JP2012047516A5 - - Google Patents
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- JP2012047516A5 JP2012047516A5 JP2010188100A JP2010188100A JP2012047516A5 JP 2012047516 A5 JP2012047516 A5 JP 2012047516A5 JP 2010188100 A JP2010188100 A JP 2010188100A JP 2010188100 A JP2010188100 A JP 2010188100A JP 2012047516 A5 JP2012047516 A5 JP 2012047516A5
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- voltage
- amplifier
- output
- source follower
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010188100A JP5672853B2 (ja) | 2010-08-25 | 2010-08-25 | 放射線撮像装置 |
| US13/137,209 US8618492B2 (en) | 2010-08-25 | 2011-07-28 | Radiation image pickup device |
| TW100127797A TWI466540B (zh) | 2010-08-25 | 2011-08-04 | 輻射影像拾取裝置 |
| CN201110245646.2A CN102420945B (zh) | 2010-08-25 | 2011-08-25 | 放射线图像拾取设备 |
| US14/072,114 US8859978B2 (en) | 2010-08-25 | 2013-11-05 | Radiation image pickup device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010188100A JP5672853B2 (ja) | 2010-08-25 | 2010-08-25 | 放射線撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012047516A JP2012047516A (ja) | 2012-03-08 |
| JP2012047516A5 true JP2012047516A5 (enExample) | 2013-09-19 |
| JP5672853B2 JP5672853B2 (ja) | 2015-02-18 |
Family
ID=45695874
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010188100A Expired - Fee Related JP5672853B2 (ja) | 2010-08-25 | 2010-08-25 | 放射線撮像装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8618492B2 (enExample) |
| JP (1) | JP5672853B2 (enExample) |
| CN (1) | CN102420945B (enExample) |
| TW (1) | TWI466540B (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8872120B2 (en) | 2012-08-23 | 2014-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and method for driving the same |
| KR102069683B1 (ko) * | 2012-08-24 | 2020-01-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 방사선 검출 패널, 방사선 촬상 장치, 및 화상 진단 장치 |
| JP5996442B2 (ja) * | 2013-01-10 | 2016-09-21 | アンリツインフィビス株式会社 | Ｘ線検査装置 |
| CN103200367B (zh) * | 2013-04-15 | 2016-01-13 | 华为技术有限公司 | 一种视频监控设备及补光装置 |
| EP2793053A1 (de) * | 2013-04-16 | 2014-10-22 | Agfa HealthCare N.V. | Verfahren und Vorrichtungen zum Auslesen von in einer Speicherleuchtstoffschicht gespeicherten Röntgeninformationen |
| JP2015023359A (ja) * | 2013-07-17 | 2015-02-02 | ソニー株式会社 | 照射装置、照射方法及びプログラム |
| KR20170072889A (ko) * | 2014-10-10 | 2017-06-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 촬상 장치 |
| JP6541344B2 (ja) * | 2014-12-22 | 2019-07-10 | キヤノン株式会社 | 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法 |
| KR20190030640A (ko) * | 2016-03-18 | 2019-03-22 | 보드 오브 리전츠, 더 유니버시티 오브 텍사스 시스템 | 복수의 방사선을 동시에 검출하기 위한 방사선 검출기 |
| CN105935296B (zh) * | 2016-04-13 | 2019-03-08 | 成都京东方光电科技有限公司 | 一种像元电路、数字x射线探测装置及其探测方法 |
| KR20250024036A (ko) * | 2022-06-15 | 2025-02-18 | 소니 세미컨덕터 솔루션즈 가부시키가이샤 | 고체 촬상 소자, 및 촬상 장치 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0772256A (ja) * | 1993-09-01 | 1995-03-17 | Fuji Photo Film Co Ltd | 画像信号補正装置および方法 |
| JPH11307756A (ja) | 1998-02-20 | 1999-11-05 | Canon Inc | 光電変換装置および放射線読取装置 |
| US6393098B1 (en) * | 1999-08-31 | 2002-05-21 | General Electric Company | Amplifier offset and gain correction system for X-ray imaging panel |
| JP2001189929A (ja) * | 1999-12-28 | 2001-07-10 | Shimadzu Corp | Ｘ線透視画像装置 |
| EP1301031A1 (de) * | 2001-09-29 | 2003-04-09 | Philips Corporate Intellectual Property GmbH | Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren |
| JP2003284707A (ja) * | 2002-03-27 | 2003-10-07 | Canon Inc | 撮影装置、ゲイン補正方法、記録媒体及びプログラム |
| JP2004053584A (ja) * | 2002-05-30 | 2004-02-19 | Canon Inc | 画像補正装置及び方法 |
| JP2006068512A (ja) * | 2004-08-06 | 2006-03-16 | Canon Inc | 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム |
| JP4965931B2 (ja) * | 2005-08-17 | 2012-07-04 | キヤノン株式会社 | 放射線撮像装置、放射線撮像システム、その制御方法、及び制御プログラム |
| JP4812503B2 (ja) | 2006-04-13 | 2011-11-09 | 株式会社日立メディコ | Ｘ線撮影装置 |
| JP4989120B2 (ja) * | 2006-06-16 | 2012-08-01 | キヤノン株式会社 | 放射線撮像システム及びその駆動方法 |
| JP4931546B2 (ja) * | 2006-10-24 | 2012-05-16 | ソニー株式会社 | 固体撮像装置及び撮像装置 |
| JP5121473B2 (ja) * | 2007-02-01 | 2013-01-16 | キヤノン株式会社 | 放射線撮像装置、その制御方法及び放射線撮像システム |
| DE102007013620A1 (de) * | 2007-03-21 | 2008-09-25 | Siemens Ag | Vorrichtung und Verfahren zur Überwachung von Festkörperdetektoren |
| JP2009141439A (ja) * | 2007-12-03 | 2009-06-25 | Canon Inc | 放射線撮像装置、その駆動方法及びプログラム |
| JP5407264B2 (ja) * | 2008-10-09 | 2014-02-05 | ソニー株式会社 | 固体撮像素子およびカメラシステム |
| US8054355B2 (en) * | 2008-10-16 | 2011-11-08 | Omnivision Technologies, Inc. | Image sensor having multiple sensing layers |
-
2010
- 2010-08-25 JP JP2010188100A patent/JP5672853B2/ja not_active Expired - Fee Related
-
2011
- 2011-07-28 US US13/137,209 patent/US8618492B2/en not_active Expired - Fee Related
- 2011-08-04 TW TW100127797A patent/TWI466540B/zh not_active IP Right Cessation
- 2011-08-25 CN CN201110245646.2A patent/CN102420945B/zh not_active Expired - Fee Related
-
2013
- 2013-11-05 US US14/072,114 patent/US8859978B2/en not_active Expired - Fee Related