JP5672853B2 - 放射線撮像装置 - Google Patents

放射線撮像装置 Download PDF

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Publication number
JP5672853B2
JP5672853B2 JP2010188100A JP2010188100A JP5672853B2 JP 5672853 B2 JP5672853 B2 JP 5672853B2 JP 2010188100 A JP2010188100 A JP 2010188100A JP 2010188100 A JP2010188100 A JP 2010188100A JP 5672853 B2 JP5672853 B2 JP 5672853B2
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JP
Japan
Prior art keywords
correction
data
unit
imaging apparatus
radiation imaging
Prior art date
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Expired - Fee Related
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JP2010188100A
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English (en)
Japanese (ja)
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JP2012047516A5 (enExample
JP2012047516A (ja
Inventor
千田　みちる
みちる 千田
田中　勉
田中　　勉
勉 原田
勉 原田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
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Sony Corp
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Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2010188100A priority Critical patent/JP5672853B2/ja
Priority to US13/137,209 priority patent/US8618492B2/en
Priority to TW100127797A priority patent/TWI466540B/zh
Priority to CN201110245646.2A priority patent/CN102420945B/zh
Publication of JP2012047516A publication Critical patent/JP2012047516A/ja
Publication of JP2012047516A5 publication Critical patent/JP2012047516A5/ja
Priority to US14/072,114 priority patent/US8859978B2/en
Application granted granted Critical
Publication of JP5672853B2 publication Critical patent/JP5672853B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2010188100A 2010-08-25 2010-08-25 放射線撮像装置 Expired - Fee Related JP5672853B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010188100A JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置
US13/137,209 US8618492B2 (en) 2010-08-25 2011-07-28 Radiation image pickup device
TW100127797A TWI466540B (zh) 2010-08-25 2011-08-04 輻射影像拾取裝置
CN201110245646.2A CN102420945B (zh) 2010-08-25 2011-08-25 放射线图像拾取设备
US14/072,114 US8859978B2 (en) 2010-08-25 2013-11-05 Radiation image pickup device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010188100A JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置

Publications (3)

Publication Number Publication Date
JP2012047516A JP2012047516A (ja) 2012-03-08
JP2012047516A5 JP2012047516A5 (enExample) 2013-09-19
JP5672853B2 true JP5672853B2 (ja) 2015-02-18

Family

ID=45695874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010188100A Expired - Fee Related JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置

Country Status (4)

Country Link
US (2) US8618492B2 (enExample)
JP (1) JP5672853B2 (enExample)
CN (1) CN102420945B (enExample)
TW (1) TWI466540B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8872120B2 (en) 2012-08-23 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Imaging device and method for driving the same
KR102069683B1 (ko) * 2012-08-24 2020-01-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 방사선 검출 패널, 방사선 촬상 장치, 및 화상 진단 장치
JP5996442B2 (ja) * 2013-01-10 2016-09-21 アンリツインフィビス株式会社 Ｘ線検査装置
CN103200367B (zh) * 2013-04-15 2016-01-13 华为技术有限公司 一种视频监控设备及补光装置
EP2793053A1 (de) * 2013-04-16 2014-10-22 Agfa HealthCare N.V. Verfahren und Vorrichtungen zum Auslesen von in einer Speicherleuchtstoffschicht gespeicherten Röntgeninformationen
JP2015023359A (ja) * 2013-07-17 2015-02-02 ソニー株式会社 照射装置、照射方法及びプログラム
KR20170072889A (ko) * 2014-10-10 2017-06-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치
JP6541344B2 (ja) * 2014-12-22 2019-07-10 キヤノン株式会社 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法
KR20190030640A (ko) * 2016-03-18 2019-03-22 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 복수의 방사선을 동시에 검출하기 위한 방사선 검출기
CN105935296B (zh) * 2016-04-13 2019-03-08 成都京东方光电科技有限公司 一种像元电路、数字x射线探测装置及其探测方法
KR20250024036A (ko) * 2022-06-15 2025-02-18 소니 세미컨덕터 솔루션즈 가부시키가이샤 고체 촬상 소자, 및 촬상 장치

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0772256A (ja) * 1993-09-01 1995-03-17 Fuji Photo Film Co Ltd 画像信号補正装置および方法
JPH11307756A (ja) 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
US6393098B1 (en) * 1999-08-31 2002-05-21 General Electric Company Amplifier offset and gain correction system for X-ray imaging panel
JP2001189929A (ja) * 1999-12-28 2001-07-10 Shimadzu Corp Ｘ線透視画像装置
EP1301031A1 (de) * 2001-09-29 2003-04-09 Philips Corporate Intellectual Property GmbH Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren
JP2003284707A (ja) * 2002-03-27 2003-10-07 Canon Inc 撮影装置、ゲイン補正方法、記録媒体及びプログラム
JP2004053584A (ja) * 2002-05-30 2004-02-19 Canon Inc 画像補正装置及び方法
JP2006068512A (ja) * 2004-08-06 2006-03-16 Canon Inc 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム
JP4965931B2 (ja) * 2005-08-17 2012-07-04 キヤノン株式会社 放射線撮像装置、放射線撮像システム、その制御方法、及び制御プログラム
JP4812503B2 (ja) 2006-04-13 2011-11-09 株式会社日立メディコ Ｘ線撮影装置
JP4989120B2 (ja) * 2006-06-16 2012-08-01 キヤノン株式会社 放射線撮像システム及びその駆動方法
JP4931546B2 (ja) * 2006-10-24 2012-05-16 ソニー株式会社 固体撮像装置及び撮像装置
JP5121473B2 (ja) * 2007-02-01 2013-01-16 キヤノン株式会社 放射線撮像装置、その制御方法及び放射線撮像システム
DE102007013620A1 (de) * 2007-03-21 2008-09-25 Siemens Ag Vorrichtung und Verfahren zur Überwachung von Festkörperdetektoren
JP2009141439A (ja) * 2007-12-03 2009-06-25 Canon Inc 放射線撮像装置、その駆動方法及びプログラム
JP5407264B2 (ja) * 2008-10-09 2014-02-05 ソニー株式会社 固体撮像素子およびカメラシステム
US8054355B2 (en) * 2008-10-16 2011-11-08 Omnivision Technologies, Inc. Image sensor having multiple sensing layers

Also Published As

Publication number Publication date
US8618492B2 (en) 2013-12-31
US8859978B2 (en) 2014-10-14
CN102420945B (zh) 2017-12-26
TWI466540B (zh) 2014-12-21
US20120049078A1 (en) 2012-03-01
US20140061484A1 (en) 2014-03-06
CN102420945A (zh) 2012-04-18
TW201234850A (en) 2012-08-16
JP2012047516A (ja) 2012-03-08

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