Laminating device
CN107009718B (en) * 2017-05-10 2019-07-02 东莞市万丰纳米材料有限公司 Abutted equipment in bend glass vacuum
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CN110164798B (en) * 2019-05-29 2021-05-25 无锡胜脉电子有限公司 Packaging air pressure alarm control system based on ceramic substrate meter

Family Cites Families (10)

* Cited by examiner, † Cited by third party
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JPH1026763A (en) * 1996-07-11 1998-01-27 Seiko Epson Corp Production of liquid crystal panel and device therefor
JP4224959B2 (en) * 2001-08-21 2009-02-18 株式会社日立プラントテクノロジー Liquid crystal substrate assembly equipment
JP4248890B2 (en) * 2002-02-22 2009-04-02 芝浦メカトロニクス株式会社 Substrate bonding apparatus and substrate bonding method
JP4482395B2 (en) * 2004-08-03 2010-06-16 芝浦メカトロニクス株式会社 Substrate bonding method and bonding apparatus
JP3757231B1 (en) * 2005-06-20 2006-03-22 長州産業株式会社 Ferroelectric liquid crystal device manufacturing equipment
JP2007133145A (en) * 2005-11-10 2007-05-31 Ulvac Japan Ltd Substrate bonding apparatus and substrate bonding method
KR100846975B1 (en) * 2006-11-09 2008-07-17 삼성에스디아이 주식회사 Sealing device and method of manufacturing display device using the same
TW200914270A (en) * 2007-09-21 2009-04-01 Easy Field Corp Method for pasting touch panel and other optical glass on liquid crystal display (LCD)
US8245751B2 (en) * 2007-11-07 2012-08-21 Advanced Display Process Engineering Co., Ltd. Substrate bonding apparatus
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