JP5546198B2 - 固体撮像装置 - Google Patents
固体撮像装置 Download PDFInfo
- Publication number
- JP5546198B2 JP5546198B2 JP2009235088A JP2009235088A JP5546198B2 JP 5546198 B2 JP5546198 B2 JP 5546198B2 JP 2009235088 A JP2009235088 A JP 2009235088A JP 2009235088 A JP2009235088 A JP 2009235088A JP 5546198 B2 JP5546198 B2 JP 5546198B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor region
- pixel
- photoelectric conversion
- conversion unit
- imaging device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/807—Pixel isolation structures
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009235088A JP5546198B2 (ja) | 2009-10-09 | 2009-10-09 | 固体撮像装置 |
| CN201080044580.4A CN102576717B (zh) | 2009-10-09 | 2010-09-29 | 固态图像拾取装置 |
| EP10770882.8A EP2486588B1 (en) | 2009-10-09 | 2010-09-29 | Solid-state image pickup device |
| PCT/JP2010/005841 WO2011043035A1 (en) | 2009-10-09 | 2010-09-29 | Solid-state image pickup device |
| US13/500,043 US9041132B2 (en) | 2009-10-09 | 2010-09-29 | Solid-state image pickup device |
| US14/693,692 US9502465B2 (en) | 2009-10-09 | 2015-04-22 | Solid-state image pickup device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009235088A JP5546198B2 (ja) | 2009-10-09 | 2009-10-09 | 固体撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011082426A JP2011082426A (ja) | 2011-04-21 |
| JP2011082426A5 JP2011082426A5 (enExample) | 2012-11-22 |
| JP5546198B2 true JP5546198B2 (ja) | 2014-07-09 |
Family
ID=43109811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009235088A Active JP5546198B2 (ja) | 2009-10-09 | 2009-10-09 | 固体撮像装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9041132B2 (enExample) |
| EP (1) | EP2486588B1 (enExample) |
| JP (1) | JP5546198B2 (enExample) |
| CN (1) | CN102576717B (enExample) |
| WO (1) | WO2011043035A1 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6095258B2 (ja) | 2011-05-27 | 2017-03-15 | キヤノン株式会社 | 固体撮像装置、及び固体撮像装置を用いた撮像システム |
| US9231007B2 (en) * | 2013-08-27 | 2016-01-05 | Semiconductor Components Industries, Llc | Image sensors operable in global shutter mode and having small pixels with high well capacity |
| JP6141160B2 (ja) * | 2013-09-25 | 2017-06-07 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子およびその動作方法、並びに電子機器およびその動作方法 |
| JP6308864B2 (ja) * | 2014-05-15 | 2018-04-11 | キヤノン株式会社 | 撮像装置 |
| JP2016187018A (ja) * | 2015-03-27 | 2016-10-27 | キヤノン株式会社 | 光電変換装置およびカメラ |
| US10396108B2 (en) | 2015-10-27 | 2019-08-27 | Sony Semiconductor Solutions Corporation | Solid-state imaging element, solid-state imaging element manufacturing method, and electronic apparatus |
| JP6407227B2 (ja) * | 2016-10-05 | 2018-10-17 | キヤノン株式会社 | 固体撮像装置、及び固体撮像装置を用いた撮像システム |
| JP6661723B2 (ja) * | 2018-09-19 | 2020-03-11 | キヤノン株式会社 | 固体撮像装置、及び固体撮像装置を用いた撮像システム |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3702854B2 (ja) * | 2002-03-06 | 2005-10-05 | ソニー株式会社 | 固体撮像素子 |
| TWI353979B (en) | 2002-04-10 | 2011-12-11 | Nippon Zoki Pharmaceutical Co | Novel crystal form of 5-hydroxy-1-methylhydantoin |
| WO2003096421A1 (en) | 2002-05-14 | 2003-11-20 | Sony Corporation | Semiconductor device and its manufacturing method, and electronic device |
| WO2004017411A1 (ja) | 2002-08-12 | 2004-02-26 | Sony Corporation | 固体撮像素子及びその製造方法 |
| JP2004165462A (ja) | 2002-11-14 | 2004-06-10 | Sony Corp | 固体撮像素子及びその製造方法 |
| US7153719B2 (en) * | 2004-08-24 | 2006-12-26 | Micron Technology, Inc. | Method of fabricating a storage gate pixel design |
| JP4416668B2 (ja) | 2005-01-14 | 2010-02-17 | キヤノン株式会社 | 固体撮像装置、その制御方法及びカメラ |
| JP4273124B2 (ja) | 2005-02-04 | 2009-06-03 | キヤノン株式会社 | 撮像装置及び撮像システム |
| JP4785433B2 (ja) | 2005-06-10 | 2011-10-05 | キヤノン株式会社 | 固体撮像装置 |
| US7605440B2 (en) * | 2006-04-07 | 2009-10-20 | Aptina Imaging Corporation | Pixel cell isolation of charge storage and floating diffusion regions using doped wells |
| JP2008004692A (ja) * | 2006-06-21 | 2008-01-10 | Nikon Corp | 固体撮像装置 |
| JP2009038167A (ja) | 2007-08-01 | 2009-02-19 | Victor Co Of Japan Ltd | 固体撮像装置及びその製造方法 |
| JP5213501B2 (ja) | 2008-04-09 | 2013-06-19 | キヤノン株式会社 | 固体撮像装置 |
| JP4785963B2 (ja) * | 2009-10-09 | 2011-10-05 | キヤノン株式会社 | 固体撮像装置 |
-
2009
- 2009-10-09 JP JP2009235088A patent/JP5546198B2/ja active Active
-
2010
- 2010-09-29 US US13/500,043 patent/US9041132B2/en not_active Expired - Fee Related
- 2010-09-29 CN CN201080044580.4A patent/CN102576717B/zh active Active
- 2010-09-29 EP EP10770882.8A patent/EP2486588B1/en not_active Not-in-force
- 2010-09-29 WO PCT/JP2010/005841 patent/WO2011043035A1/en not_active Ceased
-
2015
- 2015-04-22 US US14/693,692 patent/US9502465B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US9041132B2 (en) | 2015-05-26 |
| EP2486588A1 (en) | 2012-08-15 |
| US9502465B2 (en) | 2016-11-22 |
| WO2011043035A1 (en) | 2011-04-14 |
| EP2486588B1 (en) | 2018-07-18 |
| CN102576717A (zh) | 2012-07-11 |
| US20150228692A1 (en) | 2015-08-13 |
| US20120199933A1 (en) | 2012-08-09 |
| CN102576717B (zh) | 2015-04-01 |
| JP2011082426A (ja) | 2011-04-21 |
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