JP5609327B2 - シンチレータ材料、及びシンチレーション検出器 - Google Patents
シンチレータ材料、及びシンチレーション検出器 Download PDFInfo
- Publication number
- JP5609327B2 JP5609327B2 JP2010151330A JP2010151330A JP5609327B2 JP 5609327 B2 JP5609327 B2 JP 5609327B2 JP 2010151330 A JP2010151330 A JP 2010151330A JP 2010151330 A JP2010151330 A JP 2010151330A JP 5609327 B2 JP5609327 B2 JP 5609327B2
- Authority
- JP
- Japan
- Prior art keywords
- fluorescence
- scintillator material
- scintillator
- single crystal
- zinc oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000000463 material Substances 0.000 title claims description 89
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 88
- 239000013078 crystal Substances 0.000 claims description 69
- 239000011787 zinc oxide Substances 0.000 claims description 43
- 230000005855 radiation Effects 0.000 claims description 20
- 229910052738 indium Inorganic materials 0.000 claims description 6
- 230000000052 comparative effect Effects 0.000 description 17
- 239000002994 raw material Substances 0.000 description 14
- 239000000243 solution Substances 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000010791 quenching Methods 0.000 description 6
- 230000000171 quenching effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 239000003574 free electron Substances 0.000 description 3
- 238000001027 hydrothermal synthesis Methods 0.000 description 3
- 229910052777 Praseodymium Inorganic materials 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910003437 indium oxide Inorganic materials 0.000 description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910016036 BaF 2 Inorganic materials 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 150000002500 ions Chemical group 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000002600 positron emission tomography Methods 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
- G01T1/2023—Selection of materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/62—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing gallium, indium or thallium
- C09K11/621—Chalcogenides
- C09K11/623—Chalcogenides with zinc or cadmium
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/54—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing zinc or cadmium
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/55—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing beryllium, magnesium, alkali metals or alkaline earth metals
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
- C30B7/10—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by application of pressure, e.g. hydrothermal processes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/003—Scintillation (flow) cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
- G21K2004/06—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with a phosphor layer
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Metallurgy (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Radiation (AREA)
- Luminescent Compositions (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Nuclear Medicine (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010151330A JP5609327B2 (ja) | 2010-07-01 | 2010-07-01 | シンチレータ材料、及びシンチレーション検出器 |
| US13/703,713 US8920677B2 (en) | 2010-07-01 | 2011-06-17 | Scintillator material and scintillation detector |
| PCT/JP2011/063886 WO2012002171A1 (ja) | 2010-07-01 | 2011-06-17 | シンチレータ材料、及びシンチレーション検出器 |
| CN201180029633XA CN102959038A (zh) | 2010-07-01 | 2011-06-17 | 闪烁体材料及闪烁检测器 |
| EP20110800636 EP2589641B1 (en) | 2010-07-01 | 2011-06-17 | Scintillator material and scintillation detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010151330A JP5609327B2 (ja) | 2010-07-01 | 2010-07-01 | シンチレータ材料、及びシンチレーション検出器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012012527A JP2012012527A (ja) | 2012-01-19 |
| JP2012012527A5 JP2012012527A5 (enExample) | 2013-08-01 |
| JP5609327B2 true JP5609327B2 (ja) | 2014-10-22 |
Family
ID=45401894
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010151330A Expired - Fee Related JP5609327B2 (ja) | 2010-07-01 | 2010-07-01 | シンチレータ材料、及びシンチレーション検出器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8920677B2 (enExample) |
| EP (1) | EP2589641B1 (enExample) |
| JP (1) | JP5609327B2 (enExample) |
| CN (1) | CN102959038A (enExample) |
| WO (1) | WO2012002171A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6032590B2 (ja) * | 2012-04-04 | 2016-11-30 | 株式会社福田結晶技術研究所 | 酸化亜鉛単結晶の製造方法 |
| JP5594380B2 (ja) * | 2013-01-25 | 2014-09-24 | 株式会社大真空 | シンチレータ、放射線検出器、放射線検査装置、α線検出器、及びシンチレータの製造方法 |
| US10101471B2 (en) * | 2014-07-23 | 2018-10-16 | Koninklijke Philips N.V. | Characterization apparatus for characterizing scintillator material |
| JP6623412B2 (ja) * | 2015-04-23 | 2019-12-25 | 株式会社福田結晶技術研究所 | 酸化亜鉛結晶の製造方法、酸化亜鉛結晶、シンチレータ材料及びシンチレータ検出器 |
| JP6676372B2 (ja) * | 2015-12-28 | 2020-04-08 | 株式会社S−Nanotech Co−Creation | シンチレータ及び電子検出器 |
| US10490397B1 (en) * | 2018-07-18 | 2019-11-26 | Thermo Finnigan Llc | Methods and systems for detection of ion spatial distribution |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH101396A (ja) | 1996-06-14 | 1998-01-06 | Mitsubishi Heavy Ind Ltd | 発光材料およびその製造方法 |
| JP2003277191A (ja) | 2002-03-26 | 2003-10-02 | Japan Science & Technology Corp | Yb混晶酸化物単結晶からなるシンチレータ用発光材料 |
| US20070193499A1 (en) | 2004-05-24 | 2007-08-23 | Tsuguo Fukuda | Zno single crystal as super high speed scintillator... |
| JP5146310B2 (ja) * | 2006-03-01 | 2013-02-20 | 三菱瓦斯化学株式会社 | 液相成長法によるZnO単結晶の製造方法 |
| JP2009234825A (ja) * | 2008-03-26 | 2009-10-15 | Mitsubishi Gas Chem Co Inc | ZnO単結晶の製造方法およびそれによって得られた自立ZnO単結晶ウエファー |
| WO2009130987A1 (ja) * | 2008-04-26 | 2009-10-29 | ユーエムケー・テクノロジー株式会社 | 酸化亜鉛単結晶基板の製造方法及びその方法により育成された単結晶基板並びにその基板上に成膜した半導体発光素子 |
| JP2009286856A (ja) * | 2008-05-27 | 2009-12-10 | Fukuda Crystal Laboratory | シンチレータ材料とその製造方法、及び、電離放射線検出器 |
| JP5251488B2 (ja) | 2008-12-24 | 2013-07-31 | パナソニック株式会社 | 冷蔵庫 |
-
2010
- 2010-07-01 JP JP2010151330A patent/JP5609327B2/ja not_active Expired - Fee Related
-
2011
- 2011-06-17 US US13/703,713 patent/US8920677B2/en not_active Expired - Fee Related
- 2011-06-17 CN CN201180029633XA patent/CN102959038A/zh active Pending
- 2011-06-17 EP EP20110800636 patent/EP2589641B1/en not_active Not-in-force
- 2011-06-17 WO PCT/JP2011/063886 patent/WO2012002171A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US8920677B2 (en) | 2014-12-30 |
| CN102959038A (zh) | 2013-03-06 |
| JP2012012527A (ja) | 2012-01-19 |
| WO2012002171A1 (ja) | 2012-01-05 |
| EP2589641A1 (en) | 2013-05-08 |
| EP2589641B1 (en) | 2015-05-13 |
| EP2589641A4 (en) | 2014-05-21 |
| US20130087739A1 (en) | 2013-04-11 |
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