JP5453861B2 - 周期性欠陥検出装置及びその方法 - Google Patents

周期性欠陥検出装置及びその方法 Download PDF

Info

Publication number
JP5453861B2
JP5453861B2 JP2009061501A JP2009061501A JP5453861B2 JP 5453861 B2 JP5453861 B2 JP 5453861B2 JP 2009061501 A JP2009061501 A JP 2009061501A JP 2009061501 A JP2009061501 A JP 2009061501A JP 5453861 B2 JP5453861 B2 JP 5453861B2
Authority
JP
Japan
Prior art keywords
defect
small
region
periodic
small area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2009061501A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009265087A5 (enExample
JP2009265087A (ja
Inventor
敬弘 腰原
宏晴 加藤
章生 長棟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
JFE Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2009061501A priority Critical patent/JP5453861B2/ja
Application filed by JFE Steel Corp filed Critical JFE Steel Corp
Priority to US12/935,307 priority patent/US9008975B2/en
Priority to KR1020107021180A priority patent/KR101288734B1/ko
Priority to PCT/JP2009/056914 priority patent/WO2009123296A1/ja
Priority to CN2009801121710A priority patent/CN102007400B/zh
Priority to EP09726665.4A priority patent/EP2264446B1/en
Priority to TW098110592A priority patent/TWI392865B/zh
Publication of JP2009265087A publication Critical patent/JP2009265087A/ja
Publication of JP2009265087A5 publication Critical patent/JP2009265087A5/ja
Application granted granted Critical
Publication of JP5453861B2 publication Critical patent/JP5453861B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2009061501A 2008-03-31 2009-03-13 周期性欠陥検出装置及びその方法 Active JP5453861B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2009061501A JP5453861B2 (ja) 2008-03-31 2009-03-13 周期性欠陥検出装置及びその方法
KR1020107021180A KR101288734B1 (ko) 2008-03-31 2009-03-27 주기성 결함 검출 장치 및 그 방법
PCT/JP2009/056914 WO2009123296A1 (ja) 2008-03-31 2009-03-27 周期性欠陥検出装置及びその方法
CN2009801121710A CN102007400B (zh) 2008-03-31 2009-03-27 周期性缺陷检测装置及其方法
US12/935,307 US9008975B2 (en) 2008-03-31 2009-03-27 Apparatus for detecting periodic defect and method therefor
EP09726665.4A EP2264446B1 (en) 2008-03-31 2009-03-27 Periodic defect detecting device and method for the same
TW098110592A TWI392865B (zh) 2008-03-31 2009-03-31 週期性缺陷檢測裝置及其方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008089364 2008-03-31
JP2008089364 2008-03-31
JP2009061501A JP5453861B2 (ja) 2008-03-31 2009-03-13 周期性欠陥検出装置及びその方法

Publications (3)

Publication Number Publication Date
JP2009265087A JP2009265087A (ja) 2009-11-12
JP2009265087A5 JP2009265087A5 (enExample) 2012-04-12
JP5453861B2 true JP5453861B2 (ja) 2014-03-26

Family

ID=41135663

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009061501A Active JP5453861B2 (ja) 2008-03-31 2009-03-13 周期性欠陥検出装置及びその方法

Country Status (7)

Country Link
US (1) US9008975B2 (enExample)
EP (1) EP2264446B1 (enExample)
JP (1) JP5453861B2 (enExample)
KR (1) KR101288734B1 (enExample)
CN (1) CN102007400B (enExample)
TW (1) TWI392865B (enExample)
WO (1) WO2009123296A1 (enExample)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011083405A1 (de) * 2010-12-21 2012-06-21 Sms Siemag Ag Verfahren und Vorrichtung zur Oberflächeninspektion von Bandstücken
JP5614312B2 (ja) * 2011-02-01 2014-10-29 Ｊｆｅスチール株式会社 周期性欠陥検出方法および周期性欠陥検出装置
AT511773A1 (de) * 2011-07-15 2013-02-15 Voestalpine Stahl Gmbh Vorrichtung und verfahren zur detektion wenigstens eines periodisch auftretenden fehlers an einem gegenstand
KR101309966B1 (ko) * 2011-12-15 2013-09-17 주식회사 포스코 강판의 결함 탐상 장치
KR101482347B1 (ko) 2012-12-27 2015-01-13 주식회사 포스코 강판의 내부 결함 검출 장치 및 방법
CN103630547B (zh) * 2013-11-26 2016-02-03 明基材料有限公司 具有周期性结构的光学薄膜的瑕疵检测方法及其检测装置
JP6287379B2 (ja) * 2014-03-11 2018-03-07 株式会社リコー 画像検査装置、画像検査システム及び画像検査方法
US9973121B2 (en) * 2014-08-08 2018-05-15 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US9954469B2 (en) * 2014-08-08 2018-04-24 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US9716453B2 (en) * 2014-08-08 2017-07-25 Johnson Electric S.A. Magnetic sensor and an integrated circuit
US20160344320A1 (en) * 2014-08-08 2016-11-24 Johnson Electric S.A. Magnetic sensor integrated circuit, motor component and application apparatus
US9966883B2 (en) * 2014-08-08 2018-05-08 Johnson Electric S.A. Magnetic sensor and an integrated circuit
JP6358002B2 (ja) * 2014-09-16 2018-07-18 旭硝子株式会社 不具合搬送用ロールの特定方法、およびガラスリボンにおける疵発生防止方法
CN104751288B (zh) * 2015-03-30 2018-10-09 北京首钢自动化信息技术有限公司 一种钢卷分段多维在线质量判定系统及其方法
CN105572143B (zh) * 2015-12-17 2018-05-25 湖北第二师范学院 压延过程中压延材料表面周期性缺陷的检测方法
CN106959336B (zh) * 2016-01-11 2020-07-28 宝山钢铁股份有限公司 用于漏磁检测标定的背景噪声去除装置及方法
JP6587988B2 (ja) * 2016-07-07 2019-10-09 株式会社日立ビルシステム ハンドレールの検査システムおよびハンドレールの検査方法
CN106053559A (zh) * 2016-07-30 2016-10-26 董超超 用于金属材料表面缺陷的检测系统
CN106468677B (zh) * 2016-09-06 2018-11-09 电子科技大学 一种脉冲涡流热成像中缺陷的自动分割方法
CN106918639B (zh) * 2017-04-18 2019-07-02 清华大学 沿磁化方向的单元组合缺陷漏磁信号计算方法
CN107475509B (zh) * 2017-08-04 2019-03-19 北京首钢股份有限公司 一种带钢的周期性缺陷的分析方法
WO2020137151A1 (ja) 2018-12-25 2020-07-02 Ｊｆｅスチール株式会社 学習済みモデルの生成方法、学習済みモデル、表面欠陥検出方法、鋼材の製造方法、合否判定方法、等級判定方法、表面欠陥判定プログラム、合否判定プログラム、判定システム、及び鋼材の製造設備
WO2020261554A1 (ja) * 2019-06-28 2020-12-30 Ｊｆｅスチール株式会社 丸棒の表面疵検査方法及び表面疵検査装置
CN110779928B (zh) * 2019-11-19 2022-07-26 汪科道 缺陷检测装置及方法
CN111314801B (zh) * 2020-02-13 2022-01-28 中国铁道科学研究院集团有限公司铁道建筑研究所 一种支持动态调度的数据采集系统及方法
JP7603404B2 (ja) * 2020-09-24 2024-12-20 株式会社カナデビアエンジニアリング ワイヤロープの劣化判定装置およびワイヤロープの劣化判定方法
US20230122383A1 (en) * 2021-10-18 2023-04-20 Edwin J. Lightfoot Method and apparatus for the real time quantification of subtle variations in a planar material and identification of a corresponding source of the identified subtle variation
CN115541592A (zh) * 2022-09-26 2022-12-30 北京科技大学 一种镀锡钢板表面周期缺陷的判定方法
CN120334362B (zh) * 2025-06-18 2025-08-29 中国石油大学(华东) 全矩阵显微超声泄漏缺陷三维重构方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH612152A5 (enExample) * 1976-01-26 1979-07-13 Rieter Ag Maschf
US4463425A (en) * 1980-07-17 1984-07-31 Terumo Corporation Period measurement system
JPS58156842A (ja) * 1982-03-15 1983-09-17 Toshiba Corp ロ−ル疵検出装置
JPH0786474B2 (ja) * 1988-09-09 1995-09-20 富士写真フイルム株式会社 欠陥周期の測定方法
JPH06324005A (ja) 1993-05-13 1994-11-25 Nippon Steel Corp 鋼板の圧延ロール疵検出方法
JPH07198627A (ja) * 1994-01-06 1995-08-01 Nippon Steel Corp 金属表面欠陥検査装置
JPH08160006A (ja) * 1994-11-30 1996-06-21 Kawasaki Steel Corp 鋼板の欠陥検出方法
EP0927887A1 (de) * 1997-12-17 1999-07-07 Zellweger Luwa Ag Verfahren zur Erkennung periodischer Fehler in einem längsbewegten Prüfgut
US6266983B1 (en) * 1998-12-09 2001-07-31 Kawasaki Steel Corporation Method and apparatus for detecting flaws in strip, method of manufacturing cold-rolled steel sheet and pickling equipment for hot-rolled steel strip
JP2004071045A (ja) * 2002-08-06 2004-03-04 Sony Corp デフェクト検出装置、デフェクト検出方法
JP2006105791A (ja) 2004-10-05 2006-04-20 Nippon Steel Corp 帯状体や柱状体の周期性疵検出方法およびその装置
JP4395057B2 (ja) * 2004-11-29 2010-01-06 新日本製鐵株式会社 帯状体や柱状体の周期疵検出方法およびその装置

Also Published As

Publication number Publication date
US20110040499A1 (en) 2011-02-17
EP2264446A1 (en) 2010-12-22
TWI392865B (zh) 2013-04-11
CN102007400B (zh) 2012-09-05
EP2264446A4 (en) 2017-05-03
JP2009265087A (ja) 2009-11-12
KR20100116683A (ko) 2010-11-01
EP2264446B1 (en) 2021-01-20
US9008975B2 (en) 2015-04-14
CN102007400A (zh) 2011-04-06
WO2009123296A1 (ja) 2009-10-08
TW200951426A (en) 2009-12-16
KR101288734B1 (ko) 2013-07-23

Similar Documents

Publication Publication Date Title
JP5453861B2 (ja) 周期性欠陥検出装置及びその方法
RU2342653C2 (ru) Способ неразрушающего испытания труб и устройство для его осуществления
JP5462576B2 (ja) 渦電流探傷装置及びその信号処理方法
JP2009265087A5 (enExample)
JP5614312B2 (ja) 周期性欠陥検出方法および周期性欠陥検出装置
CN114113307A (zh) 一种用于连续油管全向缺陷检测装置及方法
CN113671018B (zh) 一种用于抑制钢轨漏磁检测提离干扰的滤波方法
EP3344982B1 (en) A method and system for detecting a material discontinuity in a magnetisable article
CN103797362A (zh) 用于探测在目标物上的至少一个周期性出现的缺陷的设备和方法
US10788456B2 (en) Eddy current inspection device for nondestructive testing
CN105021694B (zh) 不完整信号下的漏磁检测缺陷量化与显示方法
Park et al. Vision-based inspection for periodic defects in steel wire rod production
CN115308297A (zh) 一种基于周向励磁装置的缺陷信号量化方法和系统
JP4622742B2 (ja) 金属帯の渦流探傷方法および装置
CN114723735B (zh) 一种构建磁相机检测图像来实现缺陷成像检测的方法及系统
RU2586261C2 (ru) Устройство магнитного дефектоскопа и способ уменьшения погрешности определения размеров дефектов трубопровода магнитными дефектоскопами
JP4831298B2 (ja) 焼き入れ深さ測定装置
KR102559191B1 (ko) 마스크 검사 방법 및 장치
JP5013363B2 (ja) 非破壊検査装置
Dat et al. Multilayer perceptron neural network and Eddy current technique for estimation of the crack depth on massive metal structures
CN116593575B (zh) 一种基于峭度自适应逐级特征挖掘的管道缺陷检测方法及系统
JPH11271278A (ja) 鋼材の欠陥検出方法
Woo et al. Moiré Fringe Segmentation Using Fuzzy Inference System
KR101111261B1 (ko) 강선의 결함 검사 장치
JPH0481653A (ja) 渦流探傷方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120224

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120224

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130122

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130319

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130924

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131122

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131210

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20131223

R150 Certificate of patent or registration of utility model

Ref document number: 5453861

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250