JP5621673B2 - 検波回路 - Google Patents

検波回路 Download PDF

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Publication number
JP5621673B2
JP5621673B2 JP2011060334A JP2011060334A JP5621673B2 JP 5621673 B2 JP5621673 B2 JP 5621673B2 JP 2011060334 A JP2011060334 A JP 2011060334A JP 2011060334 A JP2011060334 A JP 2011060334A JP 5621673 B2 JP5621673 B2 JP 5621673B2
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JP
Japan
Prior art keywords
current
circuit
diode
resistor
calibration
Prior art date
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Active
Application number
JP2011060334A
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English (en)
Japanese (ja)
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JP2012195910A (ja
Inventor
中本　裕之
裕之 中本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Semiconductor Ltd
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Fujitsu Semiconductor Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Semiconductor Ltd filed Critical Fujitsu Semiconductor Ltd
Priority to JP2011060334A priority Critical patent/JP5621673B2/ja
Priority to US13/405,968 priority patent/US8604836B2/en
Priority to CN201410191542.1A priority patent/CN104007311B/zh
Priority to CN201210079122.5A priority patent/CN102692541B/zh
Publication of JP2012195910A publication Critical patent/JP2012195910A/ja
Priority to US13/919,107 priority patent/US8604837B2/en
Application granted granted Critical
Publication of JP5621673B2 publication Critical patent/JP5621673B2/ja
Active legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/10—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance
    • G01R21/12—Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/14—Compensating for temperature change
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of Electrical Variables (AREA)
  • Amplifiers (AREA)
JP2011060334A 2011-03-18 2011-03-18 検波回路 Active JP5621673B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2011060334A JP5621673B2 (ja) 2011-03-18 2011-03-18 検波回路
US13/405,968 US8604836B2 (en) 2011-03-18 2012-02-27 Detector circuit
CN201410191542.1A CN104007311B (zh) 2011-03-18 2012-03-16 检测器电路
CN201210079122.5A CN102692541B (zh) 2011-03-18 2012-03-16 检测器电路
US13/919,107 US8604837B2 (en) 2011-03-18 2013-06-17 Detector circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011060334A JP5621673B2 (ja) 2011-03-18 2011-03-18 検波回路

Publications (2)

Publication Number Publication Date
JP2012195910A JP2012195910A (ja) 2012-10-11
JP5621673B2 true JP5621673B2 (ja) 2014-11-12

Family

ID=46827973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011060334A Active JP5621673B2 (ja) 2011-03-18 2011-03-18 検波回路

Country Status (3)

Country Link
US (2) US8604836B2 (zh)
JP (1) JP5621673B2 (zh)
CN (2) CN104007311B (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8624657B2 (en) * 2011-07-28 2014-01-07 Mediatek Singapore Pte. Ltd. Squaring circuit, integrated circuit, wireless communication unit and method therefor
US8847572B2 (en) * 2012-04-13 2014-09-30 Taiwan Semiconductor Manufacturing Co., Ltd. Optimization methodology and apparatus for wide-swing current mirror with wide current range
JP5994648B2 (ja) * 2013-01-11 2016-09-21 株式会社デンソー ノイズ検出装置
DE102013202903A1 (de) 2013-02-22 2014-09-11 Rohde & Schwarz Gmbh & Co. Kg Leistungsmessgerät mit interner Kalibrierung von Diodendetektoren
US10630238B2 (en) 2016-08-02 2020-04-21 Hitachi, Ltd. Detector circuit
US10389242B2 (en) 2017-02-01 2019-08-20 Infineon Technologies Austria Ag Voltage and current sensing calibration for switching voltage regulators
CN110703849A (zh) * 2019-10-29 2020-01-17 南开大学 一种低功耗正弦波转方波电路
US11726132B2 (en) 2020-05-28 2023-08-15 The University Of Akron Monitoring power systems utilizing phase locked loop and RF emissions, and high frequency envelope detector for same
CN114077272B (zh) * 2020-08-13 2022-12-23 博通集成电路（上海）股份有限公司 一种射频功率整流器电路
CN114545063B (zh) * 2022-04-22 2022-07-12 苏州贝克微电子股份有限公司 一种高精度区间电流检测电路
FR3144301A1 (fr) * 2022-12-22 2024-06-28 Stmicroelectronics International N.V. Détecteur de puissance

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5352368Y2 (zh) * 1972-12-26 1978-12-14
US4362996A (en) * 1980-11-10 1982-12-07 Hewlett-Packard Company Method and means for an accurate wideband peak detector
JP2724996B2 (ja) * 1983-12-20 1998-03-09 パイオニア株式会社 相対位置検出装置
US4689576A (en) * 1985-08-02 1987-08-25 Motorola, Inc. Linearization circuit
JPH07118612B2 (ja) * 1990-05-31 1995-12-18 東光株式会社 高周波検波回路
US5629639A (en) * 1995-06-07 1997-05-13 Omnipoint Corporation Correlation peak detector
JPH09186526A (ja) 1996-01-08 1997-07-15 Sumitomo Electric Ind Ltd 検波回路
US5796309A (en) * 1996-07-02 1998-08-18 Nippondenso Co., Ltd. Temperature compensated wide dynamic range power detection circuitry for portable RF transmission terminals
JP3678939B2 (ja) * 1999-04-30 2005-08-03 アルプス電気株式会社 温度補償を行ったａｇｃ回路
US6429638B1 (en) * 2000-08-31 2002-08-06 Nortel Networks Limited N-diode peak detector
JP4365541B2 (ja) * 2001-04-18 2009-11-18 アルプス電気株式会社 送信器の検波回路
JP4742454B2 (ja) * 2001-06-25 2011-08-10 日本テキサス・インスツルメンツ株式会社 レギュレータ回路
US7026882B2 (en) * 2003-09-19 2006-04-11 Stmicroelectronics Sa Time base circuit, oscillator based thereon, and communicating apparatus using said oscillator
JP4220884B2 (ja) 2003-11-07 2009-02-04 三菱電機株式会社 電力検波器
US7689122B2 (en) * 2004-03-05 2010-03-30 Finisar Corporation Polarity-insensitive signal detect circuit for use with any signal sequence
JP2006033185A (ja) * 2004-07-13 2006-02-02 Fujitsu Ltd ダイオード検波回路
CN201159746Y (zh) * 2008-02-03 2008-12-03 深圳艾科创新微电子有限公司 一种电流检测电路
JP4917567B2 (ja) * 2008-04-17 2012-04-18 ルネサスエレクトロニクス株式会社 起動信号検出回路
US7777552B1 (en) * 2008-04-29 2010-08-17 Analog Devices, Inc. Logarithmic amplifier with RMS post-processing

Also Published As

Publication number Publication date
US20130278292A1 (en) 2013-10-24
US8604837B2 (en) 2013-12-10
US20120235733A1 (en) 2012-09-20
US8604836B2 (en) 2013-12-10
JP2012195910A (ja) 2012-10-11
CN104007311A (zh) 2014-08-27
CN102692541B (zh) 2015-03-04
CN104007311B (zh) 2017-05-24
CN102692541A (zh) 2012-09-26

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