JP5683469B2 - 大型プラズマ処理チャンバのrf復路 - Google Patents

大型プラズマ処理チャンバのrf復路 Download PDF

Info

Publication number
JP5683469B2
JP5683469B2 JP2011531218A JP2011531218A JP5683469B2 JP 5683469 B2 JP5683469 B2 JP 5683469B2 JP 2011531218 A JP2011531218 A JP 2011531218A JP 2011531218 A JP2011531218 A JP 2011531218A JP 5683469 B2 JP5683469 B2 JP 5683469B2
Authority
JP
Japan
Prior art keywords
chamber
substrate support
return path
support assembly
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2011531218A
Other languages
English (en)
Japanese (ja)
Other versions
JP2012505313A5 (https=
JP2012505313A (ja
Inventor
ジョン エム. ホワイト,
ジョン エム. ホワイト,
ソー ヤング チェ,
ソー ヤング チェ,
カール エー. ソレンセン,
カール エー. ソレンセン,
ジョゼフ クデラ,
ジョゼフ クデラ,
ジョンフン ベック,
ジョンフン ベック,
ジャージャン ジェリー チェン,
ジャージャン ジェリー チェン,
スティーヴン マクファーソン,
スティーヴン マクファーソン,
ロビン エル. ティナー,
ロビン エル. ティナー,
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of JP2012505313A publication Critical patent/JP2012505313A/ja
Publication of JP2012505313A5 publication Critical patent/JP2012505313A5/ja
Application granted granted Critical
Publication of JP5683469B2 publication Critical patent/JP5683469B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
    • C23C16/4585Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5096Flat-bed apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32091Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Vapour Deposition (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
JP2011531218A 2008-10-09 2009-10-09 大型プラズマ処理チャンバのrf復路 Active JP5683469B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US10425408P 2008-10-09 2008-10-09
US61/104,254 2008-10-09
US11474708P 2008-11-14 2008-11-14
US61/114,747 2008-11-14
PCT/US2009/060230 WO2010042860A2 (en) 2008-10-09 2009-10-09 Rf return path for large plasma processing chamber

Publications (3)

Publication Number Publication Date
JP2012505313A JP2012505313A (ja) 2012-03-01
JP2012505313A5 JP2012505313A5 (https=) 2014-05-22
JP5683469B2 true JP5683469B2 (ja) 2015-03-11

Family

ID=42097738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011531218A Active JP5683469B2 (ja) 2008-10-09 2009-10-09 大型プラズマ処理チャンバのrf復路

Country Status (6)

Country Link
US (1) US20100089319A1 (https=)
JP (1) JP5683469B2 (https=)
KR (1) KR101641130B1 (https=)
CN (1) CN102177769B (https=)
TW (1) TWI495402B (https=)
WO (1) WO2010042860A2 (https=)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7972470B2 (en) * 2007-05-03 2011-07-05 Applied Materials, Inc. Asymmetric grounding of rectangular susceptor
US8251009B2 (en) * 2008-05-14 2012-08-28 Applied Materials, Inc. Shadow frame having alignment inserts
WO2010094002A2 (en) * 2009-02-13 2010-08-19 Applied Materials, Inc. Rf bus and rf return bus for plasma chamber electrode
US9039864B2 (en) * 2009-09-29 2015-05-26 Applied Materials, Inc. Off-center ground return for RF-powered showerhead
JP5835722B2 (ja) 2009-12-10 2015-12-24 オルボテック エルティ ソラー,エルエルシー 自動順位付け多方向直列型処理装置
JP5591585B2 (ja) * 2010-05-17 2014-09-17 東京エレクトロン株式会社 プラズマ処理装置
US20120267049A1 (en) * 2011-04-25 2012-10-25 Craig Lyle Stevens Grounding assembly for vacuum processing apparatus
US8459276B2 (en) 2011-05-24 2013-06-11 Orbotech LT Solar, LLC. Broken wafer recovery system
ITTO20110726A1 (it) * 2011-08-04 2013-02-05 Pramac Swiss S A Perfezionamenti nelle camere di reazione per la deposizione di film sottili, particolarmente per la produzione di moduli fotovoltaici
SG11201402058TA (en) * 2011-11-24 2014-09-26 Lam Res Corp Symmetric rf return path liner
US8847495B2 (en) * 2011-11-29 2014-09-30 Lam Research Corporation Movable grounding arrangements in a plasma processing chamber and methods therefor
CN204375716U (zh) * 2012-03-05 2015-06-03 应用材料公司 遮蔽框、基板支撑件以及等离子体增强型化学气相沉积设备
US8911588B2 (en) * 2012-03-19 2014-12-16 Lam Research Corporation Methods and apparatus for selectively modifying RF current paths in a plasma processing system
US9230779B2 (en) * 2012-03-19 2016-01-05 Lam Research Corporation Methods and apparatus for correcting for non-uniformity in a plasma processing system
US9340866B2 (en) * 2012-03-30 2016-05-17 Applied Materials, Inc. Substrate support with radio frequency (RF) return path
CN103456591B (zh) * 2012-05-31 2016-04-06 中微半导体设备(上海)有限公司 自动频率调谐源和偏置射频电源的电感耦合等离子处理室
US9245720B2 (en) * 2012-06-12 2016-01-26 Lam Research Corporation Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system
WO2014062323A1 (en) * 2012-10-18 2014-04-24 Applied Materials, Inc. Shadow frame support
KR200483130Y1 (ko) * 2012-10-20 2017-04-18 어플라이드 머티어리얼스, 인코포레이티드 세그먼트화된 포커스 링 조립체
KR102086549B1 (ko) * 2013-05-06 2020-03-10 삼성디스플레이 주식회사 증착원 어셈블리
KR102152811B1 (ko) 2013-11-06 2020-09-07 어플라이드 머티어리얼스, 인코포레이티드 Dc 바이어스 변조에 의한 입자 발생 억제기
KR102363241B1 (ko) 2015-03-27 2022-02-16 삼성전자주식회사 플라즈마 강화 화학기상 증착 장비 및 그 동작 방법
JP6670697B2 (ja) * 2016-04-28 2020-03-25 東京エレクトロン株式会社 プラズマ処理装置
US20170365449A1 (en) * 2016-06-21 2017-12-21 Applied Materials, Inc. Rf return strap shielding cover
KR102242988B1 (ko) * 2016-06-22 2021-04-20 가부시키가이샤 아루박 플라즈마 처리장치
KR102399343B1 (ko) * 2017-05-29 2022-05-19 삼성디스플레이 주식회사 화학기상 증착장치
US20190043698A1 (en) * 2017-08-03 2019-02-07 Applied Materials, Inc. Electrostatic shield for substrate support
CN108103473B (zh) * 2017-12-18 2020-04-24 沈阳拓荆科技有限公司 用于半导体处理腔体的遮蔽装置及其使用方法
US10923327B2 (en) * 2018-08-01 2021-02-16 Applied Materials, Inc. Chamber liner
US10790466B2 (en) * 2018-12-11 2020-09-29 Feng-wen Yen In-line system for mass production of organic optoelectronic device and manufacturing method using the same system
WO2020242817A1 (en) * 2019-05-30 2020-12-03 Applied Materials, Inc. Atomic layer deposition reactor design for uniform flow distribution
JP7733638B2 (ja) * 2019-08-02 2025-09-03 アプライド マテリアルズ インコーポレイテッド 高周波電力リターン経路
CN112447475B (zh) * 2019-09-05 2023-09-29 中微半导体设备(上海)股份有限公司 一种具有柔性电介质薄片的等离子体处理装置
JP7385023B2 (ja) * 2019-09-26 2023-11-21 アプライド マテリアルズ インコーポレイテッド 基板処理用支持体ブラケット装置および方法
US20230059495A1 (en) * 2020-02-04 2023-02-23 Lam Research Corporation Optimization of Radiofrequency Signal Ground Return in Plasma Processing System
US11335543B2 (en) * 2020-03-25 2022-05-17 Applied Materials, Inc. RF return path for reduction of parasitic plasma
US11443921B2 (en) * 2020-06-11 2022-09-13 Applied Materials, Inc. Radio frequency ground system and method
KR102825317B1 (ko) * 2020-11-19 2025-06-26 삼성전자주식회사 반도체 소자의 제조 장치 및 반도체 소자의 제조 방법
KR102846682B1 (ko) * 2021-04-01 2025-08-13 어플라이드 머티어리얼스, 인코포레이티드 플라즈마를 이용한 박막 형성을 위한 접지 리턴
US12378669B2 (en) 2022-01-28 2025-08-05 Applied Materials, Inc. Ground return for thin film formation using plasma

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US549632A (en) * 1895-11-12 Machine
US3760342A (en) * 1971-09-17 1973-09-18 Essex International Inc Terminal construction for electrical conductors
KR100276093B1 (ko) * 1992-10-19 2000-12-15 히가시 데쓰로 플라스마 에칭방법
US5380566A (en) * 1993-06-21 1995-01-10 Applied Materials, Inc. Method of limiting sticking of body to susceptor in a deposition treatment
US5558717A (en) * 1994-11-30 1996-09-24 Applied Materials CVD Processing chamber
US5900062A (en) * 1995-12-28 1999-05-04 Applied Materials, Inc. Lift pin for dechucking substrates
US6012600A (en) * 1996-02-02 2000-01-11 Applied Materials, Inc. Pressure responsive clamp for a processing chamber
US6345589B1 (en) * 1996-03-29 2002-02-12 Applied Materials, Inc. Method and apparatus for forming a borophosphosilicate film
US5764471A (en) * 1996-05-08 1998-06-09 Applied Materials, Inc. Method and apparatus for balancing an electrostatic force produced by an electrostatic chuck
US6254746B1 (en) * 1996-05-09 2001-07-03 Applied Materials, Inc. Recessed coil for generating a plasma
US5900064A (en) * 1997-05-01 1999-05-04 Applied Materials, Inc. Plasma process chamber
US5894400A (en) * 1997-05-29 1999-04-13 Wj Semiconductor Equipment Group, Inc. Method and apparatus for clamping a substrate
US6057235A (en) * 1997-09-15 2000-05-02 Micron Technology, Inc. Method for reducing surface charge on semiconducter wafers to prevent arcing during plasma deposition
US6024044A (en) * 1997-10-09 2000-02-15 Applied Komatsu Technology, Inc. Dual frequency excitation of plasma for film deposition
US6129808A (en) * 1998-03-31 2000-10-10 Lam Research Corporation Low contamination high density plasma etch chambers and methods for making the same
CN1189595C (zh) * 1998-04-13 2005-02-16 东京电子株式会社 阻抗减小的室
US6221221B1 (en) * 1998-11-16 2001-04-24 Applied Materials, Inc. Apparatus for providing RF return current path control in a semiconductor wafer processing system
US6349670B1 (en) * 1998-11-30 2002-02-26 Alps Electric Co., Ltd. Plasma treatment equipment
US6531030B1 (en) * 2000-03-31 2003-03-11 Lam Research Corp. Inductively coupled plasma etching apparatus
US6779481B2 (en) * 2000-04-27 2004-08-24 Tokyo Electron Limited Electrical coupling between chamber parts in electronic device processing equipment
US6857387B1 (en) * 2000-05-03 2005-02-22 Applied Materials, Inc. Multiple frequency plasma chamber with grounding capacitor at cathode
US6364958B1 (en) * 2000-05-24 2002-04-02 Applied Materials, Inc. Plasma assisted semiconductor substrate processing chamber having a plurality of ground path bridges
JP2001338914A (ja) * 2000-05-30 2001-12-07 Tokyo Electron Ltd ガス導入機構およびガス導入方法、ガスリーク検出方法、ならびに真空処理装置
EP1174910A3 (en) * 2000-07-20 2010-01-06 Applied Materials, Inc. Method and apparatus for dechucking a substrate
US7202690B2 (en) * 2001-02-19 2007-04-10 Nidec-Read Corporation Substrate inspection device and substrate inspecting method
US6770166B1 (en) * 2001-06-29 2004-08-03 Lam Research Corp. Apparatus and method for radio frequency de-coupling and bias voltage control in a plasma reactor
US6652713B2 (en) * 2001-08-09 2003-11-25 Applied Materials, Inc. Pedestal with integral shield
US20030236004A1 (en) * 2002-06-24 2003-12-25 Applied Materials, Inc. Dechucking with N2/O2 plasma
US7083702B2 (en) * 2003-06-12 2006-08-01 Applied Materials, Inc. RF current return path for a large area substrate plasma reactor
JP4831803B2 (ja) * 2003-11-19 2011-12-07 三菱重工業株式会社 基板処理装置
JP4550507B2 (ja) * 2004-07-26 2010-09-22 株式会社日立ハイテクノロジーズ プラズマ処理装置
US7375946B2 (en) * 2004-08-16 2008-05-20 Applied Materials, Inc. Method and apparatus for dechucking a substrate
US7534301B2 (en) * 2004-09-21 2009-05-19 Applied Materials, Inc. RF grounding of cathode in process chamber
US20060172536A1 (en) * 2005-02-03 2006-08-03 Brown Karl M Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece
US20070012558A1 (en) * 2005-07-13 2007-01-18 Applied Materials, Inc. Magnetron sputtering system for large-area substrates
US8381677B2 (en) * 2006-12-20 2013-02-26 Applied Materials, Inc. Prevention of film deposition on PECVD process chamber wall
US7968469B2 (en) * 2007-01-30 2011-06-28 Applied Materials, Inc. Method of processing a workpiece in a plasma reactor with variable height ground return path to control plasma ion density uniformity
JP4887202B2 (ja) * 2007-04-17 2012-02-29 東京エレクトロン株式会社 プラズマ処理装置及び高周波電流の短絡回路

Also Published As

Publication number Publication date
KR101641130B1 (ko) 2016-07-20
CN102177769B (zh) 2016-02-03
WO2010042860A2 (en) 2010-04-15
CN102177769A (zh) 2011-09-07
KR20110069854A (ko) 2011-06-23
JP2012505313A (ja) 2012-03-01
US20100089319A1 (en) 2010-04-15
WO2010042860A3 (en) 2010-07-15
TW201031284A (en) 2010-08-16
TWI495402B (zh) 2015-08-01

Similar Documents

Publication Publication Date Title
JP5683469B2 (ja) 大型プラズマ処理チャンバのrf復路
US11984306B2 (en) Plasma chamber and chamber component cleaning methods
KR101593460B1 (ko) 플라즈마 프로세스를 위한 접지 귀환
KR102242988B1 (ko) 플라즈마 처리장치
KR100938635B1 (ko) 반경 방향 플라즈마 분포에 대한 개선된 자기 제어를 위한플라즈마 제한 배플 및 유동비 이퀄라이저
US8691047B2 (en) Large area plasma processing chamber with at-electrode RF matching
US20080202689A1 (en) Plasma processing apparatus
US20090126634A1 (en) Plasma processing apparatus
KR101742005B1 (ko) 아크­방지 제로 필드 플레이트
US20100144160A1 (en) Plasma reactor substrate mounting surface texturing
JP2012230900A (ja) 真空処理装置用の接地アセンブリ
US11488804B2 (en) Shower head assembly and plasma processing apparatus having the same
JP2021064695A (ja) 基板処理装置及び基板処理方法
KR20180014656A (ko) 기판 처리 장치 및 기판 처리 방법
KR102380156B1 (ko) 플라즈마 화학 기상 증착 장치
KR102735428B1 (ko) 기판의 이송 효율이 향상된 기판 처리 장치
KR102739848B1 (ko) 접지 스트랩 조립체들
KR102878028B1 (ko) 적재대 및 플라스마 처리 장치
CN110396664B (zh) 接地环、腔室以及物理气相沉积设备
TW202228185A (zh) 電漿蝕刻設備
KR102893563B1 (ko) 라디오 주파수 접지 시스템 및 방법
CN112400223A (zh) 腔室衬垫
JP7492900B2 (ja) プラズマ処理装置
JPH0878346A (ja) プラズマ成膜装置
WO2025250126A1 (en) Edge susceptor design to promote uniform film deposition

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20121002

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20131031

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20131105

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20140204

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20140212

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20140303

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20140310

A524 Written submission of copy of amendment under article 19 pct

Free format text: JAPANESE INTERMEDIATE CODE: A524

Effective date: 20140403

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140715

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141008

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20141216

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150113

R150 Certificate of patent or registration of utility model

Ref document number: 5683469

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250