TWI466540B - 輻射影像拾取裝置 - Google Patents

輻射影像拾取裝置 Download PDF

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Publication number
TWI466540B
TWI466540B TW100127797A TW100127797A TWI466540B TW I466540 B TWI466540 B TW I466540B TW 100127797 A TW100127797 A TW 100127797A TW 100127797 A TW100127797 A TW 100127797A TW I466540 B TWI466540 B TW I466540B
Authority
TW
Taiwan
Prior art keywords
correction
data
section
image pickup
input
Prior art date
Application number
TW100127797A
Other languages
English (en)
Chinese (zh)
Other versions
TW201234850A (en
Inventor
千田滿
田中勉
原田勉
Original Assignee
新力股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 新力股份有限公司 filed Critical 新力股份有限公司
Publication of TW201234850A publication Critical patent/TW201234850A/zh
Application granted granted Critical
Publication of TWI466540B publication Critical patent/TWI466540B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
TW100127797A 2010-08-25 2011-08-04 輻射影像拾取裝置 TWI466540B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010188100A JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置

Publications (2)

Publication Number Publication Date
TW201234850A TW201234850A (en) 2012-08-16
TWI466540B true TWI466540B (zh) 2014-12-21

Family

ID=45695874

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100127797A TWI466540B (zh) 2010-08-25 2011-08-04 輻射影像拾取裝置

Country Status (4)

Country Link
US (2) US8618492B2 (enExample)
JP (1) JP5672853B2 (enExample)
CN (1) CN102420945B (enExample)
TW (1) TWI466540B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8872120B2 (en) 2012-08-23 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Imaging device and method for driving the same
KR102069683B1 (ko) * 2012-08-24 2020-01-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 방사선 검출 패널, 방사선 촬상 장치, 및 화상 진단 장치
JP5996442B2 (ja) * 2013-01-10 2016-09-21 アンリツインフィビス株式会社 Ｘ線検査装置
CN103200367B (zh) * 2013-04-15 2016-01-13 华为技术有限公司 一种视频监控设备及补光装置
EP2793053A1 (de) * 2013-04-16 2014-10-22 Agfa HealthCare N.V. Verfahren und Vorrichtungen zum Auslesen von in einer Speicherleuchtstoffschicht gespeicherten Röntgeninformationen
JP2015023359A (ja) * 2013-07-17 2015-02-02 ソニー株式会社 照射装置、照射方法及びプログラム
KR20170072889A (ko) * 2014-10-10 2017-06-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치
JP6541344B2 (ja) * 2014-12-22 2019-07-10 キヤノン株式会社 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法
US20200292719A1 (en) * 2016-03-18 2020-09-17 Board Of Regents, The University Of Texas System Radiation detector
CN105935296B (zh) * 2016-04-13 2019-03-08 成都京东方光电科技有限公司 一种像元电路、数字x射线探测装置及其探测方法
KR20250024036A (ko) * 2022-06-15 2025-02-18 소니 세미컨덕터 솔루션즈 가부시키가이샤 고체 촬상 소자, 및 촬상 장치

Citations (5)

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Publication number Priority date Publication date Assignee Title
US6393098B1 (en) * 1999-08-31 2002-05-21 General Electric Company Amplifier offset and gain correction system for X-ray imaging panel
US6854885B2 (en) * 2001-09-29 2005-02-15 Koninklijke Philips Electronics N.V. Method for the correction of unequal conversion characteristics of image sensors
US7026608B2 (en) * 2002-03-27 2006-04-11 Canon Kabushiki Kaisha Gain correction of image signal and calibration for gain correction
TW201018223A (en) * 2008-10-09 2010-05-01 Sony Corp Solid-state image sensor and camera system
TW201025583A (en) * 2008-10-16 2010-07-01 Eastman Kodak Co Image sensor having multiple sensing layers

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Publication number Priority date Publication date Assignee Title
JPH0772256A (ja) * 1993-09-01 1995-03-17 Fuji Photo Film Co Ltd 画像信号補正装置および方法
JPH11307756A (ja) 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
JP2001189929A (ja) * 1999-12-28 2001-07-10 Shimadzu Corp Ｘ線透視画像装置
JP2004053584A (ja) * 2002-05-30 2004-02-19 Canon Inc 画像補正装置及び方法
JP2006068512A (ja) * 2004-08-06 2006-03-16 Canon Inc 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム
JP4965931B2 (ja) * 2005-08-17 2012-07-04 キヤノン株式会社 放射線撮像装置、放射線撮像システム、その制御方法、及び制御プログラム
JP4812503B2 (ja) 2006-04-13 2011-11-09 株式会社日立メディコ Ｘ線撮影装置
JP4989120B2 (ja) * 2006-06-16 2012-08-01 キヤノン株式会社 放射線撮像システム及びその駆動方法
JP4931546B2 (ja) * 2006-10-24 2012-05-16 ソニー株式会社 固体撮像装置及び撮像装置
JP5121473B2 (ja) * 2007-02-01 2013-01-16 キヤノン株式会社 放射線撮像装置、その制御方法及び放射線撮像システム
DE102007013620A1 (de) * 2007-03-21 2008-09-25 Siemens Ag Vorrichtung und Verfahren zur Überwachung von Festkörperdetektoren
JP2009141439A (ja) * 2007-12-03 2009-06-25 Canon Inc 放射線撮像装置、その駆動方法及びプログラム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6393098B1 (en) * 1999-08-31 2002-05-21 General Electric Company Amplifier offset and gain correction system for X-ray imaging panel
US6854885B2 (en) * 2001-09-29 2005-02-15 Koninklijke Philips Electronics N.V. Method for the correction of unequal conversion characteristics of image sensors
US7026608B2 (en) * 2002-03-27 2006-04-11 Canon Kabushiki Kaisha Gain correction of image signal and calibration for gain correction
TW201018223A (en) * 2008-10-09 2010-05-01 Sony Corp Solid-state image sensor and camera system
TW201025583A (en) * 2008-10-16 2010-07-01 Eastman Kodak Co Image sensor having multiple sensing layers

Also Published As

Publication number Publication date
JP5672853B2 (ja) 2015-02-18
US20120049078A1 (en) 2012-03-01
CN102420945A (zh) 2012-04-18
US8618492B2 (en) 2013-12-31
US8859978B2 (en) 2014-10-14
TW201234850A (en) 2012-08-16
JP2012047516A (ja) 2012-03-08
US20140061484A1 (en) 2014-03-06
CN102420945B (zh) 2017-12-26

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